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@article{DBLP:journals/mr/Abessolo-BidzoPDD05,
author = {Dolphin Abessolo{-}Bidzo and
Patrick Poirier and
Philippe Descamps and
Bernadette Domeng{\`{e}}s},
title = {Isolating failing sites in {IC} packages using time domain reflectometry:
Case studies},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1639--1644},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.068},
doi = {10.1016/J.MICROREL.2005.07.068},
timestamp = {Thu, 28 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Abessolo-BidzoPDD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AdellSCHZBM05,
author = {P. C. Adell and
Ronald D. Schrimpf and
C. R. Cirba and
W. T. Holman and
X. Zhu and
Hugh J. Barnaby and
O. Mion},
title = {Single event transient effects in a voltage reference},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {355--359},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.029},
doi = {10.1016/J.MICROREL.2004.05.029},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AdellSCHZBM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AguileraPNA05,
author = {Lidia Aguilera and
Marc Porti and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich},
title = {Pre- and post-BD electrical conduction of stressed HfO\({}_{\mbox{2}}\)/SiO\({}_{\mbox{2}}\)
{MOS} gate stacks observed at the nanoscale},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1390--1393},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.105},
doi = {10.1016/J.MICROREL.2005.07.105},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AguileraPNA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlamM05,
author = {Muhammad Ashraful Alam and
S. Mahapatra},
title = {A comprehensive model of {PMOS} {NBTI} degradation},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {71--81},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.03.019},
doi = {10.1016/J.MICROREL.2004.03.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AlamM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AonoMONMOK05,
author = {Hideki Aono and
Eiichi Murakami and
Kousuke Okuyama and
A. Nishida and
Masataka Minami and
Y. Ooji and
Katsuhiko Kubota},
title = {Modeling of {NBTI} saturation effect and its impact on electric field
dependence of the lifetime},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1109--1114},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.015},
doi = {10.1016/J.MICROREL.2004.12.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AonoMONMOK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AtanassovaKMKLOSV05,
author = {Elena Atanassova and
Raisa V. Konakova and
Vadym Fedorovych Mitin and
J. Koprinarova and
O. S. Lytvym and
O. B. Okhrimenko and
V. V. Schinkarenko and
D. Virovska},
title = {Effect of microwave radiation on the properties of Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\)-Si
microstructures},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {123--135},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.04.018},
doi = {10.1016/J.MICROREL.2004.04.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AtanassovaKMKLOSV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AzaisCDSN05,
author = {Florence Aza{\"{\i}}s and
B. Caillard and
S. Dournelle and
P. Salom{\'{e}} and
Pascal Nouet},
title = {A new multi-finger SCR-based structure for efficient on-chip {ESD}
protection},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {233--243},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.011},
doi = {10.1016/J.MICROREL.2004.05.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AzaisCDSN05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AzzopardiBIW05,
author = {Stephane Azzopardi and
A. Benmansour and
M. Ishiko and
Eric Woirgard},
title = {Assessment of the Trench {IGBT} reliability: low temperature experimental
characterization},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1700--1705},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.086},
doi = {10.1016/J.MICROREL.2005.07.086},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AzzopardiBIW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BabouxPB05,
author = {Nicolas Baboux and
Carole Plossu and
Philippe Boivin},
title = {Dynamic Fowler-Nordheim injection in {EEPROM} tunnel oxides at realistic
time scales},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {911--914},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.056},
doi = {10.1016/J.MICROREL.2004.11.056},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BabouxPB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BarberanA05,
author = {S. Barberan and
E. Auvray},
title = {Die repackaging for failure analysis},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1576--1580},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.051},
doi = {10.1016/J.MICROREL.2005.07.051},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BarberanA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bargstadt-FrankeSESDGWB05,
author = {S. Bargst{\"{a}}dt{-}Franke and
Wolfgang Stadler and
Kai Esmark and
Martin Streibl and
Krzysztof Domanski and
Horst A. Gieser and
Heinrich Wolf and
Waclaw Bala},
title = {Transient latch-up: experimental analysis and device simulation},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {297--304},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.017},
doi = {10.1016/J.MICROREL.2004.05.017},
timestamp = {Fri, 16 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Bargstadt-FrankeSESDGWB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BarlettaC05,
author = {Giacomo Barletta and
Giuseppe Curr{\`{o}}},
title = {Junction leakage current degradation under high temperature reverse-bias
stress induced by band-defect-band tunnelling in power {VDMOS}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {994--999},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.008},
doi = {10.1016/J.MICROREL.2004.11.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BarlettaC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BauzaRLG05,
author = {D. Bauza and
F. Rahmoune and
R. Laqli and
G{\'{e}}rard Ghibaudo},
title = {On the {SILC} mechanism in MOSFET's with ultrathin oxides},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {849--852},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.033},
doi = {10.1016/J.MICROREL.2004.11.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BauzaRLG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeaudoinSDPNRO05,
author = {Felix Beaudoin and
Kevin Sanchez and
Romain Desplats and
Philippe Perdu and
Jean Marc Nicot and
J. P. Roux and
M. Otte},
title = {Dynamic Laser Stimulation Case Studies},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1538--1543},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.061},
doi = {10.1016/J.MICROREL.2005.07.061},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BeaudoinSDPNRO05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeckxDLHCPSJBD05,
author = {S. Beckx and
M. Demand and
S. Locorotondo and
K. Henson and
M. Claes and
V. Paraschiv and
D. Shamiryan and
P. Jaenen and
W. Boullart and
S. Degendt},
title = {Implementation of high-k and metal gate materials for the 45nm node
and beyond: gate patterning development},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {1007--1011},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.005},
doi = {10.1016/J.MICROREL.2004.11.005},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BeckxDLHCPSJBD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BelaidKMMMM05,
author = {Mohamed Ali Bela{\"{\i}}d and
K. Ketata and
Karine Mourgues and
Hichame Maanane and
Mohamed Masmoudi and
J{\'{e}}r{\^{o}}me Marcon},
title = {Comparative analysis of accelerated ageing effects on power {RF} {LDMOS}
reliability},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1732--1737},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.099},
doi = {10.1016/J.MICROREL.2005.07.099},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BelaidKMMMM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BelavicHKHCGD05,
author = {Darko Belavic and
Marko Hrovat and
Jaroslaw Kita and
Janez Holc and
Jena Cilensek and
Leszek J. Golonka and
Andrzej Dziedzic},
title = {Evaluation of compatibility of thick-film {PTC} thermistors and {LTCC}
structures},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1924--1929},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.03.002},
doi = {10.1016/J.MICROREL.2005.03.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BelavicHKHCGD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Benda05,
author = {Vitezslav Benda},
title = {A note on trap recombination in high voltage device structures},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {397--401},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.005},
doi = {10.1016/J.MICROREL.2004.05.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Benda05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BenoitRDPSVMMCN05,
author = {P. Benoit and
J{\'{e}}r{\'{e}}my Raoult and
C. Delseny and
Fabien Pascal and
L. Snadny and
J. C. Vildeuil and
M. Marin and
B. Martinet and
D. Cottin and
Olivier Noblanc},
title = {Dc and low frequency noise analysis of hot-carrier induced degradation
of low complexity 0.13 mum {CMOS} bipolar transistors},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1800--1806},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.097},
doi = {10.1016/J.MICROREL.2005.07.097},
timestamp = {Thu, 10 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BenoitRDPSVMMCN05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BlascoNAPV05,
author = {X. Blasco and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich and
J. P{\'{e}}try and
Wilfried Vandervorst},
title = {Breakdown spots of ultra-thin (EOT{\textless}1.5nm) HfO\({}_{\mbox{2}}\)/SiO\({}_{\mbox{2}}\)
stacks observed with enhanced - {CAFM}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {811--814},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.042},
doi = {10.1016/J.MICROREL.2004.11.042},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BlascoNAPV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoselliD05,
author = {Gianluca Boselli and
Charvaka Duvvury},
title = {Trends and challenges to {ESD} and Latch-up designs for nanometer
{CMOS} technologies},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1406--1414},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.028},
doi = {10.1016/J.MICROREL.2005.07.028},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BoselliD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrahmaBG05,
author = {Sanjib Kumar Brahma and
Christian Boit and
Arkadiusz Glowacki},
title = {Seebeck Effect Detection on Biased Device without {OBIRCH} Distortion
Using {FET} Readout},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1487--1492},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.041},
doi = {10.1016/J.MICROREL.2005.07.041},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrahmaBG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BraunBKBAR05,
author = {Tanja Braun and
Karl{-}Friedrich Becker and
Mathias Koch and
Volker Bader and
Rolf Aschenbrenner and
Herbert Reichl},
title = {Reliability Potential Of Epoxy Based Encapsulants For Automotive Applications},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1672--1675},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.075},
doi = {10.1016/J.MICROREL.2005.07.075},
timestamp = {Thu, 02 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BraunBKBAR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BravaixGDHPPRV05,
author = {Alain Bravaix and
Didier Goguenheim and
M. Denais and
Vincent Huard and
C. R. Parthasarathy and
F. Perrier and
Nathalie Revil and
E. Vincent},
title = {Impacts of the recovery phenomena on the worst-case of damage in {DC/AC}
stressed ultra-thin {NO} gate-oxide MOSFETs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1370--1375},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.023},
doi = {10.1016/J.MICROREL.2005.07.023},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BravaixGDHPPRV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BreitschopfBKF05,
author = {Peter Breitschopf and
Guenther Benstetter and
Bernhard Knoll and
Werner Frammelsberger},
title = {Intermittent contact scanning capacitance microscopy-An improved method
for 2D doping profiling},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1568--1571},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.047},
doi = {10.1016/J.MICROREL.2005.07.047},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BreitschopfBKF05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BriandBCRDP05,
author = {Danick Briand and
Felix Beaudoin and
J{\'{e}}r{\^{o}}me Courbat and
Nico F. de Rooij and
Romain Desplats and
Philippe Perdu},
title = {Failure analysis of micro-heating elements suspended on thin membranes},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1786--1789},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.106},
doi = {10.1016/J.MICROREL.2005.07.106},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BriandBCRDP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrisbinSC05,
author = {Douglas Brisbin and
Andy Strachan and
Prasad Chaparala},
title = {Optimizing the hot carrier reliability of {N-LDMOS} transistor arrays},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1021--1032},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.054},
doi = {10.1016/J.MICROREL.2004.11.054},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrisbinSC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Brozek05,
author = {Tomasz Brozek},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {1--2},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.07.003},
doi = {10.1016/J.MICROREL.2004.07.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Brozek05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Burghartz05,
author = {Joachim N. Burghartz},
title = {Review of add-on process modules for high-frequency silicon technology},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {409--418},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.002},
doi = {10.1016/J.MICROREL.2004.12.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Burghartz05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BusattoPVISC05,
author = {Giovanni Busatto and
Alberto Porzio and
Francesco Velardi and
Francesco Iannuzzo and
Annunziata Sanseverino and
Giuseppe Curr{\`{o}}},
title = {Experimental and Numerical investigation about {SEB/SEGR} of Power
{MOSFET}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1711--1716},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.089},
doi = {10.1016/J.MICROREL.2005.07.089},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BusattoPVISC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BuzzoCSF05,
author = {Marco Buzzo and
Mauro Ciappa and
Maria Stangoni and
Wolfgang Fichtner},
title = {Two-dimensional Dopant Profiling and Imaging of 4H Silicon Carbide
Devices by Secondary Electron Potential Contrast},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1499--1504},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.069},
doi = {10.1016/J.MICROREL.2005.07.069},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BuzzoCSF05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CacchioneCMR05,
author = {Fabrizio Cacchione and
Alberto Corigliano and
Biagio De Masi and
Caterina Riva},
title = {Out of plane vs in plane flexural behaviour of thin polysilicon films:
Mechanical characterization and application of the Weibull approach},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1758--1763},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.090},
doi = {10.1016/J.MICROREL.2005.07.090},
timestamp = {Tue, 02 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CacchioneCMR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CapodieciWSSE05,
author = {Vanessa Capodieci and
Florian Wiest and
Torsten Sulima and
J{\"{o}}rg Schulze and
Ignaz Eisele},
title = {Examination and evaluation of La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
as gate dielectric for sub-100nm {CMOS} and {DRAM} technology},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {937--940},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.021},
doi = {10.1016/J.MICROREL.2004.11.021},
timestamp = {Thu, 16 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CapodieciWSSE05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CarrerasGM05,
author = {Josep Carreras and
B. Garrido and
J. R. Morante},
title = {Improved charge injection in Si nanocrystal non-volatile memories},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {899--902},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.028},
doi = {10.1016/J.MICROREL.2004.11.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CarrerasGM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CassanelliMCVF05,
author = {G. Cassanelli and
Giovanna Mura and
F. Cesaretti and
Massimo Vanzi and
Fausto Fantini},
title = {Reliability predictions in electronic industrial applications},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1321--1326},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.014},
doi = {10.1016/J.MICROREL.2005.07.014},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CassanelliMCVF05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChaineDK05,
author = {Michael Chaine and
James Davis and
Al Kearney},
title = {{TLP} analysis of 0.125 mum {CMOS} {ESD} input protection circuit},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {223--231},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.010},
doi = {10.1016/J.MICROREL.2004.05.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChaineDK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChaparalaB05,
author = {Prasad Chaparala and
Douglas Brisbin},
title = {Impact of {NBTI} and {HCI} on {PMOSFET} threshold voltage drift},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {13--18},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.03.016},
doi = {10.1016/J.MICROREL.2004.03.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChaparalaB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenK05,
author = {Shih{-}Hung Chen and
Ming{-}Dou Ker},
title = {Investigation on seal-ring rules for {IC} product reliability in 0.25-mum
{CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1311--1316},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.012},
doi = {10.1016/J.MICROREL.2005.07.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenWK05,
author = {Yuan Chen and
Qing Wang and
Sammy Kayali},
title = {A statistical approach to characterizing the reliability of systems
utilizing {HBT} devices},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1869--1874},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.01.014},
