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ORCIDMahdieh Nadi Senejani
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2010 – 2019
- 2015
[j9]Mahdieh Nadi Senejani, Mahdiar Hosein Ghadiry, Chia Yee Ooi, Muhammad Nadzir Marsono
:
Built-in Self Test Power and Test Time Analysis in On-chip Networks. Circuits Syst. Signal Process. 34(4): 1057-1075 (2015)- 2014
- [j8]Mahdiar Hosein Ghadiry, Mahdieh Nadi Senejani, M. Bahadoran, Asrulnizam Bin Abd Manaf, H. Karimi, Hatef Sadeghi:
Corrigendum to "An analytical approach to calculate effective channel length in graphene nanoribbon field effect transistors" [Microelectron. Reliability 53 (4) (2013) 540-543]. Microelectron. Reliab. 54(3): 662 (2014) - 2013
- [j7]Mahdiar Hosein Ghadiry, Mahdieh Nadi Senjani, Abu Khari A'Ain:
DLPA: Discrepant Low PDP 8-Bit Adder. Circuits Syst. Signal Process. 32(1): 1-14 (2013) - [j6]Mahdieh Nadi Senjani, Mahdiar Hosein Ghadiry, Chia Yee Ooi, Muhammad N. Marsono:
A Semi-Analytical Approach to Study the Energy Consumption of On-Chip Networks Testing. J. Low Power Electron. 9(2): 189-197 (2013) - [j5]Mahdiar Hosein Ghadiry, Mahdieh Nadi Senjani, M. Bahadoran, Asrulnizam Bin Abd Manaf, H. Karimi, Hatef Sadeghi:
An analytical approach to calculate effective channel length in graphene nanoribbon field effect transistors. Microelectron. Reliab. 53(4): 540-543 (2013) - 2012
- [j4]Mahdiar Hosein Ghadiry, Mahdieh Nadi Senjani, Hosein Mohammadi, Asrulnizam Bin Abd Manaf:
Analysis of a Novel Full Adder Designed for Implementing in Carbone nanotube Technology. J. Circuits Syst. Comput. 21(5) (2012) - [j3]Mahdiar Hosein Ghadiry, Asrulnizam Bin Abd Manaf, Mahdieh Nadi Senjani, Meisam Rahmani, Muhammad Taghi Ahmad:
Ionization coefficient of monolayer graphene nanoribbon. Microelectron. Reliab. 52(7): 1396-1400 (2012) - 2011
- [j2]Mahdiar Hosein Ghadiry, Abu Khari A'Ain, Mahdieh Nadi Senjani:
Design and Analysis of a Novel Low PDP Full Adder Cell. J. Circuits Syst. Comput. 20(3): 439-445 (2011) - [j1]Mahdiar Hosein Ghadiry, Mahdieh Nadi Senjani, Muhammad Taghi Ahmad, Asrulnizam Bin Abd Manaf:
A model for length of saturation velocity region in double-gate Graphene nanoribbon transistors. Microelectron. Reliab. 51(12): 2143-2146 (2011)
2000 – 2009
- 2008
- [c2]Mahdieh Nadi Senjani, Mahdiar Hosein Ghadiry:
The Effect of Number of Virtual Channels on NoC EDP. CDES 2008: 70-77 - 2007
- [c1]Mahdiar Hosein Ghadiry, Mahdieh Nadi Senjani, M. T. Manzuri-Shalmani, Dara Rahmati:
Effect of number of faults on NoC power and performance. ICPADS 2007: 1-9
Coauthor Index
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