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@inproceedings{DBLP:conf/latw/AbdennadherTS20,
  author       = {Salem Abdennadher and
                  Kyle Tripician and
                  Senthil Singaravelu},
  title        = {At Speed Testing Challenges and Solutions for 56Gbps and 112Gbps {PAM4}
                  SerDes},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093685},
  doi          = {10.1109/LATS49555.2020.9093685},
  timestamp    = {Tue, 19 May 2020 15:02:50 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/AbdennadherTS20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/Aponte-MorenoIS20,
  author       = {Alexander Aponte{-}Moreno and
                  Jos{\'{e}} Isaza{-}Gonz{\'{a}}lez and
                  Alejandro Serrano{-}Cases and
                  Antonio Mart{\'{\i}}nez{-}{\'{A}}lvarez and
                  Sergio Cuenca{-}Asensi and
                  Felipe Restrepo{-}Calle},
  title        = {An Experimental Comparison of Fault Injection Tools for Microprocessor-based
                  Systems},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093668},
  doi          = {10.1109/LATS49555.2020.9093668},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/Aponte-MorenoIS20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/BadawiABCKLG20,
  author       = {Hassan El Badawi and
                  Florence Aza{\"{\i}}s and
                  Serge Bernard and
                  Mariane Comte and
                  Vincent Kerz{\`{e}}rho and
                  Francois Lefevre and
                  I. Gorenflot},
  title        = {Implementing indirect test of {RF} circuits without compromising test
                  quality: a practical case study},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093666},
  doi          = {10.1109/LATS49555.2020.9093666},
  timestamp    = {Fri, 12 Jun 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/BadawiABCKLG20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/BernalJAC20,
  author       = {Carlos Bernal and
                  Manuel Jim{\'{e}}nez and
                  Chris Aquino and
                  Raul Cedres},
  title        = {A Test Architecture and {VIE} to Characterize Dielectric Absorption
                  in Small Capacitors},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093687},
  doi          = {10.1109/LATS49555.2020.9093687},
  timestamp    = {Tue, 29 Nov 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/BernalJAC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/BordignonS20,
  author       = {Matheus Deon Bordignon and
                  Rodolfo Adamshuk Silva},
  title        = {Mutation Operators for Concurrent Programs in Elixir},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093675},
  doi          = {10.1109/LATS49555.2020.9093675},
  timestamp    = {Tue, 19 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/BordignonS20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/BrendlerZMR20,
  author       = {Leonardo Heitich Brendler and
                  Alexandra L. Zimpeck and
                  Cristina Meinhardt and
                  Ricardo Augusto da Luz Reis},
  title        = {Work-Function Fluctuation Impact on the {SET} Response of FinFET-based
                  Majority Voters},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093679},
  doi          = {10.1109/LATS49555.2020.9093679},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/BrendlerZMR20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/CantoroDRTV20,
  author       = {Riccardo Cantoro and
                  Nikolaos Ioannis Deligiannis and
                  Matteo Sonza Reorda and
                  Marcello Traiola and
                  Emanuele Valea},
  title        = {Evaluating the Code Encryption Effects on Memory Fault Resilience},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093670},
  doi          = {10.1109/LATS49555.2020.9093670},
  timestamp    = {Tue, 07 May 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/CantoroDRTV20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/CopettiMTHPB20,
  author       = {Thiago Copetti and
                  Guilherme Cardoso Medeiros and
                  Mottaqiallah Taouil and
                  Said Hamdioui and
                  Leticia Bolzani Poehls and
                  Tiago R. Balen},
  title        = {Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs
                  with Weak Resistive Defects},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093667},
  doi          = {10.1109/LATS49555.2020.9093667},
  timestamp    = {Tue, 19 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/CopettiMTHPB20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/CostaGVGB20,
  author       = {Bruno L. Costa and
                  Carlos J. Gonz{\'{a}}lez and
                  Rafael Galhardo Vaz and
                  Odair Lelis Gon{\c{c}}alez and
                  Tiago R. Balen},
  title        = {Influence of sampling frequency on {TID} response of {SAR} ADCs},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093691},
  doi          = {10.1109/LATS49555.2020.9093691},
  timestamp    = {Thu, 05 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/CostaGVGB20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/DomingosCSSPL20,
  author       = {Moabe F. Domingos and
                  George H. Castro and
                  Jarbas Silveira and
                  Felipe G. A. e Silva and
                  M. K. D. Pereira and
                  Pedro Lima},
  title        = {{MMS:} {A} Software for Error Monitoring in Memories Protected by
                  {ECC}},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093689},
  doi          = {10.1109/LATS49555.2020.9093689},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/DomingosCSSPL20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/FalcoSMC20,
  author       = {David Ruiz Falc{\'{o}} and
                  Alejandro Serrano{-}Cases and
                  Antonio Mart{\'{\i}}nez{-}{\'{A}}lvarez and
                  Sergio Cuenca{-}Asensi},
  title        = {Soft error reliability predictor based on a Deep Feedforward Neural
                  Network},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093688},
  doi          = {10.1109/LATS49555.2020.9093688},
  timestamp    = {Tue, 29 Dec 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/FalcoSMC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/FerreiraNVGH20,
  author       = {Raphael Segabinazzi Ferreira and
                  J{\"{o}}rg Nolte and
                  Fabian Vargas and
                  Nevin George and
                  Michael H{\"{u}}bner},
  title        = {Run-time Hardware Reconfiguration of Functional Units to Support Mixed-Critical
                  Applications},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093692},
  doi          = {10.1109/LATS49555.2020.9093692},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/FerreiraNVGH20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/FilhoL20,