doi = {10.1016/J.MICROREL.2005.01.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenWK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenXXAKCXST05,
author = {Jian Chen and
Jianbin Xu and
Kun Xue and
Jin An and
Ning Ke and
Wei Cao and
Haibo Xia and
Jing Shi and
Decheng Tian},
title = {Nanoscale structural characteristics and electron field emission properties
of transition metal-fullerene compound TiC\({}_{\mbox{60}}\) films},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {137--142},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.006},
doi = {10.1016/J.MICROREL.2004.05.006},
timestamp = {Mon, 04 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChenXXAKCXST05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChimentonO05,
author = {Andrea Chimenton and
Piero Olivo},
title = {Reliability of erasing operation in NOR-Flash memories},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1094--1108},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.006},
doi = {10.1016/J.MICROREL.2004.12.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChimentonO05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuLL05,
author = {Fu{-}Chien Chiu and
Shun{-}An Lin and
Joseph Ya{-}min Lee},
title = {Electrical properties of metal-HfO\({}_{\mbox{2}}\)-silicon system
measured from metal-insulator-semiconductor capacitors and metal-insulator-semiconductor
field-effect transistors using HfO\({}_{\mbox{2}}\) gate dielectric},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {961--964},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.016},
doi = {10.1016/J.MICROREL.2004.11.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuLL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Choa05,
author = {S. H. Choa},
title = {Reliability of vacuum packaged {MEMS} gyroscopes},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {361--369},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.028},
doi = {10.1016/J.MICROREL.2004.05.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Choa05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChungLL05,
author = {Cho{-}Liang Chung and
Liang{-}Tien Lu and
Yao{-}Jung Lee},
title = {Influence of halogen-free compound and lead-free solder paste on on-board
reliability of green {CSP} (chip scale package)},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1916--1923},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.03.008},
doi = {10.1016/J.MICROREL.2005.03.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChungLL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Ciappa05,
author = {Mauro Ciappa},
title = {Lifetime prediction on the base of mission profiles},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1293--1298},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.060},
doi = {10.1016/J.MICROREL.2005.07.060},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Ciappa05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CiappaFKYN05,
author = {Mauro Ciappa and
Wolfgang Fichtner and
T. Kojima and
Y. Yamada and
Y. Nishibe},
title = {Extraction of Accurate Thermal Compact Models for Fast Electro-Thermal
Simulation of {IGBT} Modules in Hybrid Electric Vehicles},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1694--1699},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.083},
doi = {10.1016/J.MICROREL.2005.07.083},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CiappaFKYN05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CortesRFUHR05,
author = {Ignasi Cort{\'{e}}s and
Jaume Roig and
David Flores and
Jes{\'{u}}s Urresti and
Salvador Hidalgo and
Jos{\'{e}} Rebollo},
title = {Analysis of hot-carrier degradation in a {SOI} {LDMOS} transistor
with a steep retrograde drift doping profile},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {493--498},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.08.005},
doi = {10.1016/J.MICROREL.2004.08.005},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CortesRFUHR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CovaDM05,
author = {Paolo Cova and
Nicola Delmonte and
Roberto Menozzi},
title = {On state breakdown in PHEMTs and its temperature dependence},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1605--1610},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.072},
doi = {10.1016/J.MICROREL.2005.07.072},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CovaDM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DecamsGJASDCOMH05,
author = {J. M. Decams and
H. Guillon and
Carmen Jim{\'{e}}nez and
M. Audier and
J. P. S{\'{e}}nateur and
C. Dubourdieu and
O. Cadix and
Barry J. O'Sullivan and
Mircea Modreanu and
Paul K. Hurley},
title = {Electrical characterization of HfO\({}_{\mbox{2}}\) films obtained
by {UV} assisted injection {MOCVD}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {929--932},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.023},
doi = {10.1016/J.MICROREL.2004.11.023},
timestamp = {Fri, 27 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DecamsGJASDCOMH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DehbiODW05,
author = {A. Dehbi and
Yves Ousten and
Yves Danto and
Wolfgang Wondrak},
title = {Vibration lifetime modelling of {PCB} assemblies using steinberg model},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1658--1661},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.074},
doi = {10.1016/J.MICROREL.2005.07.074},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DehbiODW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DeloffreMGBBBGC05,
author = {Emilie Deloffre and
L. Mont{\`{e}}s and
G{\'{e}}rard Ghibaudo and
Sylvie Bruy{\`{e}}re and
Serge Blonkowski and
St{\'{e}}phane B{\'{e}}cu and
Mickael Gros{-}Jean and
S{\'{e}}bastien Cr{\'{e}}mer},
title = {Electrical properties in low temperature range {(5K-300K)} of Tantalum
Oxide dielectric {MIM} capacitors},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {925--928},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.024},
doi = {10.1016/J.MICROREL.2004.11.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DeloffreMGBBBGC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DelugasF05,
author = {Pietro Delugas and
Vincenzo Fiorentini},
title = {Dielectric properties of two phases of crystalline lutetium oxide},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {831--833},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.037},
doi = {10.1016/J.MICROREL.2004.11.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DelugasF05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DeweerdKCSSRDPEM05,
author = {W. Deweerd and
Vidya Kaushik and
J. Chen and
Y. Shimamoto and
Tom Schram and
L.{-}{\AA}. Ragnarsson and
Annelies Delabie and
Luigi Pantisano and
B. Eyckens and
J. W. Maes},
title = {Potential remedies for the V\({}_{\mbox{T}}\)/V\({}_{\mbox{fb}}\)-shift
problem of Hf/polysilicon-based gate stacks: a solution-based survey},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {786--789},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.048},
doi = {10.1016/J.MICROREL.2004.11.048},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DeweerdKCSSRDPEM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DrielGSZ05,
author = {W. D. van Driel and
Marcel A. J. van Gils and
Richard B. R. van Silfhout and
G. Q. Zhang},
title = {Prediction of Delamination Related {IC} {\&} Packaging Reliability
Problems},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1633--1638},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.065},
doi = {10.1016/J.MICROREL.2005.07.065},
timestamp = {Wed, 18 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DrielGSZ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuenasCGBAMG05,
author = {Salvador Due{\~{n}}as and
Helena Cast{\'{a}}n and
H{\'{e}}ctor Garc{\'{\i}}a and
J. Barbolla and
E. San Andr{\'{e}}s and
I. M{\'{a}}rtil and
G. Gonz{\'{a}}lez{-}D{\'{\i}}az},
title = {On the influence of substrate cleaning method and rapid thermal annealing
conditions on the electrical characteristics of Al/SiN\({}_{\mbox{x}}\)/SiO\({}_{\mbox{2}}\)/Si
fabricated by {ECR-CVD}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {978--981},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.012},
doi = {10.1016/J.MICROREL.2004.11.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DuenasCGBAMG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuenasCGBKARL05,
author = {Salvador Due{\~{n}}as and
Helena Cast{\'{a}}n and
H{\'{e}}ctor Garc{\'{\i}}a and
J. Barbolla and
Kaupo Kukli and
Jaan Aarik and
Mikko Ritala and
Markku Leskel{\"{a}}},
title = {Electrical characterization of hafnium oxide and hafnium-rich silicate
films grown by atomic layer deposition},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {949--952},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.052},
doi = {10.1016/J.MICROREL.2004.11.052},
timestamp = {Sat, 04 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DuenasCGBKARL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuongBCSLPFP05,
author = {Q.{-}H. Duong and
Lionel Buchaillot and
Dominique Collard and
Petra Schmitt and
Xavier Lafontan and
Patrick Pons and
F. Flourens and
Francis Pressecq},
title = {Thermal and electrostatic reliability characterization in {RF} {MEMS}
switches},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1790--1793},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.095},
doi = {10.1016/J.MICROREL.2005.07.095},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DuongBCSLPFP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuschlV05,
author = {Rainer Duschl and
Rolf{-}Peter Vollertsen},
title = {Is the power-law model applicable beyond the direct tunneling regime?},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1861--1867},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.03.010},
doi = {10.1016/J.MICROREL.2005.03.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DuschlV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dziedzic05,
author = {Andrzej Dziedzic},
title = {{IMAPS} Poland 2004 - Guest Editorial},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1901--1902},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.03.001},
doi = {10.1016/J.MICROREL.2005.03.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Dziedzic05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ErshovSMCRLKGW05,
author = {Maxim Ershov and
Sharad Saxena and
Sean Minehane and
P. Clifton and
Mark Redford and
R. Lindley and
H. Karbasi and
S. Graves and
S. Winters},
title = {Degradation dynamics, recovery, and characterization of negative bias
temperature instability},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {99--105},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.03.020},
doi = {10.1016/J.MICROREL.2004.03.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ErshovSMCRLKGW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ErslandM05,
author = {Peter Ersland and
Roberto Menozzi},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1868},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.02.011},
doi = {10.1016/J.MICROREL.2005.02.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ErslandM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EstradaCRIMP05,
author = {Magali Estrada and
Antonio Cerdeira and
Luis Res{\'{e}}ndiz and
Benjam{\'{\i}}n I{\~{n}}{\'{\i}}guez and
Llu{\'{\i}}s F. Marsal and
Josep Pallar{\`{e}}s},
title = {Effect of localized traps on the anomalous behavior of the transconductance
in nanocrystalline TFTs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1161--1166},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.005},
doi = {10.1016/J.MICROREL.2004.12.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/EstradaCRIMP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ExarchosPJB05,
author = {M. A. Exarchos and
George J. Papaioannou and
Jalal Jomaah and
Francis Balestra},
title = {The impact of static and dynamic degradation on {SOI} "smart-cut"
floating body MOSFETs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1386--1389},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.027},
doi = {10.1016/J.MICROREL.2005.07.027},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ExarchosPJB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ExarchosTPPMDCP05,
author = {M. A. Exarchos and
V. Theonas and
Patrick Pons and
George J. Papaioannou and
S. Mell{\'{e}} and
David Dubuc and
Fabio Coccetti and
Robert Plana},
title = {Investigation of charging mechanisms in metal-insulator-metal structures},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1782--1785},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.094},
doi = {10.1016/J.MICROREL.2005.07.094},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ExarchosTPPMDCP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FangLMHB05,
author = {Q. Fang and
I. Liaw and
Mircea Modreanu and
Paul K. Hurley and
I. W. Boyd},
title = {Post deposition UV-induced O\({}_{\mbox{2}}\) annealing of HfO\({}_{\mbox{2}}\)
thin films},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {957--960},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.017},
doi = {10.1016/J.MICROREL.2004.11.017},
timestamp = {Fri, 27 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FangLMHB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FedorenkoTASZC05,
author = {Y. G. Fedorenko and
L. Truong and
V. V. Afanasev and
A. Stesmans and
Z. Zhang and
Stephen A. Campbell},
title = {Impact of nitrogen incorporation on interface states in (100)Si/HfO\({}_{\mbox{2}}\)},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {802--805},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.044},
doi = {10.1016/J.MICROREL.2004.11.044},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FedorenkoTASZC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FernandezRNA05,
author = {Raul Fern{\'{a}}ndez and
Rosana Rodr{\'{\i}}guez and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich},
title = {Influence of oxide breakdown position and device aspect ratio on MOSFET's
output characteristics},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {861--864},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.029},
doi = {10.1016/J.MICROREL.2004.10.029},
timestamp = {Wed, 14 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FernandezRNA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FiritiBHPLF05,
author = {Abdellatif Firiti and
Felix Beaudoin and
G{\'{e}}rald Haller and
Philippe Perdu and
Dean Lewis and
Pascal Fouillat},
title = {Impact of semiconductors material on {IR} Laser Stimulation signal},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1465--1470},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.029},
doi = {10.1016/J.MICROREL.2005.07.029},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FiritiBHPLF05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FriskR05,
author = {Laura Frisk and
Eero Ristolainen},
title = {Flip chip attachment on flexible {LCP} substrate using an {ACF}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {583--588},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.009},
doi = {10.1016/J.MICROREL.2004.10.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FriskR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FujiedaMSTY05,
author = {Shinji Fujieda and
Yoshinao Miura and
Motofumi Saitoh and
Yuden Teraoka and
Akitaka Yoshigoe},
title = {Characterization of interface defects related to negative-bias temperature
instability in ultrathin plasma-nitrided SiON/Si{\textless}1 0 0{\textgreater}
systems},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {57--64},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.02.017},
doi = {10.1016/J.MICROREL.2004.02.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FujiedaMSTY05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GarnerKAMP05,
author = {C. M. Garner and
G. Kloster and
G. Atwood and
L. Mosley and
A. C. Palanduz},
title = {Challenges for dielectric materials in future integrated circuit technologies},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {919--924},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.053},
doi = {10.1016/J.MICROREL.2004.11.053},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GarnerKAMP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhidiniCGSSV05,
author = {G. Ghidini and
C. Capolupo and
G. Giusto and
A. Sebastiani and
B. Stragliati and
Maria Elena Vitali},
title = {Tunnel oxide degradation under pulsed stress},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1337--1342},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.017},
doi = {10.1016/J.MICROREL.2005.07.017},
timestamp = {Tue, 16 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GhidiniCGSSV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhidiniLBBGGGG05,
author = {G. Ghidini and
M. Langenbuch and
R. Bottini and
D. Brazzelli and
Andrea Ghetti and
N. Galbiati and
G. Giusto and
A. Garavaglia},
title = {Impact of interface and bulk trapped charges on transistor reliability},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {857--860},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.031},
doi = {10.1016/J.MICROREL.2004.11.031},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GhidiniLBBGGGG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoguenheimBGMMLB05,
author = {Didier Goguenheim and
Alain Bravaix and
S. Gomri and
J. M. Moragues and
C. Monserie and
N. Legrand and
Philippe Boivin},
title = {Impact of wafer charging on hot carrier reliability and optimization
of latent damage detection methodology in advanced {CMOS} technologies},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {487--492},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.09.004},
doi = {10.1016/J.MICROREL.2004.09.004},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GoguenheimBGMMLB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GraubySCTD05,
author = {St{\'{e}}phane Grauby and
M. Amine Salhi and
Wilfrid Claeys and
D. Trias and
Stefan Dilhaire},
title = {ElectroStatic Discharge Fault Localization by Laser Probing},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1482--1486},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.038},
doi = {10.1016/J.MICROREL.2005.07.038},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GraubySCTD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Grutzner05,
author = {M. Gr{\"{u}}tzner},
title = {Advanced electrical analysis of embedded memory cells using atomic
force probing},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1509--1513},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.054},
doi = {10.1016/J.MICROREL.2005.07.054},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Grutzner05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Guedon-GraciaWZ05,
author = {Alexandrine Gu{\'{e}}don{-}Gracia and
Eric Woirgard and
Christian Zardini},
title = {Correlation between Experimental Results and {FE} Simulations to Evaluate
Lead-Free {BGA} Assembly Reliability},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1652--1657},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.073},
