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"Analysis of high-power devices using proton beam induced charge microscopy."

M. Zmeck et al. (2001)

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DOI: 10.1016/S0026-2714(01)00159-7

access: closed

type: Journal Article

metadata version: 2020-11-05

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  - https://dblp.org/rec/journals/mr/ZmeckPBOWBNSFB01
M. Zmeck, J. C. H. Phang, Andrew Bettiol, T. Osipowicz, F. Watt, L. J. Balk, Franz-Josef Niedernostheide, Hans-Joachim Schulze, E. Falck, R. Barthelmess:
Analysis of high-power devices using proton beam induced charge microscopy. Microelectron. Reliab. 41(9-10): 1519-1524 (2001)

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