  author       = {Jo{\~{a}}o Carlos Britto Filho and
                  Marcelo Lubaszewski},
  title        = {A Highly Reliable Wearable Device for Fall Detection},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--7},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093673},
  doi          = {10.1109/LATS49555.2020.9093673},
  timestamp    = {Tue, 19 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/FilhoL20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/GoncalvesACRS20,
  author       = {Marcio Gon{\c{c}}alves and
                  Jos{\'{e}} Rodrigo Azambuja and
                  Josie E. Rodriguez Condia and
                  Matteo Sonza Reorda and
                  Luca Sterpone},
  title        = {Evaluating Software-based Hardening Techniques for General-Purpose
                  Registers on a {GPGPU}},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093682},
  doi          = {10.1109/LATS49555.2020.9093682},
  timestamp    = {Fri, 09 Apr 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/GoncalvesACRS20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/KabinDAKL20,
  author       = {Ievgen Kabin and
                  Zoya Dyka and
                  Marcin Aftowicz and
                  Dan Klann and
                  Peter Langend{\"{o}}rfer},
  title        = {Resistance of the Montgomery kP Algorithm against Simple {SCA:} Theory
                  and Practice},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093678},
  doi          = {10.1109/LATS49555.2020.9093678},
  timestamp    = {Tue, 19 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/KabinDAKL20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/LimaVRASGM20,
  author       = {Pedro Lima and
                  Caio Vieira and
                  Jorge Reis and
                  Alexandre Almeida and
                  Jarbas Silveira and
                  Roger C. Goerl and
                  C{\'{e}}sar A. M. Marcon},
  title        = {Optimizing {RISC-V} {ISA} Usage by Sharing Coprocessors on MPSoC},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093677},
  doi          = {10.1109/LATS49555.2020.9093677},
  timestamp    = {Sat, 09 Apr 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/LimaVRASGM20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/LopesPWSTR20,
  author       = {Israel C. Lopes and
                  Vincent Pouget and
                  Frederic Wrobel and
                  Fr{\'{e}}d{\'{e}}ric Saign{\'{e}} and
                  Antoine D. Touboul and
                  Ketil R{\o}ed},
  title        = {Development and evaluation of a flexible instrumentation layer for
                  system-level testing of radiation effects},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093681},
  doi          = {10.1109/LATS49555.2020.9093681},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/LopesPWSTR20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/MarquesMB20,
  author       = {Cleiton Magano Marques and
                  Cristina Meinhardt and
                  Paulo F. Butzen},
  title        = {Soft Error Reliability of {SRAM} cells during the three operation
                  states},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093684},
  doi          = {10.1109/LATS49555.2020.9093684},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/MarquesMB20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/PerezMVVC20,
  author       = {Zahira Perez and
                  Javier Mesalles and
                  Hector Villacorta and
                  Fabian Vargas and
                  V{\'{\i}}ctor H. Champac},
  title        = {Analysis and detection of hard-to-detect full open defects in FinFET
                  based {SRAM} cells},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093680},
  doi          = {10.1109/LATS49555.2020.9093680},
  timestamp    = {Fri, 03 Sep 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/PerezMVVC20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/PiumattiQRF20,
  author       = {Davide Piumatti and
                  Matteo Vincenzo Quitadamo and
                  Matteo Sonza Reorda and
                  Franco Fiori},
  title        = {Testing Heatsink Faults in Power Transistors by means of Thermal Model},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093674},
  doi          = {10.1109/LATS49555.2020.9093674},
  timestamp    = {Sat, 05 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/PiumattiQRF20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/ReisMZBM20,
  author       = {Ricardo A. L. Reis and
                  Cristina Meinhardt and
                  Alexandra L. Zimpeck and
                  Leonardo Heitich Brendler and
                  Leonardo B. Moraes},
  title        = {Circuit Level Design Methods to Mitigate Soft Errors},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--3},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093683},
  doi          = {10.1109/LATS49555.2020.9093683},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/latw/ReisMZBM20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/SelgJE20,
  author       = {Hardi Selg and
                  Maksim Jenihhin and
                  Peeter Ellervee},
  title        = {Wafer-Level Die Re-Test Success Prediction Using Machine Learning},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093672},
  doi          = {10.1109/LATS49555.2020.9093672},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/SelgJE20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/SiniDV20,
  author       = {Jacopo Sini and
                  M. D'Auria and
                  Massimo Violante},
  title        = {Towards Vehicle-Level Simulator Aided Failure Mode, Effect, and Diagnostic
                  Analysis of Automotive Power Electronics Items},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093694},
  doi          = {10.1109/LATS49555.2020.9093694},
  timestamp    = {Tue, 19 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/SiniDV20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/latw/TchendjouS20,
  author       = {Ghislain Takam Tchendjou and
                  Emmanuel Simeu},
  title        = {Parametric faults detection and concealment on imager with {FPGA}
                  implementation},
  booktitle    = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/LATS49555.2020.9093671},
  doi          = {10.1109/LATS49555.2020.9093671},
  timestamp    = {Tue, 19 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/TchendjouS20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/latw/2020,
  title        = {{IEEE} Latin-American Test Symposium, {LATS} 2020, Maceio, Brazil,
                  March 30 - April 2, 2020},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/9088113/proceeding},
  isbn         = {978-1-7281-8731-0},
  timestamp    = {Tue, 19 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/latw/2020.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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