default search action

combined dblp search
author search
venue search
publication search

ask others

H. Nielen

> Home > Persons

Person information

Refine list

refinements active!

zoomed in on ?? of ?? records

view refined list in

export refined list as

showing all ?? records

2010 – 2019

see FAQ

What is the meaning of the colors in the publication lists?

2016
[j1]
- view
  authority control:
- export record
  dblp key:
  - journals/mr/MartinVMTBN16
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/MartinVMTBN16
Andreas Martin, Rolf-Peter Vollertsen, A. Mitchell, M. Traving, D. Beckmeier, H. Nielen:
Fast wafer level reliability monitoring as a tool to achieve automotive quality for a wafer process. Microelectron. Reliab. 64: 2-12 (2016)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.