Search dblp for Publications

• > Home > Search

@article{DBLP:journals/mr/Al-ObaidyYM17,
  author       = {Furat Al{-}Obaidy and
                  Farhang Yazdani and
                  Farah A. Mohammadi},
  title        = {Fault detection using thermal image based on soft computing methods:
                  Comparative study},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {56--64},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.013},
  doi          = {10.1016/J.MICROREL.2017.02.013},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Al-ObaidyYM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ChenCGSZZZDLGWL17,
  author       = {Rongmei Chen and
                  Wei Chen and
                  Xiaoqiang Guo and
                  Chen Shen and
                  Fengqi Zhang and
                  Lisang Zheng and
                  Wen Zhao and
                  Lili Ding and
                  Yinhong Luo and
                  Hongxia Guo and
                  Yuanming Wang and
                  Yinong Liu},
  title        = {Improved on-chip self-triggered single-event transient measurement
                  circuit design and applications},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {99--105},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.03.004},
  doi          = {10.1016/J.MICROREL.2017.03.004},
  timestamp    = {Tue, 07 May 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ChenCGSZZZDLGWL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ChenHL17,
  author       = {Qi Chen and
                  Run Hu and
                  Xiaobing Luo},
  title        = {A statistical study to identify the effects of packaging structures
                  on lumen reliability of LEDs},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {51--55},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.011},
  doi          = {10.1016/J.MICROREL.2017.02.011},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChenHL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ChenJFZ17,
  author       = {Yilong Chen and
                  Jianyuan Jia and
                  Hongzhi Fu and
                  Zhaofei Zhu},
  title        = {Development of numerical algorithm to guide solder joint structure
                  and component structural design during manufacturing},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {134--142},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.007},
  doi          = {10.1016/J.MICROREL.2017.02.007},
  timestamp    = {Thu, 29 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChenJFZ17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/DuLLZDHRYY17,
  author       = {Xuecheng Du and
                  Shuhuan Liu and
                  Dongyang Luo and
                  Yao Zhang and
                  Xiaozhi Du and
                  Chaohui He and
                  Xiaotang Ren and
                  Weitao Yang and
                  Yuan Yuan},
  title        = {Single event effects sensitivity of low energy proton in Xilinx Zynq-7010
                  system-on chip},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {65--70},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.014},
  doi          = {10.1016/J.MICROREL.2017.02.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DuLLZDHRYY17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/IonitaNI17,
  author       = {Claudiu Ionita and
                  Muhammad Nawaz and
                  Kalle Ilves},
  title        = {On the short-circuit and avalanche ruggedness reliability assessment
                  of SiC {MOSFET} modules},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {6--16},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.004},
  doi          = {10.1016/J.MICROREL.2017.02.004},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/IonitaNI17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LassnigLKPRN17,
  author       = {Alice Lassnig and
                  Martin Lederer and
                  Golta Khatibi and
                  Rainer Pelzer and
                  W. Robl and
                  Michael Nelhiebel},
  title        = {High cycle fatigue testing of thermosonic ball bonds},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {91--98},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.019},
  doi          = {10.1016/J.MICROREL.2017.02.019},
  timestamp    = {Tue, 04 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LassnigLKPRN17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LeeKBLYKY17,
  author       = {Byung{-}Suk Lee and
                  Yong{-}Ho Ko and
                  Jung{-}Hwan Bang and
                  Chang{-}Woo Lee and
                  Sehoon Yoo and
                  Jun{-}Ki Kim and
                  Jeong{-}Won Yoon},
  title        = {Interfacial reactions and mechanical strength of Sn-3.0Ag-0.5Cu/Ni/Cu
                  and Au-20Sn/Ni/Cu solder joints for power electronics applications},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {119--125},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.03.011},
  doi          = {10.1016/J.MICROREL.2017.03.011},
  timestamp    = {Thu, 01 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LeeKBLYKY17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LiangKMZZ17,
  author       = {Shuibao Liang and
                  Changbo Ke and
                  Wenjing Ma and
                  Minbo Zhou and
                  Xinping Zhang},
  title        = {Numerical simulations of migration and coalescence behavior of microvoids
                  driven by diffusion and electric field in solder interconnects},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {71--81},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.018},
  doi          = {10.1016/J.MICROREL.2017.02.018},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LiangKMZZ17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LiuLRLLH17,
  author       = {Jizhi Liu and
                  Qian Lingli and
                  Tian Rui and
