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@article{DBLP:journals/mr/Ahmad02,
author = {Afaq Ahmad},
title = {Investigation of a constant behavior of aliasing errors in signature
analysis due to the use of different ordered test-patterns in {LFSR}
based testing techniques},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {967--974},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00018-5},
doi = {10.1016/S0026-2714(02)00018-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Ahmad02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AhnLKCK02,
author = {Yongseok Ahn and
Sanghyun Lee and
Gwanhyeob Koh and
Taeyoung Chung and
Kinam Kim},
title = {The abnormality in gate oxide failure induced by stress-enhanced diffusion
of polycrystalline silicon},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {349--354},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00250-5},
doi = {10.1016/S0026-2714(01)00250-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AhnLKCK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlamCH02,
author = {M. O. Alam and
Yan Cheong Chan and
K. C. Hung},
title = {Reliability study of the electroless Ni-P layer against solder alloy},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1065--1073},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00068-9},
doi = {10.1016/S0026-2714(02)00068-9},
timestamp = {Wed, 20 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AlamCH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlanderNHR02,
author = {T. Alander and
S. Nurmi and
Pekka Heino and
Eero Ristolainen},
title = {Impact of component placement in solder joint reliability},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {399--406},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00217-7},
doi = {10.1016/S0026-2714(01)00217-7},
timestamp = {Wed, 20 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AlanderNHR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Amagai02,
author = {Masazumi Amagai},
title = {Mechanical reliability in electronic packaging},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {607--627},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00037-9},
doi = {10.1016/S0026-2714(02)00037-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Amagai02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AmagaiWOKS02,
author = {Masazumi Amagai and
Masako Watanabe and
Masaki Omiya and
Kikuo Kishimoto and
Toshikazu Shibuya},
title = {Mechanical characterization of Sn-Ag-based lead-free solders},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {951--966},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00017-3},
doi = {10.1016/S0026-2714(02)00017-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AmagaiWOKS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Amorese02,
author = {Gregory L. Amorese},
title = {Minimizing equivalent series resistance measurement errors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {855--860},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00047-1},
doi = {10.1016/S0026-2714(02)00047-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Amorese02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AndersonM02,
author = {Wallace T. Anderson and
Roberto Menozzi},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {995},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00062-8},
doi = {10.1016/S0026-2714(02)00062-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AndersonM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AndriesDCCSGLDD02,
author = {E. Andries and
R. Dreesen and
Kris Croes and
Ward De Ceuninck and
Luc De Schepper and
Guido Groeseneken and
K. F. Lo and
Marc D'Olieslaeger and
Jan D'Haen},
title = {Statistical aspects of the degradation of {LDD} nMOSFETs},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1409--1413},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00160-9},
doi = {10.1016/S0026-2714(02)00160-9},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AndriesDCCSGLDD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AresuCDCAMSDKD02,
author = {Stefano Aresu and
Ward De Ceuninck and
R. Dreesen and
Kris Croes and
E. Andries and
Jean Manca and
Luc De Schepper and
Robin Degraeve and
Ben Kaczer and
Marc D'Olieslaeger},
title = {High-resolution {SILC} measurements of thin SiO\({}_{\mbox{2}}\) at
ultra low voltages},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1485--1489},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00175-0},
doi = {10.1016/S0026-2714(02)00175-0},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AresuCDCAMSDKD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ArshakEP02,
author = {Khalil I. Arshak and
D. P. Egan and
K. Phelan},
title = {Using statistical design of experiment to investigate the effect of
firing parameters on the electrical and magnetic properties of Mn-Zn
ferrite},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1127--1132},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00035-5},
doi = {10.1016/S0026-2714(02)00035-5},
timestamp = {Wed, 06 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ArshakEP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AtanassovaP02,
author = {Elena Atanassova and
Albena Paskaleva},
title = {Breakdown fields and conduction mechanisms in thin Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\)
layers on Si for high density DRAMs},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {157--173},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00248-7},
doi = {10.1016/S0026-2714(01)00248-7},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AtanassovaP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AtanassovaS02,
author = {Elena Atanassova and
Dejan Spasov},
title = {Thermal Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\)--alternative to SiO\({}_{\mbox{2}}\)
for storage capacitor application},
journal = {Microelectron. Reliab.},
volume = {42},
number = {8},
pages = {1171--1177},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00088-4},
doi = {10.1016/S0026-2714(02)00088-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AtanassovaS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AugereauOBD02,
author = {Jean Augereau and
Yves Ousten and
Laurent B{\'{e}}chou and
Yves Danto},
title = {Acoustic analysis of an assembly: Structural identification by signal
processing (wavelets)},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1517--1522},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00182-8},
doi = {10.1016/S0026-2714(02)00182-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AugereauOBD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bafleur02,
author = {Marise Bafleur},
title = {In the memory of Georges Charitat},
journal = {Microelectron. Reliab.},
volume = {42},
number = {8},
pages = {1153--1154},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00093-8},
doi = {10.1016/S0026-2714(02)00093-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Bafleur02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BalitskaBSV02,
author = {V. O. Balitska and
B. Butkievich and
O. I. Shpotyuk and
M. M. Vakiv},
title = {On the analytical description of ageing kinetics in ceramic manganite-based
{NTC} thermistors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {2003--2007},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00096-3},
doi = {10.1016/S0026-2714(02)00096-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BalitskaBSV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BarlowLE02,
author = {Fred Barlow and
A. Lostetter and
Aicha Elshabini},
title = {Low cost flex substrates for miniaturized electronic assemblies},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1091--1099},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00061-6},
doi = {10.1016/S0026-2714(02)00061-6},
timestamp = {Mon, 18 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BarlowLE02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BarthR02,
author = {Jon Barth and
John Richner},
title = {Correlation considerations: Real {HBM} to {TLP} and {HBM} testers},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {909--917},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00054-9},
doi = {10.1016/S0026-2714(02)00054-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BarthR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Baskin02,
author = {E. M. Baskin},
title = {Analysis of burn-in time using the general law of reliability},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1967--1974},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00244-5},
doi = {10.1016/S0026-2714(02)00244-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Baskin02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BattistaCFM02,
author = {Piero Battista and
Marcantonio Catelani and
Gianni Fasano and
Alessandro Materassi},
title = {On the reliability of instruments for environmental monitoring: some
practical considerations},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1393--1396},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00157-9},
doi = {10.1016/S0026-2714(02)00157-9},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BattistaCFM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeaudoinCDPLC02,
author = {Felix Beaudoin and
D. Carisetti and
Romain Desplats and
Philippe Perdu and
Dean Lewis and
J. C. Clement},
title = {Backside Defect Localizations and Revelations Techniques on Gallium
Arsenide (GaAs) Devices},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1581--1585},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00194-4},
doi = {10.1016/S0026-2714(02)00194-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BeaudoinCDPLC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BeaudoinHPDBL02,
author = {Felix Beaudoin and
G{\'{e}}rald Haller and
Philippe Perdu and
Romain Desplats and
Thomas Beauch{\^{e}}ne and
Dean Lewis},
title = {Reliability Defect Monitoring with Thermal Laser Stimulation: Biased
Versus Unbiased},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1729--1734},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00221-4},
doi = {10.1016/S0026-2714(02)00221-4},
timestamp = {Wed, 20 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BeaudoinHPDBL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BenstetterRH02,
author = {Guenther Benstetter and
Michael W. Ruprecht and
Douglas B. Hunt},
title = {A review of {ULSI} failure analysis techniques for DRAMs 1. Defect
localization and verification},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {307--316},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00002-1},
doi = {10.1016/S0026-2714(02)00002-1},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BenstetterRH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bicaiis-LepinayAPJMK02,
author = {N. Bica{\"{\i}}s{-}L{\'{e}}pinay and
F. Andr{\'{e}} and
R. Pantel and
S. Jullian and
Alain Margain and
L. F. Tz. Kwakman},
title = {Lift-out techniques coupled with advanced {TEM} characterization methods
for electrical failure analysis},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1747--1752},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00224-X},
doi = {10.1016/S0026-2714(02)00224-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Bicaiis-LepinayAPJMK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BlahoPZAG02,
author = {M. Blaho and
Dionyz Pogany and
L. Zullino and
A. Andreini and
Erich Gornik},
title = {Experimental and simulation analysis of a {BCD} {ESD} protection element
under the {DC} and {TLP} stress conditions},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1281--1286},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00135-X},
doi = {10.1016/S0026-2714(02)00135-X},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BlahoPZAG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BlascoNA02,
author = {X. Blasco and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich},
title = {Conduction and Breakdown Behaviour of Atomic Force Microscopy Grown
SiO\({}_{\mbox{2}}\) Gate Oxide on {MOS} Structures},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1513--1516},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00181-6},
doi = {10.1016/S0026-2714(02)00181-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BlascoNA02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BojtaNH02,
author = {P. Bojta and
P. N{\'{e}}meth and
G{\'{a}}bor Hars{\'{a}}nyi},
title = {Searching for appropriate humidity accelerated migration reliability
tests methods},
journal = {Microelectron. Reliab.},
volume = {42},
number = {8},
pages = {1213--1218},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00083-5},
doi = {10.1016/S0026-2714(02)00083-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BojtaNH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrisbinC02,
author = {Douglas Brisbin and
Prasad Chaparala},
title = {Influence of test techniques on soft breakdown detection in ultra-thin
oxides},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {35--39},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00125-1},
doi = {10.1016/S0026-2714(01)00125-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BrisbinC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BusattoCFBIV02,
author = {Giovanni Busatto and
B. Cascone and
Luigi Fratelli and
M. Balsamo and
Francesco Iannuzzo and
Francesco Velardi},
title = {Non-destructive high temperature characterisation of high-voltage
IGBTs},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1635--1640},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00205-6},
doi = {10.1016/S0026-2714(02)00205-6},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BusattoCFBIV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CaddemiD02,
author = {Alina Caddemi and
Nicola Donato},
title = {Temperature-dependent noise characterization and modeling of on-wafer
microwave transistors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {361--366},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00004-5},
doi = {10.1016/S0026-2714(02)00004-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CaddemiD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CalozERGGA02,
author = {Fran{\c{c}}ois Caloz and
Daniel Ernst and
Patrick Rossini and
Laura Gherardi and
Lisa Grassi and
Jean Arnaud},
title = {Reliability of optical connectors - Humidity behavior of the adhesive},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1323--1328},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00143-9},
doi = {10.1016/S0026-2714(02)00143-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CalozERGGA02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CapraraBBBCCCDFL02,
author = {Paolo Caprara and
A. Barcella and
M. Beltramello and
C. Brambilla and
S. Cereda and
Carlo Caimi and
Valentina Contin and
V. Daniele and
M. Fontana and
P. Lucarno},
title = {Analyses on {NVM} Circuitry Delay Induced by Source {\&} Drain
BF\({}_{\mbox{2}}\) Implant},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1509--1511},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00180-4},
doi = {10.1016/S0026-2714(02)00180-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CapraraBBBCCCDFL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CaprileMIPSV02,
author = {C. Caprile and
Ilaria De Munari and
Maurizio Impronta and
Simona Podda and
Andrea Scorzoni and
Massimo Vanzi},
title = {A specimen-current branching approach for {FA} of long Electromigration
test lines},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1715--1718},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00218-4},
doi = {10.1016/S0026-2714(02)00218-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CaprileMIPSV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CaputoI02,
author = {Domenico Caputo and
Fernanda Irrera},
title = {Investigation and modeling of stressed thermal oxides},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {327--333},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00257-8},
doi = {10.1016/S0026-2714(01)00257-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CaputoI02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CarrieroPI02,
