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@inproceedings{DBLP:conf/ats/ArjhanD99,
  author       = {Chanyutt Arjhan and
                  Raghvendra G. Deshmukh},
  title        = {A Novel Fault-Detection Technique for The Parallel Multipliers and
                  Dividers},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {127--132},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810740},
  doi          = {10.1109/ATS.1999.810740},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/ArjhanD99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChenSSW99,
  author       = {Xinghao Chen and
                  Thomas J. Snethen and
                  Joe Swenton and
                  Ron Walther},
  title        = {A Simplified Method for Testing the {IBM} Pipeline Partial-Scan Microprocessor},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {321--326},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810770},
  doi          = {10.1109/ATS.1999.810770},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/ChenSSW99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DasOF99,
  author       = {Debesh Kumar Das and
                  Satoshi Ohtake and
                  Hideo Fujiwara},
  title        = {New {DFT} Techniques of Non-Scan Sequential Circuits with Complete
                  Fault Efficiency},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {263--268},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810761},
  doi          = {10.1109/ATS.1999.810761},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/DasOF99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DemidenkoL99,
  author       = {Serge N. Demidenko and
                  Kenneth V. Lever},
  title        = {Accelerating Test Data Processin},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {113},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810738},
  doi          = {10.1109/ATS.1999.810738},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/DemidenkoL99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DoumarI99,
  author       = {Abderrahim Doumar and
                  Hideo Ito},
  title        = {Testing the Logic Cells and Interconnect Resources for FPGAs},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {369--374},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810777},
  doi          = {10.1109/ATS.1999.810777},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/DoumarI99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/FengHML99,
  author       = {Wenyi Feng and
                  Wei{-}Kang Huang and
                  Fred J. Meyer and
                  Fabrizio Lombardi},
  title        = {A {BIST} {TPG} Approach for Interconnect Testing With the {IEEE} 1149.1
                  {STD}},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {95--100},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810735},
  doi          = {10.1109/ATS.1999.810735},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/FengHML99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GaoS99,
  author       = {Jianhua Gao and
                  Shihuang Shao},
  title        = {Fault-Tolerant Strategies and Their Design Methods for Application
                  Software},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {214--217},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810753},
  doi          = {10.1109/ATS.1999.810753},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/GaoS99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GirardGLP99,
  author       = {Patrick Girard and
                  Lo{\"{\i}}s Guiller and
                  Christian Landrault and
                  Serge Pravossoudovitch},
  title        = {Circuit Partitioning for Low Power {BIST} Design with Minimized Peak
                  Power Consumption},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {89--94},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810734},
  doi          = {10.1109/ATS.1999.810734},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/GirardGLP99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/GoorS99,
  author       = {Ad J. van de Goor and
                  J. E. Simonse},
  title        = {Defining {SRAM} Resistive Defects and Their Simulation Stimuli},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {33--40},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810726},
  doi          = {10.1109/ATS.1999.810726},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/GoorS99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HamdiouiG99,
  author       = {Said Hamdioui and
                  Ad J. van de Goor},
  title        = {March Tests for Word-Oriented Two-Port Memories},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {53},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810729},
  doi          = {10.1109/ATS.1999.810729},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HamdiouiG99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HashizumeYT99,
  author       = {Masaki Hashizume and
                  Hiroyuki Yotsuyanagi and
                  Takeomi Tamesada},
  title        = {Identification of Feedback Bridging Faults with Oscillation},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {25},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810725},
  doi          = {10.1109/ATS.1999.810725},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HashizumeYT99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HigamiTSK99,
  author       = {Yoshinobu Higami and
                  Yuzo Takamatsu and
                  Kewal K. Saluja and
                  Kozo Kinoshita},
  title        = {Fault Simulation Techniques to Reduce {IDDQ} Measurement Vectors for
                  Sequential Circuits},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {141--146},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810742},
  doi          = {10.1109/ATS.1999.810742},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HigamiTSK99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HiraseSA99,
  author       = {Junichi Hirase and
                  Naoki Shindou and
                  Kouji Akahori},
