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@inproceedings{DBLP:conf/itc/AcarOST08,
author = {Erkan Acar and
Sule Ozev and
Ganesh Srinivasan and
Friedrich Taenzler},
editor = {Douglas Young and
Nur A. Touba},
title = {Optimized {EVM} Testing for {IEEE} 802.11a/n {RF} ICs},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700602},
doi = {10.1109/TEST.2008.4700602},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AcarOST08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AchkirZE08,
author = {Brice Achkir and
Pavel Zivny and
Bill Eklow},
editor = {Douglas Young and
Nur A. Touba},
title = {Parametric Testing of Optical Interfaces},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700655},
doi = {10.1109/TEST.2008.4700655},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AchkirZE08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AderholzAR08,
author = {Ernst Aderholz and
Heiko Ahrens and
Michael Rohleder},
editor = {Douglas Young and
Nur A. Touba},
title = {Bridging the gap between Design and Test Engineering for Functional
Pattern Development},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700609},
doi = {10.1109/TEST.2008.4700609},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AderholzAR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgarwalBBKPWYCM08,
author = {Mridul Agarwal and
Varsha Balakrishnan and
Anshuman Bhuyan and
Kyunglok Kim and
Bipul C. Paul and
Wenping Wang and
Bo Yang and
Yu Cao and
Subhasish Mitra},
editor = {Douglas Young and
Nur A. Touba},
title = {Optimized Circuit Failure Prediction for Aging: Practicality and Promise},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700619},
doi = {10.1109/TEST.2008.4700619},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AgarwalBBKPWYCM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AhrensSLSB08,
author = {Heiko Ahrens and
Rolf Schlagenhaft and
Helmut Lang and
V. Srinivasan and
Enrico Bruzzano},
editor = {Douglas Young and
Nur A. Touba},
title = {{DFT} Architecture for Automotive Microprocessors using On-Chip Scan
Compression supporting Dual Vendor {ATPG}},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700600},
doi = {10.1109/TEST.2008.4700600},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AhrensSLSB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Al-ArsHGM08,
author = {Zaid Al{-}Ars and
Said Hamdioui and
Ad J. van de Goor and
Georg Mueller},
editor = {Douglas Young and
Nur A. Touba},
title = {Defect Oriented Testing of the Strap Problem Under Process Variations
in DRAMs},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700631},
doi = {10.1109/TEST.2008.4700631},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Al-ArsHGM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Al-AssadiK08,
author = {Waleed K. Al{-}Assadi and
Sindhu Kakarla},
editor = {Douglas Young and
Nur A. Touba},
title = {Design for Test of Asynchronous {NULL} Convention Logic {(NCL)} Circuits},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700611},
doi = {10.1109/TEST.2008.4700611},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Al-AssadiK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AlaghiSKN08,
author = {Armin Alaghi and
Mahshid Sedghi and
Naghmeh Karimi and
Zainalabedin Navabi},
editor = {Douglas Young and
Nur A. Touba},
title = {NoC Reconfiguration for Utilizing the Largest Fault-free Connected
Sub-structure},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700688},
doi = {10.1109/TEST.2008.4700688},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AlaghiSKN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AlemzadehCRPN08,
author = {Homa Alemzadeh and
Stefano Di Carlo and
Fatemeh Refan and
Paolo Prinetto and
Zainalabedin Navabi},
editor = {Douglas Young and
Nur A. Touba},
title = {"Plug {\&} Test" at System Level via Testable {TLM} Primitives},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700610},
doi = {10.1109/TEST.2008.4700610},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AlemzadehCRPN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AlimohammadFC08,
author = {Amirhossein Alimohammad and
Saeed Fouladi Fard and
Bruce F. Cockburn},
editor = {Douglas Young and
Nur A. Touba},
title = {Hardware-based Error Rate Testing of Digital Baseband Communication
Systems},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700653},
doi = {10.1109/TEST.2008.4700653},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AlimohammadFC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AlmukhaizimS08,
author = {Sobeeh Almukhaizim and
Ozgur Sinanoglu},
editor = {Douglas Young and
Nur A. Touba},
title = {Peak Power Reduction Through Dynamic Partitioning of Scan Chains},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700573},
doi = {10.1109/TEST.2008.4700573},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AlmukhaizimS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AouiniR08,
author = {Sadok Aouini and
Gordon W. Roberts},
editor = {Douglas Young and
Nur A. Touba},
title = {Generating Test Signals for Noise-Based {NPR/ACPR} Type Tests in Production},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700623},
doi = {10.1109/TEST.2008.4700623},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AouiniR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AraiINS08,
author = {Masayuki Arai and
Kazuhiko Iwasaki and
Michinobu Nakao and
Iwao Suzuki},
editor = {Douglas Young and
Nur A. Touba},
title = {Hardware Overhead Reduction for Memory {BIST}},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700690},
doi = {10.1109/TEST.2008.4700690},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AraiINS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BahlSG08,
author = {Swapnil Bahl and
Rajiv Sarkar and
Akhil Garg},
editor = {Douglas Young and
Nur A. Touba},
title = {Low Power Test},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700682},
doi = {10.1109/TEST.2008.4700682},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BahlSG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BastaniCWA08,
author = {Pouria Bastani and
Nicholas Callegari and
Li{-}C. Wang and
Magdy S. Abadir},
editor = {Douglas Young and
Nur A. Touba},
title = {Diagnosis of design-silicon timing mismatch with feature encoding
and importance ranking - the methodology explained},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700588},
doi = {10.1109/TEST.2008.4700588},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BastaniCWA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BernardiMPPA08,
author = {Paolo Bernardi and
Fabio Melchiori and
Davide Pandini and
Santo Pugliese and
Davide Appello},
editor = {Douglas Young and
Nur A. Touba},
title = {Robust Design-for-Productization Practices for High Quality Automotive
Products},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.5483612},
doi = {10.1109/TEST.2008.5483612},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BernardiMPPA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BiswasB08,
author = {Sounil Biswas and
Ronald D. Blanton},
editor = {Douglas Young and
Nur A. Touba},
title = {Improving the Accuracy of Test Compaction through Adaptive Test Update},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700706},
doi = {10.1109/TEST.2008.4700706},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BiswasB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BommuCKS08,
author = {Surendra Bommu and
Kameshwar Chandrasekar and
Rahul Kundu and
Sanjay Sengupta},
editor = {Douglas Young and
Nur A. Touba},
title = {{CONCAT:} CONflict Driven Learning in {ATPG} for Industrial designs},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700566},
doi = {10.1109/TEST.2008.4700566},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BommuCKS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bowhers08,
