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BibTeX record conf/icst/LarsenLNN17
@inproceedings{DBLP:conf/icst/LarsenLNN17, author = {Kim G. Larsen and Florian Lorber and Brian Nielsen and Ulrik Nyman}, title = {Mutation-Based Test-Case Generation with Ecdar}, booktitle = {2017 {IEEE} International Conference on Software Testing, Verification and Validation Workshops, {ICST} Workshops 2017, Tokyo, Japan, March 13-17, 2017}, pages = {319--328}, publisher = {{IEEE} Computer Society}, year = {2017}, url = {https://doi.org/10.1109/ICSTW.2017.60}, doi = {10.1109/ICSTW.2017.60}, timestamp = {Sat, 30 Sep 2023 09:46:59 +0200}, biburl = {https://dblp.org/rec/conf/icst/LarsenLNN17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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