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"Mutation-Based Test-Case Generation with Ecdar."

Kim G. Larsen et al. (2017)

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DOI: 10.1109/ICSTW.2017.60

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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  dblp key:
  - conf/icst/LarsenLNN17
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Kim G. Larsen, Florian Lorber, Brian Nielsen, Ulrik Nyman:
Mutation-Based Test-Case Generation with Ecdar. ICST Workshops 2017: 319-328

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