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Z. Y. Shou

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2011
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  - https://dblp.org/rec/journals/mr/YangWSDSGF11
Dao-Guo Yang, F. F. Wan, Z. Y. Shou, Willem D. van Driel, H. Scholten, L. Goumans, Roberto Faria:
Effect of high temperature aging on reliability of automotive electronics. Microelectron. Reliab. 51(9-11): 1938-1942 (2011)

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