doi = {10.1016/J.MICROREL.2005.07.073},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Guedon-GraciaWZ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuitardETBNPTPL05,
author = {Nicolas Guitard and
Fabien Essely and
David Tr{\'{e}}mouilles and
Marise Bafleur and
Nicolas Nolhier and
Philippe Perdu and
Andr{\'{e}} Touboul and
Vincent Pouget and
Dean Lewis},
title = {Different Failure signatures of multiple {TLP} and {HBM} Stresses
in an {ESD} robust protection structure},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1415--1420},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.030},
doi = {10.1016/J.MICROREL.2005.07.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GuitardETBNPTPL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HaggagLMM05,
author = {A. Haggag and
N. Liu and
D. Menke and
M. Moosa},
title = {Physical model for the power-law voltage and current acceleration
of {TDDB}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1855--1860},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.03.011},
doi = {10.1016/J.MICROREL.2005.03.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HaggagLMM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HalovaASM05,
author = {Elena Halova and
Sashka Alexandrova and
A. Szekeres and
Mircea Modreanu},
title = {LPCVD-silicon oxynitride films: interface properties},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {982--985},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.011},
doi = {10.1016/J.MICROREL.2004.11.011},
timestamp = {Sun, 29 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HalovaASM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HanKVGDRS05,
author = {Jin{-}Ping Han and
Sang{-}Mo Koo and
Eric M. Vogel and
Evgeni P. Gusev and
C. D'Emic and
Curt A. Richter and
John S. Suehle},
title = {Reverse short channel effects in high-k gated nMOSFETs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {783--785},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.049},
doi = {10.1016/J.MICROREL.2004.11.049},
timestamp = {Tue, 15 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HanKVGDRS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HartmannMB05,
author = {Claus Hartmann and
Wolfgang Mertin and
Gerd Bacher},
title = {Circuit-internal signal measurements with a needle sensor},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1505--1508},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.053},
doi = {10.1016/J.MICROREL.2005.07.053},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HartmannMB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HastasADKNGT05,
author = {N. A. Hastas and
N. Archontas and
C. A. Dimitriadis and
G. Kamarinos and
T. Nikolaidis and
N. Georgoulas and
Adonios Thanailakis},
title = {Substrate current and degradation of n-channel polycrystalline silicon
thin-film transistors},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {341--348},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.06.004},
doi = {10.1016/J.MICROREL.2004.06.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HastasADKNGT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HayamaTOKMRMSC05,
author = {Kiyoteru Hayama and
Kenichiro Takakura and
Hidenori Ohyama and
S. Kuboyama and
S. Matsuda and
Joan Marc Raf{\'{\i}} and
Abdelkarim Mercha and
Eddy Simoen and
Cor Claeys},
title = {Radiation source dependence of performance degradation in thin gate
oxide fully-depleted {SOI} n-MOSFETs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1376--1381},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.024},
doi = {10.1016/J.MICROREL.2005.07.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HayamaTOKMRMSC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/He05,
author = {Yi He},
title = {Chemical and diffusion-controlled curing kinetics of an underfill
material},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {689--695},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.08.013},
doi = {10.1016/J.MICROREL.2004.08.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/He05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeerDBBPGDSG05,
author = {Michael Heer and
Viktor Dubec and
M. Blaho and
Sergey Bychikhin and
Dionyz Pogany and
Erich Gornik and
Marie Denison and
Matthias Stecher and
Gerhard Groos},
title = {Automated setup for thermal imaging and electrical degradation study
of power {DMOS} devices},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1688--1693},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.082},
doi = {10.1016/J.MICROREL.2005.07.082},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeerDBBPGDSG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HisakaANSUYH05,
author = {Takayuki Hisaka and
Yasuki Aihara and
Yoichi Nogami and
Hajime Sasaki and
Yasushi Uehara and
Naohito Yoshida and
Kazuo Hayashi},
title = {Degradation mechanisms of GaAs PHEMTs in high humidity conditions},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1894--1900},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.01.017},
doi = {10.1016/J.MICROREL.2005.01.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HisakaANSUYH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HoHTL05,
author = {Ching{-}Sung Ho and
Kuo{-}Yin Huang and
Ming Tang and
Juin J. Liou},
title = {An analytical threshold voltage model of NMOSFETs with hot-carrier
induced interface charge effect},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1144--1149},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.007},
doi = {10.1016/J.MICROREL.2004.10.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HoHTL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HongMCL05,
author = {Changsoo Hong and
Linda S. Milor and
Munkang Choi and
Tom Lin},
title = {Study of Area Scaling Effect on Integrated Circuit Reliability Based
on Yield Models},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1305--1310},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.011},
doi = {10.1016/J.MICROREL.2005.07.011},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HongMCL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HookBCBRS05,
author = {Terence B. Hook and
Ronald J. Bolam and
William Clark and
Jay S. Burnham and
Nivo Rovedo and
Laura Schutz},
title = {Negative bias temperature instability on three oxide thicknesses {(1.4/2.2/5.2}
nm) with nitridation variations and deuteration},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {47--56},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.02.016},
doi = {10.1016/J.MICROREL.2004.02.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HookBCBRS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Houssa05,
author = {M. Houssa},
title = {Modelling negative bias temperature instabilities in advanced p-MOSFETs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {3--12},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.03.015},
doi = {10.1016/J.MICROREL.2004.03.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Houssa05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HsiehH05,
author = {Sheng{-}Jen Hsieh and
Sung{-}Ling Huang},
title = {A methodology for microcontroller signal frequency stress prediction},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1243--1251},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.021},
doi = {10.1016/J.MICROREL.2004.10.021},
timestamp = {Thu, 15 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HsiehH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuKCSLWK05,
author = {Ling{-}Chang Hu and
An{-}Chi Kang and
Eric Chen and
J. R. Shih and
Yao{-}Feng Lin and
Kenneth Wu and
Ya{-}Chin King},
title = {Gate stress effect on low temperature data retention characteristics
of split-gate flash memories},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1331--1336},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.016},
doi = {10.1016/J.MICROREL.2005.07.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuKCSLWK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuardDPRPBV05,
author = {Vincent Huard and
M. Denais and
F. Perrier and
Nathalie Revil and
C. R. Parthasarathy and
Alain Bravaix and
E. Vincent},
title = {A thorough investigation of MOSFETs {NBTI} degradation},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {83--98},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.04.027},
doi = {10.1016/J.MICROREL.2004.04.027},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HuardDPRPBV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Hurley05,
author = {Paul K. Hurley},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {767--769},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.006},
doi = {10.1016/J.MICROREL.2004.11.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Hurley05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuygheBZDADLGD05,
author = {S. Huyghe and
Laurent B{\'{e}}chou and
Nicolas Zerounian and
Yannick Deshayes and
Fr{\'{e}}d{\'{e}}ric Aniel and
A. Denolle and
Dominique Laffitte and
Jean{-}Luc Goudard and
Yves Danto},
title = {Electroluminescence spectroscopy for reliability investigations of
1.55 mum bulk semiconductor optical amplifier},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1593--1599},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.067},
doi = {10.1016/J.MICROREL.2005.07.067},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuygheBZDADLGD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HyvonenJR05,
author = {Sami Hyvonen and
Sopan Joshi and
Elyse Rosenbaum},
title = {Comprehensive {ESD} protection for {RF} inputs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {245--254},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.012},
doi = {10.1016/J.MICROREL.2004.05.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HyvonenJR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IannelloT05,
author = {M.{-}A. Iannello and
L. Tsung},
title = {{STEM} role in failure analysis},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1526--1531},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.059},
doi = {10.1016/J.MICROREL.2005.07.059},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IannelloT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Iannuzzo05,
author = {Francesco Iannuzzo},
title = {Non-destructive Testing Technique for MOSFET's Characterisation during
Soft-Switching {ZVS} Operations},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1738--1741},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.100},
doi = {10.1016/J.MICROREL.2005.07.100},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Iannuzzo05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IraceBSLR05,
author = {Andrea Irace and
Giovanni Breglio and
Paolo Spirito and
Romeo Letor and
Sebastiano Russo},
title = {Reliability enhancement with the aid of transient infrared thermal
analysis of smart Power MOSFETs during short circuit operation},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1706--1710},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.087},
doi = {10.1016/J.MICROREL.2005.07.087},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/IraceBSLR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IrreraP05,
author = {Fernanda Irrera and
Giuseppina Puzzilli},
title = {Crested barrier in the tunnel stack of non-volatile memories},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {907--910},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.026},
doi = {10.1016/J.MICROREL.2004.11.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IrreraP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IrreraPC05,
author = {Fernanda Irrera and
Giuseppina Puzzilli and
Domenico Caputo},
title = {A comprehensive model for oxide degradation},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {853--856},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.032},
doi = {10.1016/J.MICROREL.2004.11.032},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IrreraPC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IslamPS05,
author = {Tarikul Islam and
C. Pramanik and
Hiranmay Saha},
title = {Modeling, simulation and temperature compensation of porous polysilicon
capacitive humidity sensor using {ANN} technique},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {697--703},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.09.010},
doi = {10.1016/J.MICROREL.2004.09.010},
timestamp = {Thu, 29 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IslamPS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IsmailMLTMBL05,
author = {Naoufel Ismail and
Nathalie Malbert and
Nathalie Labat and
Andr{\'{e}} Touboul and
Jean{-}Luc Muraro and
F. Brasseau and
D. Langrez},
title = {Safe operating area of GaAs {MESFET} and {PHEMT} for amplification
in overdrive operating conditions},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1611--1616},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.080},
doi = {10.1016/J.MICROREL.2005.07.080},
timestamp = {Wed, 12 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/IsmailMLTMBL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JacobTR05,
author = {Peter Jacob and
Uwe Thiemann and
Joachim C. Reiner},
title = {Electrostatic discharge directly to the chip surface, caused by automatic
post-wafer processing},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1174--1180},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.012},
doi = {10.1016/J.MICROREL.2004.10.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JacobTR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Janczyk05,
author = {G. Janczyk},
title = {Bipolar mechanisms present in short channel {SOI-MOSFET} transistors},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1257--1263},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.007},
doi = {10.1016/J.MICROREL.2004.12.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Janczyk05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JaraghH05,
author = {Mansour Jaragh and
Ahmed Hasswa},
title = {Implementation, analysis and performance evaluation of the {IRP} replacement
policy},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1264--1269},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.01.005},
doi = {10.1016/J.MICROREL.2005.01.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JaraghH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JaroszP05,
author = {Adam Jarosz and
Andrzej Pfitzner},
title = {Evaluation of parasitic capacitances for interconnection buses crossing
in different layers},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {761--765},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.020},
doi = {10.1016/J.MICROREL.2004.10.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JaroszP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongLHP05,
author = {Jae{-}Seong Jeong and
Jae{-}Hyun Lee and
Jong{-}Shin Ha and
Sang{-}Deuk Park},
title = {Stress Mechanism about Field Lightning Surge of High Voltage {BJT}
Based Line Driver for {ADSL} System},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1398--1401},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.052},
doi = {10.1016/J.MICROREL.2005.07.052},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongLHP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JingHZM05,
author = {Ming{-}e Jing and
Yue Hao and
Jinfeng Zhang and
Peijun Ma},
title = {Efficient parametric yield optimization of {VLSI} circuit by uniform
design sampling method},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {155--162},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.06.001},
doi = {10.1016/J.MICROREL.2004.06.001},
timestamp = {Tue, 09 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JingHZM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JooCH05,
author = {Jinwon Joo and
Seungmin Cho and
Bongtae Han},
title = {Characterization of flexural and thermo-mechanical behavior of plastic
ball grid package assembly using moir{\'{e}} interferometry},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {637--646},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.006},
doi = {10.1016/J.MICROREL.2004.10.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JooCH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JuanCL05,
author = {P. C. Juan and
H. C. Chou and
J. Y. M. Lee},
title = {The effect of electrode material on the electrical conduction of metal-Pb(Zr\({}_{\mbox{0.53}}\)Ti\({}_{\mbox{0.47}}\))O\({}_{\mbox{3}}\)-metal
thin film capacitors},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {1003--1006},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.004},
doi = {10.1016/J.MICROREL.2004.11.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JuanCL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaushikCDERCRWCG05,
author = {Vidya Kaushik and
Martine Claes and
Annelies Delabie and
Sven Van Elshocht and
Olivier Richard and
Thierry Conard and
Erika Rohr and
Thomas Witters and
Matty Caymax and
Stefan De Gendt},
title = {Observation and characterization of defects in HfO\({}_{\mbox{2}}\)
high-K gate dielectric layers},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {798--801},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.045},
doi = {10.1016/J.MICROREL.2004.11.045},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KaushikCDERCRWCG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KellyDOB05,
author = {David Q. Kelly and
Sagnik Dey and
David Onsongo and
Sanjay K. Banerjee},
title = {Considerations for evaluating hot-electron reliability of strained
Si n-channel MOSFETs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1033--1040},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.01.011},
doi = {10.1016/J.MICROREL.2005.01.011},
timestamp = {Wed, 27 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KellyDOB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KerlainM05,
author = {A. Kerlain and
V. Mosser},
title = {Robust, versatile, direct low-frequency noise characterization method
for material/process quality control using cross-shaped 4-terminal
devices},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1327--1330},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.015},
doi = {10.1016/J.MICROREL.2005.07.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KerlainM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KhongTDCLDLVDF05,
author = {B. Khong and
Patrick Tounsi and
Philippe Dupuy and
X. Chauffleur and
Marc Legros and
A. Deram and
Colette Levade and
G. Vanderschaeve and
Jean{-}Marie Dorkel and
Jean{-}Pierre Fradin},
title = {Innovative Methodology for Predictive Reliability of Intelligent Power
Devices Using Extreme Electro-thermal Fatigue},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1717--1722},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.104},
doi = {10.1016/J.MICROREL.2005.07.104},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KhongTDCLDLVDF05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimKJP05,
