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J. P. M. Hoefnagels

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2011
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L. I. J. C. Bergers, J. P. M. Hoefnagels, N. K. R. Delhey, Marc G. D. Geers:
Measuring time-dependent deformations in metallic MEMS. Microelectron. Reliab. 51(6): 1054-1059 (2011)

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