  title        = {Scan Chain Diagnosis Using {IDDQ} Current Measurement},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {153--157},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810744},
  doi          = {10.1109/ATS.1999.810744},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HiraseSA99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HiraseYS99,
  author       = {Junichi Hirase and
                  Shinichi Yoshimura and
                  Tomohisa Sczaki},
  title        = {Automatic Test Pattern Generation for Improving the Fault Coverage
                  of Microprocessors},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {13--19},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810723},
  doi          = {10.1109/ATS.1999.810723},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HiraseYS99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HoL99,
  author       = {Ian Ho and
                  Jin{-}Cherng Lin},
  title        = {Generating Test Cases for Real-Time Software by Time Petri Nets Model},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {295--300},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810766},
  doi          = {10.1109/ATS.1999.810766},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HoL99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HosokawaHIF99,
  author       = {Toshinori Hosokawa and
                  Toshihiro Hiraoka and
                  Tomoo Inoue and
                  Hideo Fujiwara},
  title        = {Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential
                  Circuits Using a Time Expansion Model},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {192},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810750},
  doi          = {10.1109/ATS.1999.810750},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HosokawaHIF99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangL99,
  author       = {Tsung{-}Chu Huang and
                  Kuen{-}Jong Lee},
  title        = {An Input Control Technique for Power Reduction in Scan Circuits During
                  Test Application},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {315--320},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810769},
  doi          = {10.1109/ATS.1999.810769},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HuangL99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangYM99,
  author       = {Zulan Huang and
                  Yizheng Ye and
                  Zhigang Mao},
  title        = {A New Algorithm for Retiming-Based Partial Scan},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {327},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810771},
  doi          = {10.1109/ATS.1999.810771},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HuangYM99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuynhZKDS99,
  author       = {Sam D. Huynh and
                  Jinyan Zhang and
                  Seongwon Kim and
                  Giri Devarayanadurg and
                  Mani Soma},
  title        = {Efficient Test Set Design for Analog and Mixed-Signal Circuits and
                  Systems},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {239},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810757},
  doi          = {10.1109/ATS.1999.810757},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HuynhZKDS99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IchiharaKK99,
  author       = {Hideyuki Ichihara and
                  Kozo Kinoshita and
                  Seiji Kajihara},
  title        = {On an Effective Selection of {IDDQ} Measurement Vectors for Sequential
                  Circuits},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {147--152},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810743},
  doi          = {10.1109/ATS.1999.810743},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/IchiharaKK99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JasMT99,
  author       = {Abhijit Jas and
                  Kartik Mohanram and
                  Nur A. Touba},
  title        = {An Embedded Core {DFT} Scheme to Obtain Highly Compressed Test Sets},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {275},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810763},
  doi          = {10.1109/ATS.1999.810763},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/JasMT99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KajiharaMK99,
  author       = {Seiji Kajihara and
                  Atsushi Murakami and
                  Tomohisa Kaneko},
  title        = {On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {20--24},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810724},
  doi          = {10.1109/ATS.1999.810724},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KajiharaMK99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KeshkKM99,
  author       = {Arabi Keshk and
                  Kozo Kinoshita and
                  Yukiya Miura},
  title        = {Procedure to Overcome the Byzantine General's Problem for Bridging
                  Faults in {CMOS} Circuits},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {121--126},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810739},
  doi          = {10.1109/ATS.1999.810739},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KeshkKM99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KeshkKM99a,
  author       = {Arabi Keshk and
                  Kozo Kinoshita and
                  Yukiya Miura},
  title        = {{IDDQ} Current Dependency on Test Vectors and Bridging Resistance},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {158--163},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810745},
  doi          = {10.1109/ATS.1999.810745},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KeshkKM99a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KhouasDD99,
  author       = {Abdelhakim Khouas and
                  Mohamed Dessouky and
                  Anne Derieux},
  title        = {Optimized Statistical Analog Fault Simulation},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {227--232},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810755},