author = {William J. Bowhers},
editor = {Douglas Young and
Nur A. Touba},
title = {{FPGA} Time Measurement Module: Preliminary Results},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700703},
doi = {10.1109/TEST.2008.4700703},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Bowhers08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ButlerCS08,
author = {Kenneth M. Butler and
John M. Carulli Jr. and
Jayashree Saxena},
editor = {Douglas Young and
Nur A. Touba},
title = {Modeling Test Escape Rate as a Function of Multiple Coverages},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700605},
doi = {10.1109/TEST.2008.4700605},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ButlerCS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CarreteroVCA08,
author = {Javier Carretero and
Xavier Vera and
Pedro Chaparro and
Jaume Abella},
editor = {Douglas Young and
Nur A. Touba},
title = {On-line Failure Detection in Memory Order Buffers},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700582},
doi = {10.1109/TEST.2008.4700582},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CarreteroVCA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChangCHC08,
author = {Chi{-}Min Chang and
Mango Chia{-}Tso Chao and
Rei{-}Fu Huang and
Ding{-}Yuan Chen},
editor = {Douglas Young and
Nur A. Touba},
title = {Testing Methodology of Embedded DRAMs},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700618},
doi = {10.1109/TEST.2008.4700618},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChangCHC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChangK08,
author = {Che{-}Jen Jerry Chang and
Takeo Kobayashi},
editor = {Douglas Young and
Nur A. Touba},
title = {Test Quality Improvement with Timing-aware {ATPG:} Screening small
delay defect case study},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700702},
doi = {10.1109/TEST.2008.4700702},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChangK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenDMGDBCWZCYSGN08,
author = {Liang{-}Chi Chen and
Paul Dickinson and
Prasad Mantri and
Murali M. R. Gala and
Peter Dahlgren and
Subhra Bhattacharya and
Olivier Caty and
Kevin Woodling and
Thomas A. Ziaja and
David Curwen and
Wendy Yee and
Ellen Su and
Guixiang Gu and
Tim Nguyen},
editor = {Douglas Young and
Nur A. Touba},
title = {Transition Test on UltraSPARC- {T2} Microprocessor},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700599},
doi = {10.1109/TEST.2008.4700599},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenDMGDBCWZCYSGN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChickermaneGSYC08,
author = {Vivek Chickermane and
Patrick R. Gallagher Jr. and
James Sage and
Paul Yuan and
Krishna Chakravadhanula},
editor = {Douglas Young and
Nur A. Touba},
title = {A Power-Aware Test Methodology for Multi-Supply Multi-Voltage Designs},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700572},
doi = {10.1109/TEST.2008.4700572},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChickermaneGSYC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChiuL08,
author = {Geng{-}Ming Chiu and
James Chien{-}Mo Li},
editor = {Douglas Young and
Nur A. Touba},
title = {{IEEE} 1500 Compatible Secure Test Wrapper For Embedded {IP} Cores},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700683},
doi = {10.1109/TEST.2008.4700683},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChiuL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Chu08,
author = {Brandon Chu},
editor = {Douglas Young and
Nur A. Touba},
title = {Solder Bead on High Density Interconnect Printed Circuit Board},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--5},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700590},
doi = {10.1109/TEST.2008.4700590},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Chu08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CzyszKLMRT08,
author = {Dariusz Czysz and
Mark Kassab and
Xijiang Lin and
Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer},
editor = {Douglas Young and
Nur A. Touba},
title = {Low Power Scan Shift and Capture in the {EDT} Environment},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700585},
doi = {10.1109/TEST.2008.4700585},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CzyszKLMRT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DSouzaMMRMDAS08,
author = {Jayant D'Souza and
Subramanian Mahadevan and
Nilanjan Mukherjee and
Graham Rhodes and
Jocelyn Moreau and
Thomas Droniou and
Paul Armagnat and
Damien Sartoretti},
editor = {Douglas Young and
Nur A. Touba},
title = {High Test Quality in Low Pin Count Applications},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700700},
doi = {10.1109/TEST.2008.4700700},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DSouzaMMRMDAS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Davidson08,
author = {Scott Davidson},
editor = {Douglas Young and
Nur A. Touba},
title = {Justifying {DFT} with a Hierarchical Top-Down Cost-Benefit Model},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700656},
doi = {10.1109/TEST.2008.4700656},
timestamp = {Tue, 12 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Davidson08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DoegeC08,
author = {Jason Doege and
Alfred L. Crouch},
editor = {Douglas Young and
Nur A. Touba},
title = {The Advantages of Limiting {P1687} to a Restricted Subset},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700643},
doi = {10.1109/TEST.2008.4700643},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DoegeC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DubberkeGD08,
author = {Dave F. Dubberke and
James J. Grealish and
Bill Van Dick},
editor = {Douglas Young and
Nur A. Touba},
title = {Solving In-Circuit Defect Coverage Holes with a Novel Boundary Scan
Application},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700579},
doi = {10.1109/TEST.2008.4700579},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DubberkeGD08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DuttaAPP08,
author = {Amit Dutta and
Srinivasulu Alampally and
V. Prasanth and
Rubin A. Parekhji},
editor = {Douglas Young and
Nur A. Touba},
title = {{DFT} Implementationis for Striking the Right Balance between Test
Cost and Test Quality for Automotive SOCs},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.5483610},
doi = {10.1109/TEST.2008.5483610},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DuttaAPP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Ehrenberg08,
author = {Heiko Ehrenberg},
editor = {Douglas Young and
Nur A. Touba},
title = {{IEEE} {P1581} drastically simplifies connectivity test for memory
devices},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700681},
doi = {10.1109/TEST.2008.4700681},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Ehrenberg08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EichenbergerGHKM08,
author = {Stefan Eichenberger and
Jeroen Geuzebroek and
Camelia Hora and
Bram Kruseman and
Ananta K. Majhi},
editor = {Douglas Young and
Nur A. Touba},
title = {Towards a World Without Test Escapes: The Use of Volume Diagnosis
to Improve Test Quality},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700604},
doi = {10.1109/TEST.2008.4700604},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EichenbergerGHKM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FranchRNHFDWGS08,
author = {Robert L. Franch and
Phillip J. Restle and
James K. Norman and
William V. Huott and
Joshua Friedrich and
R. Dixon and
Steve Weitzel and
K. van Goor and
Gerard Salem},
editor = {Douglas Young and
Nur A. Touba},
title = {On-chip Timing Uncertainty Measurements on {IBM} Microprocessors},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700707},
