"DC and RF Reliability Assessment of 5G-MMW capable GaN HEMT Process (Invited)."

Satyaki Ganguly et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764539

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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Satyaki Ganguly, Kyle M. Bothe, Alexandre Niyonzima, Thomas Smith, Yueying Liu, Jeremy Fisher, Fabian Radulescu, Donald A. Gajewski, Scott T. Sheppard, Jim W. Milligan, Basim Noori, John W. Palmour:
DC and RF Reliability Assessment of 5G-MMW capable GaN HEMT Process (Invited). IRPS 2022: 11

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