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@article{DBLP:journals/mr/AgostinhoGW16,
author = {Peterson R. Agostinho and
Odair Lelis Goncalez and
Gilson I. Wirth},
title = {Rail to rail radiation hardened operational amplifier in standard
{CMOS} technology with standard layout techniques},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {99--103},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.11.001},
doi = {10.1016/J.MICROREL.2016.11.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AgostinhoGW16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GomezLMSBCV16,
author = {Andres F. Gomez and
Felipe Lavratti and
Guilherme Medeiros Machado and
M. Sartori and
Let{\'{\i}}cia Maria Veiras Bolzani and
V{\'{\i}}ctor H. Champac and
Fabian Vargas},
title = {Effectiveness of a hardware-based approach to detect resistive-open
defects in {SRAM} cells under process variations},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {150--158},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.10.012},
doi = {10.1016/J.MICROREL.2016.10.012},
timestamp = {Mon, 28 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GomezLMSBCV16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HalakTR16,
author = {Basel Halak and
Vasileios Tenentes and
Daniele Rossi},
title = {The impact of {BTI} aging on the reliability of level shifters in
nano-scale {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {74--81},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.10.018},
doi = {10.1016/J.MICROREL.2016.10.018},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HalakTR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JangKJKK16,
author = {Inseok Jang and
Wan{-}Ho Kim and
Sie{-}Wook Jeon and
Hyeon Kim and
Jae{-}Pil Kim},
title = {Enhancement of light-emitting diode reliability using silicone microsphere
in encapsulant},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {94--98},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.10.009},
doi = {10.1016/J.MICROREL.2016.10.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JangKJKK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JaniP16,
author = {L{\'{a}}z{\'{a}}r Jani and
Andr{\'{a}}s Poppe},
title = {Multilevel logic and thermal co-simulation},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {46--53},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.08.019},
doi = {10.1016/J.MICROREL.2016.08.019},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JaniP16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuHSE16,
author = {E. Liu and
Alexander Hanss and
Maximilian Schmid and
Gordon Elger},
title = {The influence of the phosphor layer as heat source and up-stream thermal
masses on the thermal characterization by transient thermal analysis
of modern wafer level high power LEDs},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {29--37},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.08.018},
doi = {10.1016/J.MICROREL.2016.08.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuHSE16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MelamedWNSKA16,
author = {Samson Melamed and
Naoya Watanabe and
Shunsuke Nemoto and
Haruo Shimamoto and
Katsuya Kikuchi and
Masahiro Aoyagi},
title = {Impact of thinning stacked dies on the thermal resistance of bump-bonded
three-dimensional integrated circuits},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {2--8},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.08.015},
doi = {10.1016/J.MICROREL.2016.08.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MelamedWNSKA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeyTKCJN16,
author = {Gilbert De Mey and
Tomasz Torzewicz and
Piotr Kawka and
Andrzej Czerwoniec and
Marcin Janicki and
Andrzej Napieralski},
title = {Analysis of nonlinear heat exchange phenomena in natural convection
cooled electronic systems},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {15--20},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.11.003},
doi = {10.1016/J.MICROREL.2016.11.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MeyTKCJN16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Monier-VinardRD16,
author = {Eric Monier{-}Vinard and
Brice Rogi{\'{e}} and
Cheikh Tidiane Dia and
Valentin Bissuel and
Najib Laraqi and
Olivier Daniel and
Marie{-}C{\'{e}}cile Kotelon and
Aben{-}Ibrahim Fahad},
title = {Experimental characterization of the predictive thermal behaviour
model of a surface-mounted soft magnetic composite inductor},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {54--63},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.09.020},
doi = {10.1016/J.MICROREL.2016.09.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Monier-VinardRD16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ParkYB16,
author = {Kyungbae Park and
Donghyuk Yun and
Sanghyeon Baeg},
title = {Statistical distributions of row-hammering induced failures in {DDR3}
components},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {143--149},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.10.014},
doi = {10.1016/J.MICROREL.2016.10.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ParkYB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Rencz16,
author = {M{\'{a}}rta Rencz},
title = {To the Special section constructed from the selected papers of Thermal
investigations of integrated circuits and systems, THERMINIC'15},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {1},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.11.010},
doi = {10.1016/J.MICROREL.2016.11.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Rencz16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SamyAIZ16,
author = {Omnia Samy and
Hamdy Abdelhamid and
Yehea Ismail and
Abdelhalim Zekry},
title = {A 2D compact model for lightly doped {DG} MOSFETs (P-DGFETs) including
negative bias temperature instability {(NBTI)} and short channel effects