doi = {10.1109/TEST.2008.4700707},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FranchRNHFDWGS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FritzscheH08,
author = {William Fritzsche and
Asim E. Haque},
editor = {Douglas Young and
Nur A. Touba},
title = {Low cost testing of multi-GBit device pins with {ATE} assisted loopback
instrument},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700558},
doi = {10.1109/TEST.2008.4700558},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FritzscheH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Gattiker08,
author = {Anne Gattiker},
editor = {Douglas Young and
Nur A. Touba},
title = {Unraveling Variability for Process/Product Improvement},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700550},
doi = {10.1109/TEST.2008.4700550},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Gattiker08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GeuzebroekV08,
author = {Jeroen Geuzebroek and
Bart Vermeulen},
editor = {Douglas Young and
Nur A. Touba},
title = {Integration of Hardware Assertions in Systems-on-Chip},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700593},
doi = {10.1109/TEST.2008.4700593},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GeuzebroekV08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GilesWSBW08,
author = {Grady Giles and
Jing Wang and
Anuja Sehgal and
Kedarnath J. Balakrishnan and
James Wingfield},
editor = {Douglas Young and
Nur A. Touba},
title = {Test Access Mechanism for Multiple Identical Cores},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700553},
doi = {10.1109/TEST.2008.4700553},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GilesWSBW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GinezPA08,
author = {Olivier Ginez and
Jean{-}Michel Portal and
Hassen Aziza},
editor = {Douglas Young and
Nur A. Touba},
title = {A High-Speed Structural Method for Testing Address Decoder Faults
in Flash Memories},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700633},
doi = {10.1109/TEST.2008.4700633},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GinezPA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GuoLHC08,
author = {Ruifeng Guo and
Liyang Lai and
Yu Huang and
Wu{-}Tung Cheng},
editor = {Douglas Young and
Nur A. Touba},
title = {Detection and Diagnosis of Static Scan Cell Internal Defect},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700596},
doi = {10.1109/TEST.2008.4700596},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GuoLHC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HillebrechtPEBKC08,
author = {Stefan Hillebrecht and
Ilia Polian and
Piet Engelke and
Bernd Becker and
Martin Keim and
Wu{-}Tung Cheng},
editor = {Douglas Young and
Nur A. Touba},
title = {Extraction, Simulation and Test Generation for Interconnect Open Defects
Based on Enhanced Aggressor-Victim Model},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700642},
doi = {10.1109/TEST.2008.4700642},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HillebrechtPEBKC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HirdW08,
author = {Steve Hird and
Reggie Weng},
editor = {Douglas Young and
Nur A. Touba},
title = {Finding Power/Ground Defects on Connectors - Case Study},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--4},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700591},
doi = {10.1109/TEST.2008.4700591},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HirdW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangCNSG08,
author = {I{-}De Huang and
Yi{-}Shing Chang and
Suriyaprakash Natarajan and
Ramesh Sharma and
Sandeep K. Gupta},
editor = {Douglas Young and
Nur A. Touba},
title = {On Accelerating Path Delay Fault Simulation of Long Test Sequences},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700625},
doi = {10.1109/TEST.2008.4700625},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HuangCNSG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangX08,
author = {Lin Huang and
Qiang Xu},
editor = {Douglas Young and
Nur A. Touba},
title = {Is It Cost-Effective to Achieve Very High Fault Coverage for Testing
Homogeneous SoCs with Core-Level Redundancy?},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700697},
doi = {10.1109/TEST.2008.4700697},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangX08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/InoueLM08,
author = {Hiroaki Inoue and
Yanjing Li and
Subhasish Mitra},
editor = {Douglas Young and
Nur A. Touba},
title = {{VAST:} Virtualization-Assisted Concurrent Autonomous Self-Test},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700583},
doi = {10.1109/TEST.2008.4700583},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/InoueLM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JayaramanFT08,
author = {Dheepakkumaran Jayaraman and
Edward Flanigan and
Spyros Tragoudas},
editor = {Douglas Young and
Nur A. Touba},
title = {Implicit Identification of Non-Robustly Unsensitizable Paths using
Bounded Delay Model},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700626},
doi = {10.1109/TEST.2008.4700626},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JayaramanFT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JiangA08,
author = {Wei Jiang and
Vishwani D. Agrawal},
editor = {Douglas Young and
Nur A. Touba},
title = {Built-in Self-Calibration of On-chip {DAC} and {ADC}},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700638},
doi = {10.1109/TEST.2008.4700638},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JiangA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Jin08,
author = {Le Jin},
editor = {Douglas Young and
Nur A. Touba},
title = {Linearity Test Time Reduction for Analog-to-Digital Converters Using
the Kalman Filter with Experimental Parameter Estimation},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700637},
doi = {10.1109/TEST.2008.4700637},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Jin08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KarimiMJM08,
author = {Naghmeh Karimi and
Michail Maniatakos and
Abhijit Jas and
Yiorgos Makris},
editor = {Douglas Young and
Nur A. Touba},
title = {On the Correlation between Controller Faults and Instruction-Level
Errors in Modern Microprocessors},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700613},
doi = {10.1109/TEST.2008.4700613},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KarimiMJM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KatayamaYHTKSO08,
author = {Akira Katayama and
Tomoaki Yabe and
Osamu Hirabayashi and
Yasuhisa Takeyama and
Keiichi Kushida and
Takahiko Sasaki and
Nobuaki Otsuka},
editor = {Douglas Young and
Nur A. Touba},
title = {Direct Cell-Stability Test Techniques for an {SRAM} Macro with Asymmetric
Cell-Bias-Voltage Modulation},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700616},
doi = {10.1109/TEST.2008.4700616},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KatayamaYHTKSO08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KeezerMDM08,
author = {David C. Keezer and
Dany Minier and
Patrice Ducharme and
A. M. Majid},
editor = {Douglas Young and
Nur A. Touba},
title = {An Electronic Module for 12.8 Gbps Multiplexing and Loopback Test},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700624},
doi = {10.1109/TEST.2008.4700624},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KeezerMDM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KhocheBRP08,
author = {Ajay Khoche and
Phil Burlison and
John Rowe and
Glenn Plowman},
editor = {Douglas Young and
Nur A. Touba},
title = {A Tutorial on {STDF} Fail Datalog Standard},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700654},
doi = {10.1109/TEST.2008.4700654},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KhocheBRP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimBKJK08,
author = {Gyu{-}Yeol Kim and
Eon{-}Jo Byunb and
