BibTeX record conf/isqed/RobertsABMF05

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@inproceedings{DBLP:conf/isqed/RobertsABMF05,
  author       = {David Roberts and
                  Todd M. Austin and
                  David T. Blaauw and
                  Trevor N. Mudge and
                  Kriszti{\'{a}}n Flautner},
  title        = {Error Analysis for the Support of Robust Voltage Scaling},
  booktitle    = {6th International Symposium on Quality of Electronic Design {(ISQED}
                  2005), 21-23 March 2005, San Jose, CA, {USA}},
  pages        = {65--70},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ISQED.2005.53},
  doi          = {10.1109/ISQED.2005.53},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/RobertsABMF05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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