author = {M. R. Carriero and
Stefano Di Pascoli and
Giuseppe Iannaccone},
title = {Simulation of failure time distributions of metal lines under electromigration},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1469--1472},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00172-5},
doi = {10.1016/S0026-2714(02)00172-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CarrieroPI02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CarvouBSRBRGR02,
author = {E. Carvou and
F. Le Bihan and
Anne Claire Sala{\"{u}}n and
R. Rogel and
Olivier Bonnaud and
Yannick Rey{-}Tauriac and
Xavier Gagnard and
L. Roland},
title = {Reliability improvement of high value doped polysilicon-based resistors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1369--1372},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00151-8},
doi = {10.1016/S0026-2714(02)00151-8},
timestamp = {Fri, 25 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CarvouBSRBRGR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CastellazziKSS02,
author = {Alberto Castellazzi and
R. Kraus and
Norbert Seliger and
Doris Schmitt{-}Landsiedel},
title = {Reliability analysis of power MOSFET's with the help of compact models
and circuit simulation},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1605--1610},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00198-1},
doi = {10.1016/S0026-2714(02)00198-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CastellazziKSS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CatelaniN02,
author = {Marcantonio Catelani and
R. Nicoletti},
title = {A Custom-designed automatic measurement system for acquisition and
management of reliability data},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1381--1384},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00154-3},
doi = {10.1016/S0026-2714(02)00154-3},
timestamp = {Sat, 12 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CatelaniN02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CericS02,
author = {Hajdin Ceric and
Siegfried Selberherr},
title = {Simulative prediction of the resistance change due to electromigration
induced void evolution},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1457--1460},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00169-5},
doi = {10.1016/S0026-2714(02)00169-5},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CericS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CeschiniMM02,
author = {G. Ceschini and
Marco Mugnaini and
A. Masi},
title = {A reliability study for a submarine compression application},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1377--1380},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00153-1},
doi = {10.1016/S0026-2714(02)00153-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CeschiniMM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChakrabortyLK02,
author = {S. Chakraborty and
P. T. Lai and
Paul C. K. Kwok},
title = {{MOS} characteristics of NO-grown oxynitrides on n-type 6H-SiC},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {455--458},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00220-7},
doi = {10.1016/S0026-2714(01)00220-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChakrabortyLK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChanL02,
author = {Y. C. Chan and
D. Y. Luk},
title = {Effects of bonding parameters on the reliability performance of anisotropic
conductive adhesive interconnects for flip-chip-on-flex packages assembly
I. Different bonding temperature},
journal = {Microelectron. Reliab.},
volume = {42},
number = {8},
pages = {1185--1194},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00079-3},
doi = {10.1016/S0026-2714(02)00079-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChanL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChanL02a,
author = {Y. C. Chan and
D. Y. Luk},
title = {Effects of bonding parameters on the reliability performance of anisotropic
conductive adhesive interconnects for flip-chip-on-flex packages assembly
{II.} Different bonding pressure},
journal = {Microelectron. Reliab.},
volume = {42},
number = {8},
pages = {1195--1204},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00089-6},
doi = {10.1016/S0026-2714(02)00089-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChanL02a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChangSWHS02,
author = {Chun{-}Yen Chang and
Jiong{-}Guang Su and
Shyh{-}Chyi Wong and
Tiao{-}Yuan Huang and
Yuan{-}Chen Sun},
title = {{RF} {CMOS} technology for {MMIC}},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {721--733},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00006-9},
doi = {10.1016/S0026-2714(02)00006-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChangSWHS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenP02,
author = {Jann{-}Pygn Chen and
Wen Lea Pearn},
title = {Testing process performance based on the yield: an application to
the liquid-crystal display module},
journal = {Microelectron. Reliab.},
volume = {42},
number = {8},
pages = {1235--1241},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00081-1},
doi = {10.1016/S0026-2714(02)00081-1},
timestamp = {Fri, 18 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChenP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenVLHL02,
author = {Fen Chen and
Rolf{-}Peter Vollertsen and
Baozhen Li and
Dave Harmon and
Wing L. Lai},
title = {A new empirical extrapolation method for time-dependent dielectric
breakdown reliability projections of thin SiO\({}_{\mbox{2}}\) and
nitride-oxide dielectrics},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {335--341},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00261-X},
doi = {10.1016/S0026-2714(01)00261-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenVLHL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiaoW02,
author = {C.{-}H. Chiao and
W. Y. Wang},
title = {Reliability improvement of fluorescent lamp using grey forecasting
model},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {127--134},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00243-8},
doi = {10.1016/S0026-2714(01)00243-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiaoW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuCL02,
author = {Y. W. Chiu and
Y. C. Chan and
S. M. Lui},
title = {Study of short-circuiting between adjacent joints under electric field
effects in fine pitch anisotropic conductive adhesive interconnects},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1945--1951},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00097-5},
doi = {10.1016/S0026-2714(02)00097-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuCL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuMT02,
author = {Chia{-}Pin Chiu and
James Maveety and
Quan A. Tran},
title = {Characterization of solder interfaces using laser flash metrology},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {93--100},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00129-9},
doi = {10.1016/S0026-2714(01)00129-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuMT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChungB02,
author = {Young S. Chung and
Bob Baird},
title = {Power capability limits of power {MOSFET} devices},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {211--218},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00252-9},
doi = {10.1016/S0026-2714(01)00252-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChungB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Ciappa02,
author = {Mauro Ciappa},
title = {Selected failure mechanisms of modern power modules},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {653--667},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00042-2},
doi = {10.1016/S0026-2714(02)00042-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Ciappa02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CiappaCCF02,
author = {Mauro Ciappa and
Flavio Carbognani and
Paolo Cova and
Wolfgang Fichtner},
title = {A Novel Thermomechanics -Based Lifetime Prediction Model for Cycle
Fatigue Failure Mechanisms in Power Semiconductors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1653--1658},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00206-8},
doi = {10.1016/S0026-2714(02)00206-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CiappaCCF02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CibakovaFGKPRU02,
author = {T. Cib{\'{a}}kov{\'{a}} and
M{\'{a}}ria Fischerov{\'{a}} and
Elena Gramatov{\'{a}} and
Wieslaw Kuzmicz and
Witold A. Pleskacz and
Jaan Raik and
Raimund Ubar},
title = {Hierarchical test generation for combinational circuits with real
defects coverage},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1141--1149},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00080-X},
doi = {10.1016/S0026-2714(02)00080-X},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CibakovaFGKPRU02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CottetST02,
author = {Didier Cottet and
Michael Scheffler and
Gerhard Tr{\"{o}}ster},
title = {A novel, zone based process monitoring method for low cost {MCM-D}
substrates manufactured on large area panels},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {417--426},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00135-4},
doi = {10.1016/S0026-2714(01)00135-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CottetST02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CovaMDFJ02,
author = {Paolo Cova and
Roberto Menozzi and
Maximilian Dammann and
T. Feltgen and
W. Jantz},
title = {High-field step-stress and long term stability of PHEMTs with different
gate and recess lengths},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1587--1592},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00195-6},
doi = {10.1016/S0026-2714(02)00195-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CovaMDFJ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CrepelBMHCGPDL02,
author = {Olivier Cr{\'{e}}pel and
Felix Beaudoin and
Lionel Dantas de Morais and
G{\'{e}}rald Haller and
C. Goupil and
Philippe Perdu and
Romain Desplats and
Dean Lewis},
title = {Backside Hot Spot Detection Using Liquid Crystal Microscopy},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1741--1746},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00223-8},
doi = {10.1016/S0026-2714(02)00223-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CrepelBMHCGPDL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CrepelGDDPD02,
author = {Olivier Cr{\'{e}}pel and
C. Goupil and
Bernadette Domeng{\`{e}}s and
Philippe Descamps and
Philippe Perdu and
A. Doukkali},
title = {Magnetic field measurements for Non Destructive Failure Analysis},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1763--1766},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00227-5},
doi = {10.1016/S0026-2714(02)00227-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CrepelGDDPD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CretuBGG02,
author = {B. Cretu and
Francis Balestra and
G{\'{e}}rard Ghibaudo and
G. Gu{\'{e}}gan},
title = {Origin of hot carrier degradation in advanced nMOSFET devices},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1405--1408},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00159-2},
doi = {10.1016/S0026-2714(02)00159-2},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CretuBGG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CurroGS02,
author = {Giuseppe Curr{\`{o}} and
R. Greco and
Antonino Scandurra},
title = {Growth process and chemical characterization of an ultrathin phosphate
film grafted onto Al-alloy metallization surfaces relevant to microelectronic
devices reliability},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1659--1662},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00207-X},
doi = {10.1016/S0026-2714(02)00207-X},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CurroGS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DammannBMJ02,
author = {Maximilian Dammann and
F. Benkhelifa and
M. Meng and
W. Jantz},
title = {Reliability of Metamorphic HEMTs for Power Applications},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1569--1573},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00192-0},
doi = {10.1016/S0026-2714(02)00192-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DammannBMJ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DardalhonBLNPNO02,
author = {M. Dardalhon and
Vincent Beroulle and
Laurent Latorre and
Pascal Nouet and
Guy Perez and
Jean Marc Nicot and
Coumar Oud{\'{e}}a},
title = {Reliability analysis of {CMOS} {MEMS} structures obtained by Front
Side Bulk Micromachining},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1777--1782},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00230-5},
doi = {10.1016/S0026-2714(02)00230-5},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DardalhonBLNPNO02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DehbiWOD02,
author = {A. Dehbi and
Wolfgang Wondrak and
Yves Ousten and
Yves Danto},
title = {High temperature reliability testing of aluminum and tantalum electrolytic
capacitors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {835--840},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00021-5},
doi = {10.1016/S0026-2714(02)00021-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DehbiWOD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dhifi02,
author = {M. Dhifi},
title = {A novel simulation technique for testing analog ICs},
journal = {Microelectron. Reliab.},
volume = {42},
number = {8},
pages = {1243--1248},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00085-9},
doi = {10.1016/S0026-2714(02)00085-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Dhifi02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Djezzar02,
author = {Boualem Djezzar},
title = {On the correlation between radiation-induced oxide- and border-trap
effects in the gate-oxide nMOSFET's},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1865--1874},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00242-1},
doi = {10.1016/S0026-2714(02)00242-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Djezzar02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DomengesSPBD02,
author = {Bernadette Domeng{\`{e}}s and
P. Schwindenhammer and
Patrick Poirier and
Felix Beaudoin and
Philippe Descamps},
title = {Comprehensive failure analysis of leakage faults in bipolar transistors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1449--1452},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00167-1},
doi = {10.1016/S0026-2714(02)00167-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DomengesSPBD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuZW02,
author = {Lei Du and
Yiqi Zhuang and
Yong Wu},
title = {1/f\({}^{\mbox{gamma}}\) Noise separated from white noise with wavelet
denoising},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {183--188},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00249-9},
doi = {10.1016/S0026-2714(01)00249-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DuZW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuchampOD02,
author = {Genevi{\`{e}}ve Duchamp and
Yves Ousten and
Yves Danto},
title = {Evaluation of a micropackaging analysis technique by highfrequency
microwaves},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1551--1554},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00188-9},
doi = {10.1016/S0026-2714(02)00188-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DuchampOD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DuerrPS02,
author = {Klaus Duerr and
Reinhard Pusch and
Gottfried Schmitt},
title = {Reliability Problems of Passive Optical Devices and Modules after
Mechanical, Thermal and Humidity Testing},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1329--1332},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00144-0},
doi = {10.1016/S0026-2714(02)00144-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DuerrPS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dziedzic02,
author = {Andrzej Dziedzic},
