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Kuo-Tai Teng

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Conference and Workshop Papers

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2020
[c2]
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Marcel François Heertjes, Hans Butler, Nic J. Dirkx, Stan H. van der Meulen, Rahul Ahlawat, Kevin O'Brien, James Simonelli, Kuo-Tai Teng, Yingbo Zhao:
Control of Wafer Scanners: Methods and Developments. ACC 2020: 3686-3703
2015
[c1]
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Kuo-Tai Teng, Tsu-Chin Tsao:
A comparison of inversion based Iterative Learning Control Algorithms. ACC 2015: 3564-3569

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