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@inproceedings{DBLP:conf/ats/ArjhanD99, author = {Chanyutt Arjhan and Raghvendra G. Deshmukh}, title = {A Novel Fault-Detection Technique for The Parallel Multipliers and Dividers}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {127--132}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810740}, doi = {10.1109/ATS.1999.810740}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/ArjhanD99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/ChenSSW99, author = {Xinghao Chen and Thomas J. Snethen and Joe Swenton and Ron Walther}, title = {A Simplified Method for Testing the {IBM} Pipeline Partial-Scan Microprocessor}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {321--326}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810770}, doi = {10.1109/ATS.1999.810770}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/ChenSSW99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/DasOF99, author = {Debesh Kumar Das and Satoshi Ohtake and Hideo Fujiwara}, title = {New {DFT} Techniques of Non-Scan Sequential Circuits with Complete Fault Efficiency}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {263--268}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810761}, doi = {10.1109/ATS.1999.810761}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/DasOF99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/DemidenkoL99, author = {Serge N. Demidenko and Kenneth V. Lever}, title = {Accelerating Test Data Processin}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {113}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810738}, doi = {10.1109/ATS.1999.810738}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/DemidenkoL99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/DoumarI99, author = {Abderrahim Doumar and Hideo Ito}, title = {Testing the Logic Cells and Interconnect Resources for FPGAs}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {369--374}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810777}, doi = {10.1109/ATS.1999.810777}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/DoumarI99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/FengHML99, author = {Wenyi Feng and Wei{-}Kang Huang and Fred J. Meyer and Fabrizio Lombardi}, title = {A {BIST} {TPG} Approach for Interconnect Testing With the {IEEE} 1149.1 {STD}}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {95--100}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810735}, doi = {10.1109/ATS.1999.810735}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/FengHML99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/GaoS99, author = {Jianhua Gao and Shihuang Shao}, title = {Fault-Tolerant Strategies and Their Design Methods for Application Software}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {214--217}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810753}, doi = {10.1109/ATS.1999.810753}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/GaoS99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/GirardGLP99, author = {Patrick Girard and Lo{\"{\i}}s Guiller and Christian Landrault and Serge Pravossoudovitch}, title = {Circuit Partitioning for Low Power {BIST} Design with Minimized Peak Power Consumption}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {89--94}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810734}, doi = {10.1109/ATS.1999.810734}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/GirardGLP99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/GoorS99, author = {Ad J. van de Goor and J. E. Simonse}, title = {Defining {SRAM} Resistive Defects and Their Simulation Stimuli}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {33--40}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810726}, doi = {10.1109/ATS.1999.810726}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/GoorS99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/HamdiouiG99, author = {Said Hamdioui and Ad J. van de Goor}, title = {March Tests for Word-Oriented Two-Port Memories}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {53}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810729}, doi = {10.1109/ATS.1999.810729}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/HamdiouiG99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/HashizumeYT99, author = {Masaki Hashizume and Hiroyuki Yotsuyanagi and Takeomi Tamesada}, title = {Identification of Feedback Bridging Faults with Oscillation}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {25}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810725}, doi = {10.1109/ATS.1999.810725}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/HashizumeYT99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/HigamiTSK99, author = {Yoshinobu Higami and Yuzo Takamatsu and Kewal K. Saluja and Kozo Kinoshita}, title = {Fault Simulation Techniques to Reduce {IDDQ} Measurement Vectors for Sequential Circuits}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {141--146}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810742}, doi = {10.1109/ATS.1999.810742}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/HigamiTSK99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/HiraseSA99, author = {Junichi Hirase and Naoki Shindou and Kouji Akahori}, title = {Scan Chain Diagnosis Using {IDDQ} Current Measurement}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {153--157}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810744}, doi = {10.1109/ATS.1999.810744}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/HiraseSA99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/HiraseYS99, author = {Junichi Hirase and Shinichi Yoshimura and Tomohisa Sczaki}, title = {Automatic Test Pattern Generation for Improving the Fault Coverage of Microprocessors}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {13--19}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810723}, doi = {10.1109/ATS.1999.810723}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/HiraseYS99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/HoL99, author = {Ian Ho and Jin{-}Cherng Lin}, title = {Generating Test Cases for Real-Time Software by Time Petri Nets Model}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {295--300}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810766}, doi = {10.1109/ATS.1999.810766}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/HoL99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/HosokawaHIF99, author = {Toshinori Hosokawa and Toshihiro Hiraoka and Tomoo Inoue and Hideo Fujiwara}, title = {Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential Circuits Using a Time Expansion