(SCEs)},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {82--88},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.11.004},
doi = {10.1016/J.MICROREL.2016.11.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SamyAIZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShenCSSTL16,
author = {Junjie Shen and
Pengfei Chen and
Lei Su and
Tielin Shi and
Zirong Tang and
Guanglan Liao},
title = {X-ray inspection of {TSV} defects with self-organizing map network
and Otsu algorithm},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {129--134},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.10.011},
doi = {10.1016/J.MICROREL.2016.10.011},
timestamp = {Wed, 20 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ShenCSSTL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StoyanovBT16,
author = {Stoyan Stoyanov and
Chris Bailey and
Georgios Tourloukis},
title = {Similarity approach for reducing qualification tests of electronic
components},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {111--119},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.10.017},
doi = {10.1016/J.MICROREL.2016.10.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StoyanovBT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TaddikenHHPP16,
author = {Maike Taddiken and
Nico Hellwege and
Nils Heidmann and
Dagmar Peters{-}Drolshagen and
Steffen Paul},
title = {Analysis of aging effects - From transistor to system level},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {64--73},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.10.016},
doi = {10.1016/J.MICROREL.2016.10.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TaddikenHHPP16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TakacsSB16,
author = {G{\'{a}}bor Tak{\'{a}}cs and
P{\'{e}}ter G. Szab{\'{o}} and
Gy{\"{o}}rgy Bogn{\'{a}}r},
title = {Enhanced thermal characterization method of microscale heatsink structures},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {21--28},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.09.019},
doi = {10.1016/J.MICROREL.2016.09.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TakacsSB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsaiLCCWH16,
author = {Ming{-}Yi Tsai and
C. H. Lin and
K. F. Chuang and
Y. H. Chang and
C. T. Wu and
S. C. Hu},
title = {Failure and stress analysis of through-aluminum-nitride-via substrates
during thermal reliability tests for high power {LED} applications},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {120--128},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.11.005},
doi = {10.1016/J.MICROREL.2016.11.005},
timestamp = {Sat, 20 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TsaiLCCWH16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangKZQJMJWDC16,
author = {Weiliang Wang and
Karim Khan and
Xingye Zhang and
Haiming Qin and
Jun Jiang and
Lijing Miao and
Kemin Jiang and
Pengjun Wang and
Mingzhi Dai and
Junhao Chu},
title = {Corrigendum to "A subgap density of states modeling for the transient
characteristics in oxide-based thin-film transistors" [Microelectron.
Reliab. 60 {(2016)} 67-69]},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {159},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.09.003},
doi = {10.1016/J.MICROREL.2016.09.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangKZQJMJWDC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongCSS16,
author = {Ee{-}Hua Wong and
J. Chrisp and
C. S. Selvanayagam and
S. K. W. Seah},
title = {Constitutive modeling of solder alloys for drop-impact applications},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {135--142},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.10.007},
doi = {10.1016/J.MICROREL.2016.10.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WongCSS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangBWHLJL16,
author = {Haohao Zhang and
Jinshun Bi and
Haibin Wang and
Hongyang Hu and
Jin Li and
Lanlong Ji and
Ming Liu},
title = {Study of total ionizing dose induced read bit errors in magneto-resistive
random access memory},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {104--110},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.10.013},
doi = {10.1016/J.MICROREL.2016.10.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangBWHLJL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangWHCCLHLYY16,
author = {Wenqi Zhang and
Tzuo{-}Li Wang and
Yan{-}hua Huang and
Tsu{-}Ting Cheng and
Shih{-}Yao Chen and
Yiying Li and
Chun{-}Hsiang Hsu and
Chih{-}Jui Lai and
Wen{-}Kuan Yeh and
Yilin Yang},
title = {Influence of fin number on hot-carrier injection stress induced degradation
in bulk FinFETs},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {89--93},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.10.015},
doi = {10.1016/J.MICROREL.2016.10.015},
timestamp = {Sat, 14 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangWHCCLHLYY16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZubertRSJN16,
author = {Mariusz Zubert and
Tomasz Raszkowski and
Agnieszka Samson and
Marcin Janicki and
Andrzej Napieralski},
title = {The distributed thermal model of fin field effect transistor},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {9--14},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.09.021},
doi = {10.1016/J.MICROREL.2016.09.021},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZubertRSJN16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/dAlessandroMCRA16,
author = {Vincenzo d'Alessandro and
Alessandro Magnani and
Lorenzo Codecasa and
Niccol{\`{o}} Rinaldi and
Klaus Aufinger},
title = {Advanced thermal simulation of SiGe: {C} HBTs including back-end-of-line},
journal = {Microelectron. Reliab.},
volume = {67},
pages = {38--45},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2016.06.005},
doi = {10.1016/J.MICROREL.2016.06.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/dAlessandroMCRA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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