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@article{DBLP:journals/et/Chakravarty91,
  author       = {Sreejit Chakravarty},
  title        = {A characterization of robust test-pairs for stuck-open faults},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {4},
  pages        = {275--286},
  year         = {1991},
  url          = {https://doi.org/10.1007/BF00136316},
  doi          = {10.1007/BF00136316},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Chakravarty91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/IsmaeelB91,
  author       = {Asad A. Ismaeel and
                  Melvin A. Breuer},
  title        = {The probability of error detection in sequential circuits using random
                  test vectors},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {4},
  pages        = {245--256},
  year         = {1991},
  url          = {https://doi.org/10.1007/BF00136314},
  doi          = {10.1007/BF00136314},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/IsmaeelB91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/Litikov91,
  author       = {I. P. Litikov},
  title        = {Ring-like testing of digital circuits},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {4},
  pages        = {301--304},
  year         = {1991},
  url          = {https://doi.org/10.1007/BF00136318},
  doi          = {10.1007/BF00136318},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Litikov91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/Nicolaidis91,
  author       = {Michael Nicolaidis},
  title        = {Shorts in self-checking circuits},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {4},
  pages        = {257--273},
  year         = {1991},
  url          = {https://doi.org/10.1007/BF00136315},
  doi          = {10.1007/BF00136315},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Nicolaidis91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/TeixeiraTAGG91,
  author       = {Jo{\~{a}}o Paulo Teixeira and
                  Isabel C. Teixeira and
                  Carlos F. Beltr{\'{a}}n Almeida and
                  Fernando M. Gon{\c{c}}alves and
                  J{\'{u}}lio Gon{\c{c}}alves},
  title        = {A methodology for testability enhancement at layout level},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {4},
  pages        = {287--299},
  year         = {1991},
  url          = {https://doi.org/10.1007/BF00136317},
  doi          = {10.1007/BF00136317},
  timestamp    = {Fri, 30 Sep 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/TeixeiraTAGG91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/Agrawal90,
  author       = {Vishwani D. Agrawal},
  title        = {Editorial},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {2},
  pages        = {101},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00137387},
  doi          = {10.1007/BF00137387},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Agrawal90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/AgrawalC90,
  author       = {Vishwani D. Agrawal and
                  Kwang{-}Ting Cheng},
  title        = {Finite state machine synthesis with embedded test function},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {3},
  pages        = {221--228},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00153859},
  doi          = {10.1007/BF00153859},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/AgrawalC90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/Bardell90,
  author       = {Paul H. Bardell},
  title        = {Design considerations for Parallel pseudoRandom Pattern Generators},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {1},
  pages        = {73--87},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00134016},
  doi          = {10.1007/BF00134016},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Bardell90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/BhattacharyaH90,
  author       = {Debashis Bhattacharya and
                  John P. Hayes},
  title        = {A hierarchical test generation methodology for digital circuits},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {2},
  pages        = {103--123},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00137388},
  doi          = {10.1007/BF00137388},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/BhattacharyaH90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/BrzozowskiC90,
  author       = {Janusz A. Brzozowski and
                  Bruce F. Cockburn},
  title        = {Detection of coupling faults in RAMs},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {2},
  pages        = {151--162},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00137391},
  doi          = {10.1007/BF00137391},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/BrzozowskiC90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/CamuratiPR90,
  author       = {Paolo Camurati and
                  Paolo Prinetto and
                  Matteo Sonza Reorda},
  title        = {Exact probabilistic testability measures for multi-output circuits},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {3},
  pages        = {229--234},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00153860},
  doi          = {10.1007/BF00153860},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/CamuratiPR90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/ChengY90,
  author       = {Wu{-}Tung Cheng and
                  Meng{-}Lin Yu},
  title        = {Differential fault simulation for sequential circuits},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {1},
  pages        = {7--13},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00134011},
  doi          = {10.1007/BF00134011},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ChengY90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/Choi90,
  author       = {Yoon{-}Hwa Choi},
  title        = {Distributed diagnosis for homogeneous systems},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {3},
  pages        = {201--211},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00153857},
