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"Error Analysis for the Support of Robust Voltage Scaling."

David Roberts et al. (2005)

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DOI: 10.1109/ISQED.2005.53

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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  - https://dblp.org/rec/conf/isqed/RobertsABMF05
David Roberts, Todd M. Austin, David T. Blaauw, Trevor N. Mudge, Krisztián Flautner:
Error Analysis for the Support of Robust Voltage Scaling. ISQED 2005: 65-70

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