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Jim W. Milligan

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Journal Articles

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2018
[j1]
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  - journals/mr/GajewskiGSWBMP18
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  persistent URL:
  - https://dblp.org/rec/journals/mr/GajewskiGSWBMP18
Donald A. Gajewski, Satyaki Ganguly, Scott T. Sheppard, Simon Wood, Jeff B. Barner, Jim W. Milligan, John Palmour:
Reliability comparison of 28V-50V GaN-on-SiC S-band and X-band technologies. Microelectron. Reliab. 84: 1-6 (2018)

Conference and Workshop Papers

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2022
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  - conf/irps/GangulyBNSLFRGS22
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Satyaki Ganguly, Kyle M. Bothe, Alexandre Niyonzima, Thomas Smith, Yueying Liu, Jeremy Fisher, Fabian Radulescu, Donald A. Gajewski, Scott T. Sheppard, Jim W. Milligan, Basim Noori, John W. Palmour:
DC and RF Reliability Assessment of 5G-MMW capable GaN HEMT Process (Invited). IRPS 2022: 11
2019
[c1]
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  - conf/bcicts/SchmuklerBFGSMB19
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Bruce Schmukler, Jeffrey Barner, Jeremy Fisher, Donald A. Gajewski, Scott T. Sheppard, Jim W. Milligan, Kyle M. Bothe, Satyaki Ganguly, Terry Alcorn, Jennifer Gao, Chris Hardiman, Evan Jones, Dan Namishia, Fabian Radulescu:
A High Efficiency, Ka-Band, GaN-on-SiC MMIC with Low Compression. BCICTS 2019: 1-4

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