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@article{DBLP:journals/fteda/HeESHY11,
  author       = {Lei He and
                  Shauki Elassaad and
                  Yiyu Shi and
                  Yu Hu and
                  Wei Yao},
  title        = {System-in-Package: Electrical and Layout Perspectives},
  journal      = {Found. Trends Electron. Des. Autom.},
  volume       = {4},
  number       = {4},
  pages        = {223--306},
  year         = {2011},
  url          = {https://doi.org/10.1561/1000000014},
  doi          = {10.1561/1000000014},
  timestamp    = {Tue, 13 Dec 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/fteda/HeESHY11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/fteda/Pan10,
  author       = {David Z. Pan and
                  Minsik Cho and
                  Kun Yuan},
  title        = {Manufacturability Aware Routing in Nanometer {VLSI}},
  journal      = {Found. Trends Electron. Des. Autom.},
  volume       = {4},
  number       = {1},
  pages        = {1--97},
  year         = {2010},
  url          = {https://doi.org/10.1561/1000000015},
  doi          = {10.1561/1000000015},
  timestamp    = {Thu, 18 Jun 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/fteda/Pan10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/fteda/Seifert10,
  author       = {Norbert Seifert},
  title        = {Radiation-induced Soft Errors: {A} Chip-level Modeling Perspective},
  journal      = {Found. Trends Electron. Des. Autom.},
  volume       = {4},
  number       = {2-3},
  pages        = {99--221},
  year         = {2010},
  url          = {https://doi.org/10.1561/1000000018},
  doi          = {10.1561/1000000018},
  timestamp    = {Thu, 18 Jun 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/fteda/Seifert10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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