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Tony Fryars

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2000 – 2009

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2004
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  - conf/itc/ButlerSFH04
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Kenneth M. Butler, Jayashree Saxena, Tony Fryars, Graham Hetherington:
Minimizing Power Consumption in Scan Testing: Pattern Generation and DFT Techniques. ITC 2004: 355-364

1990 – 1999

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1999
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Graham Hetherington, Tony Fryars, Nagesh Tamarapalli, Mark Kassab, Abu S. M. Hassan, Janusz Rajski:
Logic BIST for large industrial designs: real issues and case studies. ITC 1999: 358-367

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