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Publication search results
found 60 matches
- 2018
- Meng Li, Kaveh Shamsi, Yier Jin, David Z. Pan:
TimingSAT: Decamouflaging Timing-based Logic Obfuscation. ITC 2018: 1-10 - Yu Huang, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer, Chen Wang:
Hypercompression of Test Patterns. ITC 2018: 1-9 - Alif Ahmed, Farimah Farahmandi, Yousef Iskander, Prabhat Mishra:
Scalable Hardware Trojan Activation by Interleaving Concrete Simulation and Symbolic Execution. ITC 2018: 1-10 - Martin Andraud, Laura Isabel Galindez Olascoaga, Yichuan Lu, Yiorgos Makris, Marian Verhelst:
On the use of Bayesian Networks for Resource-Efficient Self-Calibration of Analog/RF ICs. ITC 2018: 1-10 - Trevor Ault:
Optimizing the Use of Simulations for Commissioning with Systems Engineering Principles and Objective Analysis. ITC 2018: 1-6 - Riccardo Cantoro, Aleksa Damljanovic, Matteo Sonza Reorda, Giovanni Squillero:
A New Technique to Generate Test Sequences for Reconfigurable Scan Networks. ITC 2018: 1-9 - M. Casarsa, Gurgen Harutyunyan:
Case Study and Advanced Functional Safety Solution for Automotive SoCs. ITC 2018: 1-8 - Shravan K. Chaganti, Abalhassan Sheikh, Sumit Dubey, Frank Ankapong, Nitin Agarwal, Degang Chen:
Fast and accurate linearity test for DACs with various architectures using segmented models. ITC 2018: 1-10 - Arjun Chaudhuri, Krishnendu Chakrabarty:
Analysis of Process Variations, Defects, and Design-Induced Coupling in Memristors. ITC 2018: 1-10 - Sameer Chillarige, Atul Chhabra, Anil Malik, Bharath Nandakumar, Joe Swenton, Krishna Chakravadhanula:
Improving Diagnosis Resolution and Performance at High Compression Ratios. ITC 2018: 1-8 - Sourav Das, Fei Su, Sreejit Chakravarty:
A PVT-Resilient No-Touch DFT Methodology for Prebond TSV Testing. ITC 2018: 1-10 - Majid Ahadi Dolatsara, Huan Yu, Jose Ale Hejase, Wiren Dale Becker, Madhavan Swaminathan:
Polynomial Chaos modeling for jitter estimation in high-speed links. ITC 2018: 1-10 - Nicole Fern, Kwang-Ting (Tim) Cheng:
Pre-silicon Formal Verification of JTAG Instruction Opcodes for Security. ITC 2018: 1-9 - Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui:
Testing Resistive Memories: Where are We and What is Missing? ITC 2018: 1-9 - Nathan Fulton, André Platzer:
Safe AI for CPS (Invited Paper). ITC 2018: 1-7 - Hayk T. Grigoryan, Samvel K. Shoukourian, Gurgen Harutyunyan, Yervant Zorian, Costas Argyrides:
Advanced ECC-Based FIT Rate Mitigation Technique for Automotive SoCs. ITC 2018: 1-6 - Pallav Gupta:
An Effective Methodology for Automated Diagnosis of Functional Pattern Failures to Support Silicon Debug. ITC 2018: 1-8 - Friedrich Hapke, Peter C. Maxwell:
Total Critical Area Based Testing. ITC 2018: 1-10 - Tien-Phu Ho, Eric Faehn, Arnaud Virazel, Alberto Bosio, Patrick Girard:
An Effective Intra-Cell Diagnosis Flow for Industrial SRAMs. ITC 2018: 1-8 - Tamzidul Hoque, Jonathan Cruz, Prabuddha Chakraborty, Swarup Bhunia:
Hardware IP Trust Validation: Learn (the Untrustworthy), and Verify. ITC 2018: 1-10 - Fakir Sharif Hossain, Michihiro Shintani, Michiko Inoue, Alex Orailoglu:
Variation-Aware Hardware Trojan Detection through Power Side-channel. ITC 2018: 1-10 - Will Howell, Friedrich Hapke, Edward Brazil, Srikanth Venkataraman, R. Datta, Andreas Glowatz, Wilfried Redemund, J. Schmerberg, Anja Fast, Janusz Rajski:
DPPM Reduction Methods and New Defect Oriented Test Methods Applied to Advanced FinFET Technologies. ITC 2018: 1-10 - Qicheng Huang, Chenlei Fang, Soumya Mittal, R. D. Shawn Blanton:
Improving Diagnosis Efficiency via Machine Learning. ITC 2018: 1-10 - I-De Huang, Pallav Gupta, Loganathan Lingappan, Vijay Gangaram:
Online Scan Diagnosis : A Novel Approach to Volume Diagnosis. ITC 2018: 1-10 - Kiyotaka Ichiyama, Takashi Kusaka, Masahiro Ishida:
A Stressed Eye Testing Module for Production Test of 30-Gbps NRZ Signal Interfaces. ITC 2018: 1-10 - Shi Jin, Zhaobo Zhang, Krishnendu Chakrabarty, Xinli Gu:
Self-Learning Health-Status Analysis for a Core Router System. ITC 2018: 1-10 - Senwen Kan, Jennifer Dworak:
IJTAG Integrity Checking with Chained Hashing. ITC 2018: 1-10 - Christiana Kapatsori, Yu Liu, Angelos Antonopoulos, Yiorgos Makris:
Hardware Dithering: A Run-Time Method for Trojan Neutralization in Wireless Cryptographic ICs. ITC 2018: 1-7 - Leonidas Katselas, Alkis A. Hatzopoulos, Hailong Jiao, Christos Papameletis, Erik Jan Marinissen:
On-Chip Toggle Generators to Provide Realistic Conditions during Test of Digital 2D-SoCs and 3D-SICs. ITC 2018: 1-9 - Mohammad Nasim Imtiaz Khan, Swaroop Ghosh:
Test of Supply Noise for Emerging Non-Volatile Memory. ITC 2018: 1-10
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