                  Zhiwei Liu and
                  Zhao Liu and
                  Cheng Hui},
  title        = {Self-triggered stacked silicon-controlled rectifier structure {(STSSCR)}
                  for on-chip electrostatic discharge {(ESD)} protection},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {1--5},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.11.014},
  doi          = {10.1016/J.MICROREL.2016.11.014},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiuLRLLH17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LiuLZLC17,
  author       = {L. Liu and
                  S. Li and
                  Y. M. Zhou and
                  L. Y. Liu and
                  Xian An Cao},
  title        = {High-current stressing of organic light-emitting diodes with different
                  electron-transport materials},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {106--110},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.03.002},
  doi          = {10.1016/J.MICROREL.2017.03.002},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiuLZLC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/SakamotoOS17,
  author       = {Junji Sakamoto and
                  Hisakazu Ohara and
                  Tadahiro Shibutani},
  title        = {Finite element analysis of thermal and mechanical stresses due to
                  the grain anisotropy of polycrystalline {\(\beta\)}-Sn},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {29--34},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.009},
  doi          = {10.1016/J.MICROREL.2017.02.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SakamotoOS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/Shokravi17,
  author       = {M. Shokravi},
  title        = {Dynamic pull-in and pull-out analysis of viscoelastic nanoplates under
                  electrostatic and Casimir forces via sinusoidal shear deformation
                  theory},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {17--28},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.006},
  doi          = {10.1016/J.MICROREL.2017.02.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/Shokravi17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/TanHG17,
  author       = {Shihai Tan and
                  Jing Han and
                  Fu Guo},
  title        = {Effects of twin grain boundaries on the subgrain rotation of the solder
                  joint during thermal shock},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {126--133},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.03.013},
  doi          = {10.1016/J.MICROREL.2017.03.013},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TanHG17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/TranKMMHP17,
  author       = {Hiep Tran and
                  Masturina Kracica and
                  Dougal McCulloch and
                  Edwin Mayes and
                  Anthony Holland and
                  James Partridge},
  title        = {Energetic deposition, measurement and simulation of graphitic contacts
                  to 6H-SiC},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {82--85},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.017},
  doi          = {10.1016/J.MICROREL.2017.02.017},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/TranKMMHP17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/UbochiFAIK17,
  author       = {Brendan Ubochi and
                  Soroush Faramehr and
                  Khaled Ahmeda and
                  Petar Igic and
                  Karol Kalna},
  title        = {Operational frequency degradation induced trapping in scaled GaN HEMTs},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {35--40},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.008},
  doi          = {10.1016/J.MICROREL.2017.02.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/UbochiFAIK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/XiaLLCZ17,
  author       = {Jiang Xia and
                  Guoyuan Li and
                  Bin Li and
                  LanXian Cheng and
                  Bin Zhou},
  title        = {Fatigue life prediction of Package-on-Package stacking assembly under
                  random vibration loading},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {111--118},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.03.005},
  doi          = {10.1016/J.MICROREL.2017.03.005},
  timestamp    = {Thu, 27 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/XiaLLCZ17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/YoonCBMEJ17,
  author       = {Hyungseok Yoon and
                  Kwang{-}Seong Choi and
                  Hyun{-}Cheol Bae and
                  Jong{-}Tae Moon and
                  Yong{-}Sung Eom and
                  Insu Jeon},
  title        = {Evaluating the material properties of underfill for a reliable 3D
                  {TSV} integration package using numerical analysis},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {41--50},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.010},
  doi          = {10.1016/J.MICROREL.2017.02.010},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/YoonCBMEJ17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ZhangWYCYZTZ17,
  author       = {Peijian Zhang and
                  Xue Wu and
                  Qianning Yi and
                  Wensuo Chen and
                  Yonghui Yang and
                  Kunfeng Zhu and
                  Kaizhou Tan and
                  Yi Zhong},
  title        = {A comparison of the effects of cobalt-60 {\(\gamma\)} ray irradiation
                  on {DPSA} bipolar transistors at high and low injection levels},
  journal      = {Microelectron. Reliab.},
  volume       = {71},
  pages        = {86--90},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.02.015},
  doi          = {10.1016/J.MICROREL.2017.02.015},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ZhangWYCYZTZ17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}