Ki{-}Sang Kang and
Young{-}Hyun Jun and
Bai{-}Sun Kong},
editor = {Douglas Young and
Nur A. Touba},
title = {Wafer-Level Characterization of Probecards using {NAC} Probing},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700571},
doi = {10.1109/TEST.2008.4700571},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimBKJK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KoKN08,
author = {Ho Fai Ko and
Adam B. Kinsman and
Nicola Nicolici},
editor = {Douglas Young and
Nur A. Touba},
title = {Distributed Embedded Logic Analysis for Post-Silicon Validation of
SOCs},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700594},
doi = {10.1109/TEST.2008.4700594},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KoKN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Komatsu08,
author = {Satoshi Komatsu},
editor = {Douglas Young and
Nur A. Touba},
title = {{VLSI} Test Exercise Courses for Students in {EE} Department},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700689},
doi = {10.1109/TEST.2008.4700689},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Komatsu08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KongPWI08,
author = {Wei Kong and
Paul C. Parries and
G. Wang and
Subramanian S. Iyer},
editor = {Douglas Young and
Nur A. Touba},
title = {Analysis of Retention Time Distribution of Embedded {DRAM} - {A} New
Method to Characterize Across-Chip Threshold Voltage Variation},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700556},
doi = {10.1109/TEST.2008.4700556},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KongPWI08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LarssonZLC08,
author = {Anders Larsson and
Xin Zhang and
Erik Larsson and
Krishnendu Chakrabarty},
editor = {Douglas Young and
Nur A. Touba},
title = {{SOC} Test Optimization with Compression-Technique Selection},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700685},
doi = {10.1109/TEST.2008.4700685},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LarssonZLC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeM08,
author = {Jaekwang Lee and
Edward J. McCluskey},
editor = {Douglas Young and
Nur A. Touba},
title = {Failing Frequency Signature Analysis},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700561},
doi = {10.1109/TEST.2008.4700561},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeT08,
author = {Jeremy Lee and
Mohammad Tehranipoor},
editor = {Douglas Young and
Nur A. Touba},
title = {A Novel Pattern Generation Framework for Inducing Maximum Crosstalk
Effects on Delay-Sensitive Paths},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700641},
doi = {10.1109/TEST.2008.4700641},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Li08,
author = {Mike P. Li},
editor = {Douglas Young and
Nur A. Touba},
title = {Jitter and Signal Integrity Verification for Synchronous and Asynchronous
I/Os at Multiple to 10 GHz/Gbps},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700649},
doi = {10.1109/TEST.2008.4700649},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Li08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinHLHCCC08,
author = {Chung{-}Fu Lin and
Chia{-}Fu Huang and
De{-}Chung Lu and
Chih{-}Chiang Hsu and
Wen{-}Tsung Chiu and
Yu{-}Wei Chen and
Yeong{-}Jar Chang},
editor = {Douglas Young and
Nur A. Touba},
title = {A Low-Cost Programmable Memory {BIST} Design for Multiple Memory Instances},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700691},
doi = {10.1109/TEST.2008.4700691},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinHLHCCC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinPBNLI08,
author = {Yen{-}Tzu Lin and
Osei Poku and
Ronald D. Blanton and
Phil Nigh and
Peter Lloyd and
Vikram Iyengar},
editor = {Douglas Young and
Nur A. Touba},
title = {Evaluating the Effectiveness of Physically-Aware N-Detect Test using
Real Silicon},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700606},
doi = {10.1109/TEST.2008.4700606},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinPBNLI08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinR08,
author = {Xijiang Lin and
Janusz Rajski},
editor = {Douglas Young and
Nur A. Touba},
title = {Test Generation for Interconnect Opens},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700640},
doi = {10.1109/TEST.2008.4700640},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinWLCTHT08,
author = {Hsiu{-}Ting Lin and
Jen{-}Yang Wen and
James Li and
Ming{-}Tung Chang and
Min{-}Hsiu Tsai and
Sheng{-}Chih Huang and
Chili{-}Mou Tseng},
editor = {Douglas Young and
Nur A. Touba},
title = {Capture and Shift Toggle Reduction {(CASTR)} {ATPG} to Minimize Peak
Power Supply Noise},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700701},
doi = {10.1109/TEST.2008.4700701},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinWLCTHT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuTLL08,
author = {Wei{-}Chih Liu and
Wei{-}Lin Tsai and
Hsiu{-}Ting Lin and
James Chien{-}Mo Li},
editor = {Douglas Young and
Nur A. Touba},
title = {Diagnosis of Logic-to-chain Bridging Faults},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700695},
doi = {10.1109/TEST.2008.4700695},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuTLL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuYX08,
author = {Xiao Liu and
Feng Yuan and
Qiang Xu},
editor = {Douglas Young and
Nur A. Touba},
title = {A Generic Framework for Scan Capture Power Reduction in Test Compression
Environment},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700699},
doi = {10.1109/TEST.2008.4700699},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuYX08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lydon08,
author = {Mike Lydon},
editor = {Douglas Young and
Nur A. Touba},
title = {Managing Test in the End-to-End, Mega Supply Chain},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700540},
doi = {10.1109/TEST.2008.4700540},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lydon08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaLT08,
author = {Junxia Ma and
Jeremy Lee and
Mohammad Tehranipoor},
editor = {Douglas Young and
Nur A. Touba},
title = {Power Distribution Failure Analysis Using Transition-Delay Fault Patterns},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700696},
doi = {10.1109/TEST.2008.4700696},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaLT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Maeda08,
author = {Akinori Maeda},
editor = {Douglas Young and
Nur A. Touba},
title = {A Method to Generate a Very Low Distortion, High Frequency Sine Waveform
Using an {AWG}},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700607},
doi = {10.1109/TEST.2008.4700607},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Maeda08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MajzoobiKP08,
author = {Mehrdad Majzoobi and
Farinaz Koushanfar and
Miodrag Potkonjak},
editor = {Douglas Young and
Nur A. Touba},
title = {Testing Techniques for Hardware Security},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700636},
doi = {10.1109/TEST.2008.4700636},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MajzoobiKP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Mak08,
author = {T. M. Mak},
editor = {Douglas Young and
Nur A. Touba},
title = {Jitters in high performance microprocessors},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700650},
doi = {10.1109/TEST.2008.4700650},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Mak08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MalianE08,
author = {John Malian and
Bill Eklow},
editor = {Douglas Young and
Nur A. Touba},
title = {Embedded Testing in an In-Circuit Test Environment},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700652},
