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M. Zmeck

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2001
[j1]
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M. Zmeck, J. C. H. Phang, Andrew Bettiol, T. Osipowicz, F. Watt, L. J. Balk, Franz-Josef Niedernostheide, Hans-Joachim Schulze, E. Falck, R. Barthelmess:
Analysis of high-power devices using proton beam induced charge microscopy. Microelectron. Reliab. 41(9-10): 1519-1524 (2001)

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