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Marc D'Olieslaeger

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Journal Articles

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2005
[j6]
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  dblp key:
  - journals/mr/VanstreelsDCDM05
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  persistent URL:
  - https://dblp.org/rec/journals/mr/VanstreelsDCDM05
Kris Vanstreels, Marc D'Olieslaeger, Ward De Ceuninck, Jan D'Haen, Karen Maex:
A new method for the lifetime determination of submicron metal interconnects by means of a parallel test structure. Microelectron. Reliab. 45(3-4): 753-759 (2005)
2004
[j5]
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  - journals/mr/BiesemansSVDCD04
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  - https://dblp.org/rec/journals/mr/BiesemansSVDCD04
Leen Biesemans, K. Schepers, Kris Vanstreels, Jan D'Haen, Ward De Ceuninck, Marc D'Olieslaeger:
MTF test system with AC based dynamic joule correction for electromigration tests on interconnects. Microelectron. Reliab. 44(9-11): 1849-1854 (2004)
2003
[j4]
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  - journals/mr/AresuCKMMSDKDD03
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  - https://dblp.org/rec/journals/mr/AresuCKMMSDKDD03
Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen:
A new method for the analysis of high-resolution SILC data. Microelectron. Reliab. 43(9-11): 1483-1488 (2003)
2002
[j3]
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  - journals/mr/PetersenCDDSVBP02
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  - https://dblp.org/rec/journals/mr/PetersenCDDSVBP02
R. Petersen, Ward De Ceuninck, Jan D'Haen, Marc D'Olieslaeger, Luc De Schepper, Olivier Vendier, Hervé Blanck, Dominique Pons:
Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology. Microelectron. Reliab. 42(9-11): 1359-1363 (2002)
[j2]
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  - journals/mr/AndriesDCCSGLDD02
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E. Andries, R. Dreesen, Kris Croes, Ward De Ceuninck, Luc De Schepper, Guido Groeseneken, K. F. Lo, Marc D'Olieslaeger, Jan D'Haen:
Statistical aspects of the degradation of LDD nMOSFETs. Microelectron. Reliab. 42(9-11): 1409-1413 (2002)
[j1]
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  - journals/mr/AresuCDCAMSDKD02
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  - https://dblp.org/rec/journals/mr/AresuCDCAMSDKD02
Stefano Aresu, Ward De Ceuninck, R. Dreesen, Kris Croes, E. Andries, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger:
High-resolution SILC measurements of thin SiO₂ at ultra low voltages. Microelectron. Reliab. 42(9-11): 1485-1489 (2002)

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