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Jinyu Jason Ruan
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2010 – 2019
- 2012
- [j6]Jinyu Jason Ruan, Nicolas Monnereau, David Trémouilles
, Nicolas Mauran, Fabio Coccetti, Nicolas Nolhier, Robert Plana
:
An Accelerated Stress Test Method for Electrostatically Driven MEMS Devices. IEEE Trans. Instrum. Meas. 61(2): 456-461 (2012) - 2010
- [b1]Jinyu Jason Ruan:
Analyse et modélisation de l'impact des décharges électrostatiques et des agressions électromagnétiques sur les microcommutateurs. Paul Sabatier University, Toulouse, France, 2010
2000 – 2009
- 2009
- [j5]Jinyu Jason Ruan, Nicolas Nolhier, George J. Papaioannou
, David Trémouilles
, Vincent Puyal, C. Villeneuve
, T. Idda, Fabio Coccetti, Robert Plana
:
Accelerated lifetime test of RF-MEMS switches under ESD stress. Microelectron. Reliab. 49(9-11): 1256-1259 (2009) - [j4]Joo-Young Choi, Jinyu Jason Ruan, Fabio Coccetti, Stepan Lucyszyn:
Three-Dimensional RF MEMS Switch for Power Applications. IEEE Trans. Ind. Electron. 56(4): 1031-1039 (2009) - 2008
- [j3]Jinyu Jason Ruan, George J. Papaioannou
, Nicolas Nolhier, Nicolas Mauran, Marise Bafleur, Fabio Coccetti, Robert Plana
:
ESD failure signature in capacitive RF MEMS switches. Microelectron. Reliab. 48(8-9): 1237-1240 (2008) - [j2]Jinyu Jason Ruan, E. Papandreou, Mohamed Lamhamdi, Matroni Koutsoureli, Fabio Coccetti, Patrick Pons
, George J. Papaioannou, Robert Plana
:
Alpha particle radiation effects in RF MEMS capacitive switches. Microelectron. Reliab. 48(8-9): 1241-1244 (2008) - 2007
- [j1]Jinyu Jason Ruan, Nicolas Nolhier, Marise Bafleur, Laurent Bary, Fabio Coccetti, T. Lisec, Robert Plana
:
Electrostatic discharge failure analysis of capacitive RF MEMS switches. Microelectron. Reliab. 47(9-11): 1818-1822 (2007)
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