- Bruce W. Weide, Wayne D. Heym, Joseph E. Hollingsworth:
Reverse Engineering of Legacy Code Exposed. ICSE 1995: 327-331 - W. Eric Wong, Joseph Robert Horgan, Saul London, Aditya P. Mathur:
Effect of Test Set Minimization on Fault Detection Effectiveness. ICSE 1995: 41-50 - Dewayne E. Perry, Ross Jeffery, David Notkin:
17th International Conference on Software Engineering, Seattle, Washington, USA, April 23-30, 1995, Proceedings. ACM 1995, ISBN 0-89791-708-1 [contents]