"Test Patterns with TTCN-3."

Alain Vouffo-Feudjio, Ina Schieferdecker (2004)

Details and statistics

DOI: 10.1007/978-3-540-31848-4_12

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

a service of  Schloss Dagstuhl - Leibniz Center for Informatics