Du-Ming Tsai

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

◀ ▶ joint publications with Shin-Min Chao

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Publications

2010
[j40]
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Du-Ming Tsai, Chih-Chieh Chang, Shin-Min Chao:
Micro-crack inspection in heterogeneously textured solar wafers using anisotropic diffusion. Image Vis. Comput. 28(3): 491-501 (2010)
[j38]
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Shin-Min Chao, Du-Ming Tsai:
Anisotropic diffusion with generalized diffusion coefficient function for defect detection in low-contrast surface images. Pattern Recognit. 43(5): 1917-1931 (2010)
[j37]
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Shin-Min Chao, Du-Ming Tsai:
An improved anisotropic diffusion model for detail- and edge-preserving smoothing. Pattern Recognit. Lett. 31(13): 2012-2023 (2010)
[c5]
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  - conf/icip/ChaoTCL10
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Shin-Min Chao, Du-Ming Tsai, Wei-Yao Chiu, Wei-Chen Li:
Anisotropic diffusion-based detail-preserving smoothing for image restoration. ICIP 2010: 4145-4148
[c4]
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  - conf/icpr/ChaoTLC10
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Shin-Min Chao, Du-Ming Tsai, Wei-Chen Li, Wei-Yao Chiu:
A Generalized Anisotropic Diffusion for Defect Detection in Low-Contrast Surfaces. ICPR 2010: 4408-4411
2008
[j34]
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  - journals/ivc/ChaoT08
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Shin-Min Chao, Du-Ming Tsai:
An anisotropic diffusion-based defect detection for low-contrast glass substrates. Image Vis. Comput. 26(2): 187-200 (2008)
2006
[j28]
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Shin-Min Chao, Du-Ming Tsai:
Astronomical image restoration using an improved anisotropic diffusion. Pattern Recognit. Lett. 27(5): 335-344 (2006)
[c2]
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  - conf/icpr/TsaiTCY06
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Du-Ming Tsai, Yan-Hsin Tseng, Shin-Min Chao, Chao-Hsuan Yen:
Independent component analysis based filter design for defect detection in low-contrast textured images. ICPR (2) 2006: 231-234
[c1]
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  - conf/icpr/ChaoTTJ06
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Shin-Min Chao, Du-Ming Tsai, Yan-Hsin Tseng, Yuan-Ruei Jhang:
Defect detection in low-contrast glass substrates using anisotropic diffusion. ICPR (1) 2006: 654-657
2005
[j27]
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  - journals/ivc/TsaiC05
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Du-Ming Tsai, Shin-Min Chao:
An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures. Image Vis. Comput. 23(3): 325-338 (2005)

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