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Publication search results
found 71 matches
- 2019
- Robert C. Aitken:
56th Design Automation Conference Report. IEEE Des. Test 36(6): 80-81 (2019) - Donkyu Baek, Naehyuck Chang, Jaemin Kim:
Build Your Own EV: A Rapid Energy-Aware Synthesis of Electric Vehicles. IEEE Des. Test 36(1): 40-47 (2019) - Donkyu Baek, Hyung Gyu Lee, Naehyuck Chang:
SmartPatch: A Self-Powered and Patchable Cumulative UV Irradiance Meter. IEEE Des. Test 36(1): 57-64 (2019) - R. Iris Bahar
:
Conference Reports: Recap of the 37th Edition of the International Conference on Computer-Aided Design (ICCAD 2018). IEEE Des. Test 36(2): 98-99 (2019) - Ganapati Bhat
, Ranadeep Deb, Ümit Y. Ogras
:
OpenHealth: Open-Source Platform for Wearable Health Monitoring. IEEE Des. Test 36(5): 27-34 (2019) - Ulbert J. Botero, Mark M. Tehranipoor, Domenic Forte
:
Upgrade/Downgrade: Efficient and Secure Legacy Electronic System Replacement. IEEE Des. Test 36(1): 14-22 (2019) - Andreas Burg
, Matthew M. Ziegler
, Saibal Mukhopdhyay:
Conference Report from the 2019 International Symposium on Low Power Electronics and Design (ISLPED). IEEE Des. Test 36(6): 82-83 (2019) - Baibhab Chatterjee
, Shreyas Sen
, Ningyuan Cao, Arijit Raychowdhury:
Context-Aware Intelligence in Resource-Constrained IoT Nodes: Opportunities and Challenges. IEEE Des. Test 36(2): 7-40 (2019) - Wen Chen
, Jayanta Bhadra:
Practices and Challenges for Achieving Functional Safety of Modern Automotive SoCs. IEEE Des. Test 36(4): 31-47 (2019) - An Chen, Vivek De
, Xiaobo Sharon Hu
, Michael T. Niemier
:
Guest Editors' Introduction: Special Issue on Architecture Advances Enabled by Emerging Technologies. IEEE Des. Test 36(3): 5-6 (2019) - An Chen, Supriyo Datta, Xiaobo Sharon Hu
, Michael T. Niemier, Tajana Simunic Rosing, J. Joshua Yang
:
A Survey on Architecture Advances Enabled by Emerging Beyond-CMOS Technologies. IEEE Des. Test 36(3): 46-68 (2019) - Pai-Yu Chen
, Shimeng Yu
:
Technological Benchmark of Analog Synaptic Devices for Neuroinspired Architectures. IEEE Des. Test 36(3): 31-38 (2019) - Shu-Feng Cheng
, Po-Tsang Huang, Li-Chun Wang
, Mau-Chung Frank Chang
:
Built-In Self-Test/Repair Methodology for Multiband RF-Interconnected TSV 3D Integration. IEEE Des. Test 36(6): 63-71 (2019) - Scott Davidson:
Is This a System? IEEE Des. Test 36(1): 72 (2019) - Scott Davidson
:
The Last Byte: I Have Met the IoT Security Enemy and He Is Us. IEEE Des. Test 36(2): 104 (2019) - Scott Davidson
:
The Last Byte: System Testing Ourselves. IEEE Des. Test 36(3): 128 (2019) - Scott Davidson
:
The Last Byte: IoT and That Nagging Feeling. IEEE Des. Test 36(4): 64 (2019) - Scott Davidson
:
The Last Byte: The Internet of People. IEEE Des. Test 36(5): 64 (2019) - Janardhan Rao Doppa
, Justinian Rosca, Paul Bogdan:
Guest Editors' Introduction: Special Issue on Smart and Autonomous Systems for Sustainability. IEEE Des. Test 36(5): 5-6 (2019) - Janardhan Rao Doppa
, Justinian Rosca, Paul Bogdan:
Autonomous Design Space Exploration of Computing Systems for Sustainability: Opportunities and Challenges. IEEE Des. Test 36(5): 35-43 (2019) - Mohammad Abdullah Al Faruque
, Chung-Wei Lin
:
Report of the Fourth International Workshop on Design Automation for Cyber-Physical Systems (DACPS) 2019. IEEE Des. Test 36(6): 84-85 (2019) - Apostolos P. Fournaris, Christos Alexakos, Christos Anagnostopoulos, Christos Koulamas, Athanasios P. Kalogeras:
Introducing Hardware-Based Intelligence and Reconfigurability on Industrial IoT Edge Nodes. IEEE Des. Test 36(4): 15-23 (2019) - Hari Mohan Gaur
, Ashutosh Kumar Singh
, Umesh Ghanekar
:
Design of Reversible Arithmetic Logic Unit with Built-In Testability. IEEE Des. Test 36(5): 54-61 (2019) - Santosh Ghosh
, Rafael Misoczki, Manoj R. Sastry:
Intelligent IoT Motes: Preventing Their Abuse at the Weakest Entry Point. IEEE Des. Test 36(2): 73-80 (2019) - Rajesh K. Gupta
, Subhasish Mitra, Puneet Gupta
:
Variability Expeditions: A Retrospective. IEEE Des. Test 36(1): 65-67 (2019) - Soonhoi Ha, Petru Eles:
2018 Embedded Systems Week (ESWEEK) in Torino. IEEE Des. Test 36(1): 68-69 (2019) - Kyuseung Han
, Jae-Jin Lee
, Woojoo Lee
, Jinho Lee
:
A Diagnosable Network-on-Chip for FPGA Verification of Intellectual Properties. IEEE Des. Test 36(2): 81-87 (2019) - Orchi Hassan
, Kerem Yunus Camsari
, Supriyo Datta:
Voltage-Driven Building Block for Hardware Belief Networks. IEEE Des. Test 36(3): 15-21 (2019) - Jörg Henkel:
From the EIC: Special Section on Test. IEEE Des. Test 36(1): 4 (2019) - Jörg Henkel:
From the EIC: Intelligent Resource-Constrained Sensor Nodes. IEEE Des. Test 36(2): 4 (2019)
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