author = {Jong Hun Kim and
Kyosun Kim and
Seok Hee Jeon and
Jong Tae Park},
title = {Reliability improvement by the suppression of keyhole generation in
W-plug vias},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1455--1458},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.048},
doi = {10.1016/J.MICROREL.2005.07.048},
timestamp = {Fri, 22 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KimKJP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimRYK05,
author = {Kyung{-}Seob Kim and
K. W. Ryu and
C. H. Yu and
J. M. Kim},
title = {The formation and growth of intermetallic compounds and shear strength
at Sn-Zn solder/Au-Ni-Cu interfaces},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {647--655},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.07.005},
doi = {10.1016/J.MICROREL.2004.07.005},
timestamp = {Thu, 31 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KimRYK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KisielBKF05,
author = {Ryszard Kisiel and
Janusz Borecki and
Grazyna Koziol and
Jan Felba},
title = {Conductive adhesives for through holes and blind vias metallization},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1935--1940},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.03.005},
doi = {10.1016/J.MICROREL.2005.03.005},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KisielBKF05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KitajimaS05,
author = {Masayuki Kitajima and
Tadaaki Shono},
title = {Reliability study of new SnZnAl lead-free solders used in {CSP} packages},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1208--1214},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.011},
doi = {10.1016/J.MICROREL.2004.10.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KitajimaS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KrsticSDA05,
author = {Milos D. Krstic and
Mile K. Stojcev and
Goran Lj. Djordjevic and
Ivan D. Andrejic},
title = {A mid-value select voter},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {733--738},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.07.006},
doi = {10.1016/J.MICROREL.2004.07.006},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KrsticSDA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Labat05,
author = {Nathalie Labat},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1275--1276},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.036},
doi = {10.1016/J.MICROREL.2005.07.036},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Labat05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LaiW05,
author = {Yi{-}Shao Lai and
Tong Hong Wang},
title = {Verification of submodeling technique in thermomechanical reliability
assessment of flip-chip package assembly},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {575--582},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.09.007},
doi = {10.1016/J.MICROREL.2004.09.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LaiW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LajnefVBW05,
author = {Walid Lajnef and
Jean{-}Michel Vinassa and
Olivier Briat and
Eric Woirgard},
title = {Specification and use of pulsed current profiles for ultracapacitors
power cycling},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1746--1749},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.102},
doi = {10.1016/J.MICROREL.2005.07.102},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LajnefVBW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LangenbuchBVG05,
author = {M. Langenbuch and
R. Bottini and
Maria Elena Vitali and
G. Ghidini},
title = {In situ steam generation {(ISSG)} versus standard steam technology:
impact on oxide reliability},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {875--878},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.026},
doi = {10.1016/J.MICROREL.2004.10.026},
timestamp = {Tue, 16 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LangenbuchBVG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeBYPSCM05,
author = {Jin{-}Wook Lee and
Gyoung Ho Buh and
Guk{-}Hyon Yon and
Tai{-}su Park and
Yu Gyun Shin and
U{-}In Chung and
Joo Tae Moon},
title = {Elimination of surface state induced edge transistors in high voltage
NMOSFETs for flash memory devices},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1394--1397},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.035},
doi = {10.1016/J.MICROREL.2005.07.035},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeBYPSCM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeCH05,
author = {Yao{-}Jen Lee and
Tien{-}Sheng Chao and
Tiao{-}Yuan Huang},
title = {High voltage applications and {NBTI} effects of DT-pMOSFETS with reverse
Schottky substrate contacts},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1119--1123},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.01.002},
doi = {10.1016/J.MICROREL.2005.01.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeCH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeJSMN05,
author = {Yung{-}Huei Lee and
Steve Jacobs and
Stefan Stadler and
Neal R. Mielke and
Ramez Nachman},
title = {The impact of {PMOST} bias-temperature degradation on logic circuit
reliability performance},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {107--114},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.027},
doi = {10.1016/J.MICROREL.2004.05.027},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeJSMN05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeVA05,
author = {Kheng Chooi Lee and
A. Vythilingam and
Peter Alpern},
title = {A simple moisture diffusion model for the prediction of optimal baking
schedules for plastic {SMD} packages},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1668--1671},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.079},
doi = {10.1016/J.MICROREL.2005.07.079},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeVA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LembergerPZBFR05,
author = {Martin Lemberger and
Albena Paskaleva and
Stefan Z{\"{u}}rcher and
Anton J. Bauer and
Lothar Frey and
Heiner Ryssel},
title = {Electrical properties of hafnium silicate films obtained from a single-source
{MOCVD} precursor},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {819--822},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.040},
doi = {10.1016/J.MICROREL.2004.11.040},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LembergerPZBFR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LemmeEGMWK05,
author = {Max C. Lemme and
J. K. Efavi and
H. D. B. Gottlob and
Thomas Mollenhauer and
Thorsten Wahlbrink and
Heinrich Kurz},
title = {Comparison of metal gate electrodes on {MOCVD} HfO\({}_{\mbox{2}}\)},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {953--956},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.018},
doi = {10.1016/J.MICROREL.2004.11.018},
timestamp = {Thu, 30 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LemmeEGMWK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiSTSBZ05,
author = {H. Y. Li and
Y. J. Su and
C. F. Tsang and
S. M. Sohan and
V. N. Bliznetsov and
L. Zhang},
title = {Process improvement of 0.13mum Cu/Low {K} (Black Diamond\({}^{\mbox{TM}}\))
dual damascene interconnection},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1134--1143},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.057},
doi = {10.1016/J.MICROREL.2004.11.057},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiSTSBZ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiTRGM05,
author = {Yunlong Li and
Zsolt T{\"{o}}kei and
Philippe Roussel and
Guido Groeseneken and
Karen Maex},
title = {Layout dependency induced deviation from Poisson area scaling in {BEOL}
dielectric reliability},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1299--1304},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.010},
doi = {10.1016/J.MICROREL.2005.07.010},
timestamp = {Fri, 02 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiTRGM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiaoWCM05,
author = {Joy Y. Liao and
G. L. Woods and
X. Chen and
Howard L. Marks},
title = {Localization of Marginal Circuits for Yield Diagnostics Utilizing
a Dynamic Laser Stimulation Probing System},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1554--1557},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.039},
doi = {10.1016/J.MICROREL.2005.07.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiaoWCM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LimKSBKSO05,
author = {Jihyuk Lim and
Keon Kuk and
Seung{-}joo Shin and
Seog{-}soon Baek and
Youngjae Kim and
Jong{-}Woo Shin and
Yongsoo Oh},
title = {Failure mechanisms in thermal inkjet printhead analyzed by experiments
and numerical simulation},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {473--478},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.009},
doi = {10.1016/J.MICROREL.2004.12.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LimKSBKSO05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinCLL05,
author = {Y. C. Lin and
Xu Chen and
Xingsheng Liu and
Guo{-}Quan Lu},
title = {Effect of substrate flexibility on solder joint reliability. Part
{II:} finite element modeling},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {143--154},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.06.009},
doi = {10.1016/J.MICROREL.2004.06.009},
timestamp = {Sat, 20 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LinCLL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinLCSW05,
author = {M. H. Lin and
Y. L. Lin and
K. P. Chang and
K. C. Su and
Tahui Wang},
title = {Copper interconnect electromigration behaviors in various structures
and lifetime improvement by cap/dielectric interface treatment},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1061--1078},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.055},
doi = {10.1016/J.MICROREL.2004.11.055},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinLCSW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/London05,
author = {A. London},
title = {Basic Principles for Managing Foundry Programs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1285--1292},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.009},
doi = {10.1016/J.MICROREL.2005.07.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/London05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuBHH05,
author = {Y. Lu and
Octavian Buiu and
Steve Hall and
Paul K. Hurley},
title = {Optical and electrical characterization of hafnium oxide deposited
by {MOCVD}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {965--968},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.015},
doi = {10.1016/J.MICROREL.2004.11.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LuBHH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuZGZ05,
author = {Hua Lu and
Jesse Zhou and
Rich Golek and
Ming Zhou},
title = {Hybrid reliability assessment for packaging prototyping},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {597--609},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.011},
doi = {10.1016/J.MICROREL.2004.12.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LuZGZ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LucovskyHFSZNAAS05,
author = {Gerald Lucovsky and
J. G. Hong and
Charles C. Fulton and
N. A. Stoute and
Y. Zou and
Robert J. Nemanich and
David E. Aspnes and
H. Ade and
D. G. Schlom},
title = {Conduction band states of transition metal {(TM)} high-k gate dielectrics
as determined from X-ray absorption spectra},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {827--830},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.038},
doi = {10.1016/J.MICROREL.2004.11.038},
timestamp = {Fri, 10 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LucovskyHFSZNAAS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LucovskyP05,
author = {Gerald Lucovsky and
James C. Phillips},
title = {Bond strain and defects at interfaces in high-k gate stacks},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {770--778},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.051},
doi = {10.1016/J.MICROREL.2004.11.051},
timestamp = {Wed, 29 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LucovskyP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LujanMRKGHM05,
author = {G. S. Lujan and
Wim Magnus and
L.{-}{\AA}. Ragnarsson and
Stefan Kubicek and
Stefan De Gendt and
Marc M. Heyns and
Kristin De Meyer},
title = {Modelling mobility degradation due to remote Coulomb scattering from
dielectric charges and its impact on {MOS} device performance},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {794--797},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.046},
doi = {10.1016/J.MICROREL.2004.11.046},
timestamp = {Fri, 28 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LujanMRKGHM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaguireBM05,
author = {Luke Maguire and
Masud Behnia and
Graham Morrison},
title = {Systematic evaluation of thermal interface materials - a case study
in high power amplifier design},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {711--725},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.030},
doi = {10.1016/J.MICROREL.2004.10.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaguireBM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaigaTTB05,
author = {Cheick Oumar Ma{\"{\i}}ga and
Hamid Toutah and
Boubekeur Tala{-}Ighil and
Bertrand Boudart},
title = {Trench insulated gate bipolar transistors submitted to high temperature
bias stress},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1728--1731},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.098},
doi = {10.1016/J.MICROREL.2005.07.098},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaigaTTB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ManC05,
author = {Tsz Yin Man and
Mansun Chan},
title = {A 2-bit highly scalable nonvolatile memory cell with two electrically
isolated charge trapping sites},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {349--354},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.08.016},
doi = {10.1016/J.MICROREL.2004.08.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ManC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MarrasMVC05,
author = {Alessandro Marras and
Ilaria De Munari and
Davide Vescovi and
Paolo Ciampolini},
title = {Impact of gate-leakage currents on {CMOS} circuit performance},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {499--506},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.09.006},
doi = {10.1016/J.MICROREL.2004.09.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MarrasMVC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Martin05,
author = {Andreas Martin},
title = {Reliability of gate dielectrics and metal-insulator-metal capacitors},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {834--840},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.036},
doi = {10.1016/J.MICROREL.2004.11.036},
timestamp = {Thu, 11 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Martin05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MartinezS05,
author = {Pedro A. Mart{\'{\i}}nez Mart{\'{\i}}nez and
B. M. Monge Sanz},
title = {Single resistance controlled oscillator using unity gain cells},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {191--194},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.07.008},
doi = {10.1016/J.MICROREL.2004.07.008},
timestamp = {Fri, 15 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MartinezS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MelleCMDPBGBVM05,
author = {S. Mell{\'{e}} and
D. De Conto and
L. Mazenq and
David Dubuc and
B. Poussard and
C. Bordas and
Katja Grenier and
Laurent Bary and
Olivier Vendier and
J. L. Muraro},
title = {Failure predictive model of capacitive {RF-MEMS}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1770--1775},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.092},
doi = {10.1016/J.MICROREL.2005.07.092},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MelleCMDPBGBVM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MikhelashviliMSKE05,
author = {V. Mikhelashvili and
B. Meyler and
J. Shneider and
O. Kreinin and
Gadi Eisenstein},
title = {Electrical properties of {MIS} capacitor using low temperature electron
beam gun - evaporated HfAlO dielectrics},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {933--936},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.022},
doi = {10.1016/J.MICROREL.2004.11.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MikhelashviliMSKE05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MirandaB05,
author = {Enrique Miranda and
B. Brandala},
title = {A function-fit model for the hard breakdown {I-V} characteristics
of ultra-thin oxides in {MOS} structures},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {175--178},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.08.003},
doi = {10.1016/J.MICROREL.2004.08.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MirandaB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MirandaMKI05,
author = {Enrique Miranda and
Joel Molina Reyes and
Y. Kim and
Hiroshi Iwai},
title = {Degradation of high-K LA\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) gate dielectrics
using progressive electrical stress},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1365--1369},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.022},
doi = {10.1016/J.MICROREL.2005.07.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MirandaMKI05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MisraIHKA05,
author = {E. Misra and
Md. M. Islam and
Mahbub Hasan and
H. C. Kim and
T. L. Alford},
title = {Percolative approach for failure time prediction of thin film interconnects
under high current stress},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {391--395},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.09.009},
doi = {10.1016/J.MICROREL.2004.09.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MisraIHKA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MizubayashiYOOHITYHN05,
author = {Wataru Mizubayashi and
Naoki Yasuda and
Kenji Okada and
Hiroyuki Ota and
Hirokazu Hisamatsu and
Kunihiko Iwamoto and
Koji Tominaga and
Katsuhiko Yamamoto and
Tsuyoshi Horikawa and
Toshihide Nabatame},
title = {Carrier separation analysis for clarifying carrier conduction and
degradation mechanisms in high-k stack gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1041--1050},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.016},
doi = {10.1016/J.MICROREL.2004.12.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MizubayashiYOOHITYHN05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MuehleLWL05,
author = {U. Muehle and
A. Lenk and
R. Weiland and
H. Lichte},
title = {Characterisation of dopants distribution using electron holography
and FIB-based lift-off preparation},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1558--1561},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.043},
