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"Non-Destructive Imaging of Insulated Gate Bipolar Transistor Power Modules."

Sharhts Siima Bugingo et al. (2019)

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DOI: 10.1109/AFRICON46755.2019.9134042

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-29

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  dblp key:
  - conf/africon/BugingoFSBN19
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  - https://dblp.org/rec/conf/africon/BugingoFSBN19
Sharhts Siima Bugingo, Peter Freere, Ross Schultz, Frikkie C. De Beer, Xandri van Niekerk:
Non-Destructive Imaging of Insulated Gate Bipolar Transistor Power Modules. AFRICON 2019: 1-6

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