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ORCIDSami A. Al-Arian
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2000 – 2009
- 2000
[j3]Bassam Shaer, Sami A. Al-Arian, David L. Landis:
Partitioning sequential circuits for pseudoexhaustive testing. IEEE Trans. Very Large Scale Integr. Syst. 8(5): 534-541 (2000)- [j2]Bassam Shaer, David L. Landis, Sami A. Al-Arian:
Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSI circuits. IEEE Trans. Very Large Scale Integr. Syst. 8(6): 750-754 (2000)
1990 – 1999
- 1999
- [c14]Bassam Shaer, Sami A. Al-Arian, David L. Landis:
Pseudo-Exhaustive Testing of Sequential Circuits. Great Lakes Symposium on VLSI 1999: 109- - 1998
- [c13]Bassam Shaer, Sami A. Al-Arian, David L. Landis:
Partitioning algorithm to enhance VLSI testability. ACM Southeast Regional Conference 1998: 121-129 - 1997
- [c12]Musaed A. Al-Kharji, Sami A. Al-Arian:
A New Heuristic Algorithm for Estimating Signal and Detection Probabilities. Great Lakes Symposium on VLSI 1997: 26-31 - 1996
- [c11]Stephan P. Athan, David L. Landis, Sami A. Al-Arian:
A novel built-in current sensor for IDDQ testing of deep submicron CMOS ICs. VTS 1996: 118-123 - 1994
- [c10]Randy E. Bolling, Sami A. Al-Arian:
Reconfigurable Linear Feedback Register Design, Analysis & Applications. ISCAS 1994: 87-90 - [c9]Sami A. Al-Arian, Randy E. Bolling:
Improving the Testability of VLSI Circuits through Partitioning. ISCAS 1994: 199-202 - 1993
- [j1]Warren H. Debany Jr., Kevin A. Kwiat, Sami A. Al-Arian:
A Method for Consistent Fault Coverage Reporting. IEEE Des. Test Comput. 10(3): 68-79 (1993) - [c8]Hussam Y. Abujbara, Sami A. Al-Arian:
Degrading fault model for WSI interconnection lines. VTS 1993: 182-185 - 1992
- [c7]Sami A. Al-Arian, Musaed A. Al-Kharji:
Fault Simulation and Test Generation by Fault Sampling Techniques. ICCD 1992: 365-368 - 1991
- [c6]Sami A. Al-Arian, Hussam Y. Abujbara, Jim C. Ruel:
A Unique Approach to Built-in-Self-Test Circuit Design. ICCD 1991: 270-274 - 1990
- [c5]Sami A. Al-Arian, Hari P. Kunamneni:
Three approaches to design fault tolerant programmable logic arrays. ACM Southeast Regional Conference 1990: 151-158 - [c4]Hussam Y. Abujbara, Sami A. Al-Arian:
Self-testing and self-reconfiguration architecture for 2-D WSI arrays. SPDP 1990: 527-530
1980 – 1989
- 1989
- [c3]Sami A. Al-Arian:
Design and Test in the Universities. ITC 1989: 245-245 - 1988
- [c2]Sami A. Al-Arian, Kevin A. Kwiat:
Defining a Standard for Fault Simulator Evaluation. ITC 1988: 1001 - 1984
- [c1]Dharma P. Agrawal, Sami A. Al-Arian:
Comprehensive Fault Model and Testing of CMOS Circuits. ITC 1984: 218-223
Coauthor Index
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