  doi          = {10.1109/ATS.1999.810755},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KhouasDD99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KimC99,
  author       = {Youngchul Kim and
                  C. Robert Carlson},
  title        = {Scenario Based Integration Testing for Object-Oriented Software Development},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {283--288},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810764},
  doi          = {10.1109/ATS.1999.810764},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KimC99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KonijnenburgLG99,
  author       = {M. H. Konijnenburg and
                  Hans van der Linden and
                  Ad J. van de Goor},
  title        = {Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking
                  to Guide Sequential Circuit Test Generation},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {185--191},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810749},
  doi          = {10.1109/ATS.1999.810749},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KonijnenburgLG99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LiangL99,
  author       = {Hsing{-}Chung Liang and
                  Chung{-}Len Lee},
  title        = {An Effective Methodology for Mixed Scan and Reset Design Based on
                  Test Generation and Structure of Sequential Circuits},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {173--178},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810747},
  doi          = {10.1109/ATS.1999.810747},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/LiangL99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LuLW99,
  author       = {Shyue{-}Kung Lu and
                  Tsung{-}Ying Lee and
                  Cheng{-}Wen Wu},
  title        = {Defect Level Prediction Using Multi-Model Fault Coverage},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {301},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810767},
  doi          = {10.1109/ATS.1999.810767},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/LuLW99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MiaoGL99,
  author       = {Huaikou Miao and
                  Xiaolei Gao and
                  Ling Liu},
  title        = {An Approach to Testing the Nonexistence of Initial State in {Z} Specifications},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {289--294},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810765},
  doi          = {10.1109/ATS.1999.810765},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/MiaoGL99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MiuraNF99,
  author       = {Katsuyoshi Miura and
                  Koji Nakamae and
                  Hiromu Fujioka},
  title        = {Intelligent {EB} Test System for Automatic {VLSI} Fault Tracing},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {335--341},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810772},
  doi          = {10.1109/ATS.1999.810772},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/MiuraNF99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NikawaIMS99,
  author       = {Kiyoshi Nikawa and
                  Shoji Inoue and
                  Kazuyuki Morimoto and
                  Shinya Sone},
  title        = {Failure Analysis Case Studies Using the {IR-OBIRCH} (Infrared Optical
                  Beam Induced Resistance CHange) Method},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {383--388},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810779},
  doi          = {10.1109/ATS.1999.810779},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/NikawaIMS99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NikawaIMS99a,
  author       = {Kiyoshi Nikawa and
                  Shoji Inoue and
                  Kazuyuki Morimoto and
                  Shinya Sone},
  title        = {Failure Analysis Case Studies Using the {IR-OBIRCH} (Infrared Optical
                  Beam Induced Resistance CHange) Method},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {394},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810781},
  doi          = {10.1109/ATS.1999.810781},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/NikawaIMS99a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/OhtakeIF99,
  author       = {Satoshi Ohtake and
                  Michiko Inoue and
                  Hideo Fujiwara},
  title        = {A Method of Test Generation for Weakly Testable Data Paths Using Test
                  Knowledge Extracted from {RTL} Description},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {5--12},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810722},
  doi          = {10.1109/ATS.1999.810722},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/OhtakeIF99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PengWS99,
  author       = {Chenglian Peng and
                  Baifeng Wu and
                  Xiaoguang Sun},
  title        = {Test by Distributed Monitoring},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {218},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810754},
  doi          = {10.1109/ATS.1999.810754},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/PengWS99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PomeranzR99,
  author       = {Irith Pomeranz and
                  Sudhakar M. Reddy},
  title        = {Vector-Based Functional Fault Models for Delay Faults},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {41--46},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810727},
  doi          = {10.1109/ATS.1999.810727},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/PomeranzR99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PomeranzR99a,
  author       = {Irith Pomeranz and
                  Sudhakar M. Reddy},
  title        = {Pattern Sensitivity: {A} Property to Guide Test Generation for Combinational
                  Circuits},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {75--80},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810732},
  doi          = {10.1109/ATS.1999.810732},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/PomeranzR99a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RavikumarVC99,
