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Hari Balachandran
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2000 – 2009
- 2004
- [c11]Wangqi Qiu, Jing Wang, D. M. H. Walker, Divya Reddy, Zhuo Li, Weiping Shi, Hari Balachandran:
K Longest Paths Per Gate (KLPG) Test Generation for Scan-Based Sequential Circuits. ITC 2004: 223-231 - 2002
- [c10]Hari Balachandran, Kenneth M. Butler, Neil Simpson:
Facilitating Rapid First Silicon Debug. ITC 2002: 628-637 - 2000
- [c9]Anjali Kinra, Hari Balachandran, Regy Thomas, John Carulli:
Logic mapping on a microprocessor. ITC 2000: 701-710 - [c8]Zoran Stanojevic, Hari Balachandran, D. M. H. Walker, Fred Lakbani, Jayashree Saxena, Kenneth M. Butler:
Computer-aided fault to defect mapping (CAFDM) for defect diagnosis. ITC 2000: 729-738 - [c7]Sri Jandhyala, Hari Balachandran, Manidip Sengupta, Anura P. Jayasumana:
Clustering Based Evaluation of IDDQ Measurements: Applications in Testing and Classification of ICs. VTS 2000: 444-452
1990 – 1999
- 1999
- [c6]Hari Balachandran, Jason Parker, Gordon Gammie, John W. Olson, Craig Force, Kenneth M. Butler, Sri Jandhyala:
Expediting ramp-to-volume production. ITC 1999: 103-112 - [c5]Hari Balachandran, Jason Parker, Daniel Shupp, Stephanie Butler, Kenneth M. Butler, Craig Force, Jason Smith:
Correlation of logical failures to a suspect process step. ITC 1999: 458-476 - [c4]Sri Jandhyala, Hari Balachandran, Anura P. Jayasumana:
Clustering based techniques for I_DDQ testing. ITC 1999: 730-737 - [c3]Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer:
REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. VTS 1999: 268-274 - 1998
- [c2]Jayashree Saxena, Kenneth M. Butler, Hari Balachandran, David B. Lavo, Tracy Larrabee, F. Joel Ferguson, Brian Chess:
On applying non-classical defect models to automated diagnosis. ITC 1998: 748-757 - 1996
- [c1]Hari Balachandran, D. M. H. Walker:
Improvement of SRAM-based failure analysis using calibrated Iddq testing. VTS 1996: 130-137
Coauthor Index
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