title = {Electrical and structural investigations in reliability characterisation
of modern passives and passive integrated components},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {709--719},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00044-6},
doi = {10.1016/S0026-2714(02)00044-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Dziedzic02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EnzlerHD02,
author = {A. Enzler and
Nikolaus Herres and
Alex Dommann},
title = {Analysis of etched cantilevers},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1807--1809},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00235-4},
doi = {10.1016/S0026-2714(02)00235-4},
timestamp = {Mon, 23 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/EnzlerHD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Fabis02,
author = {Philip M. Fabis},
title = {The processing technology and electronic packaging of {CVD} diamond:
a case study for GaAs/CVD diamond plastic packages},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {233--252},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00242-6},
doi = {10.1016/S0026-2714(01)00242-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Fabis02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FadlallahGJZG02,
author = {M. Fadlallah and
G{\'{e}}rard Ghibaudo and
Jalal Jomaah and
M. Zoaeter and
G. Gu{\'{e}}gan},
title = {Static and low frequency noise characterization of surface- and buried-mode
0.1 mum {P} and {N} MOSFETs},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {41--46},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00232-3},
doi = {10.1016/S0026-2714(01)00232-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FadlallahGJZG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FanC02,
author = {S. H. Fan and
Y. C. Chan},
title = {Effect of misalignment on electrical characteristics of {ACF} joints
for flip chip on flex applications},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1081--1090},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00069-0},
doi = {10.1016/S0026-2714(02)00069-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FanC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FantiniV02,
author = {Fausto Fantini and
Massimo Vanzi},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1249},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00245-7},
doi = {10.1016/S0026-2714(02)00245-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FantiniV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FaureW02,
author = {D. Faure and
C. A. Waggoner},
title = {A New sub-micro probing technique for failure analysis in integrated
circuits},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1767--1770},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00228-7},
doi = {10.1016/S0026-2714(02)00228-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FaureW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FeruglioIR02,
author = {Ruggero Feruglio and
Fernanda Irrera and
Bruno Ricc{\`{o}}},
title = {Microscopic aspects of defect generation in SiO\({}_{\mbox{2}}\)},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1427--1432},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00163-4},
doi = {10.1016/S0026-2714(02)00163-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FeruglioIR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Fleetwood02,
author = {Daniel M. Fleetwood},
title = {Effects of hydrogen transport and reactions on microelectronics radiation
response and reliability},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {523--541},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00019-7},
doi = {10.1016/S0026-2714(02)00019-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Fleetwood02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Fleetwood02a,
author = {Daniel M. Fleetwood},
title = {Hydrogen-related reliability issues for advanced microelectronics},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1397--1403},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00158-0},
doi = {10.1016/S0026-2714(02)00158-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Fleetwood02a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FongZLSSLXW02,
author = {Wai{-}Keung Fong and
C. F. Zhu and
B. H. Leung and
C. Surya and
B. Sundaravel and
E. Z. Luo and
Jianbin Xu and
I. H. Wilson},
title = {Characterizations of GaN films grown with indium surfactant by RF-plasma
assisted molecular beam epitaxy},
journal = {Microelectron. Reliab.},
volume = {42},
number = {8},
pages = {1179--1184},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00086-0},
doi = {10.1016/S0026-2714(02)00086-0},
timestamp = {Mon, 11 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FongZLSSLXW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FoucherBMD02,
author = {B. Foucher and
J. Boulli{\'{e}} and
B. Meslet and
D. Das},
title = {A review of reliability prediction methods for electronic devices},
journal = {Microelectron. Reliab.},
volume = {42},
number = {8},
pages = {1155--1162},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00087-2},
doi = {10.1016/S0026-2714(02)00087-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FoucherBMD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FreyHPHSPSKKET02,
author = {Alexander Frey and
Franz Hofmann and
R. Peters and
Birgit Holzapfl and
Meinrad Schienle and
Christian Paulus and
Petra Schindler{-}Bauer and
Dirk Kuhlmeier and
J{\"{u}}rgen Krause and
Gerald Eckstein and
Roland Thewes},
title = {Yield Evaluation of Gold Sensor Electrodes Used for Fully Electronic
{DNA} Detection Arrays on {CMOS}},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1801--1806},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00234-2},
doi = {10.1016/S0026-2714(02)00234-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FreyHPHSPSKKET02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FriskJR02,
author = {Laura Frisk and
J. J{\"{a}}rvinen and
R. Ristolainen},
title = {Chip on flex attachment with thermoplastic {ACF} for {RFID} applications},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1559--1562},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00190-7},
doi = {10.1016/S0026-2714(02)00190-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FriskJR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Fukuda02,
author = {Mitsuo Fukuda},
title = {Optical semiconductor device reliability},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {679--683},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00022-7},
doi = {10.1016/S0026-2714(02)00022-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Fukuda02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GalyBFGCBB02,
author = {Philippe Galy and
V. Berland and
B. Foucher and
A. Guilhaume and
J. P. Chante and
S. Bardy and
F. Blanc},
title = {Experimental and 3D simulation correlation of a gg-nMOS transistor
under high current pulse},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1299--1302},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00138-5},
doi = {10.1016/S0026-2714(02)00138-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GalyBFGCBB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GamerithP02,
author = {S. Gamerith and
M. P{\"{o}}lzl},
title = {Negative bias temperature stress on low voltage p-channel {DMOS} transistors
and the role of nitrogen},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1439--1443},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00165-8},
doi = {10.1016/S0026-2714(02)00165-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GamerithP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GaoCN02,
author = {Frank Gao and
Ravi Chanana and
Tom Nicholls},
title = {The effects of buffer thickness on GaAs {MESFET} characteristics:
channel-substrate current, drain breakdown, and reliability},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1003--1010},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00064-1},
doi = {10.1016/S0026-2714(02)00064-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GaoCN02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GarbolinoH02,
author = {Tomasz Garbolino and
Andrzej Hlawiczka},
title = {Efficient test pattern generators based on specific cellular automata
structures},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {975--983},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00033-1},
doi = {10.1016/S0026-2714(02)00033-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GarbolinoH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhibaudoB02,
author = {G{\'{e}}rard Ghibaudo and
T. Boutchacha},
title = {Electrical noise and {RTS} fluctuations in advanced {CMOS} devices},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {573--582},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00025-2},
doi = {10.1016/S0026-2714(02)00025-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GhibaudoB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhidiniB02,
author = {G. Ghidini and
D. Brazzelli},
title = {Evaluation methodology of thin dielectrics for non-volatile memory
application},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1473--1480},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00173-7},
doi = {10.1016/S0026-2714(02)00173-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GhidiniB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GiacomoO02,
author = {Giulio Di Giacomo and
Stefano Oggioni},
title = {Reliability of Flip Chip Applications with Ceramic and Organic Chip
Carriers},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1541--1546},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00186-5},
doi = {10.1016/S0026-2714(02)00186-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GiacomoO02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GiglioMMPV02,
author = {M. Giglio and
G. Martines and
Giovanna Mura and
Simona Podda and
Massimo Vanzi},
title = {An automated lifetest equipment for optical emitters},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1311--1315},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00141-5},
doi = {10.1016/S0026-2714(02)00141-5},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GiglioMMPV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GiretBFARG02,
author = {C. Giret and
D. Bru and
D. Faure and
C. Ali and
M. Razani and
D. Gobled},
title = {Electrical characteristics measurement of transistors by 4 tips-0.2
micron probing technique in Semiconductor Failure Analysis},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1723--1727},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00220-2},
doi = {10.1016/S0026-2714(02)00220-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GiretBFARG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoloKM02,
author = {N. Tosic Golo and
Fred G. Kuper and
Ton J. Mouthaan},
title = {Zapping thin film transistors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {747--765},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00041-0},
doi = {10.1016/S0026-2714(02)00041-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GoloKM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GopalanKEVZ02,
author = {Sudha Gopalan and
Benno H. Krabbenborg and
Jan{-}Hein Egbers and
Bart van Velzen and
Rene Zingg},
title = {Reliability of power transistors against application driven temperature
swings},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1623--1628},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00201-9},
doi = {10.1016/S0026-2714(02)00201-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GopalanKEVZ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GoudardBBLP02,
author = {Jean{-}Luc Goudard and
P. Berthier and
X. Boddaert and
Dominique Laffitte and
J. P{\'{e}}rinet},
title = {New qualification approach for optoelectronic components},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1307--1310},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00140-3},
doi = {10.1016/S0026-2714(02)00140-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GoudardBBLP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GrybosDHSSW02,
author = {Pawel Grybos and
Wladyslaw Dabrowski and
Pawel Hottowy and
Robert Szczygiel and
Krzysztof Swientek and
Piotr Wiacek},
title = {Multichannel mixed-mode {IC} for digital readout of silicon strip
detectors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {427--436},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00260-8},
doi = {10.1016/S0026-2714(01)00260-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GrybosDHSSW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuedonWZ02,
author = {Alexandrine Gu{\'{e}}don and
Eric Woirgard and
Christian Zardini},
title = {Evaluation of lead-free soldering for automotive applications},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1555--1558},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00189-0},
doi = {10.1016/S0026-2714(02)00189-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GuedonWZ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuijunJSF02,
author = {Hu Guijun and
Shi Jiawei and
Zhang Shumei and
Zhang Fenggang},
title = {The correlation between the low-frequency electrical noise of high-power
quantum well lasers and devices surface non-radiative current},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {153--156},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00244-X},
doi = {10.1016/S0026-2714(01)00244-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GuijunJSF02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuilbaultWZL02,
author = {P. Guilbault and
Eric Woirgard and
Christian Zardini and
D. Lambert},
title = {Reliability study of the assembly of a large {EGA} on a build up board
using thermo-mechanical simulations},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1529--1533},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00184-1},
doi = {10.1016/S0026-2714(02)00184-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GuilbaultWZL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HanWCP02,
author = {P. G. Han and
Hei Wong and
Andy H. P. Chan and
M. C. Poon},
title = {A novel approach for fabricating light-emitting porous polysilicon
films},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {929--933},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00011-2},
doi = {10.1016/S0026-2714(02)00011-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HanWCP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HartmannWMKMH02,
author = {Claus Hartmann and
Rainer Weber and
Wolfgang Mertin and
Erich Kubalek and
Anne{-}Dorothea M{\"{u}}ller and
Michael Hietschold},
title = {Simultaneous IC-internal voltage and current measurements via a multi
lever Scanning Force Microscope},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1759--1762},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00226-3},
doi = {10.1016/S0026-2714(02)00226-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HartmannWMKMH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeZHW02,
author = {Jin He and
Xing Zhang and
Ru Huang and
Yangyuan Wang},
title = {Application of forward gated-diode {R-G} current method in extracting
{F-N} stress-induced interface traps in {SOI} NMOSFETs},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {145--148},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00122-6},
doi = {10.1016/S0026-2714(01)00122-6},
timestamp = {Fri, 01 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HeZHW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Henderson02,
author = {Tim Henderson},
title = {Modeling gallium arsenide heterojunction bipolar transistor ledge
variations for insight into device reliability},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1011--1020},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00065-3},
doi = {10.1016/S0026-2714(02)00065-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Henderson02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HenryBHDS02,
author = {Leo G. Henry and
Jon Barth and
Hugh Hyatt and
Tom Diep and
Michael Stevens},
