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@inproceedings{DBLP:conf/ets/AlexandrescuSL14,
author = {Dan Alexandrescu and
Luca Sterpone and
Celia L{\'{o}}pez{-}Ongil},
editor = {Giorgio Di Natale},
title = {Fault injection and fault tolerance methodologies for assessing device
robustness and mitigating against ionizing radiation},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847812},
doi = {10.1109/ETS.2014.6847812},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/AlexandrescuSL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/AliSK14,
author = {Sk Subidh Ali and
Ozgur Sinanoglu and
Ramesh Karri},
editor = {Giorgio Di Natale},
title = {Test-mode-only scan attack using the boundary scan chain},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847798},
doi = {10.1109/ETS.2014.6847798},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/AliSK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/AnastasiouT14,
author = {Anthi Anastasiou and
Yiorgos Tsiatouhas},
editor = {Giorgio Di Natale},
title = {Power efficient scan testing by exploiting existing error tolerance
circuitry in a design},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847834},
doi = {10.1109/ETS.2014.6847834},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/AnastasiouT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Asenov14,
author = {Asen Asenov},
editor = {Giorgio Di Natale},
title = {Factoring variability in the Design/Technology Co Optimisation {(DTCO)}
in advanced {CMOS}},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847791},
doi = {10.1109/ETS.2014.6847791},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/Asenov14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/BadackG14,
author = {Christian Badack and
Michael G{\"{o}}ssel},
editor = {Giorgio Di Natale},
title = {Triple error detection for Imai-Kamiyanagi codes based on subsyndrome
computations},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847840},
doi = {10.1109/ETS.2014.6847840},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/BadackG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/BanerjeeGC14,
author = {Suvadeep Banerjee and
{\'{A}}lvaro G{\'{o}}mez{-}Pau and
Abhijit Chatterjee},
editor = {Giorgio Di Natale},
title = {Design of low cost fault tolerant analog circuits using real-time
learned error compensation},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847838},
doi = {10.1109/ETS.2014.6847838},
timestamp = {Thu, 16 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/BanerjeeGC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/BehnamAN14,
author = {Payman Behnam and
Bijan Alizadeh and
Zainalabedin Navabi},
editor = {Giorgio Di Natale},
title = {Automatic correction of certain design errors using mutation technique},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847833},
doi = {10.1109/ETS.2014.6847833},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/BehnamAN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/BohlLD14,
author = {Eberhard B{\"{o}}hl and
Matthew Lewis and
Klaus Damm},
editor = {Giorgio Di Natale},
title = {A collision resistant deterministic random bit generator with fault
attack detection possibilities},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847829},
doi = {10.1109/ETS.2014.6847829},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/BohlLD14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/BohlLG14,
author = {Eberhard B{\"{o}}hl and
Matthew Lewis and
S. Galkin},
editor = {Giorgio Di Natale},
title = {A true random number generator with on-line testability},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847799},
doi = {10.1109/ETS.2014.6847799},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/BohlLG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/CassanoBN14,
author = {Luca Cassano and
Alberto Bosio and
Giorgio Di Natale},
editor = {Giorgio Di Natale},
title = {A novel adaptive fault tolerant flip-flop architecture based on {TMR}},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847831},
doi = {10.1109/ETS.2014.6847831},
timestamp = {Fri, 02 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/CassanoBN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/ChaixZN14,
author = {Fabien Chaix and
Nacer{-}Eddine Zergainoh and
Michael Nicolaidis},
editor = {Giorgio Di Natale},
title = {A generic and high-level model of large unreliable NoCs for fault
tolerance and performance analysis},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847827},
doi = {10.1109/ETS.2014.6847827},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/ChaixZN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/ChenET14,
author = {Liang Chen and
Mojtaba Ebrahimi and
Mehdi Baradaran Tahoori},
editor = {Giorgio Di Natale},
title = {Quantitative evaluation of register vulnerabilities in {RTL} control
paths},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847837},
doi = {10.1109/ETS.2014.6847837},
timestamp = {Mon, 29 Apr 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/ChenET14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/CookW14,
author = {Alejandro Cook and
Hans{-}Joachim Wunderlich},
editor = {Giorgio Di Natale},
