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Publication search results
found 51 matches
- 2017
- Daniel W. Apley:
Technometrics 2017 Editor's Report. Technometrics 59(4): 413-415 (2017) - Giovanna Capizzi, Guido Masarotto:
Phase I Distribution-Free Analysis of Multivariate Data. Technometrics 59(4): 484-495 (2017) - Avishek Chakraborty, Derek Bingham, Soma S. Dhavala, Carolyn C. Kuranz, R. Paul Drake, Michael J. Grosskopf, Erica M. Rutter, Ben R. Torralva, James Paul Holloway, Ryan G. McClarren, Bani K. Mallick:
Emulation of Numerical Models With Over-Specified Basis Functions. Technometrics 59(2): 153-164 (2017) - Ray-Bing Chen, Weichung Wang, C. F. Jeff Wu:
Sequential Designs Based on Bayesian Uncertainty Quantification in Sparse Representation Surrogate Modeling. Technometrics 59(2): 139-152 (2017) - Piao Chen, Zhi-Sheng Ye:
Estimation of Field Reliability Based on Aggregate Lifetime Data. Technometrics 59(1): 115-125 (2017) - Piao Chen, Zhi-Sheng Ye, Xingqiu Zhao:
Minimum Distance Estimation for the Generalized Pareto Distribution. Technometrics 59(4): 528-541 (2017) - Anil Damle, Yuekai Sun:
A Geometric Approach to Archetypal Analysis and Nonnegative Matrix Factorization. Technometrics 59(3): 361-370 (2017) - Xinwei Deng, C. Devon Lin, K.-W. Liu, R. Kerry Rowe:
Additive Gaussian Process for Computer Models With Qualitative and Quantitative Factors. Technometrics 59(3): 283-292 (2017) - Ling Dong, Xiaodong Li, Dan Yu, Hui Zhang, Zhong Zhang, Yanjun Qian, Yu Ding:
Quantifying Nanoparticle Mixing State to Account for Both Location and Size Effects. Technometrics 59(3): 391-403 (2017) - Weitao Duan, Bruce E. Ankenman, Susan M. Sanchez, Paul J. Sanchez:
Sliced Full Factorial-Based Latin Hypercube Designs as a Framework for a Batch Sequential Design Algorithm. Technometrics 59(1): 11-22 (2017) - Pieter T. Eendebak, Eric D. Schoen:
Two-Level Designs to Estimate All Main Effects and Two-Factor Interactions. Technometrics 59(1): 69-79 (2017) - Anna Errore, Bradley A. Jones, William Li, Christopher J. Nachtsheim:
Benefits and Fast Construction of Efficient Two-Level Foldover Designs. Technometrics 59(1): 48-57 (2017) - Konstantinos Fokianos, Maria Pitsillou:
Consistent Testing for Pairwise Dependence in Time Series. Technometrics 59(2): 262-270 (2017) - Xu He, Rui Tuo, C. F. Jeff Wu:
Optimization of Multi-Fidelity Computer Experiments via the EQIE Criterion. Technometrics 59(1): 58-68 (2017) - Matthew J. Heaton, William F. Christensen, Maria A. Terres:
Nonstationary Gaussian Process Models Using Spatial Hierarchical Clustering from Finite Differences. Technometrics 59(1): 93-101 (2017) - Andrew J. Henrey, Thomas M. Loughin:
Joint Identification of Location and Dispersion Effects in Unreplicated Two-Level Factorials. Technometrics 59(1): 23-35 (2017) - Xiaoming Huo, Gábor J. Székely:
Clarifications for "Fast Computing for Distance Covariance" by Xiaoming Huo and Gábor J. Székely. Technometrics 59(1): 134-135 (2017) - Ching-Kang Ing, Tze Leung Lai, Milan Shen, Kawai Tsang, Shu-Hui Yu:
Multiple Testing in Regression Models With Applications to Fault Diagnosis in the Big Data Era. Technometrics 59(3): 351-360 (2017) - Bradley A. Jones, Christopher J. Nachtsheim:
Effective Design-Based Model Selection for Definitive Screening Designs. Technometrics 59(3): 319-329 (2017) - Heeyoung Kim, Jaehwan Lee:
Hierarchical Spatially Varying Coefficient Process Model. Technometrics 59(4): 521-527 (2017) - Robert W. Mee, Eric D. Schoen, David J. Edwards:
Selecting an Orthogonal or Nonorthogonal Two-Level Design for Screening. Technometrics 59(3): 305-318 (2017) - Xiao Nie, Jared D. Huling, Peter Z. G. Qian:
Accelerating Large-Scale Statistical Computation With the GOEM Algorithm. Technometrics 59(4): 416-425 (2017) - Jeremy E. Oakley, Benjamin D. Youngman:
Calibration of Stochastic Computer Simulators Using Likelihood Emulation. Technometrics 59(1): 80-92 (2017) - Antony M. Overstall, David C. Woods:
Bayesian Design of Experiments Using Approximate Coordinate Exchange. Technometrics 59(4): 458-470 (2017) - Samuel D. Pimentel, Dylan S. Small, Paul R. Rosenbaum:
An Exact Test of Fit for the Gaussian Linear Model Using Optimal Nonbipartite Matching. Technometrics 59(3): 330-337 (2017) - Matthew Plumlee, Daniel W. Apley:
Lifted Brownian Kriging Models. Technometrics 59(2): 165-177 (2017) - Luc Pronzato, Maria-João Rendas:
Bayesian Local Kriging. Technometrics 59(3): 293-304 (2017) - Daniel V. Samarov, David Allen, Jeeseong Hwang, Young Jong Lee, Maritoni Litorja:
A Coordinate-Descent-Based Approach to Solving the Sparse Group Elastic Net. Technometrics 59(4): 437-445 (2017) - Grant Schneider, Peter F. Craigmile, Radu Herbei:
Maximum Likelihood Estimation for Stochastic Differential Equations Using Sequential Gaussian-Process-Based Optimization. Technometrics 59(2): 178-188 (2017) - Weijie Shen:
Robust Parameter Designs in Computer Experiments Using Stochastic Approximation. Technometrics 59(4): 471-483 (2017)
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