title = {Charged device model metrology: limitations and problems},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {919--927},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00055-0},
doi = {10.1016/S0026-2714(02)00055-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HenryBHDS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HoaSG02,
author = {Phan L. P. Hoa and
Gunnar Suchaneck and
Gerald Gerlach},
title = {Investigation of dynamic disturbance quantities in piezoresistive
silicon sensors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1819--1822},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00238-X},
doi = {10.1016/S0026-2714(02)00238-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HoaSG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangCH02,
author = {M. L. Huang and
Kuen{-}Suan Chen and
Y. H. Hung},
title = {Integrated process capability analysis with an application in backlight
module},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {2009--2014},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00126-9},
doi = {10.1016/S0026-2714(02)00126-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangCH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangGF02,
author = {Yu{-}Jung Huang and
Mei{-}hui Guo and
Shen{-}Li Fu},
title = {Reliability and routability consideration for {MCM} placement},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {83--91},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00228-1},
doi = {10.1016/S0026-2714(01)00228-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangGF02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangLS02,
author = {Wei Huang and
James M. Loman and
B{\"{u}}lent Sener},
title = {Study of the effect of reflow time and temperature on Cu-Sn intermetallic
compound layer reliability},
journal = {Microelectron. Reliab.},
volume = {42},
number = {8},
pages = {1229--1234},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00090-2},
doi = {10.1016/S0026-2714(02)00090-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangLS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IchizliRMGCMH02,
author = {V. Ichizli and
Manuel Rodr{\'{\i}}guez{-}Giron{\'{e}}s and
L. Marchand and
C. Garden and
Oleg Cojocari and
Bastian Mottet and
Hans L. Hartnagel},
title = {Process Control and Failure Analysis Implementation for THz Schottky-based
components},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1593--1596},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00196-8},
doi = {10.1016/S0026-2714(02)00196-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IchizliRMGCMH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IgicMTJB02,
author = {P. M. Igic and
P. A. Mawby and
M. S. Towers and
W. M. Jamal and
S. G. J. Batcup},
title = {Investigation of the power dissipation during {IGBT} turn-off using
a new physics-based {IGBT} compact model},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1045--1052},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00016-1},
doi = {10.1016/S0026-2714(02)00016-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IgicMTJB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IkossiRKBMG02,
author = {K. Ikossi and
William S. Rabinovich and
D. Scott Katzer and
Steven C. Binari and
J. Mittereder and
Peter G. Goetz},
title = {Multiple quantum well {PIN} optoelectronic devices and a method of
restoring failed device characteristics},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1021--1028},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00066-5},
doi = {10.1016/S0026-2714(02)00066-5},
timestamp = {Tue, 03 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/IkossiRKBMG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IsmaeelBM02,
author = {Asad A. Ismaeel and
R. Bhatnagar and
Rajan Mathew},
title = {On-line testable data path synthesis for minimizing testing time},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {437--453},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00263-3},
doi = {10.1016/S0026-2714(01)00263-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IsmaeelBM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ItoNHAKISSH02,
author = {Shinya Ito and
Hiroaki Namba and
Tsuyoshi Hirata and
Koichi Ando and
Shin Koyama and
Nobuyuki Ikezawa and
Tatsuya Suzuki and
Takehiro Saitoh and
Tadahiko Horiuchi},
title = {Effect of mechanical stress induced by etch-stop nitride: impact on
deep-submicron transistor performance},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {201--209},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00238-4},
doi = {10.1016/S0026-2714(01)00238-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ItoNHAKISSH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IwaiO02,
author = {Hiroshi Iwai and
Shun'ichiro Ohmi},
title = {Silicon integrated circuit technology from past to future},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {465--491},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00032-X},
doi = {10.1016/S0026-2714(02)00032-X},
timestamp = {Fri, 12 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/IwaiO02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IwaiO02a,
author = {Hiroshi Iwai and
S. Ohmi},
title = {Trend of {CMOS} downsizing and its reliability},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1251--1258},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00131-2},
doi = {10.1016/S0026-2714(02)00131-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IwaiO02a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JalonenT02,
author = {Paavo Jalonen and
Aulis Tuominen},
title = {The effect of sputtered interface metallic layers on reinforced core
laminate making build-up structures},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1075--1079},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00059-8},
doi = {10.1016/S0026-2714(02)00059-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JalonenT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JanickiMN02,
author = {Marcin Janicki and
Gilbert De Mey and
Andrzej Napieralski},
title = {Transient thermal analysis of multilayered structures using Green's
functions},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1059--1064},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00082-3},
doi = {10.1016/S0026-2714(02)00082-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JanickiMN02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JantingPG02,
author = {Jakob Janting and
Dirch Hjorth Petersen and
Christoffer Greisen},
title = {Simulated {SAM} A-scans on multilayer {MEMS} components},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1811--1814},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00236-6},
doi = {10.1016/S0026-2714(02)00236-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JantingPG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeandupeuxMAFBK02,
author = {O. Jeandupeux and
V. Marsico and
A. Acovic and
P. Fazan and
H. Brune and
K. Kern},
title = {Use of scanning capacitance microscopy for controlling wafer processing},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {225--231},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00234-7},
doi = {10.1016/S0026-2714(01)00234-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeandupeuxMAFBK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JokinenR02,
author = {Erja Jokinen and
Eero Ristolainen},
title = {Anisotropic conductive film flip chip joining using thin chips},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1913--1920},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00100-2},
doi = {10.1016/S0026-2714(02)00100-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JokinenR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Jones02,
author = {B. K. Jones},
title = {Logarithmic distributions in reliability analysis},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {779--786},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00031-8},
doi = {10.1016/S0026-2714(02)00031-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Jones02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Jonnalagadda02,
author = {K. Jonnalagadda},
title = {Reliability of via-in-pad structures in mechanical cycling fatigue},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {253--258},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00136-6},
doi = {10.1016/S0026-2714(01)00136-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Jonnalagadda02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaczerDRKMG02,
author = {Ben Kaczer and
Robin Degraeve and
Mahmoud Rasras and
An De Keersgieter and
K. Van de Mieroop and
Guido Groeseneken},
title = {Analysis and modeling of a digital {CMOS} circuit operation and reliability
after gate oxide breakdown: a case study},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {555--564},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00026-4},
doi = {10.1016/S0026-2714(02)00026-4},
timestamp = {Mon, 09 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KaczerDRKMG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KeppensHIVG02,
author = {Bart Keppens and
Vincent De Heyn and
M. Natarajan Iyer and
Vesselin K. Vassilev and
Guido Groeseneken},
title = {Significance of the failure criterion on transmission line pulse testing},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {901--907},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00053-7},
doi = {10.1016/S0026-2714(02)00053-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KeppensHIVG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KerC02,
author = {Ming{-}Dou Ker and
Chyh{-}Yih Chang},
title = {{ESD} protection design for {CMOS} {RF} integrated circuits using
polysilicon diodes},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {863--872},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00049-5},
doi = {10.1016/S0026-2714(02)00049-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KerC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KilijanskiS02,
author = {M. S. Kilijanski and
Yu{-}Lin Shen},
title = {Analysis of thermal stresses in metal interconnects with multilevel
structures},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {259--264},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00239-6},
doi = {10.1016/S0026-2714(01)00239-6},
timestamp = {Fri, 17 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KilijanskiS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimEJB02,
author = {Deok{-}Hoon Kim and
Peter Elenius and
Michael Johnson and
Scott Barrett},
title = {Solder joint reliability of a polymer reinforced wafer level package},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1837--1848},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00102-6},
doi = {10.1016/S0026-2714(02)00102-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimEJB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimJCH02,
author = {Kinam Kim and
Gitae Jeong and
Chan{-}Woong Chun and
Sam{-}Jin Hwang},
title = {{DRAM} reliability},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {543--553},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00030-6},
doi = {10.1016/S0026-2714(02)00030-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimJCH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KloeserCAR02,
author = {Joachim Kloeser and
Paradiso Coskina and
Rolf Aschenbrenner and
Herbert Reichl},
title = {Bump formation for flip chip and {CSP} by solder paste printing},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {391--398},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00223-2},
doi = {10.1016/S0026-2714(01)00223-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KloeserCAR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KolliasA02,
author = {A. T. Kollias and
John N. Avaritsiotis},
title = {Analysis and design of thin film resonator ladder filters},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1133--1140},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00056-2},
doi = {10.1016/S0026-2714(02)00056-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KolliasA02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Kouvatsos02,
author = {Dimitrios N. Kouvatsos},
title = {On-state and off-state stress-induced degradation in unhydrogenated
solid phase crystallized polysilicon thin film transistors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1875--1882},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00120-8},
doi = {10.1016/S0026-2714(02)00120-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Kouvatsos02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KrishnanKMMBL02,
author = {Mahesh S. Krishnan and
Viktor Kol'dyaev and
Eiji Morifoji and
Koji Miyamoto and
Tomasz Brozek and
Xiaolei Li},
title = {Series resistance degradation due to {NBTI} in {PMOSFET}},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1433--1438},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00164-6},
doi = {10.1016/S0026-2714(02)00164-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KrishnanKMMBL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Kuehl02,
author = {Reiner W. Kuehl},
title = {Reliability of thin-film resistors: impact of third harmonic screenings},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {807--813},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00012-4},
doi = {10.1016/S0026-2714(02)00012-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Kuehl02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LabatMLTGP02,
author = {Nathalie Labat and
Nathalie Malbert and
Benoit Lambert and
Andr{\'{e}} Touboul and
F. Garat and
B. Proust},
title = {Degradation mechanisms induced by thermal and bias stresses in InP
HEMTs},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1575--1580},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00193-2},
doi = {10.1016/S0026-2714(02)00193-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LabatMLTGP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LantzHP02,
author = {Leon Lantz and
Seongdeok Hwang and
Michael G. Pecht},
title = {Characterization of plastic encapsulant materials as a baseline for
quality assessment and reliability testing},
journal = {Microelectron. Reliab.},
volume = {42},
number = {8},
pages = {1163--1170},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00091-4},
doi = {10.1016/S0026-2714(02)00091-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LantzHP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeCSC02,
author = {Jon C. Lee and
C. H. Chen and
David Su and
J. H. Chuang},
title = {Investigation of Sensitivity Improvement on Passive Voltage Contrast
for Defect Isolation},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1707--1710},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00216-0},
doi = {10.1016/S0026-2714(02)00216-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeCSC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeGSJWDWGAB02,
author = {T. H. Lee and
X. Guo and
G. D. Shen and
Yuan Ji and
G. H. Wang and
J. Y. Du and
X. Z. Wang and
G. Gao and
A. Altes and
L. J. Balk},
title = {Investigation of Tunnel-Regenerated Multi-Active-Region Light-Emitting
Diodes {(TRMAR} {LED)} by Scanning Thermal Microscopy {(STHM)}},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1711--1714},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00217-2},
doi = {10.1016/S0026-2714(02)00217-2},
timestamp = {Tue, 22 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeGSJWDWGAB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LefrancLM02,
author = {Guy Lefranc and
T. Licht and
Gerhard Mitic},
title = {Properties of solders and their fatigue in power modules},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1641--1646},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00203-2},
doi = {10.1016/S0026-2714(02)00203-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LefrancLM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LellouchiBTPD02,
author = {Djemel Lellouchi and
Felix Beaudoin and
Christophe Le Touze and
Philippe Perdu and
Romain Desplats},
title = {{IR} confocal laser microscopy for {MEMS} Technological Evaluation},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1815--1817},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00237-8},