title = {Diagnosis of multiple faults with highly compacted test responses},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847796},
doi = {10.1109/ETS.2014.6847796},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/CookW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/CoyetteGVD14,
author = {Anthony Coyette and
Georges G. E. Gielen and
Ronny Vanhooren and
Wim Dobbelaere},
editor = {Giorgio Di Natale},
title = {Optimization of analog fault coverage by exploiting defect-specific
masking},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847817},
doi = {10.1109/ETS.2014.6847817},
timestamp = {Fri, 02 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/CoyetteGVD14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/DehbashiF14,
author = {Mehdi Dehbashi and
G{\"{o}}rschwin Fey},
editor = {Giorgio Di Natale},
title = {Sat-based speedpath debugging using waveforms},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847802},
doi = {10.1109/ETS.2014.6847802},
timestamp = {Fri, 02 Jun 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/DehbashiF14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/DubrovaNS14,
author = {Elena Dubrova and
Mats N{\"{a}}slund and
G{\"{o}}ran Selander},
editor = {Giorgio Di Natale},
title = {Secure and efficient {LBIST} for feedback shift register-based cryptographic
systems},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847821},
doi = {10.1109/ETS.2014.6847821},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/DubrovaNS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/EggersglussSKD14,
author = {Stephan Eggersgl{\"{u}}{\ss} and
Kenneth Schmitz and
Rene Krenz{-}Baath and
Rolf Drechsler},
editor = {Giorgio Di Natale},
title = {Optimization-based multiple target test generation for highly compacted
test sets},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847807},
doi = {10.1109/ETS.2014.6847807},
timestamp = {Sun, 02 Jun 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/EggersglussSKD14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/FerranteFM14,
author = {Orlando Ferrante and
Alberto Ferrari and
Marco Marazza},
editor = {Giorgio Di Natale},
title = {Model based generation of high coverage test suites for embedded systems},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847843},
doi = {10.1109/ETS.2014.6847843},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/FerranteFM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Gomez-PauBF14,
author = {{\'{A}}lvaro G{\'{o}}mez{-}Pau and
Luz Balado and
Joan Figueras},
editor = {Giorgio Di Natale},
title = {{M-S} specification binning based on digitally coded indirect measurements},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847809},
doi = {10.1109/ETS.2014.6847809},
timestamp = {Thu, 16 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/Gomez-PauBF14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/HapkeABBSGPBMPSRGFR14,
author = {Friedrich Hapke and
Ralf Arnold and
Matthias Beck and
M. Baby and
S. Straehle and
J. F. Goncalves and
A. Panait and
R. Behr and
Gwenol{\'{e}} Maugard and
A. Prashanthi and
Juergen Schloeffel and
Wilfried Redemund and
Andreas Glowatz and
Anja Fast and
Janusz Rajski},
editor = {Giorgio Di Natale},
title = {Cell-aware experiences in a high-quality automotive test suite},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847814},
doi = {10.1109/ETS.2014.6847814},
timestamp = {Wed, 21 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/HapkeABBSGPBMPSRGFR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/HerrmannMM14,
author = {Thomas Herrmann and
Shobhit Malik and
Sriram Madhavan},
editor = {Giorgio Di Natale},
title = {Quantified contribution of design for manufacturing to yield at 28nm},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847815},
doi = {10.1109/ETS.2014.6847815},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/HerrmannMM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/HuangZTC14,
author = {Shi{-}Yu Huang and
Zeng{-}Fu Zeng and
Kun{-}Han Tsai and
Wu{-}Tung Cheng},
editor = {Giorgio Di Natale},
title = {On-the-fly timing-aware built-in self-repair for high-speed interposer
wires in 2.5-D ICs},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847841},
doi = {10.1109/ETS.2014.6847841},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/HuangZTC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/IndacoPV14,
author = {Marco Indaco and
Paolo Prinetto and
Elena I. Vatajelu},
editor = {Giorgio Di Natale},
title = {On the impact of process variability and aging on the reliability
of emerging memories (Embedded tutorial)},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--10},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847813},
doi = {10.1109/ETS.2014.6847813},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/IndacoPV14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KamranN14,
author = {Arezoo Kamran and
Zainalabedin Navabi},
editor = {Giorgio Di Natale},
title = {Homogeneous many-core processor system test distribution and execution
mechanism},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847839},
doi = {10.1109/ETS.2014.6847839},
