Chuan-Yu Chang

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with MuDer Jeng

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Publications

2011
[j16]
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Chuan-Yu Chang, ChunHsi Li, Yung-Chi Chang, MuDer Jeng:
Wafer defect inspection by neural analysis of region features. J. Intell. Manuf. 22(6): 953-964 (2011)
[j15]
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ChunHsi Li, Chuan-Yu Chang, MuDer Jeng:
Applying Regional Level-Set Formulation to Postsawing Four-Element LED Wafer Inspection. IEEE Trans. Syst. Man Cybern. Part C 41(6): 842-853 (2011)
2010
[c23]
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  - conf/smc/LiCJJ10
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ChunHsi Li, Chuan-Yu Chang, MuDer Jeng, Yang-Ting Jeng:
A case study of applying regional level-set formulation to post-sawing LED wafer inspection. SMC 2010: 2745-2752
2009
[j8]
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Chuan-Yu Chang, ChunHsi Li, Jia-Wei Chang, MuDer Jeng:
An unsupervised neural network approach for automatic semiconductor wafer defect inspection. Expert Syst. Appl. 36(1): 950-958 (2009)
[j5]
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Chuan-Yu Chang, ChunHsi Li, Si-Yan Lin, MuDer Jeng:
Application of Two Hopfield Neural Networks for Automatic Four-Element LED Inspection. IEEE Trans. Syst. Man Cybern. Part C 39(3): 352-365 (2009)
[c17]
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Chuan-Yu Chang, Yung-Chi Chang, ChunHsi Li, MuDer Jeng:
Automatic Die Inspection for Post-sawing LED Wafers. SMC 2009: 1615-1620
2005
[c6]
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  - conf/case/ChangLJ05
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Chuan-Yu Chang, Si-Yan Lin, MuDer Jeng:
Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection. CASE 2005: 301-306
[c5]
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  - conf/icra/ChangCJ05
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Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng:
An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection. ICRA 2005: 3000-3005
2004
[c2]
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  - conf/smc/ChangCJ04
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Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng:
Using a self-organizing neural network for wafer defect inspection. SMC (5) 2004: 4312-4317
1995
[c1]
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  - conf/icra/ChangJ95
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Chuan-Yu Chang, MuDer Jeng:
A Neural Network Model for the Job-Shop Sheduling Problem with the Consideration of Lots Sizes. ICRA 1995: 202-207

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