doi = {10.1016/J.MICROREL.2005.07.043},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MuehleLWL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MurthyCKC05,
author = {Ramana Murthy and
Y. W. Chen and
A. Krishnamoorthy and
X. T. Chen},
title = {SiLK\({}^{\mbox{TM}}\) etch optimization and electrical characterization
for 0.13 mum interconnects},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {507--516},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.06.005},
doi = {10.1016/J.MICROREL.2004.06.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MurthyCKC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NardiDPBG05,
author = {C. De Nardi and
Romain Desplats and
Philippe Perdu and
Felix Beaudoin and
J.{-}L. Gauffier},
title = {Oxide charge measurements in {EEPROM} devices},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1514--1519},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.055},
doi = {10.1016/J.MICROREL.2005.07.055},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NardiDPBG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NdipSJR05,
author = {Ivan N. Ndip and
Grit Sommer and
Werner John and
Herbert Reichl},
title = {Characterization of bump arrays at RF/microwave frequencies},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {551--558},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.08.001},
doi = {10.1016/J.MICROREL.2004.08.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NdipSJR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NelhiebelWDTB05,
author = {Michael Nelhiebel and
J. Wissenwasser and
Thomas Detzel and
A. Timmerer and
E. Bertagnolli},
title = {Hydrogen-related influence of the metallization stack on characteristics
and reliability of a trench gate oxide},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1355--1359},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.020},
doi = {10.1016/J.MICROREL.2005.07.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NelhiebelWDTB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NenadovicCTNSSJS05,
author = {Nebojsa Nenadovic and
V. Cuoco and
S. J. C. H. Theeuwen and
Lis K. Nanver and
Hugo Schellevis and
G. Spierings and
H. F. F. Jos and
J. W. Slotboom},
title = {Electrothermal characterization of silicon-on-glass VDMOSFETs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {541--550},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.08.015},
doi = {10.1016/J.MICROREL.2004.08.015},
timestamp = {Thu, 21 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NenadovicCTNSSJS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NeumannTD05,
author = {Gerald Neumann and
J. Touzel and
Rainer Duschl},
title = {Localization and physical analysis of dielectric weaknesses for state-of-the-art
deep trench based {DRAM} products},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1520--1525},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.056},
doi = {10.1016/J.MICROREL.2005.07.056},
timestamp = {Fri, 31 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NeumannTD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NiemiecBCGGJKKKM05,
author = {Halina Niemiec and
Antonio Bulgheroni and
Massimo Caccia and
Piotr Grabiec and
Miroslaw Grodner and
M. Jastrzab and
Wojciech Kucewicz and
Krzysztof Kucharski and
Stanislaw W. Kuta and
Jacek Marczewski},
title = {Monolithic active pixel sensor realized in {SOI} technology - concept
and verification},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1202--1207},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.014},
doi = {10.1016/J.MICROREL.2004.10.014},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NiemiecBCGGJKKKM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OConnorHDK05,
author = {Robert O'Connor and
Greg Hughes and
Robin Degraeve and
Ben Kaczer},
title = {Progressive breakdown in ultrathin SiON dielectrics and its effect
on transistor performance},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {869--874},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.027},
doi = {10.1016/J.MICROREL.2004.10.027},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OConnorHDK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OlneyGGR05,
author = {Andrew Olney and
Brad Gifford and
John Guravage and
Alan W. Righter},
title = {Real-world printed circuit board {ESD} failures},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {287--295},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.016},
doi = {10.1016/J.MICROREL.2004.05.016},
timestamp = {Tue, 11 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OlneyGGR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PajonaALD05,
author = {O. Pajona and
Christelle Aupetit{-}Berthelemot and
R. Lefevre and
Jean{-}Michel Dumas},
title = {Performances and limitations analyses of {PHEMT} and {MHEMT} for applications
in high bit rate fiber-optic systems},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1622--1625},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.084},
doi = {10.1016/J.MICROREL.2005.07.084},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PajonaALD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PalumboCLPTT05,
author = {Felix Palumbo and
G. Condorelli and
Salvatore Lombardo and
Kin Leong Pey and
C. H. Tung and
L. J. Tang},
title = {Structure of the oxide damage under progressive breakdown},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {845--848},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.034},
doi = {10.1016/J.MICROREL.2004.11.034},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PalumboCLPTT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PanCCY05,
author = {C. T. Pan and
P. J. Cheng and
M. F. Chen and
C. K. Yen},
title = {Intermediate wafer level bonding and interface behavior},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {657--663},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.019},
doi = {10.1016/J.MICROREL.2004.10.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PanCCY05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PaskalevaBL05,
author = {Albena Paskaleva and
Anton J. Bauer and
Martin Lemberger},
title = {Conduction mechanisms and an evidence for phonon-assisted conduction
process in thin high-k Hf\({}_{\mbox{x}}\)Ti\({}_{\mbox{y}}\)Si\({}_{\mbox{z}}\)O
films},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1124--1133},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.018},
doi = {10.1016/J.MICROREL.2004.12.018},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PaskalevaBL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PearnL05,
author = {Wen Lea Pearn and
Mou{-}Yuan Liao},
title = {Measuring process capability based on C\({}_{\mbox{PK}}\) with gauge
measurement errors},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {739--751},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.09.005},
doi = {10.1016/J.MICROREL.2004.09.005},
timestamp = {Fri, 18 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PearnL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PecoraMBCMMFY05,
author = {A. Pecora and
Luca Maiolo and
A. Bonfiglietti and
M. Cuscun{\`{a}} and
F. Mecarini and
Luigi Mariucci and
Guglielmo Fortunato and
N. D. Young},
title = {Silicon dioxide deposited by {ECR-PECVD} for low-temperature Si devices
processing},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {879--882},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.09.012},
doi = {10.1016/J.MICROREL.2004.09.012},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PecoraMBCMMFY05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PetitMZSFM05,
author = {Christian Petit and
A. Meinertzhagen and
Damien Zander and
O. Simonetti and
M. Fadlallah and
T. Maurel},
title = {Low voltage {SILC} and {P-} and {N-MOSFET} gate oxide reliability},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {479--485},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.08.002},
doi = {10.1016/J.MICROREL.2004.08.002},
timestamp = {Fri, 17 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PetitMZSFM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PetryVPD05,
author = {J. P{\'{e}}try and
Wilfried Vandervorst and
Luigi Pantisano and
Robin Degraeve},
title = {On the data interpretation of the {C-AFM} measurements in the characterization
of thin insulating layers},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {815--818},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.041},
doi = {10.1016/J.MICROREL.2004.11.041},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PetryVPD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PintusPV05,
author = {Ruggero Pintus and
Simona Podda and
Massimo Vanzi},
title = {Image alignment for 3D reconstruction in a {SEM}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1581--1584},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.063},
doi = {10.1016/J.MICROREL.2005.07.063},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PintusPV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PolonskyBGWS05,
author = {Stas Polonsky and
M. Bhushan and
A. Gattiker and
Alan J. Weger and
Peilin Song},
title = {Photon emission microscopy of inter/intra chip device performance
variations},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1471--1475},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.031},
doi = {10.1016/J.MICROREL.2005.07.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PolonskyBGWS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PomplR05,
author = {Thomas Pompl and
Michael R{\"{o}}hner},
title = {Voltage acceleration of time-dependent breakdown of ultra-thin gate
dielectrics},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1835--1841},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.04.007},
doi = {10.1016/J.MICROREL.2005.04.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PomplR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PostLBHSSWOLD05,
author = {H. A. Post and
P. Letullier and
T. Briolat and
R. Humke and
R. Schuhmann and
K. Saarinen and
W. Werner and
Yves Ousten and
G. Lekens and
A. Dehbi},
title = {Failure mechanisms and qualification testing of passive components},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1626--1632},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.085},
doi = {10.1016/J.MICROREL.2005.07.085},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PostLBHSSWOLD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PrendergastOM05,
author = {James Prendergast and
Eoin O'Driscoll and
Ed Mullen},
title = {Investigation into the correct statistical distribution for oxide
breakdown over oxide thickness range},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {973--977},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.013},
doi = {10.1016/J.MICROREL.2004.11.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PrendergastOM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RadovanovicAN05,
author = {Sasa Radovanovic and
Anne{-}Johan Annema and
Bram Nauta},
title = {Bandwidth of integrated photodiodes in standard {CMOS} for {CD/DVD}
applications},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {705--710},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.09.011},
doi = {10.1016/J.MICROREL.2004.09.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RadovanovicAN05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReddyKMRNRK05,
author = {Vijay Reddy and
Anand T. Krishnan and
Andrew Marshall and
John Rodriguez and
Sreedhar Natarajan and
Tim Rost and
Srikanth Krishnan},
title = {Impact of negative bias temperature instability on digital circuit
reliability},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {31--38},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.023},
doi = {10.1016/J.MICROREL.2004.05.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ReddyKMRNRK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RemmachPDPLND05,
author = {Mustapha Remmach and
A. Pigozzi and
Romain Desplats and
Philippe Perdu and
Dean Lewis and
J. Noel and
Sylvain Dudit},
title = {Light Emission to Time Resolved Emission For {IC} Debug and Failure
Analysis},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1476--1481},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.034},
doi = {10.1016/J.MICROREL.2005.07.034},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RemmachPDPLND05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Rey-TauriacBRBLB05,
author = {Yannick Rey{-}Tauriac and
J. Badoc and
B. Reynard and
Ra{\'{u}}l Andr{\'{e}}s Bianchi and
D. Lachenal and
Alain Bravaix},
title = {Hot-carrier reliability of 20V {MOS} transistors in 0.13 mum {CMOS}
technology},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1349--1354},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.019},
doi = {10.1016/J.MICROREL.2005.07.019},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Rey-TauriacBRBLB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RheeL05,
author = {Se Jong Rhee and
Jack C. Lee},
title = {Threshold voltage instability characteristics of HfO\({}_{\mbox{2}}\)
dielectrics n-MOSFETs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1051--1060},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.01.006},
doi = {10.1016/J.MICROREL.2005.01.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RheeL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RibesBDMHRG05,
author = {G. Ribes and
S. Bruy{\`{e}}re and
M. Denais and
Frederic Monsieur and
Vincent Huard and
David Roy and
G{\'{e}}rard Ghibaudo},
title = {Multi-vibrational hydrogen release: Physical origin of T\({}_{\mbox{bd}}\),
Q\({}_{\mbox{bd}}\) power-law voltage dependence of oxide breakdown
in ultra-thin gate oxides},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1842--1854},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.03.009},
doi = {10.1016/J.MICROREL.2005.03.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RibesBDMHRG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RibesBDRG05,
author = {G. Ribes and
S. Bruy{\`{e}}re and
M. Denais and
David Roy and
G{\'{e}}rard Ghibaudo},
title = {Evidence and modelling current dependence of defect generation probability
and its impact on charge to breakdown},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {841--844},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.035},
doi = {10.1016/J.MICROREL.2004.11.035},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RibesBDRG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RichardFL05,
author = {Isaline Richard and
Romain Fayolle and
Jean{-}Claude Lecomte},
title = {New experimental approach for failure prediction in electronics: Topography
and deformation measurement complemented with acoustic microscopy},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1645--1651},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.071},
doi = {10.1016/J.MICROREL.2005.07.071},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RichardFL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RizviCBL05,
author = {M. J. Rizvi and
Y. C. Chan and
Chris Bailey and
Hua Lu},
title = {Study of anisotropic conductive adhesive joint behavior under 3-point
bending},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {589--596},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.015},
doi = {10.1016/J.MICROREL.2004.10.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RizviCBL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoeschH05,
author = {William J. Roesch and
Dorothy June M. Hamada},
title = {Metal defect yield and reliability relationships},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1875--1881},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.01.015},
doi = {10.1016/J.MICROREL.2005.01.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RoeschH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RolverWFSK05,
author = {R. R{\"{o}}lver and
O. Winkler and
Michael F{\"{o}}rst and
B. Spangenberg and
H. Kurz},
title = {Light emission from Si/SiO\({}_{\mbox{2}}\) superlattices fabricated
by {RPECVD}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {915--918},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.025},
doi = {10.1016/J.MICROREL.2004.11.025},
timestamp = {Sat, 11 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RolverWFSK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RooneyNGS05,
author = {Daniel T. Rooney and
DeePak Nager and
David Geiger and
Dongkai Shanguan},
title = {Evaluation of wire bonding performance, process conditions, and metallurgical
integrity of chip on board wire bonds},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {379--390},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.06.008},
doi = {10.1016/J.MICROREL.2004.06.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RooneyNGS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoyTKC05,
author = {Arijit Roy and
Cher Ming Tan and
Rakesh Kumar and
Xian Tong Chen},
title = {Effect of test condition and stress free temperature on the electromigration
failure of Cu dual damascene submicron interconnect line-via test
structures},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1443--1448},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.042},
doi = {10.1016/J.MICROREL.2005.07.042},
timestamp = {Tue, 27 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RoyTKC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RushworthSKONH05,
author = {Simon A. Rushworth and
L. M. Smith and
Andrew J. Kingsley and
Rajesh Odedra and
R. Nickson and
P. Hughes},
title = {Vapour pressure measurement of low volatility precursors},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {1000--1002},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.007},
doi = {10.1016/J.MICROREL.2004.11.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RushworthSKONH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RyuC05,
author = {Dongsu Ryu and
Seogweon Chang},
title = {Novel concepts for reliability technology},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {611--622},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.010},
doi = {10.1016/J.MICROREL.2004.10.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RyuC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SahaCDNM05,
author = {Anirban Saha and
S. Chattopadhyay and
G. K. Dalapati and
S. K. Nandi and
Chinmay K. Maiti},
title = {An investigation of electrical and structural properties of Ni-germanosilicided
Schottky diode},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1154--1160},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.08.012},
doi = {10.1016/J.MICROREL.2004.08.012},
timestamp = {Tue, 23 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SahaCDNM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SanchezDBPRWL05,
author = {Kevin Sanchez and
Romain Desplats and
Felix Beaudoin and
Philippe Perdu and
J. P. Roux and
G. Woods and
Dean Lewis},