  author       = {C. P. Ravikumar and
                  Ashutosh Verma and
                  Gaurav Chandra},
  title        = {A Polynomial-Time Algorithm for Power Constrained Testing of Core
                  Based Systems},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {107--112},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810737},
  doi          = {10.1109/ATS.1999.810737},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/RavikumarVC99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RenovellPFZ99,
  author       = {Michel Renovell and
                  Jean{-}Michel Portal and
                  Joan Figueras and
                  Yervant Zorian},
  title        = {Minimizing the Number of Test Configurations for Different {FPGA}
                  Families},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {363--368},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810776},
  doi          = {10.1109/ATS.1999.810776},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/RenovellPFZ99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SakataTSO99,
  author       = {Takahide Sakata and
                  Hideyuki Takahashi and
                  Tetsu Sekine and
                  Toshiya Ogiwara},
  title        = {Investigation of Ga Contamination Due to Analysis by Dual Beam {FIB}},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {389--393},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810780},
  doi          = {10.1109/ATS.1999.810780},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/SakataTSO99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Shen99,
  author       = {Li Shen},
  title        = {Genetic Algorithm Based Test Generation for Sequential Circuits},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {179--184},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810748},
  doi          = {10.1109/ATS.1999.810748},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/Shen99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShimodaYWTNM99,
  author       = {Reisuke Shimoda and
                  Takaki Yoshida and
                  Masafumi Watari and
                  Yasuhiro Toyota and
                  Kiyokazu Nishi and
                  Akira Motohara},
  title        = {Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging,
                  and Measurement Condition Dependent Faults in Fully Scanned Sequential
                  Circuits},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {347},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810774},
  doi          = {10.1109/ATS.1999.810774},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/ShimodaYWTNM99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShinogiH99,
  author       = {Tsuyoshi Shinogi and
                  Terumine Hayashi},
  title        = {A Parallel Generation System of Compact {IDDQ} Test Sets for Large
                  Combinational Circuits},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {164},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810746},
  doi          = {10.1109/ATS.1999.810746},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/ShinogiH99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SidiropoulosVN99,
  author       = {G. Sidiropoulos and
                  Haridimos T. Vergos and
                  Dimitris Nikolos},
  title        = {Easily Path Delay Fault Testable Non-Restoring Cellular Array Dividers},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {47--52},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810728},
  doi          = {10.1109/ATS.1999.810728},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/SidiropoulosVN99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/StroeleM99,
  author       = {Albrecht P. Stroele and
                  Frank Mayer},
  title        = {Test Scheduling with Loop Folding and Its Application to Test Configurations
                  with Accumulators},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {101--106},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810736},
  doi          = {10.1109/ATS.1999.810736},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/StroeleM99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SuCL99,
  author       = {Chauchin Su and
                  Yue{-}Tsang Chen and
                  Chung{-}Len Lee},
  title        = {Analog Metrology and Stimulus Selection in a Noisy Environment},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {233--238},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810756},
  doi          = {10.1109/ATS.1999.810756},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/SuCL99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakahashiBTY99,
  author       = {Hiroshi Takahashi and
                  Kwame Osei Boateng and
                  Yuzo Takamatsu and
                  Nobuhiro Yanagida},
  title        = {Multiple Fault Diagnosis in Logic Circuits Using {EB} Tester and Multiple/Single
                  Fault Simulators},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {341--346},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810773},
  doi          = {10.1109/ATS.1999.810773},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/TakahashiBTY99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakasakiFI99,
  author       = {Tomoya Takasaki and
                  Hideo Fujiwara and
                  Tomoo Inoue},
  title        = {A High-Level Synthesis Approach to Partial Scan Design Based on Acyclic
                  Structure},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {309--314},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810768},
  doi          = {10.1109/ATS.1999.810768},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/TakasakiFI99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Tang99,
  author       = {Jing{-}Jou Tang},
  title        = {An Accurate Logic Threshold Voltages Determination Model for {CMOS}
                  Gates to Facilitate Test Generation and Fault Simulation},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {81},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810733},