doi = {10.1016/S0026-2714(02)00237-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LellouchiBTPD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeonMD02,
author = {Octavio A. Leon and
Gilbert De Mey and
Erik Dick},
title = {Study of the optimal layout of cooling fins in forced convection cooling},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1101--1111},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00078-1},
doi = {10.1016/S0026-2714(02)00078-1},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LeonMD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Liebert02,
author = {Silke Liebert},
title = {Encapsulation of naked dies for bulk silicon etching with {TMAH}},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1939--1944},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00098-7},
doi = {10.1016/S0026-2714(02)00098-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Liebert02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LimZ02,
author = {K. Y. Lim and
X. Zhou},
title = {An analytical effective channel-length modulation model for velocity
overshoot in submicron MOSFETs based on energy-balance formulation},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1857--1864},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00243-3},
doi = {10.1016/S0026-2714(02)00243-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LimZ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinLCOMPC02,
author = {T. Y. Lin and
W. S. Leong and
K. H. Chua and
R. Oh and
Y. Miao and
J. S. Pan and
J. W. Chai},
title = {The impact of copper contamination on the quality of the second wire
bonding process using X-ray photoelectron spectroscopy method},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {375--380},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00003-3},
doi = {10.1016/S0026-2714(02)00003-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinLCOMPC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinP02,
author = {P. C. Lin and
Wen Lea Pearn},
title = {Testing process capability for one-sided specification limit with
application to the voltage level translator},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1975--1983},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00103-8},
doi = {10.1016/S0026-2714(02)00103-8},
timestamp = {Fri, 18 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LinP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiouSOSCGZH02,
author = {Juin J. Liou and
R. Shireen and
Adelmo Ortiz{-}Conde and
Francisco J. Garc{\'{\i}}a{-}S{\'{a}}nchez and
Antonio Cerdeira and
Xiaofang Gao and
Xuecheng Zou and
Ching{-}Sung Ho},
title = {Influence of polysilicon-gate depletion on the subthreshold behavior
of submicron MOSFETs},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {343--347},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00259-1},
doi = {10.1016/S0026-2714(01)00259-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiouSOSCGZH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiouZMTSL02,
author = {Juin J. Liou and
Qiang Zhang and
John McMacken and
J. Ross Thomson and
Kevin Stiles and
Paul Layman},
title = {Statistical modeling of {MOS} devices for parametric yield prediction},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {787--795},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00262-1},
doi = {10.1016/S0026-2714(01)00262-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiouZMTSL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ListaGTBFGRV02,
author = {V. Lista and
P. Garbossa and
T. Tomasi and
Mattia Borgarino and
Fausto Fantini and
L. Gherardi and
A. Righetti and
M. Villa},
title = {Degradation Based Long-Term Reliability Assessment for Electronic
Components in Submarine Applications},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1389--1392},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00156-7},
doi = {10.1016/S0026-2714(02)00156-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ListaGTBFGRV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuHZ02,
author = {Hongxia Liu and
Yue Hao and
Jiangang Zhu},
title = {A thorough investigation of hot-carrier-induced gate oxide breakdown
in partially depleted {N-} and P-channel {SIMOX} MOSFETs},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1037--1044},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00070-7},
doi = {10.1016/S0026-2714(02)00070-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuHZ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuN02,
author = {De{-}Shin Liu and
Chin{-}Yu Ni},
title = {A thermo-mechanical study on the electrical resistance of aluminum
wire conductors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {367--374},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00258-X},
doi = {10.1016/S0026-2714(01)00258-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuN02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuN02a,
author = {De{-}Shin Liu and
Chin{-}Yu Ni},
title = {The optimization design of bump interconnections in flip chip packages
from the electrical standpoint},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1893--1901},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00262-7},
doi = {10.1016/S0026-2714(02)00262-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuN02a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuXLD02,
author = {Xingsheng Liu and
Shuangyan Xu and
Guo{-}Quan Lu and
David A. Dillard},
title = {Effect of substrate flexibility on solder joint reliability},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1883--1891},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00269-X},
doi = {10.1016/S0026-2714(02)00269-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuXLD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LoT02,
author = {Yu{-}Lung Lo and
Chih{-}Chiang Tsao},
title = {Wirebond profiles characterized by a modified linkage-spring model
which includes a looping speed factor},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {285--291},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00246-3},
doi = {10.1016/S0026-2714(01)00246-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LoT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LombardoSL02,
author = {Salvatore Lombardo and
James H. Stathis and
Barry P. Linder},
title = {Dependence of Post-Breakdown Conduction on Gate Oxide Thickness},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1481--1484},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00174-9},
doi = {10.1016/S0026-2714(02)00174-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LombardoSL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LomeliC02,
author = {F. S. Lomeli and
Antonio Cerdeira},
title = {Precise {SPICE} macromodel applied to high-voltage power {MOSFET}},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {149--152},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00127-5},
doi = {10.1016/S0026-2714(01)00127-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LomeliC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuHSBC02,
author = {Hua Lu and
K. C. Hung and
Stoyan Stoyanov and
Chris Bailey and
Y. C. Chan},
title = {No-flow underfill flip chip assembly--an experimental and modeling
analysis},
journal = {Microelectron. Reliab.},
volume = {42},
number = {8},
pages = {1205--1212},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00092-6},
doi = {10.1016/S0026-2714(02)00092-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LuHSBC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LukCH02,
author = {C. F. Luk and
Y. C. Chan and
K. C. Hung},
title = {Development of gold to gold interconnection flip chip bonding for
chip on suspension assemblies},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {381--389},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00256-6},
doi = {10.1016/S0026-2714(01)00256-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LukCH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LukCH02a,
author = {C. F. Luk and
Y. C. Chan and
K. C. Hung},
title = {Application of adhesive bonding techniques in hard disk drive head
assembly},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {767--777},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00038-0},
doi = {10.1016/S0026-2714(02)00038-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LukCH02a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaoTX02,
author = {Lingfeng Mao and
Changhua Tan and
Mingzhen Xu},
title = {Erratum to "The effect of image potential on electron transmission
and electric current in the direct tunneling regime of ultra-thin
{MOS} structures" [Microelectronics Reliability 2001;41: 927-931]},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {991},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00072-0},
doi = {10.1016/S0026-2714(02)00072-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaoTX02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaoZTX02,
author = {Lingfeng Mao and
Heqiu Zhang and
Changhua Tan and
Mingzhen Xu},
title = {The effect of transition region on the direct tunneling current and
Fowler-Nordheim tunneling current oscillations in ultrathin {MOS}
structures},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {175--181},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00247-5},
doi = {10.1016/S0026-2714(01)00247-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaoZTX02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MarshWHLK02,
author = {Phil F. Marsh and
Colin S. Whelan and
William E. Hoke and
Robert E. Leoni III and
Thomas E. Kazior},
title = {Reliability of metamorphic HEMTs on GaAs substrates},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {997--1002},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00063-X},
doi = {10.1016/S0026-2714(02)00063-X},
timestamp = {Fri, 08 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MarshWHLK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeneghessoCMPV02,
author = {Gaudenzio Meneghesso and
A. Cocco and
Giovanna Mura and
Simona Podda and
Massimo Vanzi},
title = {Backside Failure Analysis of GaAs ICs after {ESD} tests},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1293--1298},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00137-3},
doi = {10.1016/S0026-2714(02)00137-3},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MeneghessoCMPV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeneghessoZ02,
author = {Gaudenzio Meneghesso and
Enrico Zanoni},
title = {Failure modes and mechanisms of InP-based and metamorphic high electron
mobility transistors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {685--708},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00045-8},
doi = {10.1016/S0026-2714(02)00045-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MeneghessoZ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Mergens02,
author = {Markus P. J. Mergens},
title = {On-Chip {ESD}},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {861},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00048-3},
doi = {10.1016/S0026-2714(02)00048-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Mergens02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MervicLMSG02,
author = {A. Mervic and
A. Lanzani and
M. Menchise and
P. Serra and
D. Gerosa},
title = {Contact resistivity instability in embedded {SRAM} memory},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1365--1368},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00150-6},
doi = {10.1016/S0026-2714(02)00150-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MervicLMSG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Mey02,
author = {Gilbert De Mey},
title = {A thermodynamic limit for digital electronics},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {507--510},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00036-7},
doi = {10.1016/S0026-2714(02)00036-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Mey02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MilletCB02,
author = {Olivier Millet and
Dominique Collard and
Lionel Buchaillot},
title = {Reliability of polysilicon microstructures: in situ test benches},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1795--1800},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00233-0},
doi = {10.1016/S0026-2714(02)00233-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MilletCB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MirandaRF02,
author = {Enrique Miranda and
Gabriel Redin and
Adri{\'{a}}n Faig{\'{o}}n},
title = {Modeling of the {I-V} characteristics of high-field stressed {MOS}
structures using a Fowler-Nordheim-type tunneling expression},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {935--941},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00009-4},
doi = {10.1016/S0026-2714(02)00009-4},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MirandaRF02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MishiroIAKHT02,
author = {Kinuko Mishiro and
Shigeo Ishikawa and
Mitsunori Abe and
Toshio Kumai and
Yutaka Higashiguchi and
Ken{-}ichiro Tsubone},
title = {Effect of the drop impact on {BGA/CSP} package reliability},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {77--82},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00230-X},
doi = {10.1016/S0026-2714(01)00230-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MishiroIAKHT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MiuraNF02,
author = {Katsuyoshi Miura and
Koji Nakamae and
Hiromu Fujioka},
title = {{CAD} navigation system, for backside waveform probing of {CMOS} devices},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1679--1684},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00211-1},
doi = {10.1016/S0026-2714(02)00211-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MiuraNF02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MongellazMMD02,
author = {B. Mongellaz and
Fran{\c{c}}ois Marc and
N. Milet{-}Lewis and
Yves Danto},
title = {Contribution to ageing simulation of complex analogue circuit using
{VHDL-AMS} behavioural modelling language},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1353--1358},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00148-8},
doi = {10.1016/S0026-2714(02)00148-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MongellazMMD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MonsieurVRBPG02,
author = {Frederic Monsieur and
E. Vincent and
David Roy and
S. Bruy{\`{e}}re and
G. Pananakakis and
G{\'{e}}rard Ghibaudo},
title = {Gate oxide Reliability assessment optimization},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1505--1508},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00179-8},
doi = {10.1016/S0026-2714(02)00179-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MonsieurVRBPG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoonHYCK02,
author = {Seok Hwan Moon and
Gunn Hwang and
Ho Gyeong Yun and
Tae Goo Choy and
Young I. I. Kang},
title = {Improving thermal performance of miniature heat pipe for notebook
{PC} cooling},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {135--140},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00226-8},
doi = {10.1016/S0026-2714(01)00226-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MoonHYCK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MooreJ02,
author = {Thomas D. Moore and
John L. Jarvis},
title = {The effects of in-plane orthotropic properties in a multi-chip ball
grid array assembly},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {943--949},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00010-0},
doi = {10.1016/S0026-2714(02)00010-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MooreJ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoreauFLJ02,
author = {St{\'{e}}phane Moreau and
St{\'{e}}phane Forster and
Thierry Lequeu and
Robert J{\'{e}}risian},
title = {Influence of the turn-on mechanism on TRIACs' reliability: di/dt thermal
fatigue study in {Q1} compared to {Q2}},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1663--1666},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00208-1},