title = {{NIR} laser stimulation for dynamic timing analysis},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1459--1464},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.050},
doi = {10.1016/J.MICROREL.2005.07.050},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SanchezDBPRWL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SanzCCA05,
author = {Maria Teresa Sanz and
Santiago Celma and
Bel{\'{e}}n Calvo and
Juan Pablo Alegre},
title = {{MOS} current divider based {PGA}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {727--732},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.09.008},
doi = {10.1016/J.MICROREL.2004.09.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SanzCCA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Sauter05,
author = {Martin Sauter},
title = {Determination of self-heating and thermal resistance in polycrystalline
and bulk silicon resistors by {DC} measurements},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1187--1193},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.003},
doi = {10.1016/J.MICROREL.2004.12.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Sauter05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchlangenKKB05,
author = {Rudolf Schlangen and
Uwe Kerst and
A. Kabakow and
Christian Boit},
title = {Electrical Performance Evaluation of {FIB} Edited Circuits through
Chip Backside Exposing Shallow Trench Isolations},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1544--1549},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.033},
doi = {10.1016/J.MICROREL.2005.07.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchlangenKKB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchlunderBAGGT05,
author = {Christian Schl{\"{u}}nder and
Ralf Brederlow and
Benno Ankele and
Wolfgang Gustin and
Karl Goser and
Roland Thewes},
title = {Effects of inhomogeneous negative bias temperature stress on p-channel
MOSFETs of analog and {RF} circuits},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {39--46},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.03.017},
doi = {10.1016/J.MICROREL.2004.03.017},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchlunderBAGGT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchramRLDCTHLHV05,
author = {Tom Schram and
L.{-}{\AA}. Ragnarsson and
G. S. Lujan and
W. Deweerd and
J. Chen and
W. Tsai and
K. Henson and
R. J. P. Lander and
J. C. Hooker and
J. Vertommen},
title = {Performance improvement of self-aligned HfO\({}_{\mbox{2}}\)/TaN and
SiON/TaN nMOS transistors},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {779--782},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.050},
doi = {10.1016/J.MICROREL.2004.11.050},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchramRLDCTHLHV05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchwalkeS05,
author = {Udo Schwalke and
Yordan Stefanov},
title = {Process integration and nanometer-scale electrical characterization
of crystalline high-k gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {790--793},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.047},
doi = {10.1016/J.MICROREL.2004.11.047},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SchwalkeS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SeoLKLHY05,
author = {J. Y. Seo and
K. J. Lee and
Y. S. Kim and
S. Y. Lee and
S. J. Hwang and
C. K. Yoon},
title = {Reliability for Recessed Channel Structure n-MOSFET},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1317--1320},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.013},
doi = {10.1016/J.MICROREL.2005.07.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SeoLKLHY05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SeoLLHY05,
author = {J. Y. Seo and
K. J. Lee and
S. Y. Lee and
S. J. Hwang and
C. K. Yoon},
title = {Dielectric reliability of stacked Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)-HfO\({}_{\mbox{2}}\)
{MIS} capacitors with cylinder type for improving {DRAM} data retention
characteristics},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1360--1364},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.021},
doi = {10.1016/J.MICROREL.2005.07.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SeoLLHY05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SerenyiBNKBM05,
author = {M. Ser{\'{e}}nyi and
J. Betko and
{\'{A}}kos Nemcsics and
N. Q. Khanh and
D. K. Basa and
M. Morvic},
title = {Study on the {RF} Sputtered hydrogenated amorphous silicon-germanium
thin films},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1252--1256},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.02.008},
doi = {10.1016/J.MICROREL.2005.02.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SerenyiBNKBM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShimotoBMTMO05,
author = {Tadanori Shimoto and
Kazuhiro Baba and
Koji Matsui and
Jun Tsukano and
Takehiko Maeda and
Kenji Oyachi},
title = {Ultra-thin high-density {LSI} packaging substrate for advanced CSPs
and SiPs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {567--574},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.08.006},
doi = {10.1016/J.MICROREL.2004.08.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShimotoBMTMO05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SiauBCHT05,
author = {Sam Siau and
Johan de Baets and
Andr{\'{e}} Van Calster and
Leon Heremans and
Sammy Tanghe},
title = {Processing quality results for electroless/electroplating of high-aspect
ratio plated through holes in industrially produced printed circuit
boards},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {675--687},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.07.009},
doi = {10.1016/J.MICROREL.2004.07.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SiauBCHT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SibaiLRSADLSAH05,
author = {A. Sibai and
S. Lhostis and
Yoann Rozier and
O. Salicio and
S. Amtablian and
C. Dubois and
J. Legrand and
J. P. S{\'{e}}nateur and
M. Audier and
L. Hubert{-}Pfalzgraff},
title = {Characterization of crystalline {MOCVD} SrTiO\({}_{\mbox{3}}\) films
on SiO\({}_{\mbox{2}}\)/Si(100)},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {941--944},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.020},
doi = {10.1016/J.MICROREL.2004.11.020},
timestamp = {Thu, 02 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SibaiLRSADLSAH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SibileauAGF05,
author = {F. Sibileau and
C. Ali and
C. Giret and
D. Faure},
title = {{SRAM} cell defect isolation methodology by sub micron probing technique},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1562--1567},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.046},
doi = {10.1016/J.MICROREL.2005.07.046},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SibileauAGF05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SicardD05,
author = {Etienne Sicard and
J. M. Dienot},
title = {Issues in electromagnetic compatibility of integrated circuits: emission
and susceptibility},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1277--1284},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.057},
doi = {10.1016/J.MICROREL.2005.07.057},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SicardD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SleeckxSSKDJBA05,
author = {E. Sleeckx and
Marc Schaekers and
X. Shi and
E. Kunnen and
B. Degroote and
M. Jurczak and
Muriel de Potter de ten Broeck and
E. Augendre},
title = {Optimization of low temperature silicon nitride processes for improvement
of device performance},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {865--868},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.028},
doi = {10.1016/J.MICROREL.2004.10.028},
timestamp = {Wed, 13 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SleeckxSSKDJBA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SmetanaRH05,
author = {Walter Smetana and
Roland Reicher and
H. Homolka},
title = {Improving reliability of thick film initiators for automotive applications
based on FE-analyses},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1194--1201},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.016},
doi = {10.1016/J.MICROREL.2004.10.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SmetanaRH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SmithB05,
author = {Jeremy C. Smith and
Gianluca Boselli},
title = {A {MOSFET} power supply clamp with feedback enhanced triggering for
{ESD} protection in advanced {CMOS} technologies},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {201--210},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.008},
doi = {10.1016/J.MICROREL.2004.05.008},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SmithB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SongJKKPKKLK05,
author = {Yoon{-}Jong Song and
Heung{-}Jin Joo and
Seung{-}Kuk Kang and
Hyun{-}Ho Kim and
Jung{-}Hoon Park and
Y. M. Kang and
E. Y. Kang and
Sung{-}Young Lee and
Kinam Kim},
title = {Electrical properties of highly reliable 32Mb {FRAM} with advanced
capacitor technology},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1150--1153},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.08.014},
doi = {10.1016/J.MICROREL.2004.08.014},
timestamp = {Fri, 01 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SongJKKPKKLK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SowarirajSJSMK05,
author = {M. S. B. Sowariraj and
Theo Smedes and
Peter C. de Jong and
Cora Salm and
Ton J. Mouthaan and
Fred G. Kuper},
title = {A 3-D Circuit Model to evaluate {CDM} performance of ICs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1425--1429},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.066},
doi = {10.1016/J.MICROREL.2005.07.066},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SowarirajSJSMK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SozzaDMGD05,
author = {A. Sozza and
Christian Dua and
Erwan Morvan and
Bertrand Grimbert and
Sylvain L. Delage},
title = {A 3000 hours {DC} Life Test on AlGaN/GaN {HEMT} for {RF} and microwave
applications},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1617--1621},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.081},
doi = {10.1016/J.MICROREL.2005.07.081},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SozzaDMGD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SpitaleCCLG05,
author = {Ester Spitale and
D. Corso and
Isodiana Crupi and
Salvatore Lombardo and
Cosimo Gerardi},
title = {Improvement of the {P/E} window in nanocrystal memories by the use
of high-k materials in the control dielectric},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {895--898},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.029},
doi = {10.1016/J.MICROREL.2004.11.029},
timestamp = {Fri, 19 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SpitaleCCLG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stadler05,
author = {Wolfgang Stadler},
title = {Guest editorial},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {199--200},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.007},
doi = {10.1016/J.MICROREL.2004.05.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stadler05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StadlerERZGWWQME05,
author = {Wolfgang Stadler and
Kai Esmark and
K. Reynders and
M. Zubeidat and
Michael Graf and
Wolfgang Wilkening and
J. Willemen and
Ning Qu and
S. Mettler and
M. Etherton},
title = {Test circuits for fast and reliable assessment of {CDM} robustness
of {I/O} stages},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {269--277},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.014},
doi = {10.1016/J.MICROREL.2004.05.014},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StadlerERZGWWQME05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StangoniCF05,
author = {Maria Stangoni and
Mauro Ciappa and
Wolfgang Fichtner},
title = {Assessment of the Analytical Capabilities of Scanning Capacitance
and Scanning Spreading Resistance Microscopy Applied to Semiconductor
Devices},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1532--1537},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.058},
doi = {10.1016/J.MICROREL.2005.07.058},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StangoniCF05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StellariSHTWWT05,
author = {Franco Stellari and
Peilin Song and
John Hryckowian and
Otto A. Torreiter and
Steve Wilson and
Philip Wu and
Alberto Tosi},
title = {Characterization of a 0.13 mum {CMOS} Link Chip using Time Resolved
Emission {(TRE)}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1550--1553},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.062},
doi = {10.1016/J.MICROREL.2005.07.062},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StellariSHTWWT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StockingerMKTWPBAK05,
author = {Michael Stockinger and
James W. Miller and
Michael G. Khazhinsky and
Cynthia A. Torres and
James C. Weldon and
Bryan D. Preble and
Martin J. Bayer and
Matthew D. Akers and
Vishnu G. Kamat},
title = {Advanced rail clamp networks for {ESD} protection},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {211--222},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.009},
doi = {10.1016/J.MICROREL.2004.05.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StockingerMKTWPBAK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StojadinovicDDDMG05,
author = {Ninoslav Stojadinovic and
Danijel Dankovic and
Snezana Djoric{-}Veljkovic and
Vojkan Davidovic and
Ivica Manic and
Snezana Golubovic},
title = {Negative bias temperature instability mechanisms in p-channel power
VDMOSFETs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1343--1348},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.018},
doi = {10.1016/J.MICROREL.2005.07.018},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StojadinovicDDDMG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StojadinovicMDDDGD05,
author = {Ninoslav Stojadinovic and
Ivica Manic and
Vojkan Davidovic and
Danijel Dankovic and
Snezana Djoric{-}Veljkovic and
Snezana Golubovic and
Sima Dimitrijev},
title = {Effects of electrical stressing in power VDMOSFETs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {115--122},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.09.002},
doi = {10.1016/J.MICROREL.2004.09.002},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StojadinovicMDDDGD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev05,
author = {Mile K. Stojcev},
title = {Analog {IP} blocks},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {195--196},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.07.001},
doi = {10.1016/J.MICROREL.2004.07.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev05a,
author = {Mile K. Stojcev},
title = {Layout-mixed-signal},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {197--198},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.07.002},
doi = {10.1016/J.MICROREL.2004.07.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev05a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev05b,
author = {Mile K. Stojcev},
title = {Data communication},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {403--404},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.07.004},
doi = {10.1016/J.MICROREL.2004.07.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev05b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev05c,
author = {Mile K. Stojcev},
title = {Yale N. Patt and Sanjay J. Patel, Introduction to Computing Systems:
From Bits and Gates to {C} and Beyond Second edition, McGraw-Hill
Higher Education, Boston {(2004)} {ISBN} 0-07-121503-4 Softcover,
pp 632, plus {XXIV}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {405--406},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.08.010},
doi = {10.1016/J.MICROREL.2004.08.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev05c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev05d,
author = {Mile K. Stojcev},
title = {Vadim Ivanov, Igor Filanovsky, Operational Amplifier Speed and Accuracy
Improvement: Analog Circuit Design with Structural Methodology, Kluwer
Academic Publishers, Boston, 2004, Hardcover, pp 194, plus XIV, {ISBN}
1-4020-7772-6},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {407--408},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.001},
doi = {10.1016/J.MICROREL.2004.10.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev05d.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev05e,
author = {Mile K. Stojcev},
title = {Testing Static Random Access Memories: Defects, Fault Models and Test
Patterns, Said Hamdioui, Kluwer Academic Publishers, Boston, 2004,
Hardcover, pp 221, plus XX, {ISBN} 1-4020-7752-1},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {1012--1013},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.003},
doi = {10.1016/J.MICROREL.2004.11.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev05e.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev05f,
author = {Mile K. Stojcev},
title = {Behrouz A. Forouzan, Data Communications and Networking Third edition,
McGraw-Hill Higher Education, Boston {(2003)} {ISBN} 0-07-251584-8
Softcover, pp 973, plus {XXXIV}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {1014--1016},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.08.011},
doi = {10.1016/J.MICROREL.2004.08.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev05f.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev05g,
author = {Mile K. Stojcev},
title = {Boris Murmann, Bernhard Boser, Digitally Assisted Pipeline ADCs: Theory
and Implementation, Kluwer Academic Publishers, Boston, 2004, {ISBN}
1-4020-7839-0. Hardcover, pp 155, plus {XX}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {1017--1018},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.09.001},
doi = {10.1016/J.MICROREL.2004.09.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev05g.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev05h,
author = {Mile K. Stojcev},
title = {Carl Hamacher, Zvonko Vranesic, Safwat Zaky, Computer Organization,
Fifth edition, 2004, {ISBN} 0-07-112214-4. Hardcover, pp 805, plus
{XX}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {1019--1020},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.002},
doi = {10.1016/J.MICROREL.2004.10.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev05h.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev05i,
author = {Mile K. Stojcev},
title = {Design of Energy-Efficient Application-Specific Instruction Set Processors
(ASIPs), Tilman Glokler, Heinrich Meyr, Kluwer Academic Publishers,
Boston, 2004, {ISBN} 1-4020-7730-0, Hardcover, pp 234, plus {XX}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1270--1271},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.001},
doi = {10.1016/J.MICROREL.2004.11.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev05i.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev05j,