  doi          = {10.1109/ATS.1999.810733},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/Tang99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TaniguchiKHM99,
  author       = {Yasuyuki Taniguchi and
                  Naotake Kamiura and
                  Yutaka Hata and
                  Nobuyuki Matsui},
  title        = {Activation Function Manipulation for Fault Tolerant Feedforward Neural
                  Networks},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {203--208},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810751},
  doi          = {10.1109/ATS.1999.810751},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/TaniguchiKHM99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TuW99,
  author       = {Haiying Tu and
                  Fangmei Wu},
  title        = {How to Design an Environment Simulator for Safety Critical Software
                  Testing},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {256},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810760},
  doi          = {10.1109/ATS.1999.810760},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/TuW99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WuL99,
  author       = {Fangmei Wu and
                  Meng Li},
  title        = {Railway Signaling Safety-critical Software Testing Based on Dynamic
                  Decision Table},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {247--250},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810758},
  doi          = {10.1109/ATS.1999.810758},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/WuL99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XuF99,
  author       = {Shiyi Xu and
                  Tukwasibwe Justaf Frank},
  title        = {An Evaluation of Test Generation Algorithms for combinational Circuits},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {63--69},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810730},
  doi          = {10.1109/ATS.1999.810730},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/XuF99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XuW99,
  author       = {Zhongwei Xu and
                  Fangmei Wu},
  title        = {A Novel Testing Approach for Safety-Critical Software},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {251--255},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810759},
  doi          = {10.1109/ATS.1999.810759},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/XuW99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YamadaKTY99,
  author       = {Teruhiko Yamada and
                  Toshinori Kotake and
                  Hiroshi Takahashi and
                  Koji Yamazaki},
  title        = {Identification of Redundant Crosspoint Faults in Sequential PLAs with
                  Fault-Free Hardware Reset},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {269--274},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810762},
  doi          = {10.1109/ATS.1999.810762},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/YamadaKTY99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YuXHL99,
  author       = {Yinlei Yu and
                  Jian Xu and
                  Wei{-}Kang Huang and
                  Fabrizio Lombardi},
  title        = {Minimizing the Number of Programming Steps for Diagnosis of Interconnect
                  Faults in FPGAs},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {357--362},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810775},
  doi          = {10.1109/ATS.1999.810775},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/YuXHL99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZengCC99,
  author       = {Zhide Zeng and
                  Jihua Chen and
                  Hefeng Cao},
  title        = {Research and Implementation of a High Speed Test Generation for Ultra
                  Large Scale Combinational Circuits},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {70--74},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810731},
  doi          = {10.1109/ATS.1999.810731},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/ZengCC99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZengCL99,
  author       = {Zhide Zeng and
                  Jihua Chen and
                  Pengxia Liu},
  title        = {A Fault Partitioning Method in Parallel Test Generation for Large
                  Scale {VLSI} Circuits},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {133},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810741},
  doi          = {10.1109/ATS.1999.810741},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/ZengCL99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhangHY99,
  author       = {Tao Zhang and
                  Dongcheng Hu and
                  Shiyuan Yang},
  title        = {Fault-Tolerant Analysis of Feedback Neural Networks with Threshold
                  Neurons},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {209--213},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810752},
  doi          = {10.1109/ATS.1999.810752},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/ZhangHY99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ZhaoWL99,
  author       = {Lan Zhao and
                  D. M. H. Walker and
                  Fabrizio Lombardi},
  title        = {{IDDQ} Testing of Input/Output Resources of SRAM-Based FPGAs},
  booktitle    = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  pages        = {375},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/ATS.1999.810778},
  doi          = {10.1109/ATS.1999.810778},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/ZhaoWL99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/1999,
  title        = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai,
                  China},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/6575/proceeding},
  isbn         = {0-7695-0315-2},
  timestamp    = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/1999.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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