doi = {10.1016/S0026-2714(02)00208-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MoreauFLJ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MuXTD02,
author = {Fuchen Mu and
Mingzhen Xu and
Changhua Tan and
Xiaorong Duan},
title = {Weibull characteristics of n-MOSFET's with ultrathin gate oxides under
{FN} stress and lifetime prediction},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {985--989},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00007-0},
doi = {10.1016/S0026-2714(02)00007-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MuXTD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Muehlhoff02,
author = {A. Muehlhoff},
title = {Inversion of degradation direction of n-channel MOS-FETs in off-state
operation},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1453--1456},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00168-3},
doi = {10.1016/S0026-2714(02)00168-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Muehlhoff02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MugnainiCCMN02,
author = {Marco Mugnaini and
Marcantonio Catelani and
G. Ceschini and
A. Masi and
F. Nocentini},
title = {Pseudo Time-Variant parameters in centrifugal compressor availability
studies by means of Markov models},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1373--1376},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00152-X},
doi = {10.1016/S0026-2714(02)00152-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MugnainiCCMN02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Muller-FiedlerWB02,
author = {Roland M{\"{u}}ller{-}Fiedler and
Ulrich Wagner and
Winfried Bernhard},
title = {Reliability of {MEMS} - a methodical approach},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1771--1776},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00229-9},
doi = {10.1016/S0026-2714(02)00229-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Muller-FiedlerWB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MullerMMMWGH02,
author = {Anne{-}Dorothea M{\"{u}}ller and
Falk M{\"{u}}ller and
J{\"{u}}rgen Middeke and
Jan Mehner and
J. Wibbeler and
Thomas Gessner and
Michael Hietschold},
title = {Double-cantilever device for Atomic Force Microscopy in dynamic noncontact-mode},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1685--1688},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00212-3},
doi = {10.1016/S0026-2714(02)00212-3},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MullerMMMWGH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NaitoT02,
author = {Christine Naito and
Michael Todd},
title = {The effects of curing parameters on the properties development of
an epoxy encapsulant material},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {119--125},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00126-3},
doi = {10.1016/S0026-2714(01)00126-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NaitoT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NakajimaKYY02,
author = {Anri Nakajima and
Quazi D. M. Khosru and
Takashi Yoshimoto and
Shin Yokoyama},
title = {Atomic-layer-deposited silicon-nitride/SiO\({}_{\mbox{2}}\) stack--a
highly potential gate dielectrics for advanced {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1823--1835},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00095-1},
doi = {10.1016/S0026-2714(02)00095-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NakajimaKYY02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NakajimaNKUAS02,
author = {S. Nakajima and
S. Nakamura and
K. Kuji and
T. Ueki and
T. Ajioka and
T. Sakai},
title = {Construction of a cost-effective failure analysis service network--microelectronic
failure analysis service in Japan},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {511--521},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00043-4},
doi = {10.1016/S0026-2714(02)00043-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NakajimaNKUAS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NathanPMSR02,
author = {Arokia Nathan and
Byung{-}kyu Park and
Qinghua Ma and
Andrei Sazonov and
John A. Rowlands},
title = {Amorphous silicon technology for large area digital X-ray and optical
imaging},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {735--746},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00024-0},
doi = {10.1016/S0026-2714(02)00024-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NathanPMSR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NazarovOLGRS02,
author = {A. N. Nazarov and
I. N. Osiyuk and
V. S. Lysenko and
T. Gebel and
Lars Rebohle and
W. Skorupa},
title = {Charge trapping and degradation in Ge\({}^{\mbox{+}}\) ion implanted
SiO\({}_{\mbox{2}}\) layers during high-field electron injection},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1461--1464},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00170-1},
doi = {10.1016/S0026-2714(02)00170-1},
timestamp = {Thu, 05 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NazarovOLGRS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NeinhusWBMKBDF02,
author = {M. Neinh{\"{u}}s and
Rainer Weber and
Ulf Behnke and
Wolfgang Mertin and
Erich Kubalek and
R. A. Breil and
M. Detje and
A. Feltz},
title = {Contactless current and voltage measurements in integrated circuits
by using a needle sensor},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1695--1700},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00214-7},
doi = {10.1016/S0026-2714(02)00214-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NeinhusWBMKBDF02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NguyenSVVKBMK02,
author = {H. V. Nguyen and
Cora Salm and
J. Vroemen and
J. Voets and
Benno Krabbenborg and
Jaap Bisschop and
A. J. Mouthaan and
Fred G. Kuper},
title = {Fast temperature cycling and electromigration induced thin film cracking
in multilevel interconnection: experiments and modeling},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1415--1420},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00161-0},
doi = {10.1016/S0026-2714(02)00161-0},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NguyenSVVKBMK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NguyenSWMK02,
author = {H. V. Nguyen and
Cora Salm and
R. Wenzel and
A. J. Mouthaan and
Fred G. Kuper},
title = {Simulation and experimental characterization of reservoir and via
layout effects on electromigration lifetime},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1421--1425},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00162-2},
doi = {10.1016/S0026-2714(02)00162-2},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NguyenSWMK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NiLC02,
author = {Chin{-}Yu Ni and
De{-}Shin Liu and
Ching{-}Yang Chen},
title = {Procedure for design optimization of a T-cap flip chip package},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1903--1911},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00116-6},
doi = {10.1016/S0026-2714(02)00116-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NiLC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Ortiz-CondeSLCEY02,
author = {Adelmo Ortiz{-}Conde and
Francisco J. Garc{\'{\i}}a{-}S{\'{a}}nchez and
Juin J. Liou and
Antonio Cerdeira and
Magali Estrada and
Y. Yue},
title = {A review of recent {MOSFET} threshold voltage extraction methods},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {583--596},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00027-6},
doi = {10.1016/S0026-2714(02)00027-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Ortiz-CondeSLCEY02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OsmokrovicLSV02,
author = {Predrag Osmokrovic and
Boris Loncar and
Srboljub Stankovic and
Aleksandra Vasic},
title = {Aging of the over-voltage protection elements caused by over-voltages},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1959--1966},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00240-8},
doi = {10.1016/S0026-2714(02)00240-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OsmokrovicLSV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PassagrilliGT02,
author = {C. Passagrilli and
L. Gobbato and
R. Tiziani},
title = {Reliability of Au/Al bonding in plastic packages for high temperature
(200degreeC) and high current applications},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1523--1528},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00183-X},
doi = {10.1016/S0026-2714(02)00183-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PassagrilliGT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PaulC02,
author = {Shashi Paul and
F. J. Clough},
title = {A reliability of different metal contacts with amorphous carbon},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {141--143},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00133-0},
doi = {10.1016/S0026-2714(01)00133-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PaulC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PaulsenR02,
author = {Jonathan L. Paulsen and
Erik K. Reed},
title = {Highly accelerated lifetesting of base-metal-electrode ceramic chip
capacitors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {815--820},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00014-8},
doi = {10.1016/S0026-2714(02)00014-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PaulsenR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PavelkaSVSTH02,
author = {Jan Pavelka and
Josef Sikula and
Petr Vasina and
Vlasta Sedlakova and
Munecazu Tacano and
Sumihisa Hashiguchi},
title = {Noise and transport characterisation of tantalum capacitors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {841--847},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00013-6},
doi = {10.1016/S0026-2714(02)00013-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PavelkaSVSTH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PearnKW02,
author = {Wen Lea Pearn and
C. H. Ko and
K. H. Wang},
title = {A multiprocess performance analysis chart based on the incapability
index C\({}_{\mbox{pp}}\): an application to the chip resistors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1121--1125},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00071-9},
doi = {10.1016/S0026-2714(02)00071-9},
timestamp = {Fri, 18 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PearnKW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PechtDR02,
author = {Michael G. Pecht and
Diganta Das and
Arun Ramakrishnan},
title = {The {IEEE} standards on reliability program and reliability prediction
methods for electronic equipment},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1259--1266},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00132-4},
doi = {10.1016/S0026-2714(02)00132-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PechtDR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PendseZ02,
author = {Rajendra D. Pendse and
Peng Zhou},
title = {Methodology for predicting solder joint reliability in semiconductor
packages},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {301--305},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00130-5},
doi = {10.1016/S0026-2714(01)00130-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PendseZ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PeratDSBCPZT02,
author = {Oliver Perat and
Jean{-}Marie Dorkel and
Emmanuel Scheid and
Pierre Temple{-}Boyer and
Y. S. Chung and
A. Peyre{-}Lavigne and
M. Zecri and
Patrick Tounsi},
title = {Characterization method of thermomechanical parameters for microelectronic
materials},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1053--1058},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00060-4},
doi = {10.1016/S0026-2714(02)00060-4},
timestamp = {Fri, 06 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PeratDSBCPZT02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PershenkovATLBISBZU02,
author = {V. S. Pershenkov and
S. V. Avdeev and
A. S. Tsimbalov and
M. N. Levin and
V. V. Belyakov and
D. V. Ivashin and
A. Y. Slesarev and
A. Y. Bashin and
Gennady I. Zebrev and
Viktor N. Ulimov},
title = {Use of preliminary ultraviolet and infrared illumination for diagnostics
of {MOS} and bipolar devices radiation response},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {797--804},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00023-9},
doi = {10.1016/S0026-2714(02)00023-9},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PershenkovATLBISBZU02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PetersenCDDSVBP02,
author = {R. Petersen and
Ward De Ceuninck and
Jan D'Haen and
Marc D'Olieslaeger and
Luc De Schepper and
Olivier Vendier and
Herv{\'{e}} Blanck and
Dominique Pons},
title = {Exploring the limits of Arrhenius-based life testing with heterojunction
bipolar transistor technology},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1359--1363},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00149-X},
doi = {10.1016/S0026-2714(02)00149-X},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PetersenCDDSVBP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PoganyKDLBUMHLG02,
author = {Dionyz Pogany and
J{\'{a}}n Kuzm{\'{\i}}k and
J. Darmo and
Martin Litzenberger and
Sergey Bychikhin and
Karl Unterrainer and
Z. Mozolova and
S. Hascik and
Tibor Lalinsky and
Erich Gornik},
title = {Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters
using backside infrared {OBIC} technique},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1673--1677},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00210-X},
doi = {10.1016/S0026-2714(02)00210-X},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PoganyKDLBUMHLG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PolyakovBB02,
author = {Alexander Polyakov and
Marian Bartek and
Joachim N. Burghartz},
title = {Mechanical Reliability of Silicon Wafers with Through-Wafer Vias for
Wafer-Level Packaging},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1783--1788},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00231-7},
doi = {10.1016/S0026-2714(02)00231-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PolyakovBB02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QuinteroCO02,
author = {Rodolfo Quintero and
Antonio Cerdeira and
Adelmo Ortiz{-}Conde},
title = {Quasi-three-dimensional spice-based simulation of the transient behavior,
including plasma spread, of thyristors and over-voltage protectors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {67--76},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00131-7},
doi = {10.1016/S0026-2714(01)00131-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/QuinteroCO02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RadhakrishnanPTL02,
author = {M. K. Radhakrishnan and
Kin Leong Pey and
C. H. Tung and
W. H. Lin},
title = {Physical analysis of hard and soft breakdown failures in ultrathin
gate oxides},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {565--571},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00058-6},
doi = {10.1016/S0026-2714(02)00058-6},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RadhakrishnanPTL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RafiVCFFLMU02,
author = {Joan Marc Raf{\'{\i}} and
B. Vergnet and
Francesca Campabadal and
Celeste Fleta and
Luis Fonseca and
Manuel Lozano and
C. Mart{\'{\i}}nez and
Miguel Ull{\'{a}}n},
title = {Electrical characteristics of high-energy proton irradiated ultra-thin
gate oxides},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1501--1504},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00178-6},
doi = {10.1016/S0026-2714(02)00178-6},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RafiVCFFLMU02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RaneP02,
author = {Sunit Rane and
Vijaya Puri},
title = {Thin film, thick film microstrip band pass filter: a comparison and
effect of bulk overlay},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1953--1958},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00129-4},