timestamp = {Fri, 02 Jun 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/KamranN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KastensmidtTBRWRBBTF14,
author = {Fernanda Lima Kastensmidt and
Jorge L. Tonfat and
Thiago Hanna Both and
Paolo Rech and
Gilson I. Wirth and
Ricardo Reis and
Florent Bruguier and
Pascal Benoit and
Lionel Torres and
Christopher Frost},
editor = {Giorgio Di Natale},
title = {Aging and voltage scaling impacts under neutron-induced soft error
rate in SRAM-based FPGAs},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847845},
doi = {10.1109/ETS.2014.6847845},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/KastensmidtTBRWRBBTF14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/KohanBAFN14,
author = {Somayeh Sadeghi Kohan and
Payman Behnam and
Bijan Alizadeh and
Masahiro Fujita and
Zainalabedin Navabi},
editor = {Giorgio Di Natale},
title = {Improving polynomial datapath debugging with HEDs},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847797},
doi = {10.1109/ETS.2014.6847797},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/KohanBAFN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/LehnerKWB14,
author = {Thomas Lehner and
Andreas Kuhr and
Michael G. Wahl and
Rainer Br{\"{u}}ck},
editor = {Giorgio Di Natale},
title = {Site dependencies in a multisite testing environment},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847808},
doi = {10.1109/ETS.2014.6847808},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/LehnerKWB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/LiHW14,
author = {Jia Li and
Zhuolei Huang and
Weibing Wang},
editor = {Giorgio Di Natale},
title = {Built-in self-calibration of CMOS-compatible thermopile sensor with
on-chip electrical stimulus},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847819},
doi = {10.1109/ETS.2014.6847819},
timestamp = {Thu, 25 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/LiHW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/LiaoCLLHW14,
author = {Kuan{-}Yu Liao and
Po{-}Juei Chen and
Ang{-}Feng Lin and
James Chien{-}Mo Li and
Michael S. Hsiao and
Laung{-}Terng Wang},
editor = {Giorgio Di Natale},
title = {GPU-based timing-aware test generation for small delay defects},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847835},
doi = {10.1109/ETS.2014.6847835},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/LiaoCLLHW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/LienLCH14,
author = {Wei{-}Cheng Lien and
Kuen{-}Jong Lee and
Krishnendu Chakrabarty and
Tong{-}Yu Hsieh},
editor = {Giorgio Di Natale},
title = {Output-bit selection with X-avoidance using multiple counters for
test-response compaction},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847823},
doi = {10.1109/ETS.2014.6847823},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/LienLCH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/LinKR14,
author = {Xijiang Lin and
Mark Kassab and
Janusz Rajski},
editor = {Giorgio Di Natale},
title = {Using dynamic shift to reduce test data volume in high-compression
designs},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847822},
doi = {10.1109/ETS.2014.6847822},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/LinKR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/LinR14,
author = {Shudong Lin and
Gordon W. Roberts},
editor = {Giorgio Di Natale},
title = {Towards a general purpose mixed-signal instrumentation layer in the
die stack of a 3D-SIC},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847832},
doi = {10.1109/ETS.2014.6847832},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/LinR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MironovUR14,
author = {Dmitri Mironov and
Raimund Ubar and
Jaan Raik},
editor = {Giorgio Di Natale},
title = {Logic simulation and fault collapsing with shared structurally synthesized
bdds},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847825},
doi = {10.1109/ETS.2014.6847825},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/MironovUR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/MohammadiKMN14,
author = {Marzieh Mohammadi and
Somayeh Sadeghi Kohan and
Nasser Masoumi and
Zainalabedin Navabi},
editor = {Giorgio Di Natale},
title = {An off-line {MDSI} interconnect {BIST} incorporated in {BS} 1149.1},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847847},
doi = {10.1109/ETS.2014.6847847},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/MohammadiKMN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/NeaguMM14,
author = {Madalin Neagu and
Liviu Miclea and
Salvador Manich},
editor = {Giorgio Di Natale},
title = {Interleaved scrambling technique: {A} novel low-power security layer
for cache memories},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847844},
doi = {10.1109/ETS.2014.6847844},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/NeaguMM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/NeumeierK14,
author = {Yaara Neumeier and
Osnat Keren},
editor = {Giorgio Di Natale},
title = {A new efficiency criterion for security oriented error correcting
codes},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847800},
doi = {10.1109/ETS.2014.6847800},
