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Xandri van Niekerk

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2010 – 2019

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2019
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Sharhts Siima Bugingo, Peter Freere, Ross Schultz, Frikkie C. De Beer, Xandri van Niekerk:
Non-Destructive Imaging of Insulated Gate Bipolar Transistor Power Modules. AFRICON 2019: 1-6

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