  doi          = {10.1007/BF00153857},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Choi90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/DevadasMN90,
  author       = {Srinivas Devadas and
                  Hi{-}Keung Tony Ma and
                  A. Richard Newton},
  title        = {Redundancies and don't cares in sequential logic synthesis},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {1},
  pages        = {15--30},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00134012},
  doi          = {10.1007/BF00134012},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/DevadasMN90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/JoneD90,
  author       = {Wen{-}Ben Jone and
                  Sunil R. Das},
  title        = {Multiple-output parity bit signature for exhaustive testing},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {2},
  pages        = {175--178},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00137393},
  doi          = {10.1007/BF00137393},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/JoneD90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/KunduR90,
  author       = {Sandip Kundu and
                  Sudhakar M. Reddy},
  title        = {Robust tests for parity trees},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {3},
  pages        = {191--200},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00938682},
  doi          = {10.1007/BF00938682},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/KunduR90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/KunzmannW90,
  author       = {Arno Kunzmann and
                  Hans{-}Joachim Wunderlich},
  title        = {An analytical approach to the partial scan problem},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {2},
  pages        = {163--174},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00137392},
  doi          = {10.1007/BF00137392},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/KunzmannW90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/MinR90,
  author       = {Hyoung B. Min and
                  William A. Rogers},
  title        = {Search strategy switching: {A} cost model and an analysis of backtracking},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {2},
  pages        = {125--137},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00137389},
  doi          = {10.1007/BF00137389},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/MinR90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/NakazawaNH90,
  author       = {Masahisa Nakazawa and
                  Susumu Nitta and
                  Kanji Hirabayashi},
  title        = {Probabilistic fault grading based on activation checking and observability
                  analysis},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {3},
  pages        = {235--238},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00153861},
  doi          = {10.1007/BF00153861},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/NakazawaNH90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/Rudolph90,
  author       = {Martin Rudolph},
  title        = {Feedback-testing by using multiple input signature registers},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {3},
  pages        = {213--219},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00153858},
  doi          = {10.1007/BF00153858},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/Rudolph90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/SaabMBRA90,
  author       = {Daniel G. Saab and
                  Robert B. Mueller{-}Thuns and
                  David T. Blaauw and
                  Joseph T. Rahmeh and
                  Jacob A. Abraham},
  title        = {Hierarchical multi-level fault simulation of large systems},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {2},
  pages        = {139--149},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00137390},
  doi          = {10.1007/BF00137390},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/SaabMBRA90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/ShenL90,
  author       = {Yinan N. Shen and
                  Fabrizio Lombardi},
  title        = {Yield enhancement and manufacturing throughput of redundant memories
                  by repairability/unrepairability detection},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {1},
  pages        = {43--57},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00134014},
  doi          = {10.1007/BF00134014},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ShenL90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/SunGC90,
  author       = {Jianli Sun and
                  Jan Gecsei and
                  Eduard Cerny},
  title        = {Fault-tolerance in balanced sorting networks},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {1},
  pages        = {31--41},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00134013},
  doi          = {10.1007/BF00134013},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/SunGC90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/TakamatsuK90,
  author       = {Yuzo Takamatsu and
                  Kozo Kinoshita},
  title        = {Extended selection of switching target faults in {CONT} algorithm
                  for test generation},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {3},
  pages        = {183--189},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00153855},
  doi          = {10.1007/BF00153855},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/TakamatsuK90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/et/ZorianA90,
  author       = {Yervant Zorian and
                  Vinod K. Agarwal},
  title        = {Optimizing error masking in {BIST} by output data modification},
  journal      = {J. Electron. Test.},
  volume       = {1},
  number       = {1},
  pages        = {59--71},
  year         = {1990},
  url          = {https://doi.org/10.1007/BF00134015},
  doi          = {10.1007/BF00134015},
  timestamp    = {Fri, 11 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/ZorianA90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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