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"Electrical aging behavioral modeling for reliability analyses of ionizing ..."
Corinne Bestory et al. (2009)
- Corinne Bestory, François Marc, S. Duzellier, Hervé Levi:
Electrical aging behavioral modeling for reliability analyses of ionizing dose effects on an n-MOS simple current mirror. Microelectron. Reliab. 49(9-11): 946-951 (2009)
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