Model}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {192}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810750}, doi = {10.1109/ATS.1999.810750}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/HosokawaHIF99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/HuangL99, author = {Tsung{-}Chu Huang and Kuen{-}Jong Lee}, title = {An Input Control Technique for Power Reduction in Scan Circuits During Test Application}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {315--320}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810769}, doi = {10.1109/ATS.1999.810769}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/HuangL99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/HuangYM99, author = {Zulan Huang and Yizheng Ye and Zhigang Mao}, title = {A New Algorithm for Retiming-Based Partial Scan}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {327}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810771}, doi = {10.1109/ATS.1999.810771}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/HuangYM99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/HuynhZKDS99, author = {Sam D. Huynh and Jinyan Zhang and Seongwon Kim and Giri Devarayanadurg and Mani Soma}, title = {Efficient Test Set Design for Analog and Mixed-Signal Circuits and Systems}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {239}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810757}, doi = {10.1109/ATS.1999.810757}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/HuynhZKDS99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/IchiharaKK99, author = {Hideyuki Ichihara and Kozo Kinoshita and Seiji Kajihara}, title = {On an Effective Selection of {IDDQ} Measurement Vectors for Sequential Circuits}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {147--152}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810743}, doi = {10.1109/ATS.1999.810743}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/IchiharaKK99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/JasMT99, author = {Abhijit Jas and Kartik Mohanram and Nur A. Touba}, title = {An Embedded Core {DFT} Scheme to Obtain Highly Compressed Test Sets}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {275}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810763}, doi = {10.1109/ATS.1999.810763}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/JasMT99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/KajiharaMK99, author = {Seiji Kajihara and Atsushi Murakami and Tomohisa Kaneko}, title = {On Compact Test Sets for Multiple Stuck-at Faults for Large Circuits}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {20--24}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810724}, doi = {10.1109/ATS.1999.810724}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/KajiharaMK99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/KeshkKM99, author = {Arabi Keshk and Kozo Kinoshita and Yukiya Miura}, title = {Procedure to Overcome the Byzantine General's Problem for Bridging Faults in {CMOS} Circuits}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {121--126}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810739}, doi = {10.1109/ATS.1999.810739}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/KeshkKM99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/KeshkKM99a, author = {Arabi Keshk and Kozo Kinoshita and Yukiya Miura}, title = {{IDDQ} Current Dependency on Test Vectors and Bridging Resistance}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {158--163}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810745}, doi = {10.1109/ATS.1999.810745}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/KeshkKM99a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/KhouasDD99, author = {Abdelhakim Khouas and Mohamed Dessouky and Anne Derieux}, title = {Optimized Statistical Analog Fault Simulation}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {227--232}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810755}, doi = {10.1109/ATS.1999.810755}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/KhouasDD99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/KimC99, author = {Youngchul Kim and C. Robert Carlson}, title = {Scenario Based Integration Testing for Object-Oriented Software Development}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {283--288}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810764}, doi = {10.1109/ATS.1999.810764}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/KimC99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/KonijnenburgLG99, author = {M. H. Konijnenburg and Hans van der Linden and Ad J. van de Goor}, title = {Fault (In)Dependent Cost Estimates and Conflict-Directed Backtracking to Guide Sequential Circuit Test Generation}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {185--191}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810749}, doi = {10.1109/ATS.1999.810749}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/KonijnenburgLG99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/LiangL99, author = {Hsing{-}Chung Liang and Chung{-}Len Lee}, title = {An Effective Methodology for Mixed Scan and Reset Design Based on Test Generation and Structure of Sequential Circuits}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {173--178}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810747}, doi = {10.1109/ATS.1999.810747}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/LiangL99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/LuLW99, author = {Shyue{-}Kung Lu and Tsung{-}Ying Lee and Cheng{-}Wen Wu}, title = {Defect Level Prediction Using Multi-Model Fault Coverage}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {301}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810767}, doi = {10.1109/ATS.1999.810767}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/LuLW99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/MiaoGL99, author = {Huaikou Miao and Xiaolei Gao and Ling Liu}, title = {An Approach to Testing the Nonexistence of Initial State in {Z} Specifications}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {289--294}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810765}, doi = {10.1109/ATS.1999.810765}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/MiaoGL99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/MiuraNF99, author = {Katsuyoshi Miura and Koji Nakamae and Hiromu Fujioka}, title = {Intelligent {EB} Test System for Automatic {VLSI} Fault Tracing}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {335--341}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810772}, doi = {10.1109/ATS.1999.810772}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/MiuraNF99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/NikawaIMS99, author = {Kiyoshi Nikawa and Shoji Inoue and Kazuyuki Morimoto and Shinya Sone}, title = {Failure Analysis Case Studies Using the {IR-OBIRCH} (Infrared Optical Beam Induced Resistance CHange) Method}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {383--388}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810779}, doi = {10.1109/ATS.1999.810779}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/NikawaIMS99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/NikawaIMS99a, author = {Kiyoshi Nikawa and Shoji Inoue and Kazuyuki Morimoto and Shinya Sone}, title = {Failure Analysis Case Studies Using the {IR-OBIRCH} (Infrared Optical Beam Induced Resistance CHange) Method}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {394}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810781}, doi = {10.1109/ATS.1999.810781}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/NikawaIMS99a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/OhtakeIF99, author = {Satoshi Ohtake and Michiko Inoue and Hideo Fujiwara}, title = {A Method of Test Generation for Weakly Testable Data Paths Using Test Knowledge Extracted from {RTL} Description}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {5--12}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810722}, doi = {10.1109/ATS.1999.810722}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/OhtakeIF99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/PengWS99, author = {Chenglian Peng and Baifeng Wu and Xiaoguang Sun}, title = {Test by Distributed Monitoring}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {218}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810754}, doi = {10.1109/ATS.1999.810754}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/PengWS99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/PomeranzR99, author = {Irith Pomeranz and Sudhakar M. Reddy}, title = {Vector-Based Functional Fault Models for Delay Faults}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {41--46}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810727}, doi = {10.1109/ATS.1999.810727}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/PomeranzR99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/PomeranzR99a, author = {Irith Pomeranz and Sudhakar M. Reddy}, title = {Pattern Sensitivity: {A} Property to Guide Test Generation for Combinational Circuits}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {75--80}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810732}, doi = {10.1109/ATS.1999.810732}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/PomeranzR99a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/RavikumarVC99, author = {C. P. Ravikumar and Ashutosh Verma and Gaurav Chandra}, title = {A Polynomial-Time Algorithm for Power Constrained Testing of Core Based Systems}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {107--112}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810737}, doi = {10.1109/ATS.1999.810737}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/RavikumarVC99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/RenovellPFZ99, author = {Michel Renovell and Jean{-}Michel Portal and Joan Figueras and Yervant Zorian}, title = {Minimizing the Number of Test Configurations for Different {FPGA} Families}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {363--368}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810776}, doi = {10.1109/ATS.1999.810776}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/RenovellPFZ99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/SakataTSO99, author = {Takahide Sakata and Hideyuki Takahashi and Tetsu Sekine and Toshiya Ogiwara}, title = {Investigation of Ga Contamination Due to Analysis by Dual Beam {FIB}}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {389--393}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810780}, doi = {10.1109/ATS.1999.810780}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/SakataTSO99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/Shen99, author = {Li Shen}, title = {Genetic Algorithm Based Test Generation for Sequential Circuits}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {179--184}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810748}, doi = {10.1109/ATS.1999.810748}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/Shen99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/ShimodaYWTNM99, author = {Reisuke Shimoda and Takaki Yoshida and Masafumi Watari and Yasuhiro Toyota and Kiyokazu Nishi and Akira Motohara}, title = {Practical Application of Automated Fault Diagnosis for Stuck-at, Bridging, and Measurement Condition Dependent Faults in Fully Scanned Sequential Circuits}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {347}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810774}, doi = {10.1109/ATS.1999.810774}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/ShimodaYWTNM99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/ShinogiH99, author = {Tsuyoshi Shinogi and Terumine Hayashi}, title = {A Parallel Generation System of Compact {IDDQ} Test Sets for Large Combinational Circuits}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {164}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810746}, doi = {10.1109/ATS.1999.810746}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/ShinogiH99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/SidiropoulosVN99, author = {G. Sidiropoulos and Haridimos T. Vergos and Dimitris Nikolos}, title = {Easily Path Delay Fault Testable Non-Restoring Cellular Array Dividers}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {47--52}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810728}, doi = {10.1109/ATS.1999.810728}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/SidiropoulosVN99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/StroeleM99, author = {Albrecht P. Stroele and Frank Mayer}, title = {Test Scheduling with Loop Folding and Its Application to Test Configurations with Accumulators}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {101--106}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810736}, doi = {10.1109/ATS.1999.810736}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/StroeleM99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/SuCL99, author = {Chauchin Su and Yue{-}Tsang Chen and Chung{-}Len Lee}, title = {Analog Metrology and Stimulus Selection in a Noisy Environment}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {233--238}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810756}, doi = {10.1109/ATS.1999.810756}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/SuCL99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/TakahashiBTY99, author = {Hiroshi Takahashi and Kwame Osei Boateng and Yuzo Takamatsu and Nobuhiro Yanagida}, title = {Multiple Fault Diagnosis in Logic Circuits Using {EB} Tester and Multiple/Single Fault Simulators}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {341--346}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810773}, doi = {10.1109/ATS.1999.810773}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/TakahashiBTY99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/TakasakiFI99, author = {Tomoya Takasaki and Hideo Fujiwara and Tomoo Inoue}, title = {A High-Level Synthesis Approach to Partial Scan Design Based on Acyclic Structure}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {309--314}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810768}, doi = {10.1109/ATS.1999.810768}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/TakasakiFI99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/Tang99, author = {Jing{-}Jou Tang}, title = {An Accurate Logic Threshold Voltages Determination Model for {CMOS} Gates to Facilitate Test Generation and Fault Simulation}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {81}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810733}, doi = {10.1109/ATS.1999.810733}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/Tang99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/TaniguchiKHM99, author = {Yasuyuki Taniguchi and Naotake Kamiura and Yutaka Hata and Nobuyuki Matsui}, title = {Activation Function Manipulation for Fault Tolerant Feedforward Neural Networks}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {203--208}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810751}, doi = {10.1109/ATS.1999.810751}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/TaniguchiKHM99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/TuW99, author = {Haiying Tu and Fangmei Wu}, title = {How to Design an Environment Simulator for Safety Critical Software Testing}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {256}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810760}, doi = {10.1109/ATS.1999.810760}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/TuW99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/WuL99, author = {Fangmei Wu and Meng Li}, title = {Railway Signaling Safety-critical Software Testing Based on Dynamic Decision Table}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {247--250}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810758}, doi = {10.1109/ATS.1999.810758}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/WuL99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/XuF99, author = {Shiyi Xu and Tukwasibwe Justaf Frank}, title = {An Evaluation of Test Generation Algorithms for combinational Circuits}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {63--69}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810730}, doi = {10.1109/ATS.1999.810730}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/XuF99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/XuW99, author = {Zhongwei Xu and Fangmei Wu}, title = {A Novel Testing Approach for Safety-Critical Software}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {251--255}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810759}, doi = {10.1109/ATS.1999.810759}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/XuW99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/YamadaKTY99, author = {Teruhiko Yamada and Toshinori Kotake and Hiroshi Takahashi and Koji Yamazaki}, title = {Identification of Redundant Crosspoint Faults in Sequential PLAs with Fault-Free Hardware Reset}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {269--274}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810762}, doi = {10.1109/ATS.1999.810762}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/YamadaKTY99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/YuXHL99, author = {Yinlei Yu and Jian Xu and Wei{-}Kang Huang and Fabrizio Lombardi}, title = {Minimizing the Number of Programming Steps for Diagnosis of Interconnect Faults in FPGAs}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {357--362}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810775}, doi = {10.1109/ATS.1999.810775}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/YuXHL99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/ZengCC99, author = {Zhide Zeng and Jihua Chen and Hefeng Cao}, title = {Research and Implementation of a High Speed Test Generation for Ultra Large Scale Combinational Circuits}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {70--74}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810731}, doi = {10.1109/ATS.1999.810731}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/ZengCC99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/ZengCL99, author = {Zhide Zeng and Jihua Chen and Pengxia Liu}, title = {A Fault Partitioning Method in Parallel Test Generation for Large Scale {VLSI} Circuits}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {133}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810741}, doi = {10.1109/ATS.1999.810741}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/ZengCL99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/ZhangHY99, author = {Tao Zhang and Dongcheng Hu and Shiyuan Yang}, title = {Fault-Tolerant Analysis of Feedback Neural Networks with Threshold Neurons}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {209--213}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810752}, doi = {10.1109/ATS.1999.810752}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/ZhangHY99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/ZhaoWL99, author = {Lan Zhao and D. M. H. Walker and Fabrizio Lombardi}, title = {{IDDQ} Testing of Input/Output Resources of SRAM-Based FPGAs}, booktitle = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, pages = {375}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://doi.org/10.1109/ATS.1999.810778}, doi = {10.1109/ATS.1999.810778}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/ZhaoWL99.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/ats/1999, title = {8th Asian Test Symposium {(ATS} '99), 16-18 November 1999, Shanghai, China}, publisher = {{IEEE} Computer Society}, year = {1999}, url = {https://ieeexplore.ieee.org/xpl/conhome/6575/proceeding}, isbn = {0-7695-0315-2}, timestamp = {Wed, 16 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ats/1999.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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