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J. Daniel Mis

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1990 – 1999

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1992
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Paul M. Fahey, Siegfried R. Mader, Scott R. Stiffler, Rick L. Mohler, J. Daniel Mis, James A. Slinkman:
Stress-induced dislocations in silicon integrated circuits. IBM J. Res. Dev. 36(2): 158-182 (1992)

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