timestamp = {Fri, 27 Dec 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/NeumeierK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PeraliasGR14,
author = {Eduardo J. Peral{\'{\i}}as and
Antonio Jose Gin{\'{e}}s and
Adoraci{\'{o}}n Rueda},
editor = {Giorgio Di Natale},
title = {{INL} systematic reduced-test technique for Pipeline ADCs},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847818},
doi = {10.1109/ETS.2014.6847818},
timestamp = {Mon, 16 Sep 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/PeraliasGR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PolianJS14,
author = {Ilia Polian and
Jie Jiang and
Adit D. Singh},
editor = {Giorgio Di Natale},
title = {Detection conditions for errors in self-adaptive better-than-worst-case
designs},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847794},
doi = {10.1109/ETS.2014.6847794},
timestamp = {Thu, 11 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/PolianJS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Pomeranz14,
author = {Irith Pomeranz},
editor = {Giorgio Di Natale},
title = {A distance-based test cube merging procedure for compatible and incompatible
test cubes},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847824},
doi = {10.1109/ETS.2014.6847824},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/Pomeranz14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PrabhuABH14,
author = {Sarvesh Prabhu and
Vineeth V. Acharya and
Sharad Bagri and
Michael S. Hsiao},
editor = {Giorgio Di Natale},
title = {Property-checking based {LBIST} for improved diagnosability},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847828},
doi = {10.1109/ETS.2014.6847828},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/PrabhuABH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/PrabhuVLS14,
author = {Athul Prabhu and
Vlado Vorisek and
Helmut Lang and
Thomas Schumann},
editor = {Giorgio Di Natale},
title = {Analysis of cell-aware test pattern effectiveness - {A} case study
using a 32-bit automotive microcontroller},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847826},
doi = {10.1109/ETS.2014.6847826},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/PrabhuVLS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Rhines14,
author = {Walden C. Rhines},
editor = {Giorgio Di Natale},
title = {Major eras of Design for Test},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847790},
doi = {10.1109/ETS.2014.6847790},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/Rhines14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Rodriguez-MontanesAF14,
author = {Rosa Rodr{\'{\i}}guez{-}Monta{\~{n}}{\'{e}}s and
Daniel Arum{\'{\i}} and
Joan Figueras},
editor = {Giorgio Di Natale},
title = {Post-bond test of Through-Silicon Vias with open defects},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847816},
doi = {10.1109/ETS.2014.6847816},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/Rodriguez-MontanesAF14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/RohaniK14,
author = {Alireza Rohani and
Hans G. Kerkhoff},
editor = {Giorgio Di Natale},
title = {Two soft-error mitigation techniques for functional units of {DSP}
processors},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847792},
doi = {10.1109/ETS.2014.6847792},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/RohaniK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SabenaSSKVWGRSPH14,
author = {Davide Sabena and
Luca Sterpone and
Mario Sch{\"{o}}lzel and
Tobias Koal and
Heinrich Theodor Vierhaus and
S. Wong and
Rob{\'{e}}rt Glein and
Florian Rittner and
C. Stender and
Mario Porrmann and
Jens Hagemeyer},
editor = {Giorgio Di Natale},
title = {Reconfigurable high performance architectures: How much are they ready
for safety-critical applications?},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--8},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847820},
doi = {10.1109/ETS.2014.6847820},
timestamp = {Wed, 25 Sep 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/SabenaSSKVWGRSPH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SantiniRNCW14,
author = {Thiago Santini and
Paolo Rech and
Gabriel L. Nazar and
Luigi Carro and
Fl{\'{a}}vio Rech Wagner},
editor = {Giorgio Di Natale},
title = {Reducing embedded software radiation-induced failures through cache
memories},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847793},
doi = {10.1109/ETS.2014.6847793},
timestamp = {Mon, 16 Sep 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/SantiniRNCW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SarrazinEPVPNG14,
author = {S{\'{e}}bastien Sarrazin and
Samuel Evain and
Ivan Miro Panades and
Alexandre Valentian and
Suresh Pajaniradja and
Lirida Alves de Barros Naviner and
Valentin Gherman},
editor = {Giorgio Di Natale},
title = {Shadow-scan design with low latency overhead and in-situ slack-time
monitoring},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847801},
doi = {10.1109/ETS.2014.6847801},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/SarrazinEPVPNG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SauerPIMSCWB14,
author = {Matthias Sauer and
Ilia Polian and
Michael E. Imhof and
