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Publication search results
found 308 matches
- 2003
- Gabriel Abadal, Francesc Pérez-Murano, Núria Barniol, Xavier Aymerich:
The measurement of the tip current noise as a method to characterize the exposed area of coated ESTM tips. IEEE Trans. Instrum. Meas. 52(3): 859-864 (2003) - Salvatore Acunto, Pasquale Arpaia, Donald M. Hummels, Fred H. Irons:
A new bidimensional histogram for the dynamic characterization of ADCs. IEEE Trans. Instrum. Meas. 52(1): 38-45 (2003) - Francesco Adamo, Filippo Attivissimo, Nicola Giaquinto, Amerigo Trotta:
A/D converters nonlinearity measurement and correction by frequency analysis and dither. IEEE Trans. Instrum. Meas. 52(4): 1200-1205 (2003) - Andrea Aiello, Domenico Grimaldi:
Frequency error measurement in GMSK signals in a multipath propagation environment. IEEE Trans. Instrum. Meas. 52(3): 938-945 (2003) - Francisco André Corrêa Alegria, António Manuel da Cruz Serra:
Variance of the cumulative histogram of ADCs due to frequency errors. IEEE Trans. Instrum. Meas. 52(1): 69-74 (2003) - Francesco Amigoni, Arnaldo Brandolini, Gabriele D'Antona, Roberto Ottoboni, Marco Somalvico:
Artificial intelligence in science of measurements: from measurement instruments to perceptive agencies. IEEE Trans. Instrum. Meas. 52(3): 716-723 (2003) - Bruno Andò, Annalisa Baeri, Ignazio Fragalà, Salvatore Graziani:
A field point based approach for sensor conditioning in MO-CVD reactors. IEEE Trans. Instrum. Meas. 52(3): 796-803 (2003) - Bruno Andò, Salvatore Graziani:
An instrument for the detection of optimal working conditions in stochastic systems. IEEE Trans. Instrum. Meas. 52(3): 815-821 (2003) - Leopoldo Angrisani, Aldo Baccigalupi, Giovanni D'Angiolo:
A frame-level measurement apparatus for performance testing of ATM equipment. IEEE Trans. Instrum. Meas. 52(1): 20-26 (2003) - Leopoldo Angrisani, Massimo D'Apuzzo, Mauro D'Arco:
A new method for power measurements in digital wireless communication systems. IEEE Trans. Instrum. Meas. 52(4): 1097-1106 (2003) - Theodore Antonakopoulos, Eustathia Ziouva, Vassilios Makios:
On mapping stochastic processes into hardware and its application on ATM traffic emulation. IEEE Trans. Instrum. Meas. 52(3): 771-779 (2003) - Lörinc Antoni, Régis Leveugle, Béla Fehér:
Using run-time reconfiguration for fault injection applications. IEEE Trans. Instrum. Meas. 52(5): 1468-1473 (2003) - Pasquale Arpaia, Felice Cennamo, Pasquale Daponte, Harald Schumny:
Modeling and characterization of sigma-delta analog-to-digital converters. IEEE Trans. Instrum. Meas. 52(3): 978-983 (2003) - Gustavo H. M. de Arruda, Péricles R. Barros:
Relay-based gain and phase margins PI controller design. IEEE Trans. Instrum. Meas. 52(5): 1548-1553 (2003) - Réjean Arseneau, Michelle E. Sutherland, John J. Zelle:
A new transfer device for the NRC Travelling Standard Program. IEEE Trans. Instrum. Meas. 52(2): 411-414 (2003) - Salvatore Baglio:
Bio-geochemically inspired capacitive sensors for heavy metals pollution monitoring. IEEE Trans. Instrum. Meas. 52(5): 1474-1481 (2003) - Salvatore Baglio, Enrico Foti:
Non-invasive measurements to analyze sandy bed evolution under sea waves action. IEEE Trans. Instrum. Meas. 52(3): 762-770 (2003) - M. Bahoura, André Clairon:
Diode laser phase noise influence on the ultimate performance of its frequency stabilization to a Mach-Zehnder interferometer fringe. IEEE Trans. Instrum. Meas. 52(6): 1846-1853 (2003) - Federico Baronti, Luca Fanucci, Diego Lunardini, Roberto Roncella, Roberto Saletti:
A technique for nonlinearity self-calibration of DLLs. IEEE Trans. Instrum. Meas. 52(4): 1255-1260 (2003) - Michael Bazzarelli, Nelson G. Durdle, Edmond Lou, V. James Raso:
A wearable computer for physiotherapeutic scoliosis treatment. IEEE Trans. Instrum. Meas. 52(1): 126-129 (2003) - Laurent Béchou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, Sergio Rapuano:
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy. IEEE Trans. Instrum. Meas. 52(1): 135-142 (2003) - Walter Beer, Ali L. Eichenberger, Blaise Jeanneret, Beat Jeckelmann, Ali R. Pourzand, Philippe Richard, Joshua P. Schwarz:
Status of the METAS watt balance experiment. IEEE Trans. Instrum. Meas. 52(2): 626-630 (2003) - Ralf Behr, Torsten Funck, Bernd Schumacher, Peter Warnecke:
Measuring resistance standards in terms of the quantized Hall resistance with a dual Josephson voltage standard using SINIS Josephson arrays. IEEE Trans. Instrum. Meas. 52(2): 521-523 (2003) - Ralf Behr, Johannes Kohlmann, Theodoor J. B. M. Janssen, Peter Kleinschmidt, Jonathan M. Williams, Sophie Djordjevic, Jean-Pierre Lo-Hive, François P. M. Piquemal, Per-Otto Hetland, Dominique Reymann, Gunnar Eklund, Christian Hof, Blaise Jeanneret, Oleg A. Chevtchenko, Ernest Houtzager, Helko E. van den Brom, Andrea Sosso, Domenico Andreone, Jaani Nissilä, Panu Helistö:
Analysis of different measurement setups for a programmable Josephson voltage standard. IEEE Trans. Instrum. Meas. 52(2): 524-528 (2003) - Samuel P. Benz, John M. Martinis, Paul D. Dresselhaus, Sae Woo Nam:
An AC Josephson source for Johnson noise thermometry. IEEE Trans. Instrum. Meas. 52(2): 545-549 (2003) - David I. Bergman, Bryan C. Waltrip:
A low-noise latching comparator probe for waveform sampling applications. IEEE Trans. Instrum. Meas. 52(4): 1107-1113 (2003) - Laurent-Guy Bernier:
Use of the Allan deviation and linear prediction for the determination of the uncertainty on time calibrations against predicted timescales. IEEE Trans. Instrum. Meas. 52(2): 483-486 (2003) - Andrea Bernieri, Giovanni Betta, Luigi Ferrigno:
Improving nondestructive testing probe performance by digital processing techniques. IEEE Trans. Instrum. Meas. 52(3): 959-965 (2003) - Matteo Bertocco, Sandro Cappellazzo, Alessio Carullo, Marco Parvis, Alberto Vallan:
Virtual environment for fast development of distributed measurement applications. IEEE Trans. Instrum. Meas. 52(3): 681-685 (2003) - Matteo Bertocco, Luca Garbin, Claudio Narduzzi:
Correction of systematic effects in digitizing oscilloscopes. IEEE Trans. Instrum. Meas. 52(3): 871-877 (2003)
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