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Beau R. Wilson Jr.

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Conference and Workshop Papers

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1984
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Beau R. Wilson Jr., Eugene R. Hnatek:
Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook). ITC 1984: 778-788
1982
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Eugene R. Hnatek, Beau R. Wilson Jr.:
An Evaluation of the 2816 EEPROM. ITC 1982: 225-235
1981
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Beau R. Wilson Jr.:
A Method for Testing Subnanosecond ECL. ITC 1981: 393-401

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