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"An anisotropic diffusion-based defect detection for sputtered surfaces ..."

Du-Ming Tsai, Shin-Min Chao (2005)

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DOI: 10.1016/J.IMAVIS.2004.09.003

access: closed

type: Journal Article

metadata version: 2020-02-20

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Du-Ming Tsai, Shin-Min Chao:
An anisotropic diffusion-based defect detection for sputtered surfaces with inhomogeneous textures. Image Vis. Comput. 23(3): 325-338 (2005)

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