author = {Mile K. Stojcev},
title = {Digital Computer Arithmetic Datapath Design Using Verilog HDL, James
E. Stine, Kluwer Academic Publishers, Boston, 2004, {ISBN} 1-4020-7710-6.
Hardcover, pp 180, plus {XI}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1272},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.002},
doi = {10.1016/J.MICROREL.2004.11.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev05j.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev05k,
author = {Mile K. Stojcev},
title = {Alberto Leon-Garcia, Indra Widjaja, Communication Networks: Fundamental
Concepts and Key Architectures, Second edition, McGraw Hill Higher
Education, Boston, 2004, {ISBN} 0-07-119848-2. Hardcover, pp 900,
plus {XXVII}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1273--1274},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.003},
doi = {10.1016/J.MICROREL.2004.10.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev05k.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev05l,
author = {Mile K. Stojcev},
title = {{N.G.} Jacobson, The In-System Configuration Handbook: {A} Designer's
Guide to ISC, Kluwer Academic Publishers, Boston, 2004, {ISBN} 1-4020-7655-X.
Hardcover, pp 201, plus {XVII}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1949--1950},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.004},
doi = {10.1016/J.MICROREL.2004.10.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev05l.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev05m,
author = {Mile K. Stojcev},
title = {Gregory A. Matson, Tony R. Taylor, Julie N. Villar, Elements of {STIL:}
Principles and Applications of {IEEE} Std. 1450, Kluwer Academic Publishers,
Boston, 2003, Hardcover, pp 291, plus XIX, {ISBN} 1-4020-7637-1},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1951--1952},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.01.003},
doi = {10.1016/J.MICROREL.2005.01.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev05m.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StreiblZESSGDS05,
author = {Martin Streibl and
Franz Z{\"{a}}ngl and
Kai Esmark and
Robert Schwencker and
Wolfgang Stadler and
Harald Gossner and
S. Dr{\"{u}}en and
Doris Schmitt{-}Landsiedel},
title = {High abstraction level permutational {ESD} concept analysis},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {313--321},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.019},
doi = {10.1016/J.MICROREL.2004.05.019},
timestamp = {Mon, 15 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StreiblZESSGDS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuehleZCB05,
author = {John S. Suehle and
Baozhong Zhu and
Yuan Chen and
Joseph B. Bernstein},
title = {Detailed study and projection of hard breakdown evolution in ultra-thin
gate oxides},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {419--426},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.018},
doi = {10.1016/J.MICROREL.2004.10.018},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SuehleZCB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SunS05,
author = {Weifeng Sun and
Longxing Shi},
title = {Improving the yield and reliability of the bulk-silicon {HV-CMOS}
by adding a P-well},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {185--190},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.08.007},
doi = {10.1016/J.MICROREL.2004.08.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SunS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuszynskiD05,
author = {Zbigniew Suszynski and
Radoslaw Duer},
title = {Photoacoustic inspection of thermal properties of layered structure
with pulse excitations},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1910--1915},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.03.003},
doi = {10.1016/J.MICROREL.2005.03.003},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SuszynskiD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SydloSMH05,
author = {Cezary Sydlo and
Jochen Sigmund and
Bastian Mottet and
Hans L. Hartnagel},
title = {Reliability investigations on LTG-GaAs photomixers for THz generation
based on optical heterodyning},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1600--1604},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.070},
doi = {10.1016/J.MICROREL.2005.07.070},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SydloSMH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanCAC05,
author = {Shyue Seng Tan and
Tupei Chen and
Chew Hoe Ang and
Lap Chan},
title = {Mechanism of nitrogen-enhanced negative bias temperature instability
in pMOSFET},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {19--30},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.02.015},
doi = {10.1016/J.MICROREL.2004.02.015},
timestamp = {Fri, 30 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TanCAC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanCC05,
author = {Shyue Seng Tan and
Tupei Chen and
Lap Chan},
title = {Dynamic {NBTI} lifetime model for inverter-like waveform},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1115--1118},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.01.009},
doi = {10.1016/J.MICROREL.2005.01.009},
timestamp = {Fri, 30 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TanCC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanCLZ05,
author = {Cher Ming Tan and
Joe Chiu and
Robert Liu and
Guan Zhang},
title = {Reliability screening through electrical testing for press-fit alternator
power diode in automotive application},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1723--1727},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.103},
doi = {10.1016/J.MICROREL.2005.07.103},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TanCLZ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanGHCL05,
author = {Cher Ming Tan and
Zhenghao Gan and
Wai Fung Ho and
Sam Chen and
Robert Liu},
title = {Determination of the dice forward {I-V} characteristics of a power
diode from a packaged device and its applications},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {179--184},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.004},
doi = {10.1016/J.MICROREL.2004.05.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TanGHCL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanLCL05,
author = {Cher Ming Tan and
Kim Peng Lim and
Tai Chong Chai and
Guat Cheng Lim},
title = {Non-destructive identification of open circuit in wiring on organic
substrate with high wiring density covered with solder resist},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1572--1575},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.049},
doi = {10.1016/J.MICROREL.2005.07.049},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TanLCL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanRTYL05,
author = {Cher Ming Tan and
Arijit Roy and
Kok Tong Tan and
Derek Sim Kwang Ye and
Frankie Low},
title = {Effect of vacuum break after the barrier layer deposition on the electromigration
performance of aluminum based line interconnects},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1449--1454},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.045},
doi = {10.1016/J.MICROREL.2005.07.045},
timestamp = {Tue, 27 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TanRTYL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TaoM05,
author = {Yi Tao and
Ajay P. Malshe},
title = {Theoretical investigation on hermeticity testing of {MEMS} packages
based on {MIL-STD-883E}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {559--566},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.08.004},
doi = {10.1016/J.MICROREL.2004.08.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TaoM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TazzoliMZ05,
author = {Augusto Tazzoli and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {A novel fast and versatile temperature measurement system for {LDMOS}
transistors},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1742--1745},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.101},
doi = {10.1016/J.MICROREL.2005.07.101},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TazzoliMZ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TokeiLB05,
author = {Zsolt T{\"{o}}kei and
Yunlong Li and
G. P. Beyer},
title = {Reliability challenges for copper low-k dielectrics and copper diffusion
barriers},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1436--1442},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.040},
doi = {10.1016/J.MICROREL.2005.07.040},
timestamp = {Fri, 02 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TokeiLB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TosiSZ05,
author = {Alberto Tosi and
Franco Stellari and
Franco Zappa},
title = {Innovative packaging technique for backside optical testing of wire-bonded
chips},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1493--1498},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.044},
doi = {10.1016/J.MICROREL.2005.07.044},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TosiSZ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TrapesGB05,
author = {C. Trapes and
Didier Goguenheim and
Alain Bravaix},
title = {Experimental extraction of degradation parameters after constant voltage
stress and substrate hot electron injection on ultrathin oxides},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {883--886},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.025},
doi = {10.1016/J.MICROREL.2004.10.025},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TrapesGB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TruongFAS05,
author = {L. Truong and
Y. G. Fedorenko and
V. V. Afanasev and
A. Stesmans},
title = {Admittance spectroscopy of traps at the interfaces of (100)Si with
Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\), ZrO\({}_{\mbox{2}}\), and HfO\({}_{\mbox{2}}\)},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {823--826},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.039},
doi = {10.1016/J.MICROREL.2004.11.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TruongFAS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsangCKESLLW05,
author = {C. F. Tsang and
C. K. Chang and
A. Krishnamoorthy and
K. Y. Ee and
Y. J. Su and
H. Y. Li and
W. H. Li and
L. Y. Wong},
title = {A study of post-etch wet clean on electrical and reliability performance
of Cu/low k interconnections},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {517--525},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.07.007},
doi = {10.1016/J.MICROREL.2004.07.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsangCKESLLW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsujikawaY05,
author = {Shimpei Tsujikawa and
Jiro Yugami},
title = {Positive charge generation due to species of hydrogen during {NBTI}
phenomenon in pMOSFETs with ultra-thin SiON gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {65--69},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.03.018},
doi = {10.1016/J.MICROREL.2004.03.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsujikawaY05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TurchanikovNLCG05,
author = {V. I. Turchanikov and
A. N. Nazarov and
V. S. Lysenko and
Josep Carreras and
B. Garrido},
title = {Charge storage peculiarities in poly-Si-SiO\({}_{\mbox{2}}\)-Si memory
devices with Si nanocrystals rich SiO\({}_{\mbox{2}}\)},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {903--906},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.027},
doi = {10.1016/J.MICROREL.2004.11.027},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TurchanikovNLCG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/UmarjiKPGMA05,
author = {Govind G. Umarji and
Supriya A. Ketkar and
Girish J. Phatak and
V. D. Giramkar and
Uttam P. Mulik and
Dinesh P. Amalnerkar},
title = {An aqueous developable photoimageable silver conductor composition
for high density electronic packaging},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1903--1909},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.03.007},
doi = {10.1016/J.MICROREL.2005.03.007},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/UmarjiKPGMA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/UrrestiHFRCR05,
author = {Jes{\'{u}}s Urresti and
Salvador Hidalgo and
David Flores and
Jaume Roig and
Ignasi Cort{\'{e}}s and
Jos{\'{e}} Rebollo},
title = {Lateral punch-through {TVS} devices for on-chip protection in low-voltage
applications},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1181--1186},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.023},
doi = {10.1016/J.MICROREL.2004.10.023},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/UrrestiHFRCR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/UsuiIHKH05,
author = {Masanori Usui and
Masayasu Ishiko and
Koji Hotta and
Satoshi Kuwano and
Masato Hashimoto},
title = {Effects of uni-axial mechanical stress on {IGBT} characteristics},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1682--1687},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.078},
doi = {10.1016/J.MICROREL.2005.07.078},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/UsuiIHKH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ValdaperezRBCB05,
author = {Nicolas Valdaperez and
Jean{-}Marc Routoure and
Daniel Bloyet and
R{\'{e}}gis Carin and
Serge Bardy},
title = {Size effects on the {DC} characteristics and low frequency noise of
double polysilicon {NPN} bipolar transistors},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1167--1173},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.012},
doi = {10.1016/J.MICROREL.2004.12.012},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ValdaperezRBCB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VamvakasD05,
author = {V. Em. Vamvakas and
D. Davazoglou},
title = {Influence of the annealing temperature on the {IR} properties of SiO\({}_{\mbox{2}}\)
films grown from SiH\({}_{\mbox{4}}\)+O\({}_{\mbox{2}}\)},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {986--989},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.010},
doi = {10.1016/J.MICROREL.2004.11.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VamvakasD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VanstreelsDCDM05,
author = {Kris Vanstreels and
Marc D'Olieslaeger and
Ward De Ceuninck and
Jan D'Haen and
Karen Maex},
title = {A new method for the lifetime determination of submicron metal interconnects
by means of a parallel test structure},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {753--759},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.010},
doi = {10.1016/J.MICROREL.2004.12.010},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VanstreelsDCDM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VashchenkoH05,
author = {Vladislav A. Vashchenko and
P. Hopper},
title = {Bipolar {SCR} {ESD} devices},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {457--471},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.013},
doi = {10.1016/J.MICROREL.2004.12.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VashchenkoH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VasilopoulouDKAD05,
author = {Maria Vasilopoulou and
A. M. Douvas and
D. Kouvatsos and
Panagiotis Argitis and
D. Davazoglou},
title = {Characterization of various insulators for possible use as low-k dielectrics
deposited at temperatures below 200degreeC},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {990--993},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.009},
doi = {10.1016/J.MICROREL.2004.11.009},
timestamp = {Thu, 17 Feb 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VasilopoulouDKAD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VassilevTSWLGNMS05,
author = {Vesselin K. Vassilev and
Steven Thijs and
P. L. Segura and
Piet Wambacq and
Paul Leroux and
Guido Groeseneken and
M. I. Natarajan and
Herman E. Maes and
Michiel Steyaert},
title = {{ESD-RF} co-design methodology for the state of the art {RF-CMOS}
blocks},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {255--268},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.013},
doi = {10.1016/J.MICROREL.2004.05.013},
timestamp = {Tue, 31 Oct 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VassilevTSWLGNMS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VassilevVJGB05,
author = {Vesselin K. Vassilev and
Vladislav A. Vashchenko and
Philippe Jansen and
Guido Groeseneken and
Marcel ter Beek},
title = {{ESD} circuit model based protection network optimisation for extended-voltage
{NMOS} drivers},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1430--1435},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.037},