doi = {10.1109/TEST.2008.4700652},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MalianE08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaoDC08,
author = {Vincent Mao and
Chris Dwyer and
Krishnendu Chakrabarty},
editor = {Douglas Young and
Nur A. Touba},
title = {Fabrication Defects and Fault Models for {DNA} Self-Assembled Nanoelectronics},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700634},
doi = {10.1109/TEST.2008.4700634},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaoDC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MargulisAWM08,
author = {Arie Margulis and
David Akselrod and
Tim Wood and
Sopho Metsis},
editor = {Douglas Young and
Nur A. Touba},
title = {Platform Independent Test Access Port Architecture},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700687},
doi = {10.1109/TEST.2008.4700687},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MargulisAWM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MeixnerKPB08,
author = {Anne Meixner and
Akira Kakizawa and
Benoit Provost and
Serge Bedwani},
editor = {Douglas Young and
Nur A. Touba},
title = {External Loopback Testing Experiences with High Speed Serial Interfaces},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700557},
doi = {10.1109/TEST.2008.4700557},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MeixnerKPB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MerentitisKPG08,
author = {Andreas Merentitis and
Nektarios Kranitis and
Antonis M. Paschalis and
Dimitris Gizopoulos},
editor = {Douglas Young and
Nur A. Touba},
title = {Low Energy On-Line {SBST} of Embedded Processors},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700581},
doi = {10.1109/TEST.2008.4700581},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MerentitisKPG08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MirzaeianZC08,
author = {Saeed Mirzaeian and
Feijun (Frank) Zheng and
Kwang{-}Ting (Tim) Cheng},
editor = {Douglas Young and
Nur A. Touba},
title = {{RTL} Error Diagnosis Using a Word-Level SAT-Solver},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700568},
doi = {10.1109/TEST.2008.4700568},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MirzaeianZC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MooreMSRWBRFS08,
author = {Brian Moore and
Marc Mangrum and
Chris Sellathamby and
Md. Mahbub Reja and
T. Weng and
Brenda Bai and
Edwin Walter Reid and
Igor M. Filanovsky and
Steven Slupsky},
editor = {Douglas Young and
Nur A. Touba},
title = {Non-contact Testing for SoC and {RCP} (SIPs) at Advanced Nodes},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700612},
doi = {10.1109/TEST.2008.4700612},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MooreMSRWBRFS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MoreiraBKCRC08,
author = {Jose Moreira and
Heidi Barnes and
Hiroshi Kaga and
Michael Comai and
Bernhard Roth and
Morgan Culver},
editor = {Douglas Young and
Nur A. Touba},
title = {Beyond 10 Gbps? Challenges of Characterizing Future {I/O} Interfaces
with Automated Test Equipment},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700651},
doi = {10.1109/TEST.2008.4700651},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MoreiraBKCRC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MukherjeePRT08,
author = {Nilanjan Mukherjee and
Artur Pogiel and
Janusz Rajski and
Jerzy Tyszer},
editor = {Douglas Young and
Nur A. Touba},
title = {High Throughput Diagnosis via Compression of Failure Data in Embedded
Memory {BIST}},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700554},
doi = {10.1109/TEST.2008.4700554},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MukherjeePRT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MullaneHM08,
author = {Brendan Mullane and
Michael Higgins and
Ciaran MacNamee},
editor = {Douglas Young and
Nur A. Touba},
title = {{IEEE} 1500 Core Wrapper Optimization Techniques and Implementation},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700629},
doi = {10.1109/TEST.2008.4700629},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MullaneHM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Nadeau-DostieTC08,
author = {Benoit Nadeau{-}Dostie and
Kiyoshi Takeshita and
Jean{-}Francois Cote},
editor = {Douglas Young and
Nur A. Touba},
title = {Power-Aware At-Speed Scan Test Methodology for Circuits with Synchronous
Clocks},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700574},
doi = {10.1109/TEST.2008.4700574},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Nadeau-DostieTC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NagarajK08,
author = {Kelageri Nagaraj and
Sandip Kundu},
editor = {Douglas Young and
Nur A. Touba},
title = {An Automatic Post Silicon Clock Tuning System for Improving System
Performance based on Tester Measurements},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700565},
doi = {10.1109/TEST.2008.4700565},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NagarajK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NamCKKMLJKKSKK08,
author = {Junghyun Nam and
Sunghoon Chun and
Gibum Koo and
Yanggi Kim and
Byungsoo Moon and
Jonghyoung Lim and
Jaehoon Joo and
Sangseok Kang and
Hoonjung Kim and
Kyeongseon Shin and
Kisang Kang and
Sungho Kang},
editor = {Douglas Young and
Nur A. Touba},
title = {A New Wafer Level Latent Defect Screening Methodology for Highly Reliable
{DRAM} Using a Response Surface Method},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700632},
doi = {10.1109/TEST.2008.4700632},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NamCKKMLJKKSKK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NatarajanCLSC08,
author = {Vishwanath Natarajan and
Hyun Woo Choi and
Deuk Lee and
Rajarajan Senguttuvan and
Abhijit Chatterjee},
editor = {Douglas Young and
Nur A. Touba},
title = {{EVM} Testing of Wireless {OFDM} Transceivers Using Intelligent Back-End
Digital Signal Processing Algorithms},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700603},
doi = {10.1109/TEST.2008.4700603},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NatarajanCLSC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NepalADB08,
author = {Kundan Nepal and
Nuno Alves and
Jennifer Dworak and
R. Iris Bahar},
editor = {Douglas Young and
Nur A. Touba},
title = {Using Implications for Online Error Detection},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700614},
doi = {10.1109/TEST.2008.4700614},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NepalADB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NeyBDGPVB08,
author = {Alexandre Ney and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Arnaud Virazel and
Magali Bastian},
editor = {Douglas Young and
Nur A. Touba},
title = {A History-Based Diagnosis Technique for Static and Dynamic Faults
in SRAMs},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700555},
doi = {10.1109/TEST.2008.4700555},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NeyBDGPVB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NirmaierZLSRS08,
author = {Thomas Nirmaier and
Jose Torres Zaguirre and
Eric Liau and
Wolfgang Spirkl and
Armin Rettenberger and
Doris Schmitt{-}Landsiedel},
editor = {Douglas Young and
Nur A. Touba},
title = {Efficient High-Speed Interface Verification and Fault Analysis},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700559},
doi = {10.1109/TEST.2008.4700559},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NirmaierZLSRS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NorrgardP08,
author = {Dayton Norrgard and
Kenneth P. Parker},
editor = {Douglas Young and
Nur A. Touba},
title = {Augmenting Boundary-Scan Tests for Enhanced Defect Coverage},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700580},
doi = {10.1109/TEST.2008.4700580},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NorrgardP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NounCFAB08,