Abdullah Mumtaz and
Eric Schneider and
Alexander Czutro and
Hans{-}Joachim Wunderlich and
Bernd Becker},
editor = {Giorgio Di Natale},
title = {Variation-aware deterministic {ATPG}},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847806},
doi = {10.1109/ETS.2014.6847806},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/SauerPIMSCWB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Sayed-AhmedFK14,
author = {Amr A. R. Sayed{-}Ahmed and
Hossam A. H. Fahmy and
Ulrich K{\"{u}}hne},
editor = {Giorgio Di Natale},
title = {Verification of the decimal floating-point square root operation},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847842},
doi = {10.1109/ETS.2014.6847842},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/Sayed-AhmedFK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SchirmeierRS14,
author = {Horst Schirmeier and
Lars Rademacher and
Olaf Spinczyk},
editor = {Giorgio Di Natale},
title = {Smart-hopping: Highly efficient ISA-level fault injection on real
hardware},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847803},
doi = {10.1109/ETS.2014.6847803},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/SchirmeierRS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/ScholzelKV14,
author = {Mario Sch{\"{o}}lzel and
Tobias Koal and
Heinrich Theodor Vierhaus},
editor = {Giorgio Di Natale},
title = {Systematic generation of diagnostic software-based self-test routines
for processor components},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847795},
doi = {10.1109/ETS.2014.6847795},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/ScholzelKV14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Singh14,
author = {Adit D. Singh},
editor = {Giorgio Di Natale},
title = {Error detection and recovery in better-than-worst-case timing designs},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847811},
doi = {10.1109/ETS.2014.6847811},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/Singh14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SterponeD14,
author = {Luca Sterpone and
Boyang Du},
editor = {Giorgio Di Natale},
title = {Analysis and mitigation of single event effects on flash-based {FPGAS}},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847804},
doi = {10.1109/ETS.2014.6847804},
timestamp = {Wed, 25 Sep 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/SterponeD14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/SwansonWEM14,
author = {Richard Swanson and
Anna Wong and
Suraj Ethirajan and
Amitava Majumdar},
editor = {Giorgio Di Natale},
title = {Avoiding burnt probe tips: Practical solutions for testing internally
regulated power supplies},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847810},
doi = {10.1109/ETS.2014.6847810},
timestamp = {Thu, 18 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/SwansonWEM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/ValkaBDTVGDG14,
author = {Miroslav Valka and
Alberto Bosio and
Luigi Dilillo and
Aida Todri and
Arnaud Virazel and
Patrick Girard and
P. Debaud and
S. Guilhot},
editor = {Giorgio Di Natale},
title = {iBoX - Jitter based Power Supply Noise sensor},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847830},
doi = {10.1109/ETS.2014.6847830},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ets/ValkaBDTVGDG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Voyiatzis14,
author = {Ioannis Voyiatzis},
editor = {Giorgio Di Natale},
title = {Accumulator-based test-per-clock scheme for low-power on-chip application
of test patterns},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847836},
doi = {10.1109/ETS.2014.6847836},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/Voyiatzis14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/Voyiatzis14a,
author = {Ioannis Voyiatzis},
editor = {Giorgio Di Natale},
title = {Concurrent online {BIST} for sequential circuits exploiting input
reduction and output space compaction},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--2},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847846},
doi = {10.1109/ETS.2014.6847846},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/Voyiatzis14a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ets/WagnerW14,
author = {Marcus Wagner and
Hans{-}Joachim Wunderlich},
editor = {Giorgio Di Natale},
title = {Incremental computation of delay fault detection probability for variation-aware
test generation},
booktitle = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
pages = {1--6},
publisher = {{IEEE}},
year = {2014},
url = {https://doi.org/10.1109/ETS.2014.6847805},
doi = {10.1109/ETS.2014.6847805},
timestamp = {Mon, 22 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/WagnerW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ets/2014,
editor = {Giorgio Di Natale},
title = {19th {IEEE} European Test Symposium, {ETS} 2014, Paderborn, Germany,
May 26-30, 2014},
publisher = {{IEEE}},
year = {2014},
url = {https://ieeexplore.ieee.org/xpl/conhome/6842412/proceeding},
isbn = {978-1-4799-3415-7},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ets/2014.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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