doi = {10.1016/J.MICROREL.2005.07.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VassilevVJGB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VerzellesiMCZC05,
author = {Giovanni Verzellesi and
Gaudenzio Meneghesso and
Alessandro Chini and
Enrico Zanoni and
Claudio Canali},
title = {DC-to-RF dispersion effects in GaAs- and GaN-based heterostructure
FETs: performance and reliability issues},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1585--1592},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.064},
doi = {10.1016/J.MICROREL.2005.07.064},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VerzellesiMCZC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VeyrieLRPTP05,
author = {David Veyri{\'{e}} and
Djemel Lellouchi and
J.{-}L. Roux and
Francis Pressecq and
Angie Tetelin and
Claude Pellet},
title = {{FTIR} spectroscopy for the hermeticity assessment of micro-cavities},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1764--1769},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.091},
doi = {10.1016/J.MICROREL.2005.07.091},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VeyrieLRPTP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VobeckyK05,
author = {J. Vobeck{\'{y}} and
D. Kolesnikov},
title = {Reliability of Contacts for Press-Pack High-Power Devices},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1676--1681},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.076},
doi = {10.1016/J.MICROREL.2005.07.076},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VobeckyK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Voldman05,
author = {Steven H. Voldman},
title = {A review of latchup and electrostatic discharge {(ESD)} in BiCMOS
{RF} silicon germanium technologies: Part {I} - {ESD}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {323--340},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.017},
doi = {10.1016/J.MICROREL.2004.10.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Voldman05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Voldman05a,
author = {Steven H. Voldman},
title = {A review of {CMOS} latchup and electrostatic discharge {(ESD)} in
bipolar complimentary {MOSFET} (BiCMOS) Silicon Germanium technologies:
Part {II} - Latchup},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {437--455},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.001},
doi = {10.1016/J.MICROREL.2004.12.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Voldman05a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VollertsenM05,
author = {Rolf{-}Peter Vollertsen and
Enrique Miranda},
title = {The {TDDB} power-law model - Physics and experimental evidences},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1807--1808},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.04.005},
doi = {10.1016/J.MICROREL.2005.04.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VollertsenM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VriesDS05,
author = {J. de Vries and
J. van Delft and
C. Slob},
title = {100 mum Pitch flip chip on foil assemblies with adhesive interconnections},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {527--534},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.06.006},
doi = {10.1016/J.MICROREL.2004.06.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VriesDS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wallash05,
author = {Al Wallash},
title = {{ESD} {SPICE} model and measurements for a hard disk drive},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {305--311},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.018},
doi = {10.1016/J.MICROREL.2004.05.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Wallash05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Walraven05,
author = {Jeremy A. Walraven},
title = {Failure Analysis Issues in Microelectromechanical Systems {(MEMS)}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1750--1757},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.088},
doi = {10.1016/J.MICROREL.2005.07.088},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Walraven05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangHG05,
author = {Guotao Wang and
Paul S. Ho and
Steven Groothuis},
title = {Chip-packaging interaction: a critical concern for Cu/low k packaging},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1079--1093},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.008},
doi = {10.1016/J.MICROREL.2004.12.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangHG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangWL05,
author = {Ming{-}Tsong Wang and
Tsung{-}Hong Wang and
Joseph Ya{-}min Lee},
title = {Electrical conduction mechanism in high-dielectric-constant ZrO\({}_{\mbox{2}}\)
thin films},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {969--972},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.014},
doi = {10.1016/J.MICROREL.2004.11.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangWL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangZWL05,
author = {Ying Wang and
Changchun Zhu and
Chunyu Wu and
Junhua Liu},
title = {Improving reliability of beveled power semiconductor devices passivated
by {SIPOS}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {535--539},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.005},
doi = {10.1016/J.MICROREL.2004.10.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangZWL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WarisTLK05,
author = {Tuomas F. Waris and
Markus P. K. Turunen and
Tomi Laurila and
Jorma K. Kivilahti},
title = {Evaluation of electrolessly deposited NiP integral resistors on flexible
polyimide substrate},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {665--673},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.09.003},
doi = {10.1016/J.MICROREL.2004.09.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WarisTLK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WeberSLBLMBBLM05,
author = {U. Weber and
M. Schumacher and
J. Lindner and
O. Boissi{\`{e}}re and
P. Lehnen and
S. Miedl and
P. K. Baumann and
G. Barbar and
C. Lohe and
T. McEntee},
title = {AVD\({}^{\mbox{{\textregistered}}}\) technology for deposition of
next generation devices},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {945--948},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.019},
doi = {10.1016/J.MICROREL.2004.11.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WeberSLBLMBBLM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Weide-ZaageHF05,
author = {Kirsten Weide{-}Zaage and
Walter Horaud and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont},
title = {Moisture diffusion in Printed Circuit Boards: Measurements and Finite-
Element- Simulations},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1662--1667},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.077},
doi = {10.1016/J.MICROREL.2005.07.077},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Weide-ZaageHF05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WeirLSA05,
author = {Bonnie E. Weir and
Che{-}Choi Leung and
Paul J. Silverman and
Muhammad Ashraful Alam},
title = {Gate dielectric breakdown in the time-scale of {ESD} events},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {427--436},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.004},
doi = {10.1016/J.MICROREL.2004.12.004},
timestamp = {Fri, 03 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WeirLSA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WhitmanM05,
author = {Charles S. Whitman and
Michael Meeder},
title = {Determining constant voltage lifetimes for silicon nitride capacitors
in a GaAs {IC} process by a step stress method},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1882--1893},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.01.016},
doi = {10.1016/J.MICROREL.2005.01.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WhitmanM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WolfGSG05,
author = {Heinrich Wolf and
Horst A. Gieser and
Wolfgang Soldner and
Harald Gossner},
title = {A Dedicated {TLP} Set-Up to Investigate the {ESD} Robustness of {RF}
Elements and Circuits},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1421--1424},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.032},
doi = {10.1016/J.MICROREL.2005.07.032},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WolfGSG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WolfGSW05,
author = {Heinrich Wolf and
Horst A. Gieser and
Wolfgang Stadler and
Wolfgang Wilkening},
title = {Capacitively coupled transmission line pulsing cc-TLP--a traceable
and reproducible stress method in the CDM-domain},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {279--285},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.05.015},
doi = {10.1016/J.MICROREL.2004.05.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WolfGSW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WronskiKMD05,
author = {Marek Wronski and
Slawomir Kaminski and
Edward Mis and
Andrzej Dziedzic},
title = {New trim configurations for laser trimmed thick-film resistors - theoretical
analysis, numerical simulation and experimental verification},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1941--1948},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.03.006},
doi = {10.1016/J.MICROREL.2005.03.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WronskiKMD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuS05,
author = {Ernest Y. Wu and
Jordi Su{\~{n}}{\'{e}}},
title = {Power-law voltage acceleration: {A} key element for ultra-thin gate
oxide reliability},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1809--1834},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.04.004},
doi = {10.1016/J.MICROREL.2005.04.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XiaoGYY05,
author = {Enjun Xiao and
P. P. Ghosh and
Chuanzhao Yu and
J. S. Yuan},
title = {Hot carrier and soft breakdown effects on {LNA} performance for ultra
wideband communications},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1382--1385},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.025},
doi = {10.1016/J.MICROREL.2005.07.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XiaoGYY05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YacineFBSCLDBPP05,
author = {K. Yacine and
F. Flourens and
David Bourrier and
Ludovic Salvagnac and
P. Calmont and
Xavier Lafontan and
Q.{-}H. Duong and
Lionel Buchaillot and
D. Peyrou and
Patrick Pons},
title = {Biaxial initial stress characterization of bilayer gold RF-switches},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1776--1781},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.093},
doi = {10.1016/J.MICROREL.2005.07.093},
timestamp = {Mon, 19 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YacineFBSCLDBPP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangKPB05,
author = {J. Yang and
Joseph J. Kopanski and
Adam Postula and
Marek E. Bialkowski},
title = {Experimental investigation of the dielectric-semiconductor interface
with scanning capacitance microscopy},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {887--890},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.030},
doi = {10.1016/J.MICROREL.2004.11.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangKPB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YaoNCL05,
author = {Y. F. Yao and
B. Njoman and
K. H. Chua and
T. Y. Lin},
title = {New encapsulation development for fine pitch {IC} devices},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1222--1229},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.008},
doi = {10.1016/J.MICROREL.2004.10.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YaoNCL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YehL05,
author = {Chang{-}Lin Yeh and
Yi{-}Shao Lai},
title = {Transient analysis of the impact stage of wirebonding on Cu/low-K
wafers},
journal = {Microelectron. Reliab.},
volume = {45},
number = {2},
pages = {371--378},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.04.026},
doi = {10.1016/J.MICROREL.2004.04.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YehL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YoungBZPBBSCLZ05,
author = {Chadwin D. Young and
Gennadi Bersuker and
Yuegang Zhao and
Jeff J. Peterson and
Joel Barnett and
George A. Brown and
Jang H. Sim and
Rino Choi and
Byoung Hun Lee and
Peter Zeitzoff},
title = {Probing stress effects in HfO\({}_{\mbox{2}}\) gate stacks with time
dependent measurements},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {806--810},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.11.043},
doi = {10.1016/J.MICROREL.2004.11.043},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/YoungBZPBBSCLZ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuXY05,
author = {Chuanzhao Yu and
Enjun Xiao and
J. S. Yuan},
title = {Voltage stress-induced hot carrier effects on SiGe {HBT} {VCO}},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1402--1405},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.026},
doi = {10.1016/J.MICROREL.2005.07.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuXY05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuYS05,
author = {Chuanzhao Yu and
J. S. Yuan and
Anwar Sadat},
title = {Dynamic stress-induced high-frequency noise degradations in nMOSFETs},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1794--1799},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.096},
doi = {10.1016/J.MICROREL.2005.07.096},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuYS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Zander05,
author = {D. Zander},
title = {Comparison of interfaces states density through their energy distribution
and {LVSILC} induced by uniform and localized injections in 2.3nm
thick oxides},
journal = {Microelectron. Reliab.},
volume = {45},
number = {5-6},
pages = {891--894},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.10.024},
doi = {10.1016/J.MICROREL.2004.10.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Zander05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZaraskaTLCGPZ05,
author = {Wieslaw Zaraska and
P. Thor and
Marcin Lipinski and
M. Ciez and
Wojciech Grzesiak and
J. Poczatek and
Krzysztof Zaraska},
title = {Design and fabrication of neurostimulator implants - selected problems},
journal = {Microelectron. Reliab.},
volume = {45},
number = {12},
pages = {1930--1934},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.03.004},
doi = {10.1016/J.MICROREL.2005.03.004},
timestamp = {Thu, 25 Feb 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZaraskaTLCGPZ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZemvaZ05,
author = {Andrej Zemva and
Baldomir Zajc},
title = {Test generation for technology-specific multi-faults based on detectable
perturbations},
journal = {Microelectron. Reliab.},
volume = {45},
number = {1},
pages = {163--173},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.04.025},
doi = {10.1016/J.MICROREL.2004.04.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZemvaZ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangML05,
author = {Wenming Zhang and
Guang Meng and
Hongguang Li},
title = {Electrostatic micromotor and its reliability},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1230--1242},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.12.017},
doi = {10.1016/J.MICROREL.2004.12.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangML05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangSHR05,
author = {L. Zhang and
G. Subbarayan and
B. C. Hunter and
D. Rose},
title = {Response surface models for efficient, modular estimation of solder
joint reliability in area array packages},
journal = {Microelectron. Reliab.},
volume = {45},
number = {3-4},
pages = {623--635},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.06.007},
doi = {10.1016/J.MICROREL.2004.06.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangSHR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangWRICZ05,
author = {Xiaowu Zhang and
Ee{-}Hua Wong and
Ranjan Rajoo and
Mahadevan K. Iyer and
J. F. J. M. Caers and
X. J. Zhao},
title = {Development of process modeling methodology for flip chip on flex
interconnections with non-conductive adhesives},
journal = {Microelectron. Reliab.},
volume = {45},
number = {7-8},
pages = {1215--1221},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2004.07.112},
doi = {10.1016/J.MICROREL.2004.07.112},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangWRICZ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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