author = {Ziad Noun and
Philippe Cauvet and
Marie{-}Lise Flottes and
David Andreu and
Serge Bernard},
editor = {Douglas Young and
Nur A. Touba},
title = {Wireless Test Structure for Integrated Systems},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700704},
doi = {10.1109/TEST.2008.4700704},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NounCFAB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ONeill08,
author = {Peter M. O'Neill},
editor = {Douglas Young and
Nur A. Touba},
title = {Production Multivariate Outlier Detection Using Principal Components},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700549},
doi = {10.1109/TEST.2008.4700549},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ONeill08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ParkM08,
author = {Intaik Park and
Edward J. McCluskey},
editor = {Douglas Young and
Nur A. Touba},
title = {Launch-on-Shift-Capture Transition Tests},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700648},
doi = {10.1109/TEST.2008.4700648},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ParkM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ParkerJ08,
author = {Kenneth P. Parker and
Neil G. Jacobson},
editor = {Douglas Young and
Nur A. Touba},
title = {Boundary-Scan Testing of Power/Ground Pins},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700628},
doi = {10.1109/TEST.2008.4700628},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ParkerJ08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ParulkarAALRCP08,
author = {Ishwar Parulkar and
Sriram Anandakumar and
Gaurav Agarwal and
Gordon Liu and
Krishna Rajan and
Frank Chiu and
Rajesh Pendurkar},
editor = {Douglas Young and
Nur A. Touba},
title = {{DFX} of a 3\({}^{\mbox{rd}}\) Generation, 16-core/32-thread UltraSPARC-
{CMT} Microprocessor},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700552},
doi = {10.1109/TEST.2008.4700552},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ParulkarAALRCP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pease08,
author = {Robert A. Pease},
editor = {Douglas Young and
Nur A. Touba},
title = {Having {FUN} with Analog Test},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700542},
doi = {10.1109/TEST.2008.4700542},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pease08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PhamCSCTMS08,
author = {Tung N. Pham and
Frances Clougherty and
Gerard Salem and
James M. Crafts and
Jon Tetzloff and
Pamela Moczygemba and
Timothy M. Skergan},
editor = {Douglas Young and
Nur A. Touba},
title = {Functional Test and Speed/Power Sorting of the {IBM} {POWER6} and
{Z10} Processors},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700598},
doi = {10.1109/TEST.2008.4700598},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PhamCSCTMS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PhelpsJGK08,
author = {Jonathan Phelps and
Chuck Johnson and
Corey Goodrich and
Aman Kokrady},
editor = {Douglas Young and
Nur A. Touba},
title = {The Importance of Functional-Like Access for Memory Test},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700692},
doi = {10.1109/TEST.2008.4700692},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PhelpsJGK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PortolanGTCCC08,
author = {Michele Portolan and
Suresh Goyal and
Bradford G. Van Treuren and
Chen{-}Huan Chiang and
Tapan J. Chakraborty and
Thomas B. Cook},
editor = {Douglas Young and
Nur A. Touba},
title = {A New Language Approach for {IJTAG}},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700644},
doi = {10.1109/TEST.2008.4700644},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PortolanGTCCC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rabaey08,
author = {Jan M. Rabaey},
editor = {Douglas Young and
Nur A. Touba},
title = {Computing at the Crossroads (And What Does it Mean to Verification
and Test?)},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700541},
doi = {10.1109/TEST.2008.4700541},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Rabaey08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Raina08,
author = {Rajesh Raina},
editor = {Douglas Young and
Nur A. Touba},
title = {Achieving Zero-Defects for Automotive Applications},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.5483611},
doi = {10.1109/TEST.2008.5483611},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Raina08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rearick08,
author = {Jeff Rearick},
editor = {Douglas Young and
Nur A. Touba},
title = {This is a Test: How to Tell if {DFT} and Test Are Adding Value to
Your Company},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700543},
doi = {10.1109/TEST.2008.4700543},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Rearick08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rodriguez-MontanesAFEHK08,
author = {Rosa Rodr{\'{\i}}guez{-}Monta{\~{n}}{\'{e}}s and
Daniel Arum{\'{\i}} and
Joan Figueras and
Stefan Eichenberger and
Camelia Hora and
Bram Kruseman},
editor = {Douglas Young and
Nur A. Touba},
title = {Time-dependent Behaviour of Full Open Defects in Interconnect Lines},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700575},
doi = {10.1109/TEST.2008.4700575},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Rodriguez-MontanesAFEHK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchneiderS08,
author = {Myron Schneider and
Ayub Shafi},
editor = {Douglas Young and
Nur A. Touba},
title = {Engineering Test Coverage on Complex Sockets},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700578},
doi = {10.1109/TEST.2008.4700578},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SchneiderS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sde-PazS08,
author = {Shlomi Sde{-}Paz and
Eyal Salomon},
editor = {Douglas Young and
Nur A. Touba},
title = {Frequency and Power Correlation between At-Speed Scan and Functional
Tests},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700586},
doi = {10.1109/TEST.2008.4700586},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sde-PazS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShamshiriLPC08,
author = {Saeed Shamshiri and
Peter Lisherness and
Sung{-}Jui (Song{-}Ra) Pan and
Kwang{-}Ting Cheng},
editor = {Douglas Young and
Nur A. Touba},
title = {A Cost Analysis Framework for Multi-core Systems with Spares},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700562},
doi = {10.1109/TEST.2008.4700562},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShamshiriLPC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SharmaBLALKTCTCLM08,
author = {Manish Sharma and
Brady Benware and
Lei Ling and
David Abercrombie and
Lincoln Lee and
Martin Keim and
Huaxing Tang and
Wu{-}Tung Cheng and
Ting{-}Pu Tai and
Yi{-}Jung Chang and
Reinhart Lin and
Albert Mann},
editor = {Douglas Young and
Nur A. Touba},
title = {Efficiently Performing Yield Enhancements by Identifying Dominant
Physical Root Cause from Test Fail Data},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700589},
doi = {10.1109/TEST.2008.4700589},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SharmaBLALKTCTCLM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShazliATK08,
author = {Syed Zafar Shazli and
Mohammed A. Abdul{-}Aziz and
Mehdi Baradaran Tahoori and
David R. Kaeli},
editor = {Douglas Young and
Nur A. Touba},
title = {A Field Analysis of System-level Effects of Soft Errors Occurring
in Microprocessors used in Information Systems},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700615},
doi = {10.1109/TEST.2008.4700615},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShazliATK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sinanoglu08,
author = {Ozgur Sinanoglu},
editor = {Douglas Young and
Nur A. Touba},
