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Peter Czurratis

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2010 – 2019

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2016
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Eva Grünwald, Jördis Rosc, René Hammer, Peter Czurratis, Matthias Koch, Jochen Kraft, Franz Schrank, Roland Brunner:
Automatized failure analysis of tungsten coated TSVs via scanning acoustic microscopy. Microelectron. Reliab. 64: 370-374 (2016)

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