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S. Duzellier

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2000 – 2009

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2009
[j1]
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  - journals/mr/BestoryMDL09
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  - https://dblp.org/rec/journals/mr/BestoryMDL09
Corinne Bestory, François Marc, S. Duzellier, Hervé Levi:
Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror. Microelectron. Reliab. 49(9-11): 946-951 (2009)
2000
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  - conf/iolts/PougetFLLSRDE00
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Vincent Pouget, Pascal Fouillat, Dean Lewis, Hervé Lapuyade, L. Sarger, F. M. Roche, S. Duzellier, R. Ecoffet:
An Overview of the Applications of a Pulsed Laser System for SEU Testing. IOLTW 2000: 52-

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