title = {Align-Encode: Improving the Encoding Capability of Test Stimulus Decompressors},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700647},
doi = {10.1109/TEST.2008.4700647},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sinanoglu08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Singh08,
author = {Adit D. Singh},
editor = {Douglas Young and
Nur A. Touba},
title = {Scan Based Testing of Dual/Multi Core Processors for Small Delay Defects},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700563},
doi = {10.1109/TEST.2008.4700563},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Singh08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SongISSDSMJKS08,
author = {Peilin Song and
Stephen Ippolito and
Franco Stellari and
John Sylvestri and
Tim Diemoz and
George Smith and
Paul Muench and
Norm James and
Seongwon Kim and
Hector Saenz},
editor = {Douglas Young and
Nur A. Touba},
title = {Optical Diagnostics for {IBM} {POWER6-} Microprocessor},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700597},
doi = {10.1109/TEST.2008.4700597},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SongISSDSMJKS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SongJLJKP08,
author = {Jaehoon Song and
Taejin Jung and
Junseop Lee and
Hyeran Jeong and
Byeongjin Kim and
Sungju Park},
editor = {Douglas Young and
Nur A. Touba},
title = {An Efficient Secure Scan Design for an SoC Embedding {AES} Core},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700693},
doi = {10.1109/TEST.2008.4700693},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SongJLJKP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SouefEA08,
author = {Laurent Souef and
Christophe Eychenne and
Emmanuel Alie},
editor = {Douglas Young and
Nur A. Touba},
title = {Architecture for Testing Multi-Voltage Domain {SOC}},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700592},
doi = {10.1109/TEST.2008.4700592},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SouefEA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SreedharK08,
author = {Aswin Sreedhar and
Sandip Kundu},
editor = {Douglas Young and
Nur A. Touba},
title = {Statistical Yield Modeling for Sub-wavelength Lithography},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700576},
doi = {10.1109/TEST.2008.4700576},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SreedharK08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SrinivasanCT08,
author = {Ganesh Srinivasan and
Hui{-}Chuan Chao and
Friedrich Taenzler},
editor = {Douglas Young and
Nur A. Touba},
title = {Octal-Site {EVM} Tests for {WLAN} Transceivers on "Very" Low-Cost
{ATE} Platforms},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700601},
doi = {10.1109/TEST.2008.4700601},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SrinivasanCT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StewartA08,
author = {John Stewart and
Temitope Animashaun},
editor = {Douglas Young and
Nur A. Touba},
title = {Overview of a High Speed Top Side Socket Solution},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700705},
doi = {10.1109/TEST.2008.4700705},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StewartA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TakeuchiTMYKS08,
author = {Kan Takeuchi and
Genichi Tanaka and
Hiroaki Matsushita and
Kenichi Yoshizumi and
Yusaku Katsuki and
Takao Sato},
editor = {Douglas Young and
Nur A. Touba},
title = {Observations of Supply-Voltage-Noise Dispersion in Sub-nsec},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700621},
doi = {10.1109/TEST.2008.4700621},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TakeuchiTMYKS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Tamba08,
author = {Mamoru Tamba},
editor = {Douglas Young and
Nur A. Touba},
title = {A Hybrid {A/D} Converter with 120dB {SNR} and -125dB {THD}},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700622},
doi = {10.1109/TEST.2008.4700622},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Tamba08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TayadeA08,
author = {Rajeshwary Tayade and
Jacob A. Abraham},
editor = {Douglas Young and
Nur A. Touba},
title = {On-chip Programmable Capture for Accurate Path Delay Test and Characterization},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700564},
doi = {10.1109/TEST.2008.4700564},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TayadeA08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Treuren08,
author = {Bradford G. Van Treuren},
editor = {Douglas Young and
Nur A. Touba},
title = {System {JTAG} Initiative Group Advancements},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700698},
doi = {10.1109/TEST.2008.4700698},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Treuren08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TreurenCH08,
author = {Bradford G. Van Treuren and
Chen{-}Huan Chiang and
Kenneth Honaker},
editor = {Douglas Young and
Nur A. Touba},
title = {Problems Using Boundary-Scan for Memory Cluster Tests},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700645},
doi = {10.1109/TEST.2008.4700645},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TreurenCH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsengL08,
author = {Tsu{-}Wei Tseng and
Jin{-}Fu Li},
editor = {Douglas Young and
Nur A. Touba},
title = {A Shared Parallel Built-In Self-Repair Scheme for Random Access Memories
in SOCs},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700617},
doi = {10.1109/TEST.2008.4700617},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TsengL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Ungar08,
author = {Louis Y. Ungar},
editor = {Douglas Young and
Nur A. Touba},
title = {The Economics of Harm Prevention through Design for Testability},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700657},
doi = {10.1109/TEST.2008.4700657},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Ungar08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VialBGLPV08,
author = {Julien Vial and
Alberto Bosio and
Patrick Girard and
Christian Landrault and
Serge Pravossoudovitch and
Arnaud Virazel},
editor = {Douglas Young and
Nur A. Touba},
title = {SoC Yield Improvement: Redundant Architectures to the Rescue?},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700686},
doi = {10.1109/TEST.2008.4700686},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VialBGLPV08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VijR08,
author = {Anjali Vij and
Richard Ratliff},
editor = {Douglas Young and
Nur A. Touba},
title = {Implementation Update: Logic Mapping On {SPARC-} Microprocessors},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700560},
doi = {10.1109/TEST.2008.4700560},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VijR08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VikinskiLSC08,
author = {Omer Vikinski and
Shaul Lupo and
Gregory Sizikov and
Chee Yee Chung},
editor = {Douglas Young and
Nur A. Touba},
title = {Embedded Power Delivery Decoupling in Small Form Factor Test Sockets},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700569},
doi = {10.1109/TEST.2008.4700569},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VikinskiLSC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WagenenVT08,
author = {Bethany Van Wagenen and
Jon Vollmar and
Dan Thornton},
editor = {Douglas Young and
Nur A. Touba},
title = {Leveraging {IEEE} 1641 for Tester-Independent {ATE} Software},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700608},
doi = {10.1109/TEST.2008.4700608},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WagenenVT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangAWSLWJYWCGLNSWL08,
author = {Laung{-}Terng Wang and
Ravi Apte and
Shianling Wu and
Boryau Sheu and
Kuen{-}Jong Lee and
Xiaoqing Wen and
Wen{-}Ben Jone and
Chia{-}Hsien Yeh and
Wei{-}Shin Wang and
