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ORCIDQuality and Reliability Engineering International, Volume 26
Volume 26, Number 1, February 2010
- Douglas C. Montgomery:
The 25th anniversary volume of Quality and Reliability Engineering International. 1-2
- Jeh-Nan Pan, Chun-Yi Lee:
New capability indices for evaluating the performance of multivariate manufacturing processes. 3-15 - Cinzia Mortarino:
Duncan's model for X-control charts: sensitivity analysis to input parameters. 17-26 - Om Prakash Yadav, Sunil S. Bhamare, Ajay Pal Singh Rathore:
Reliability-based robust design optimization: A multi-objective framework using hybrid quality loss function. 27-41 - Sarah E. Marshall
, Stefanka S. Chukova:
On analysing warranty data from repairable items. 43-52 - J. F. Gifun, D. M. Karydas:
Organizational attributes of Highly Reliable complex systems. 53-62 - Jiujun Zhang, Changliang Zou, Zhaojun Wang:
A control chart based on likelihood ratio test for monitoring process mean and variability. 63-73 - Christina A. Hamada, Michael S. Hamada:
All-subsets regression under effect heredity restrictions for experimental designs with complex aliasing. 75-81 - Ben Flood, Brett Houlding, Simon P. Wilson, Sergiy Vilkomir:
A probability model of system downtime with implications for optimal warranty design. 83-96 - Henrik Spliid:
An exponentially weighted moving average control chart for Bernoulli data. 97-113 - M. Tkác, S. Lyócsa:
On the evaluation of Six Sigma projects. 115-124
Volume 26, Number 2, March 2010
- Murat Caner Testik, Douglas C. Montgomery, Aarnout Brombacher:
Editorial - ENBIS 8th Annual Meeting. 125-126
- Heidi Arnouts, Peter Goos, Bradley A. Jones:
Design and analysis of industrial strip-plot experiments. 127-136 - Christian Dehlendorff, Murat Kulahci, Klaus K. Andersen:
Analysis of computer experiments with multiple noise sources. 137-146 - Hilla Ginsburg, Irad Ben-Gal:
Optimization-seeking experimentations: Design of an RL-circuit via the vs-optimality criterion. 147-155 - Elisabeth Viles, Martín Tanco, Inge Isasa, Unai Arteche, Xabier Sagartzazu:
Applying Design of Experiments to a lift test rig. 157-165 - Marit Schoonhoven, Ronald J. M. M. Does:
The X control chart under non-normality. 167-176 - Canan Pehlivan, Murat Caner Testik:
Impact of model misspecification on the exponential EWMA charts: a robustness study when the time-between-events are not exponential. 177-190
Volume 26, Number 3, April 2010
- Aarnout Brombacher:
Reliability engineers and dinosaurs.... 191
- A. Dieter, K. Pickard, Bernd Bertsche:
Periodic renewal of spare parts using Weibull. 193-198 - Marion R. Reynolds Jr., Changsoon Park:
CUSUM charts for detecting special causes in integrated process control. 199-221 - P. Angelopoulos, Haralambos Evangelaras, Christos Koukouvinos:
Analyzing unreplicated 2k factorial designs by examining their projections into k-1 factors. 223-233 - Christopher A. Carolan, John Francis Kros, Said E. Said:
Economic design of Xbar control charts with continuously variable sampling intervals. 235-245 - Chen-ju Lin, Wen Lea Pearn:
Process selection for higher production yield based on capability index Spk. 247-258 - Søren Bisgaard, Davit Khachatryan:
Asymptotic confidence intervals for variograms of stationary time series. 259-265 - Young-Il Kim, Benjamin M. Adams:
Multivariate SPC for recipe preservation of batch processes. 267-277 - Sung Won Han, Kwok-Leung Tsui, Bancha Ariyajunya, Seoung Bum Kim:
A comparison of CUSUM, EWMA, and temporal scan statistics for detection of increases in poisson rates. 279-289 - Rassoul Noorossana, M. Eyvazian, Amirhossein Amiri, Mahmoud A. Mahmoud:
