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Bahman Honari

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2010 – 2019

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2013
[c1]
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  - conf/icatech/WanHM13
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  - https://dblp.org/rec/conf/icatech/WanHM13
Jian Wan, Bahman Honari, Seán F. McLoone:
A dynamic sampling methodology for plasma etch processes using Gaussian process regression. ICAT 2013: 1-6
2010
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Bahman Honari, John Donovan, Toby Joyce, Simon P. Wilson, Eamonn Murphy:
Stress test optimization using an integrated production test and field reliability model. Qual. Reliab. Eng. Int. 26(6): 579-592 (2010)

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