doi = {10.1016/S0026-2714(02)00129-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RaneP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReedP02,
author = {Erik K. Reed and
Jonathan L. Paulsen},
title = {Impact of circuit resistance on the breakdown voltage of tantalum
chip capacitors},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {821--827},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00015-X},
doi = {10.1016/S0026-2714(02)00015-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ReedP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ReinerGS02,
author = {Joachim C. Reiner and
Philippe Gasser and
Urs Sennhauser},
title = {Novel FIB-based sample preparation technique for {TEM} analysis of
ultra-thin gate oxide breakdown},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1753--1757},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00225-1},
doi = {10.1016/S0026-2714(02)00225-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ReinerGS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RodriguezSLKCJNBBL02,
author = {Rosana Rodr{\'{\i}}guez and
James H. Stathis and
Barry P. Linder and
Steven P. Kowalczyk and
Ching{-}Te Chuang and
Rajiv V. Joshi and
Gregory A. Northrop and
Kerry Bernstein and
Azeez J. Bhavnagarwala and
Salvatore Lombardo},
title = {Analysis of the effect of the gate oxide breakdown on {SRAM} stability},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1445--1448},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00166-X},
doi = {10.1016/S0026-2714(02)00166-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RodriguezSLKCJNBBL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Roesch02,
author = {William J. Roesch},
title = {Methods of reducing defects in GaAs ICs},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1029--1036},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00067-7},
doi = {10.1016/S0026-2714(02)00067-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Roesch02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoigFVRM02,
author = {Jaume Roig and
David Flores and
Miquel Vellveh{\'{\i}} and
Jos{\'{e}} Rebollo and
Jos{\'{e}} Mill{\'{a}}n},
title = {Reduction of self-heating effect on {SOIM} devices},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {61--66},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00116-0},
doi = {10.1016/S0026-2714(01)00116-0},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RoigFVRM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RoyBVM02,
author = {David Roy and
S. Bruy{\`{e}}re and
E. Vincent and
Frederic Monsieur},
title = {Series resistance and oxide thickness spread influence on Weibull
breakdown distribution: New experimental correction for reliability
projection improvement},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1497--1500},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00177-4},
doi = {10.1016/S0026-2714(02)00177-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RoyBVM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RussoLVTV02,
author = {Sebastiano Russo and
Romeo Letor and
Orazio Viscuso and
Lucia Torrisi and
Gianluigi Vitali},
title = {Fast thermal fatigue on top metal layer of power devices},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1617--1622},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00200-7},
doi = {10.1016/S0026-2714(02)00200-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RussoLVTV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SaigneQDJOFG02,
author = {F. Saign{\'{e}} and
Olivier Quittard and
Laurent Dusseau and
F. Joffre and
Coumar Oud{\'{e}}a and
J. Fesquet and
Jean Gasiot},
title = {Prediction of long-term thermal behavior of an irradiated {SRAM} based
on isochronal annealing measurements},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {459--461},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00255-4},
doi = {10.1016/S0026-2714(01)00255-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SaigneQDJOFG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SallingHWDCP02,
author = {Craig Salling and
Jerry Hu and
Jeff Wu and
Charvaka Duvvury and
Roger Cline and
Rith Pok},
title = {Development of substrate-pumped nMOS protection for a 0.13 mum technology},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {887--899},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00052-5},
doi = {10.1016/S0026-2714(02)00052-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SallingHWDCP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SanoMMN02,
author = {Nobuyuki Sano and
Kazuya Matsuzawa and
Mikio Mukai and
Noriaki Nakayama},
title = {On discrete random dopant modeling in drift-diffusion simulations:
physical meaning of 'atomistic' dopants},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {189--199},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00138-X},
doi = {10.1016/S0026-2714(01)00138-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SanoMMN02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ScandurraCPSA02,
author = {Graziella Scandurra and
Carmine Ciofi and
Calogero Pace and
F. Speroni and
F. Alagi},
title = {True constant temperature {MTF} test system for the characterization
of electromigration of thick Cu interconnection lines},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1347--1351},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00147-6},
doi = {10.1016/S0026-2714(02)00147-6},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ScandurraCPSA02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SeligerWLBL02,
author = {Norbert Seliger and
E. Wolfgang and
Guy Lefranc and
H. Berg and
T. Licht},
title = {Reliable power electronics for automotive applications},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1597--1604},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00197-X},
doi = {10.1016/S0026-2714(02)00197-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SeligerWLBL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SemmensK02,
author = {Janet E. Semmens and
Lawrence W. Kessler},
title = {Application of Acoustic Frequency Domain Imaging for the Evaluation
of Advanced Micro Electronic Packages},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1735--1740},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00222-6},
doi = {10.1016/S0026-2714(02)00222-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SemmensK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SeppalaAR02,
author = {Anne Sepp{\"{a}}l{\"{a}} and
T. Allinniemi and
Eero Ristolainen},
title = {Failure mechanisms of adhesive flip chip joints},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1547--1550},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00187-7},
doi = {10.1016/S0026-2714(02)00187-7},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SeppalaAR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShammasRM02,
author = {Noel Y. A. Shammas and
M. P. Rodriguez and
F. Masana},
title = {A simple method for evaluating the transient thermal response of semiconductor
devices},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {109--117},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00229-3},
doi = {10.1016/S0026-2714(01)00229-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShammasRM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SiplonEG02,
author = {Jocelyn Siplon and
Gary J. Ewell and
Thomas Gibson},
title = {{ESR} concerns in tantalum chip capacitors exposed to non-oxygen-containing
environments},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {829--834},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00020-3},
doi = {10.1016/S0026-2714(02)00020-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SiplonEG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SivakumarKCCL02,
author = {Mohandass Sivakumar and
Kripesh Vaidyanathan and
Chong Ser Choong and
Tai Chong Chai and
Loon Aik Lim},
title = {Reliability of Wire Bonding on Low-k Dielectric Material in Damascene
Copper Integrated Circuits {PBGA} Assembly},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1535--1540},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00185-3},
doi = {10.1016/S0026-2714(02)00185-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SivakumarKCCL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SongDR02,
author = {Zhigang Song and
Jiyan Dai and
Shailesh Redkar},
title = {Open contact analysis of single bit failure in 0.18 mum technology},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1997--2001},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00117-8},
doi = {10.1016/S0026-2714(02)00117-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SongDR02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SongPJK02,
author = {Yong{-}Ha Song and
Myoung{-}Lae Park and
Gye{-}Won Jung and
Taek{-}Soo Kim},
title = {A study of advanced layout verification to prevent leakage current
failure during power down mode operation},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1385--1388},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00155-5},
doi = {10.1016/S0026-2714(02)00155-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SongPJK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SowarirajSSMK02,
author = {M. S. B. Sowariraj and
Theo Smedes and
Cora Salm and
Ton J. Mouthaan and
Fred G. Kuper},
title = {The influence of technology variation on ggNMOSTs and SCRs against
{CDM} {BSD} stress},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1287--1292},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00136-1},
doi = {10.1016/S0026-2714(02)00136-1},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SowarirajSSMK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SozziM02,
author = {Giovanna Sozzi and
Roberto Menozzi},
title = {High-electric-field effects and degradation of AlGaAs/GaAs power HFETs:
a numerical study},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {53--59},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00240-2},
doi = {10.1016/S0026-2714(01)00240-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SozziM02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SpontonCCMPVMZ02,
author = {Luca Sponton and
Lorenzo Cerati and
Giuseppe Croce and
Giovanna Mura and
Simona Podda and
Massimo Vanzi and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {{ESD} protection structures for 20 {V} and 40 {V} power supply suitable
for {BCD6} smart power technology},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1303--1306},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00139-7},
doi = {10.1016/S0026-2714(02)00139-7},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SpontonCCMPVMZ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StadlerEGSWFPLG02,
author = {Wolfgang Stadler and
Kai Esmark and
Harald Gossner and
Martin Streibl and
M. Wendel and
Wolfgang Fichtner and
Dionyz Pogany and
Martin Litzenberger and
Erich Gornik},
title = {Device Simulation and Backside Laser Interferometry--Powerful Tools
for {ESD} Protection Development},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1267--1274},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00133-6},
doi = {10.1016/S0026-2714(02)00133-6},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StadlerEGSWFPLG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StangoniCBLF02,
author = {Maria Stangoni and
Mauro Ciappa and
Marco Buzzo and
Markus Leicht and
Wolfgang Fichtner},
title = {Simulation and Experimental Validation of Scanning Capacitance Microscopy
Measurements across Low-doped Epitaxial PN-Junction},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1701--1706},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00215-9},
doi = {10.1016/S0026-2714(02)00215-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StangoniCBLF02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StellariSTMK02,
author = {Franco Stellari and
Peilin Song and
James C. Tsang and
Moyra K. McManus and
Mark B. Ketchen},
title = {Optical diagnosis of excess I\({}_{\mbox{DDQ}}\) in low power {CMOS}
circuits},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1689--1694},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00213-5},
doi = {10.1016/S0026-2714(02)00213-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StellariSTMK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stepniak02,
author = {Frank Stepniak},
title = {Failure criteria of flip chip joints during accelerated testing},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1921--1930},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00121-X},
doi = {10.1016/S0026-2714(02)00121-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stepniak02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojadinovic02,
author = {Ninoslav Stojadinovic},
title = {Dependability of Engineering Systems: {J.M.} Nahman, Springer-Verlag,
Berlin, Heidelberg, New York, 2002, 192 pages},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {993},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00075-6},
doi = {10.1016/S0026-2714(02)00075-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojadinovic02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StojadinovicMDDDGD02,
author = {Ninoslav Stojadinovic and
Ivica Manic and
Snezana Djoric{-}Veljkovic and
Vojkan Davidovic and
Danijel Dankovic and
Snezana Golubovic and
Sima Dimitrijev},
title = {Mechanisms of spontaneous recovery in positive gate bias stressed
power VDMOSFETs},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1465--1468},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00171-3},
doi = {10.1016/S0026-2714(02)00171-3},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StojadinovicMDDDGD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StojadinovicMDDGD02,
author = {Ninoslav Stojadinovic and
Ivica Manic and
Snezana Djoric{-}Veljkovic and
Vojkan Davidovic and
Snezana Golubovic and
Sima Dimitrijev},
title = {Effects of high electric field and elevated-temperature bias stressing
on radiation response in power VDMOSFETs},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {669--677},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00039-2},
doi = {10.1016/S0026-2714(02)00039-2},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/StojadinovicMDDGD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StojadinovicP02,
author = {Ninoslav Stojadinovic and
Michael G. Pecht},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {463},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00073-2},
doi = {10.1016/S0026-2714(02)00073-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StojadinovicP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Stojcev02,
author = {Mile K. Stojcev},
title = {The Computer Engineering Handbook; Vojin Oklobdzija. {CRC} Press,
Boca Raton, 2002. Hardcover, pp 1338, {ISBN} 0-8493-0885-2},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1151},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00077-X},
doi = {10.1016/S0026-2714(02)00077-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Stojcev02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StrandjordPJ02,
author = {Andrew J. G. Strandjord and
Scott Popelar and
Christine Jauernig},
title = {Interconnecting to aluminum- and copper-based semiconductors (electroless-nickel/gold
for solder bumping and wire bonding)},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {265--283},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00236-0},
doi = {10.1016/S0026-2714(01)00236-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StrandjordPJ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuemitsuFSWY02,
author = {Tetsuya Suemitsu and
Yoshino K. Fukai and
Hiroki Sugiyama and
Kazuo Watanabe and
Haruki Yokoyama},
title = {Bias-stress-induced increase in parasitic resistance of InP-based
InAlAs/InGaAs HEMTs},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {47--52},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00215-3},
doi = {10.1016/S0026-2714(01)00215-3},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SuemitsuFSWY02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SydloSMRH02,
author = {Cezary Sydlo and
M. Saglam and
Bastian Mottet and
