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P. J. Liao
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Conference and Workshop Papers
- 2024
- [c7]H. C. Chang, P. J. Liao, S. H. Chen, Y. K. Chang, C. P. Li, W. C. Liao, M. H. Hsieh, H. W. Yang, J. H. Lee, C. M. Huang, Jun He:
Enhancing EM Reliability and Lifetime Modeling: A Multi-Link Structure Approach. IRPS 2024: 1-4 - 2023
- [c6]P. C. Chang, P. J. Liao, C. H. Wu, Y. C. Chang, D. H. Hou, Elia Ambrosi, H. Y. Lee, J. H. Lee, X. Y. Bao:
A New Ramp Stress Reliability Assessment on Pulse Energy Based OTS Switching Operation. IRPS 2023: 1-5 - 2022
- [c5]Y. K. Chang, P. J. Liao, S. H. Yeong, Y.-M. Lin, J. H. Lee, C. T. Lin, Z. Yu, Wilman Tsai, Paul C. McIntyre:
The Field-dependence Endurance Model and Its Mutual Effect in Hf-based Ferroelectrics. IRPS 2022: 3 - [c4]P. C. Chang, P. J. Liao, D. W. Heh, C. Lee, D. H. Hou, Elia Ambrosi, C. H. Wu, H. Y. Lee, J. H. Lee, Xinyu Bao:
Investigation of First Fire Effect on VTH Stability and Endurance in GeCTe Selector. IRPS 2022: 4 - 2021
- [c3]Yung-Huei Lee, P. J. Liao, Vincent Hou, Dawei Heh, Chih-Hung Nien, Wen-Hsien Kuo, Gary T. Chen, Shao-Ming Yu, Yu-Sheng Chen, Jau-Yi Wu, Xinyu Bao, Carlos H. Diaz
:
Composition Segregation of Ge-Rich GST and Its Effect on Reliability. IRPS 2021: 1-6 - 2019
- [c2]Kaustubh Joshi
, Yung-Huei Lee, Yu-Cheng Yao, Shu-Wen Chang, Siao-Syong Bian, P. J. Liao, Jiaw-Ren Shih, Min-Jan Chen:
A Statistical Learning Model for Accurate Prediction of Time-Dependent Dielectric Degradation for Low Failure Rates. IRPS 2019: 1-6 - 2018
- [c1]Kaustubh Joshi
, Shu-Wen Chang, D. S. Huang, P. J. Liao, Yung-Huei Lee:
Study of dynamic TDDB in scaled FinFET technologies. IRPS 2018: 5-1
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