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Kyu-Hwan Shim

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2010 – 2019

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2011
[j3]
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  - https://dblp.org/rec/journals/ieicet/LeeCSYC11
Hoon-Ki Lee, S. V. Jagadeesh Chandra, Kyu-Hwan Shim, Jong-Won Yoon, Chel-Jong Choi:
Electrical and Structural Properties of Metal-Oxide-Semiconductor (MOS) Devices with Pt/Ta₂O₅ Gate Stacks. IEICE Trans. Electron. 94-C(5): 846-849 (2011)

2000 – 2009

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2008
[j2]
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Sang-Sik Choi, A-Ram Choi, Jae-Yeon Kim, Jeon-Wook Yang, Yong-Woo Hwang, Tae-Hyun Han, Deok Ho Cho, Kyu-Hwan Shim:
Stress Effect Analysis for PD SOI pMOSFETs with Undoped-Si_0.88Ge_0.12 Heterostructure Channel. IEICE Trans. Electron. 91-C(5): 716-720 (2008)
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A-Ram Choi, Sang-Sik Choi, Byung-Guan Park, Dongwoo Suh, Gyungock Kim, Jin-Tae Kim, Jin-Soo Choi, Deok Ho Cho, Tae-Hyun Han, Kyu-Hwan Shim:
Selective Epitaxial Growth of SiGe Layers with High Aspect Ratio Mask of Dielectric Films. IEICE Trans. Electron. 91-C(5): 767-771 (2008)

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