Hao{-}Jan Chao and
Jianghao Guo and
Jinsong Liu and
Yanlong Niu and
Yi{-}Chih Sung and
Chi{-}Chun Wang and
Fangfang Li},
editor = {Douglas Young and
Nur A. Touba},
title = {Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the
{IEEE} 1500 Standard},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700630},
doi = {10.1109/TEST.2008.4700630},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangAWSLWJYWCGLNSWL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangHLLYH08,
author = {Fei Wang and
Yu Hu and
Huawei Li and
Xiaowei Li and
Jing Ye and
Yu Huang},
editor = {Douglas Young and
Nur A. Touba},
title = {Deterministic Diagnostic Pattern Generation {(DDPG)} for Compound
Defects},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700587},
doi = {10.1109/TEST.2008.4700587},
timestamp = {Mon, 22 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WangHLLYH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WarwickRWRS08,
author = {Thomas P. Warwick and
Gustavo Rivera and
David Waite and
James Russell and
Jeffrey Smith},
editor = {Douglas Young and
Nur A. Touba},
title = {Measurement Repeatability for {RF} Test Within the Load-board Constraints
of High Density and Fine Pitch {SOC} Applications},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700570},
doi = {10.1109/TEST.2008.4700570},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WarwickRWRS08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WohlWN08,
author = {Peter Wohl and
John A. Waicukauski and
Frederic Neuveux},
editor = {Douglas Young and
Nur A. Touba},
title = {Increasing Scan Compression by Using X-chains},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700646},
doi = {10.1109/TEST.2008.4700646},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WohlWN08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WoodGKSTIM08,
author = {Tim Wood and
Grady Giles and
Chris Kiszely and
Martin Schuessler and
Daniela Toneva and
Joel Irby and
Michael Mateja},
editor = {Douglas Young and
Nur A. Touba},
title = {The Test Features of the Quad-Core {AMD} Opteron- Microprocessor},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700551},
doi = {10.1109/TEST.2008.4700551},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WoodGKSTIM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuCCX08,
author = {Xiaoxia Wu and
Yibo Chen and
Krishnendu Chakrabarty and
Yuan Xie},
editor = {Douglas Young and
Nur A. Touba},
title = {Test-Access Solutions for Three-Dimensional SOCs},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700684},
doi = {10.1109/TEST.2008.4700684},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WuCCX08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuDW08,
author = {Sean H. Wu and
Dragoljub Gagi Drmanac and
Li{-}C. Wang},
editor = {Douglas Young and
Nur A. Touba},
title = {A Study of Outlier Analysis Techniques for Delay Testing},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700548},
doi = {10.1109/TEST.2008.4700548},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WuDW08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuH08,
author = {Weixin Wu and
Michael S. Hsiao},
editor = {Douglas Young and
Nur A. Touba},
title = {SAT-based State Justification with Adaptive Mining of Invariants},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700567},
doi = {10.1109/TEST.2008.4700567},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WuH08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuHWM08,
author = {Meng{-}Fan Wu and
Jiun{-}Lang Huang and
Xiaoqing Wen and
Kohei Miyase},
editor = {Douglas Young and
Nur A. Touba},
title = {Reducing Power Supply Noise in Linear-Decompressor-Based Test Data
Compression Environment for At-Speed Scan Testing},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700584},
doi = {10.1109/TEST.2008.4700584},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WuHWM08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/X08,
editor = {Douglas Young and
Nur A. Touba},
title = {Overview of {IEEE} {P1450.6.2} Standard; Creating {CTL} Model For
Memory Test and Repair},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700680},
doi = {10.1109/TEST.2008.4700680},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/X08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YamaguchiKSISU08,
author = {Takahiro J. Yamaguchi and
Masayuki Kawabata and
Mani Soma and
Masahiro Ishida and
K. Sawami and
Koichiro Uekusa},
editor = {Douglas Young and
Nur A. Touba},
title = {A New Method for Measuring Aperture Jitter in {ADC} Output and Its
Application to {ENOB} Testing},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700639},
doi = {10.1109/TEST.2008.4700639},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YamaguchiKSISU08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YangCDRP08,
author = {Fan Yang and
Sreejit Chakravarty and
Narendra Devta{-}Prasanna and
Sudhakar M. Reddy and
Irith Pomeranz},
editor = {Douglas Young and
Nur A. Touba},
title = {Detection of Internal Stuck-open Faults in Scan Chains},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700577},
doi = {10.1109/TEST.2008.4700577},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YangCDRP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YeWHL08,
author = {Jing Ye and
Fei Wang and
Yu Hu and
Xiaowei Li},
editor = {Douglas Young and
Nur A. Touba},
title = {Diagnosis of Mask-Effect Multiple Timing Faults in Scan Chains},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700694},
doi = {10.1109/TEST.2008.4700694},
timestamp = {Mon, 22 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/YeWHL08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YilmazCT08,
author = {Mahmut Yilmaz and
Krishnendu Chakrabarty and
Mohammad Tehranipoor},
editor = {Douglas Young and
Nur A. Touba},
title = {Interconnect-Aware and Layout-Oriented Test-Pattern Selection for
Small-Delay Defects},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700627},
doi = {10.1109/TEST.2008.4700627},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YilmazCT08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YuB08,
author = {Xiaochun Yu and
Ronald D. Blanton},
editor = {Douglas Young and
Nur A. Touba},
title = {An Effective and Flexible Multiple Defect Diagnosis Methodology Using
Error Propagation Analysis},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700595},
doi = {10.1109/TEST.2008.4700595},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YuB08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YuanX08,
author = {Feng Yuan and
Qiang Xu},
editor = {Douglas Young and
Nur A. Touba},
title = {SoC Test Architecture Design and Optimization Considering Power Supply
Noise Effects},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700620},
doi = {10.1109/TEST.2008.4700620},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YuanX08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhaoXC08,
author = {Yang Zhao and
Tao Xu and
Krishnendu Chakrabarty},
editor = {Douglas Young and
Nur A. Touba},
title = {Built-in Self-Test and Fault Diagnosis for Lab-on-Chip Using Digital
Microfluidic Logic Gates},
booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://doi.org/10.1109/TEST.2008.4700635},
doi = {10.1109/TEST.2008.4700635},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhaoXC08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2008,
editor = {Douglas Young and
Nur A. Touba},
title = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara,
California, USA, October 26-31, 2008},
publisher = {{IEEE} Computer Society},
year = {2008},
url = {https://ieeexplore.ieee.org/xpl/conhome/4690905/proceeding},
isbn = {978-1-4244-2403-0},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2008.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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