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Bruce Odekirk

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Conference and Workshop Papers

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2022
[c1]
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Robert Stahlbush, Nadeemullah A. Mahadik, Peter Bonanno, Jake Soto, Bruce Odekirk, Woongje Sung, Anant K. Agarwal:
Defects in 4H-SiC epilayers affecting device yield and reliability. IRPS 2022: 65-1

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