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ORCID4. FATES 2004: Linz, Austria
- Jens Grabowski, Brian Nielsen:
Formal Approaches to Software Testing, 4th International Workshop, FATES 2004, Linz, Austria, September 21, 2004, Revised Selected Papers. Lecture Notes in Computer Science 3395, Springer 2005, ISBN 3-540-25109-X
Symbolic Test Generation
- Lars Frantzen, Jan Tretmans, Tim A. C. Willemse
:
Test Generation Based on Symbolic Specifications. 1-15 - Achim D. Brucker, Burkhart Wolff:
Symbolic Test Case Generation for Primitive Recursive Functions. 16-32 - David de Frutos-Escrig, Carlos Gregorio-Rodríguez:
Preserving Contexts for Soft Conformance Relation. 33-48
Testing Non-functional Properties
- Natalia López, Manuel Núñez, Ismael Rodríguez:
Testing of Symbolic-Probabilistic Systems. 49-63 - Laura Brandán Briones, Ed Brinksma:
A Test Generation Framework for quiescent Real-Time Systems. 64-78 - Kim Guldstrand Larsen, Marius Mikucionis, Brian Nielsen:
Online Testing of Real-time Systems Using Uppaal. 79-94 - Behzad Bordbar, Kozo Okano:
Testing Deadlock-Freeness in Real-Time Systems: A Formal Approach. 95-109
Test Development with Model Checking Techniques
- Hyoung Seok Hong, Hasan Ural:
Using Model Checking for Reducing the Cost of Test Generation. 110-124 - Johan Blom, Anders Hessel, Bengt Jonsson, Paul Pettersson:
Specifying and Generating Test Cases Using Observer Automata. 125-139 - Thomas Arts, Koen Claessen, Hans Svensson:
Semi-formal Development of a Fault-Tolerant Leader Election Protocol in Erlang. 140-154 - Gaoyan Xie, Zhe Dang:
An Automata-Theoretic Approach for Model-Checking Systems with Unspecified Components. 155-169
Test Optimization
- Alain Vouffo-Feudjio, Ina Schieferdecker:
Test Patterns with TTCN-3. 170-179 - Antal Wu-Hen-Chang, Dung Le Viet, Gabor Batori, Roland Gecse, Gyula Csopaki:
High-Level Restructuring of TTCN-3 Test Data. 180-194 - Kalpesh Kapoor, Jonathan P. Bowen:
Ordering Mutants to Minimise Test Effort in Mutation Testing. 195-209 - Hoijin Yoon, Eunhee Kim, Jooyoung Seo, Byoungju Choi:
Testing COM Components Using Software Fault Injection and Mutation Analysis, and Its Empirical Study. 210-224
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