Manuel Rodr{\'{\i}}guez{-}Giron{\'{e}}s and
Hans L. Hartnagel},
title = {Reliability investigations on {HBV} using pulsed electrical stress},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1563--1568},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00191-9},
doi = {10.1016/S0026-2714(02)00191-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SydloSMRH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Szekely02,
author = {Vladim{\'{\i}}r Sz{\'{e}}kely},
title = {Enhancing reliability with thermal transient testing},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {629--640},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00028-8},
doi = {10.1016/S0026-2714(02)00028-8},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Szekely02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SzelochGJ02,
author = {R. F. Szeloch and
Teodor P. Gotszalk and
Pawel Janus},
title = {Scanning Thermal Microscopy in Microsystem Reliability Analysis},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1719--1722},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00219-6},
doi = {10.1016/S0026-2714(02)00219-6},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SzelochGJ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TakaoKMKYYSNAK02,
author = {Yoshihiro Takao and
Hiroshi Kudo and
Junichi Mitani and
Yoshiyuki Kotani and
Satoshi Yamaguchi and
Keizaburo Yoshie and
Kazuo Sukegawa and
Nobuhisa Naori and
Satoru Asai and
Michiari Kawano},
title = {A 0.11 mum {CMOS} technology featuring copper and very low k interconnects
with high performance and reliability},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {15--25},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00233-5},
doi = {10.1016/S0026-2714(01)00233-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TakaoKMKYYSNAK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TakedaMTOEHK02,
author = {Eiji Takeda and
Eiichi Murakami and
Kazuyoshi Torii and
Yutaka Okuyama and
Eishi Ebe and
Kenji Hinode and
Shin'ichiro Kimura},
title = {Reliability issues of silicon LSIs facing 100-nm technology node},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {493--506},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00029-X},
doi = {10.1016/S0026-2714(02)00029-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TakedaMTOEHK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ThomasAP02,
author = {Dawn A. Thomas and
Ken Ayers and
Michael G. Pecht},
title = {The "trouble not identified" phenomenon in automotive electronics},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {641--651},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00040-9},
doi = {10.1016/S0026-2714(02)00040-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ThomasAP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TielemansRC02,
author = {Luc Tielemans and
R. Rongen and
Ward De Ceuninck},
title = {How reliable are reliability tests?},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1339--1345},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00146-4},
doi = {10.1016/S0026-2714(02)00146-4},
timestamp = {Tue, 08 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TielemansRC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TizianiPS02,
author = {R. Tiziani and
G. Passoni and
G. Santospirito},
title = {Adhesive die attach for power application: Performance and reliability
in plastic package},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1611--1616},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00199-3},
doi = {10.1016/S0026-2714(02)00199-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TizianiPS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TomasiMLGRV02,
author = {T. Tomasi and
Ilaria De Munari and
V. Lista and
L. Gherardi and
A. Righetti and
M. Villa},
title = {Passive optical components: from degradation data to reliability assessment
- preliminary results},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1333--1338},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00145-2},
doi = {10.1016/S0026-2714(02)00145-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TomasiMLGRV02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TorresMSAKW02,
author = {Cynthia A. Torres and
James W. Miller and
Michael Stockinger and
Matthew D. Akers and
Michael G. Khazhinsky and
James C. Weldon},
title = {Modular, portable, and easily simulated {ESD} protection networks
for advanced {CMOS} technologies},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {873--885},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00051-3},
doi = {10.1016/S0026-2714(02)00051-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TorresMSAKW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TregonODBP02,
author = {B. Tr{\'{e}}gon and
Yves Ousten and
Yves Danto and
Laurent B{\'{e}}chou and
Bernard Parmentier},
title = {Behavioral study of passive components and coating materials under
isostatic pressure and temperature stress conditions},
journal = {Microelectron. Reliab.},
volume = {42},
number = {7},
pages = {1113--1120},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00046-X},
doi = {10.1016/S0026-2714(02)00046-X},
timestamp = {Fri, 08 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TregonODBP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsaoTL02,
author = {Chun{-}Cheng Tsao and
Bill Thompson and
Ted R. Lundquist},
title = {Imaging and Material Analysis from Sputter-Induced Light Emission
Using Coaxial Ion-Photon Column},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1667--1672},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00209-3},
doi = {10.1016/S0026-2714(02)00209-3},
timestamp = {Mon, 01 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TsaoTL02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/UsuiSIMSA02,
author = {Masanori Usui and
Takahide Sugiyama and
Masayasu Ishiko and
Jun Morimoto and
Hirokazu Saitoh and
Masaki Ajioka},
title = {Characterization of Trench {MOS} Gate Structures Utilizing Photon
Emission Microscopy},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1647--1652},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00204-4},
doi = {10.1016/S0026-2714(02)00204-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/UsuiSIMSA02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VanziSPPF02,
author = {Massimo Vanzi and
Giulia Salmini and
R. Pastorelli and
S. Pessina and
Paola Furcas},
title = {Reliability tests on {WDM} filters},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1317--1321},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00142-7},
doi = {10.1016/S0026-2714(02)00142-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VanziSPPF02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VasinaZSP02,
author = {Petr Vasina and
T. Zednicek and
Josef Sikula and
Jan Pavelka},
title = {Failure modes of tantalum capacitors made by different technologies},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {849--854},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00034-3},
doi = {10.1016/S0026-2714(02)00034-3},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VasinaZSP02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VelardiIBWK02,
author = {Francesco Velardi and
Francesco Iannuzzo and
Giovanni Busatto and
Jeffery Wyss and
A. Kaminksy},
title = {The Reliability of New Generation Power MOSFETs in Radiation Environment},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1629--1634},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00202-0},
doi = {10.1016/S0026-2714(02)00202-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VelardiIBWK02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VerhaegeMRAJ02,
author = {Koen G. Verhaege and
Markus P. J. Mergens and
Christian C. Russ and
John Armer and
Phillip Jozwiak},
title = {Novel design of driver and {ESD} transistors with significantly reduced
silicon area},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {3--13},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00237-2},
doi = {10.1016/S0026-2714(01)00237-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VerhaegeMRAJ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ViganoGGS02,
author = {E. Vigan{\`{o}} and
A. Ghetti and
Gabriella Ghidini and
Alessandro S. Spinelli},
title = {Post-breakdown characterization in thin gate oxides},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1491--1496},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00176-2},
doi = {10.1016/S0026-2714(02)00176-2},
timestamp = {Tue, 18 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ViganoGGS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wang02,
author = {Jinlin Wang},
title = {Underfill of flip chip on organic substrate: viscosity, surface tension,
and contact angle},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {293--299},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00231-1},
doi = {10.1016/S0026-2714(01)00231-1},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Wang02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WolfS02,
author = {Ingrid De Wolf and
W. Merlijn van Spengen},
title = {Techniques to study the reliability of metal {RF} {MEMS} capacitive
switches},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1789--1794},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00232-9},
doi = {10.1016/S0026-2714(02)00232-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WolfS02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wondrak02,
author = {Wolfgang Wondrak},
title = {Special Section on Reliability of Passive Components},
journal = {Microelectron. Reliab.},
volume = {42},
number = {6},
pages = {805},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00074-4},
doi = {10.1016/S0026-2714(02)00074-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Wondrak02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wong02,
author = {Hei Wong},
title = {Recent developments in silicon optoelectronic devices},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {317--326},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00008-2},
doi = {10.1016/S0026-2714(02)00008-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Wong02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongG02,
author = {Hei Wong and
V. A. Gritsenko},
title = {Defects in silicon oxynitride gate dielectric films},
journal = {Microelectron. Reliab.},
volume = {42},
number = {4-5},
pages = {597--605},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00005-7},
doi = {10.1016/S0026-2714(02)00005-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WongG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuHHLZH02,
author = {J. D. Wu and
S. H. Ho and
C. Y. Huang and
C. C. Liao and
P. J. Zheng and
S. C. Hung},
title = {Board level reliability of a stacked {CSP} subjected to cyclic bending},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {407--416},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00241-4},
doi = {10.1016/S0026-2714(01)00241-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuHHLZH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XieABYYZN02,
author = {Huimin Xie and
Anand K. Asundi and
Chai Gin Boay and
Lu Yunguang and
Jin Yu and
Zhaowei Zhong and
Bryan K. A. Ngoi},
title = {High resolution {AFM} scanning Moir{\'{e}} method and its application
to the micro-deformation in the {BGA} electronic package},
journal = {Microelectron. Reliab.},
volume = {42},
number = {8},
pages = {1219--1227},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00084-7},
doi = {10.1016/S0026-2714(02)00084-7},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XieABYYZN02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XieY02,
author = {Dongji Xie and
Sammy Yi},
title = {Reliability studies and design improvement of mirror image {CSP} assembly},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1931--1937},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00124-5},
doi = {10.1016/S0026-2714(02)00124-5},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/XieY02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YanagisawaKKTN02,
author = {Takeshi Yanagisawa and
Takeshi Kojima and
Tadamasa Koyanagi and
Kiyoshi Takahisa and
Kuniomi Nakamura},
title = {Changes in the characteristics of CuInGaSe\({}_{\mbox{2}}\) solar
cells under light irradiation and during recovery: degradation analysis
by the feeble light measuring method},
journal = {Microelectron. Reliab.},
volume = {42},
number = {2},
pages = {219--223},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00134-2},
doi = {10.1016/S0026-2714(01)00134-2},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YanagisawaKKTN02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangCDSWLC02,
author = {Bing{-}Liang Yang and
N. W. Cheung and
S. Denholm and
J. Shao and
Hei Wong and
P. T. Lai and
Y. C. Cheng},
title = {Ultra-shallow n\({}^{\mbox{+}}\)p junction formed by PH\({}_{\mbox{3}}\)
and AsH\({}_{\mbox{3}}\) plasma immersion ion implantation},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1985--1989},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00099-9},
doi = {10.1016/S0026-2714(02)00099-9},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangCDSWLC02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuanHCW02,
author = {Tsorng{-}Dih Yuan and
Bor Zen Hong and
Howard H. Chen and
Li{-}Kong Wang},
title = {Integrated electro-thermomechanical analysis of nonuniformly chip-powered
microelectronic system},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {101--108},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00124-X},
doi = {10.1016/S0026-2714(01)00124-X},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuanHCW02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuanZ02,
author = {Shoucai Yuan and
Changchun Zhu},
title = {An {IGBT} {DC} subcircuit model with non-destructive parameters extraction
and comparison with measurements},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1991--1996},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00130-0},
doi = {10.1016/S0026-2714(02)00130-0},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuanZ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZanglGEOZ02,
author = {Franz Z{\"{a}}ngl and
Harald Gossner and
Kai Esmark and
R. Owen and
G. Zimmermann},
title = {Case study of a technology transfer causing {ESD} problems},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1275--1280},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00134-8},
doi = {10.1016/S0026-2714(02)00134-8},
timestamp = {Mon, 15 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZanglGEOZ02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Zehe02,
author = {Alfred F. K. Zehe},
title = {Prediction of electromigration-void formation in copper conductors
based on the electron configuration of matrix and solute atoms},
journal = {Microelectron. Reliab.},
volume = {42},
number = {12},
pages = {1849--1855},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00101-4},
doi = {10.1016/S0026-2714(02)00101-4},
timestamp = {Fri, 05 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Zehe02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhaoQH02,
author = {Jie{-}Hua Zhao and
Wen{-}Jie Qi and
Paul S. Ho},
title = {Thermomechanical property of diffusion barrier layer and its effect
on the stress characteristics of copper submicron interconnect structures},
journal = {Microelectron. Reliab.},
volume = {42},
number = {1},
pages = {27--34},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00121-4},
doi = {10.1016/S0026-2714(01)00121-4},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhaoQH02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhuangD02,
author = {Yiqi Zhuang and
Lei Du},
title = {1/f noise as a reliability indicator for subsurface Zener diodes},
journal = {Microelectron. Reliab.},
volume = {42},
number = {3},
pages = {355--360},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(01)00251-7},
doi = {10.1016/S0026-2714(01)00251-7},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhuangD02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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