Statistical monitoring of multivariate multiple linear regression profiles in phase I with calibration application. 291-303 - John S. Lawson, Stephen Manortey:
Optimal maintenance strategy for Technology-enhanced classrooms: a case study. 305-313
Volume 26, Number 4, June 2010
- Murat Kulahci, Don R. Holcomb, Min Xie:
Editorial. 315 - Torben Hasenkamp:
Engineering Design for Six Sigma - a systematic approach. 317-324 - Yi-Hai He, Xiaoqing Tang, Wenbing Chang:
Technical decomposition approach of critical to quality characteristics for Product Design for Six Sigma. 325-339 - Benjamin Kemper, Jeroen de Mast, Michel Mandjes:
Modeling process flow using diagrams. 341-349 - Hendry Raharjo, Aarnout Brombacher, T. N. Goh, Bo Bergman:
On integrating Kano's model dynamics into QFD for multiple product design. 351-363 - Thong Ngee Goh, Shao-Wei Lam:
Problem-based learning approach to application of statistical experimentation. 365-373 - Shilpa Gupta, Murat Kulahci, Douglas C. Montgomery, Connie M. Borror:
Analysis of signal-response systems using generalized linear mixed models. 375-385
- Kuo-Liang Lee, Chun-Chin Wei:
Reducing mold changing time by implementing Lean Six Sigma. 387-395
Volume 26, Number 5, July 2010
- Aarnout Brombacher:
Reliability prediction and 'Deepwater Horizon'; lessons learned. 397
- Marcus B. Perry:
Identifying the time of polynomial drift in the mean of autocorrelated processes. 399-415 - In-Jun Jeong, Kwang-Jae Kim, Dennis K. J. Lin:
Bayesian analysis for weighted mean-squared error in dual response surface optimization. 417-430 - Rachel T. Johnson, Douglas C. Montgomery:
Designing experiments for nonlinear models - an introduction. 431-441 - Vijay Kumar Butte, Loon Ching Tang:
Multivariate charting techniques: a review and a line-column approach. 443-451 - Marion R. Reynolds Jr., Zachary G. Stoumbos:
Robust CUSUM charts for monitoring the process mean and variance. 453-473 - Jyh-Jen Horng Shiau, Jian-Huang Sun:
A new strategy for Phase I analysis in SPC. 475-486 - T. N. Goh:
An information management paradigm for statistical experiments. 487-494
- Erik Vanhatalo:
Multivariate process monitoring of an experimental blast furnace. 495-508 - Amirhossein Amiri, Willis A. Jensen, Reza Baradaran Kazemzadeh:
A case study on monitoring polynomial profiles in the automotive industry. 509-520
Volume 26, Number 6, October 2010
- Douglas C. Montgomery:
Trouble at Toyota. 521
- Fausto Pedro García Márquez, Isidro Peña García-Pardo:
Principal component analysis applied to filtered signals for maintenance management. 523-527 - Chang-Xing Ma, Ming-Yao Ai, L. Y. Chan, T. N. Goh:
Three-level and mixed-level orthogonal arrays for lean designs. 529-539 - Zhang Wu, Yafen Liu, Zhen He, Michael B. C. Khoo:
A Cumulative Sum scheme for monitoring frequency and size of an event. 541-554 - Guney Ozsan, Murat Caner Testik, Christian H. Weiß:
Properties of the exponential EWMA chart with parameter estimation. 555-569 - J. Zanoff, Stephen Ekwaro-Osire:
An approach that can quickly assess product reliability. 571-578 - Bahman Honari, John Donovan, Toby Joyce, Simon P. Wilson, Eamonn Murphy:
Stress test optimization using an integrated production test and field reliability model. 579-592 - Fiorenzo Franceschini, Domenico A. Maisano:
A survey of Quality Engineering-Management journals by bibliometric indicators. 593-604 - P. Lantiéri, F. Guérin, Ridha Hambli:
Reliability estimation by ALT when no analytical model holds. 605-613 - Fu-Kwun Wang, Y. F. Cheng:
EM algorithm for estimating the Burr XII parameters with multiple censored data. 615-630 - Arthur B. Yeh, Longcheen Huwang, Richard N. McGrath, Zhe Zhang:
On monitoring process variance with individual observations. 631-641
Volume 26, Number 7, November 2010
- Jing Li, Fugee Tsung:
Editorial - INFORMS 2009 annual meeting. 643-644
- Jian Liu:
Variation reduction for multistage manufacturing processes: a comparison survey of statistical-process-control vs stream-of-variation methodologies. 645-661 - Helen Meyers Bush, Panitarn Chongfuangprinya, Victoria C. P. Chen, Thuntee Sukchotrat, Seoung Bum Kim:
Nonparametric multivariate control charts based on a linkage ranking algorithm. 663-675 - Zhiguo Li, Shiyu Zhou, Crispian Sievenpiper, Suresh Choubey:
Change detection in the Cox Proportional Hazards models from different reliability data. 677-689 - Ping Jiang, Jae-Hak Lim, Ming Jian Zuo, Bo Guo:
Reliability estimation in a Weibull lifetime distribution with zero-failure field data. 691-701 - Yong Lei, Dragan Djurdjanovic, Jun Ni:
DeviceNet reliability assessment using physical and data link layer parameters. 703-715 - Rajesh Ganesan, Poornima Balakrishna, Lance Sherry:
Improving quality of prediction in highly dynamic environments using approximate dynamic programming. 717-732 - Andrew R. Conn, Léa A. Deleris, Jonathan R. M. Hosking, Tom Anders Thorstensen:
A simulation model for improving the maintenance of high cost systems, with application to an offshore oil installation. 733-748 - O. Arda Vanli, Chuck Zhang, Li-Jen Chen, Kan (Kevin) Wang, Ben Wang:
A Bayesian approach for integration of physical and computer experiments for quality improvement in nano-composite manufacturing. 749-764 - Hyun-Jin Kim, Kwang-Jae Kim, Doh-Soon Kwak:
A case study on modeling and optimizing photolithography stage of semiconductor fabrication process. 765-774 - Anantanat Kantanyarat, Jionghua (Judy) Jin:
Tooling adjustment strategy for acceptable product quality in assembly processes. 775-785
Volume 26, Number 8, December 2010
- Rainer Göb:
Ten years of advances in business and industrial statistics. 787
- Henry P. Wynn, Irena Ograjensek:
Is statistics becoming the number one discipline for business and industry? 789-793
- Christian H. Weiß, Martin Atzmüller:
EWMA control charts for monitoring binary processes with applications to medical diagnosis data. 795-805 - Claus Weihs, Amor Messaoud, Nils Raabe:
Control charts based on models derived from differential equations. 807-816 - Banu Yuksel Ozkaya, Murat Caner Testik:
On the expected parts per million nonconforming levels obtained from estimated process capability indices. 817-829 - Tiago J. Rato, Marco S. Reis:
Statistical monitoring of control loops performance: an improved historical-data benchmark index. 831-844 - Jan M. Myszewski:
Mathematical model of the occurrence of human error in manufacturing processes. 845-851 - Pasquale Erto, Antonio Lanzotti, Antonio Lepore:
Wind speed parameter estimation from one-month sample via Bayesian approach. 853-862 - Xiao Liu, Loon-Ching Tang:
A Bayesian optimal design for accelerated degradation tests. 863-875 - Nikolaus Haselgruber, Karin Mautner, Jan Thiele:
Usage space analysis for reliability testing. 877-885 - Silvia Figini, Ron S. Kenett, Silvia Salini:
Optimal scaling for risk assessment: merging of operational and financial data. 887-897 - Florian Sobieczky, Gerhard Rappitsch, Ernst Stadlober:
Tandem queues for inventory management under random perturbations. 899-907 - Petra Perner, Anja Attig:
Fuzzy conceptual clustering. 909-922
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